JP2012052940A5 - - Google Patents

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Publication number
JP2012052940A5
JP2012052940A5 JP2010196367A JP2010196367A JP2012052940A5 JP 2012052940 A5 JP2012052940 A5 JP 2012052940A5 JP 2010196367 A JP2010196367 A JP 2010196367A JP 2010196367 A JP2010196367 A JP 2010196367A JP 2012052940 A5 JP2012052940 A5 JP 2012052940A5
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JP
Japan
Prior art keywords
precursor ions
precursor
sample
determining
ions
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JP2010196367A
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English (en)
Japanese (ja)
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JP2012052940A (ja
JP5636614B2 (ja
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Priority to JP2010196367A priority Critical patent/JP5636614B2/ja
Priority claimed from JP2010196367A external-priority patent/JP5636614B2/ja
Priority to PCT/JP2011/069885 priority patent/WO2012029900A1/ja
Publication of JP2012052940A publication Critical patent/JP2012052940A/ja
Publication of JP2012052940A5 publication Critical patent/JP2012052940A5/ja
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JP2010196367A 2010-09-02 2010-09-02 Lc−maldiで得られたデータの比較解析方法 Expired - Fee Related JP5636614B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2010196367A JP5636614B2 (ja) 2010-09-02 2010-09-02 Lc−maldiで得られたデータの比較解析方法
PCT/JP2011/069885 WO2012029900A1 (ja) 2010-09-02 2011-09-01 Lc-maldiで得られたデータの比較解析方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010196367A JP5636614B2 (ja) 2010-09-02 2010-09-02 Lc−maldiで得られたデータの比較解析方法

Publications (3)

Publication Number Publication Date
JP2012052940A JP2012052940A (ja) 2012-03-15
JP2012052940A5 true JP2012052940A5 (enExample) 2013-10-17
JP5636614B2 JP5636614B2 (ja) 2014-12-10

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JP2010196367A Expired - Fee Related JP5636614B2 (ja) 2010-09-02 2010-09-02 Lc−maldiで得られたデータの比較解析方法

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JP (1) JP5636614B2 (enExample)
WO (1) WO2012029900A1 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5811912B2 (ja) * 2012-03-16 2015-11-11 株式会社島津製作所 質量分析装置
KR101326280B1 (ko) 2012-08-21 2013-11-11 한국항공우주연구원 소형 무게중심 측정장치 및 방법
JP6148540B2 (ja) * 2013-06-07 2017-06-14 株式会社島津製作所 質量分析装置を用いたグラニュリンペプチドの定量分析方法、および分析用プログラム
US20220189751A1 (en) * 2019-04-24 2022-06-16 Shimadzu Corporation Imaging mass spectrometer
WO2022209075A1 (ja) * 2021-03-30 2022-10-06 株式会社島津製作所 分析システム及び分析システム用プログラム

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6918309B2 (en) * 2001-01-17 2005-07-19 Irm Llc Sample deposition method and system
US7858387B2 (en) * 2003-04-30 2010-12-28 Perkinelmer Health Sciences, Inc. Method of scanning a sample plate surface mask in an area adjacent to a conductive area using matrix-assisted laser desorption and ionization mass spectrometry
JP4602374B2 (ja) * 2007-03-30 2010-12-22 株式会社日立ハイテクノロジーズ クロマトグラフィー質量分析方法、及びクロマトグラフ質量分析装置
JP4929149B2 (ja) * 2007-12-27 2012-05-09 株式会社日立ハイテクノロジーズ 質量分析スペクトル分析方法

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