JP2012127698A - 放射線検出装置およびその製造方法 - Google Patents

放射線検出装置およびその製造方法 Download PDF

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Publication number
JP2012127698A
JP2012127698A JP2010277424A JP2010277424A JP2012127698A JP 2012127698 A JP2012127698 A JP 2012127698A JP 2010277424 A JP2010277424 A JP 2010277424A JP 2010277424 A JP2010277424 A JP 2010277424A JP 2012127698 A JP2012127698 A JP 2012127698A
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Japan
Prior art keywords
columnar crystals
aggregate
base
layer
sensor panel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2010277424A
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English (en)
Japanese (ja)
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JP2012127698A5 (enExample
Inventor
Keiichi Nomura
慶一 野村
Satoshi Okada
岡田　　聡
Kazumi Nagano
和美 長野
Yohei Ishida
陽平 石田
Tomoaki Ichimura
知昭 市村
Yasuto Sasaki
慶人 佐々木
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Canon Inc
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Canon Inc
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Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2010277424A priority Critical patent/JP2012127698A/ja
Priority to US13/285,619 priority patent/US8686361B2/en
Publication of JP2012127698A publication Critical patent/JP2012127698A/ja
Publication of JP2012127698A5 publication Critical patent/JP2012127698A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal

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  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
JP2010277424A 2010-12-13 2010-12-13 放射線検出装置およびその製造方法 Pending JP2012127698A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2010277424A JP2012127698A (ja) 2010-12-13 2010-12-13 放射線検出装置およびその製造方法
US13/285,619 US8686361B2 (en) 2010-12-13 2011-10-31 Radiation detection apparatus and method for manufacturing the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010277424A JP2012127698A (ja) 2010-12-13 2010-12-13 放射線検出装置およびその製造方法

Publications (2)

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JP2012127698A true JP2012127698A (ja) 2012-07-05
JP2012127698A5 JP2012127698A5 (enExample) 2013-12-05

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ID=46198377

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JP2010277424A Pending JP2012127698A (ja) 2010-12-13 2010-12-13 放射線検出装置およびその製造方法

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US (1) US8686361B2 (enExample)
JP (1) JP2012127698A (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014059172A (ja) * 2012-09-14 2014-04-03 Hamamatsu Photonics Kk シンチレータパネル、及び、放射線検出器
KR101405537B1 (ko) 2012-10-19 2014-06-11 주식회사 아비즈알 간접방식 신틸레이터 패널 및 그 제조방법
JP2015200528A (ja) * 2014-04-04 2015-11-12 キヤノン株式会社 放射線撮像装置およびその製造方法、並びに放射線撮像システム

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6512830B2 (ja) 2015-01-09 2019-05-15 キヤノン株式会社 放射線撮像装置、その製造方法及び放射線検査装置
WO2016126260A1 (en) * 2015-02-06 2016-08-11 Analogic Corporation Radiation detector system of radiation imaging modality
EP3226038B1 (en) 2016-03-28 2020-05-06 Canon Kabushiki Kaisha Radiation detection apparatus and radiation imaging system
CN109839652B (zh) * 2019-01-25 2020-11-13 深圳市帕蓝特检测有限公司 一种放射源的监控方法、监控装置和监控终端
JP2023169762A (ja) 2022-05-17 2023-11-30 キヤノン株式会社 放射線検出器の製造方法、放射線検出器、放射線撮像装置および放射線撮像システム
JP2024027374A (ja) 2022-08-17 2024-03-01 キヤノン株式会社 放射線撮像装置の製造方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001128064A (ja) * 1999-10-26 2001-05-11 Canon Inc 放射線検出素子、放射線検出システム、及び放射線検出素子の製造方法
WO2004079396A1 (ja) * 2003-03-07 2004-09-16 Hamamatsu Photonics K.K. シンチレータパネルおよび放射線イメージセンサの製造方法
JP2006189377A (ja) * 2005-01-07 2006-07-20 Canon Inc シンチレータパネル、放射線検出装置、及び放射線検出システム
JP2011257142A (ja) * 2010-06-04 2011-12-22 Hamamatsu Photonics Kk シンチレータパネル及び放射線イメージセンサ

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6133075A (en) * 1997-04-25 2000-10-17 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method of fabricating the same
WO2005038490A1 (en) * 2003-10-22 2005-04-28 Canon Kabushiki Kaisha Radiation detection device, scintillator panel, method of making the same, making apparatus, and radiation image pick-up system
JP2006184187A (ja) 2004-12-28 2006-07-13 Canon Inc 放射線検出装置、シンチレータパネル、および放射線検出システム

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001128064A (ja) * 1999-10-26 2001-05-11 Canon Inc 放射線検出素子、放射線検出システム、及び放射線検出素子の製造方法
WO2004079396A1 (ja) * 2003-03-07 2004-09-16 Hamamatsu Photonics K.K. シンチレータパネルおよび放射線イメージセンサの製造方法
JP2006189377A (ja) * 2005-01-07 2006-07-20 Canon Inc シンチレータパネル、放射線検出装置、及び放射線検出システム
JP2011257142A (ja) * 2010-06-04 2011-12-22 Hamamatsu Photonics Kk シンチレータパネル及び放射線イメージセンサ

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014059172A (ja) * 2012-09-14 2014-04-03 Hamamatsu Photonics Kk シンチレータパネル、及び、放射線検出器
US9322932B2 (en) 2012-09-14 2016-04-26 Hamamatsu Photonics K.K. Scintillator panel and radiation detection device
KR101405537B1 (ko) 2012-10-19 2014-06-11 주식회사 아비즈알 간접방식 신틸레이터 패널 및 그 제조방법
JP2015200528A (ja) * 2014-04-04 2015-11-12 キヤノン株式会社 放射線撮像装置およびその製造方法、並びに放射線撮像システム

Also Published As

Publication number Publication date
US8686361B2 (en) 2014-04-01
US20120145905A1 (en) 2012-06-14

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