JP2012230320A5 - - Google Patents

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Publication number
JP2012230320A5
JP2012230320A5 JP2011099707A JP2011099707A JP2012230320A5 JP 2012230320 A5 JP2012230320 A5 JP 2012230320A5 JP 2011099707 A JP2011099707 A JP 2011099707A JP 2011099707 A JP2011099707 A JP 2011099707A JP 2012230320 A5 JP2012230320 A5 JP 2012230320A5
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JP
Japan
Prior art keywords
group
underlayer film
resist underlayer
photosensitive resist
polymer
Prior art date
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Application number
JP2011099707A
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English (en)
Japanese (ja)
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JP2012230320A (ja
JP5884961B2 (ja
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Priority to JP2011099707A priority Critical patent/JP5884961B2/ja
Priority claimed from JP2011099707A external-priority patent/JP5884961B2/ja
Publication of JP2012230320A publication Critical patent/JP2012230320A/ja
Publication of JP2012230320A5 publication Critical patent/JP2012230320A5/ja
Application granted granted Critical
Publication of JP5884961B2 publication Critical patent/JP5884961B2/ja
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JP2011099707A 2011-04-27 2011-04-27 光ラジカル重合開始剤を含む感光性レジスト下層膜形成組成物 Active JP5884961B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2011099707A JP5884961B2 (ja) 2011-04-27 2011-04-27 光ラジカル重合開始剤を含む感光性レジスト下層膜形成組成物

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011099707A JP5884961B2 (ja) 2011-04-27 2011-04-27 光ラジカル重合開始剤を含む感光性レジスト下層膜形成組成物

Publications (3)

Publication Number Publication Date
JP2012230320A JP2012230320A (ja) 2012-11-22
JP2012230320A5 true JP2012230320A5 (enExample) 2014-06-05
JP5884961B2 JP5884961B2 (ja) 2016-03-15

Family

ID=47431901

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011099707A Active JP5884961B2 (ja) 2011-04-27 2011-04-27 光ラジカル重合開始剤を含む感光性レジスト下層膜形成組成物

Country Status (1)

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JP (1) JP5884961B2 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5597616B2 (ja) * 2011-10-03 2014-10-01 富士フイルム株式会社 ネガ型化学増幅レジスト組成物、並びに、それを用いたレジスト膜、レジスト塗布マスクブランクス、レジストパターン形成方法、及び、フォトマスク
KR102554076B1 (ko) * 2021-04-26 2023-07-12 주식회사 켐폴 감광성 고분자 및 포토레지스트 조성물
KR20250042527A (ko) * 2023-09-20 2025-03-27 삼성에스디아이 주식회사 레지스트 하층막용 조성물 및 이를 이용한 패턴형성방법

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100583095B1 (ko) * 2000-06-30 2006-05-24 주식회사 하이닉스반도체 광산 발생제와 함께 광 라디칼 발생제(prg)를 포함하는포토레지스트 조성물
US20050214674A1 (en) * 2004-03-25 2005-09-29 Yu Sui Positive-working photoimageable bottom antireflective coating
JP4855354B2 (ja) * 2007-07-13 2012-01-18 信越化学工業株式会社 レジスト下層膜材料およびこれを用いたパターン形成方法
JP2009251392A (ja) * 2008-04-08 2009-10-29 Fujifilm Corp ネガ型レジスト組成物及びパターン形成方法
JP2011053606A (ja) * 2009-09-04 2011-03-17 Sumitomo Chemical Co Ltd レジスト組成物及びパターン形成方法

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