JP2012530947A5 - - Google Patents

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JP2012530947A5
JP2012530947A5 JP2012516561A JP2012516561A JP2012530947A5 JP 2012530947 A5 JP2012530947 A5 JP 2012530947A5 JP 2012516561 A JP2012516561 A JP 2012516561A JP 2012516561 A JP2012516561 A JP 2012516561A JP 2012530947 A5 JP2012530947 A5 JP 2012530947A5
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Japan
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microscope
counter
region
sample
phosphor
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JP2012516561A
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JP5746161B2 (ja
JP2012530947A (ja
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JP2012516561A 2009-06-26 2010-06-19 顕微鏡画像における蛍光の評価方法 Active JP5746161B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102009031231A DE102009031231A1 (de) 2009-06-26 2009-06-26 Verfahren und Anordnungen für die Fluoreszenzmikroskopie
DE102009031231.5 2009-06-26
PCT/EP2010/003705 WO2010149319A1 (de) 2009-06-26 2010-06-19 Verfahren zum auswerten von fluoreszenzereignissen in einem mikroskopbild

Publications (3)

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JP2012530947A JP2012530947A (ja) 2012-12-06
JP2012530947A5 true JP2012530947A5 (https=) 2013-08-08
JP5746161B2 JP5746161B2 (ja) 2015-07-08

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JP2012516561A Active JP5746161B2 (ja) 2009-06-26 2010-06-19 顕微鏡画像における蛍光の評価方法

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US (1) US8988771B2 (https=)
EP (1) EP2446314B1 (https=)
JP (1) JP5746161B2 (https=)
DE (1) DE102009031231A1 (https=)
WO (1) WO2010149319A1 (https=)

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US20210010920A1 (en) * 2017-12-27 2021-01-14 Riken Spectroscopic analysis device, spectroscopic analysis method, program, recording medium, and microscope
US11169368B2 (en) * 2018-01-02 2021-11-09 King's College London Method and system for localisation microscopy
US11674902B2 (en) * 2018-07-16 2023-06-13 Yissum Research Development Company Of The Hebrew University Of Jerusalem Ltd. System and method for use in fret microscopy
DE102018122816B9 (de) * 2018-09-18 2024-07-04 Carl Zeiss Meditec Ag Verfahren und Vorrichtung zum Bestimmen einer Eigenschaft eines Objekts
DE102018220779A1 (de) 2018-12-03 2020-06-04 Carl Zeiss Microscopy Gmbh Nachweisverfahren von induzierten Lichtsignalen in einer dreidimensionalen Region einer Probe
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JP7565554B2 (ja) * 2020-05-22 2024-10-11 国立大学法人山梨大学 分光計、分析システム及び分析方法
DE102020006975A1 (de) * 2020-11-11 2022-05-12 Carl Zeiss Microscopy Gmbh Laser-Scanning-Mikroskop und Verfahren zum Justieren eines Laser-Scanning-Mikroskops
DE102020131047B4 (de) * 2020-11-24 2024-08-22 Abberior Instruments Gmbh Verfahren und Vorrichtung zur Aufnahme nanoskopischer Bilder mehrfach gefärbter Proben
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