JP2012068259A5 - - Google Patents

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JP2012068259A5
JP2012068259A5 JP2011255236A JP2011255236A JP2012068259A5 JP 2012068259 A5 JP2012068259 A5 JP 2012068259A5 JP 2011255236 A JP2011255236 A JP 2011255236A JP 2011255236 A JP2011255236 A JP 2011255236A JP 2012068259 A5 JP2012068259 A5 JP 2012068259A5
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matrix
sample
mass spectrometry
laser desorption
assisted laser
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JP2011255236A
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Japanese (ja)
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JP2012068259A (ja
JP5705094B2 (ja
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JP2011255236A 2006-09-28 2011-11-22 マトリックス支援レーザー脱離イオン化質量分析用サンプル調製法及びマトリックス支援レーザー脱離イオン化質量分析法 Active JP5705094B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2011255236A JP5705094B2 (ja) 2006-09-28 2011-11-22 マトリックス支援レーザー脱離イオン化質量分析用サンプル調製法及びマトリックス支援レーザー脱離イオン化質量分析法

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2006265349 2006-09-28
JP2006265349 2006-09-28
JP2011255236A JP5705094B2 (ja) 2006-09-28 2011-11-22 マトリックス支援レーザー脱離イオン化質量分析用サンプル調製法及びマトリックス支援レーザー脱離イオン化質量分析法

Related Parent Applications (1)

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JP2008536466A Division JPWO2008038812A1 (ja) 2006-09-28 2007-09-21 マトリックス支援レーザー脱離イオン化質量分析用サンプル調製法及びマトリックス支援レーザー脱離イオン化質量分析法

Publications (3)

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JP2012068259A JP2012068259A (ja) 2012-04-05
JP2012068259A5 true JP2012068259A5 (enExample) 2012-05-24
JP5705094B2 JP5705094B2 (ja) 2015-04-22

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JP2008536466A Pending JPWO2008038812A1 (ja) 2006-09-28 2007-09-21 マトリックス支援レーザー脱離イオン化質量分析用サンプル調製法及びマトリックス支援レーザー脱離イオン化質量分析法
JP2011255236A Active JP5705094B2 (ja) 2006-09-28 2011-11-22 マトリックス支援レーザー脱離イオン化質量分析用サンプル調製法及びマトリックス支援レーザー脱離イオン化質量分析法

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JP2008536466A Pending JPWO2008038812A1 (ja) 2006-09-28 2007-09-21 マトリックス支援レーザー脱離イオン化質量分析用サンプル調製法及びマトリックス支援レーザー脱離イオン化質量分析法

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US (1) US8283625B2 (enExample)
EP (1) EP2063265B1 (enExample)
JP (2) JPWO2008038812A1 (enExample)
WO (1) WO2008038812A1 (enExample)

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US8519330B2 (en) 2010-10-01 2013-08-27 Ut-Battelle, Llc Systems and methods for laser assisted sample transfer to solution for chemical analysis
US8637813B2 (en) 2010-10-01 2014-01-28 Ut-Battelle, Llc System and method for laser assisted sample transfer to solution for chemical analysis
JP2013257282A (ja) * 2012-06-14 2013-12-26 Canon Inc 画像処理方法および装置
ITRM20120436A1 (it) * 2012-09-13 2014-03-14 System Optimal Solution S R L Elemento per la realizzazione di repliche di indagini superficiali di materiali e metodo atto a realizzare tali indagini
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CN119198891A (zh) * 2024-11-22 2024-12-27 浙江大学长三角智慧绿洲创新中心 一种麦冬中化学成分的可视化检测方法

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