JP2012182474A5 - - Google Patents

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Publication number
JP2012182474A5
JP2012182474A5 JP2012101324A JP2012101324A JP2012182474A5 JP 2012182474 A5 JP2012182474 A5 JP 2012182474A5 JP 2012101324 A JP2012101324 A JP 2012101324A JP 2012101324 A JP2012101324 A JP 2012101324A JP 2012182474 A5 JP2012182474 A5 JP 2012182474A5
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JP
Japan
Prior art keywords
film
etching
resist
opening
layer
Prior art date
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Pending
Application number
JP2012101324A
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English (en)
Japanese (ja)
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JP2012182474A (ja
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Publication date
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Priority to JP2012101324A priority Critical patent/JP2012182474A/ja
Priority claimed from JP2012101324A external-priority patent/JP2012182474A/ja
Publication of JP2012182474A publication Critical patent/JP2012182474A/ja
Publication of JP2012182474A5 publication Critical patent/JP2012182474A5/ja
Pending legal-status Critical Current

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JP2012101324A 2012-04-26 2012-04-26 半導体装置の製造方法及び記憶媒体 Pending JP2012182474A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2012101324A JP2012182474A (ja) 2012-04-26 2012-04-26 半導体装置の製造方法及び記憶媒体

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012101324A JP2012182474A (ja) 2012-04-26 2012-04-26 半導体装置の製造方法及び記憶媒体

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP2007210229A Division JP2009044090A (ja) 2007-08-10 2007-08-10 半導体装置の製造方法及び記憶媒体

Publications (2)

Publication Number Publication Date
JP2012182474A JP2012182474A (ja) 2012-09-20
JP2012182474A5 true JP2012182474A5 (https=) 2012-11-01

Family

ID=47013354

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012101324A Pending JP2012182474A (ja) 2012-04-26 2012-04-26 半導体装置の製造方法及び記憶媒体

Country Status (1)

Country Link
JP (1) JP2012182474A (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9054158B2 (en) * 2013-02-08 2015-06-09 Texas Instruments Incorporated Method of forming a metal contact opening with a width that is smaller than the minimum feature size of a photolithographically-defined opening
JP7178826B2 (ja) * 2018-08-22 2022-11-28 東京エレクトロン株式会社 処理方法
JP7220603B2 (ja) * 2019-03-20 2023-02-10 東京エレクトロン株式会社 膜をエッチングする方法及びプラズマ処理装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3923927B2 (ja) * 2003-07-07 2007-06-06 沖電気工業株式会社 半導体装置の製造方法
JP4652140B2 (ja) * 2005-06-21 2011-03-16 東京エレクトロン株式会社 プラズマエッチング方法、制御プログラム、コンピュータ記憶媒体
JP2007123399A (ja) * 2005-10-26 2007-05-17 Hitachi High-Technologies Corp ドライエッチング方法

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