JP5636614B2 - Ｌｃ−ｍａｌｄｉで得られたデータの比較解析方法 - Google Patents

Ｌｃ−ｍａｌｄｉで得られたデータの比較解析方法 Download PDF

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Publication number
JP5636614B2
JP5636614B2 JP2010196367A JP2010196367A JP5636614B2 JP 5636614 B2 JP5636614 B2 JP 5636614B2 JP 2010196367 A JP2010196367 A JP 2010196367A JP 2010196367 A JP2010196367 A JP 2010196367A JP 5636614 B2 JP5636614 B2 JP 5636614B2
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sample
precursor
precursor ions
ions
ion
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JP2012052940A (ja
JP2012052940A5 (enExample
Inventor
吉田　昌樹
昌樹 吉田
常祥 黒岩
常祥 黒岩
大和 吉田
大和 吉田
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Rikkyo Educational Corp
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0036—Step by step routines describing the handling of the data generated during a measurement

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP2010196367A 2010-09-02 2010-09-02 Ｌｃ−ｍａｌｄｉで得られたデータの比較解析方法 Expired - Fee Related JP5636614B2 (ja)

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JP2010196367A JP5636614B2 (ja) 2010-09-02 2010-09-02 Ｌｃ−ｍａｌｄｉで得られたデータの比較解析方法
PCT/JP2011/069885 WO2012029900A1 (ja) 2010-09-02 2011-09-01 Lc-maldiで得られたデータの比較解析方法

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JP2010196367A JP5636614B2 (ja) 2010-09-02 2010-09-02 Ｌｃ−ｍａｌｄｉで得られたデータの比較解析方法

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JP2012052940A JP2012052940A (ja) 2012-03-15
JP2012052940A5 JP2012052940A5 (enExample) 2013-10-17
JP5636614B2 true JP5636614B2 (ja) 2014-12-10

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WO (1) WO2012029900A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013195115A (ja) * 2012-03-16 2013-09-30 Shimadzu Corp 質量分析装置

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101326280B1 (ko) 2012-08-21 2013-11-11 한국항공우주연구원 소형 무게중심 측정장치 및 방법
JP6148540B2 (ja) * 2013-06-07 2017-06-14 株式会社島津製作所 質量分析装置を用いたグラニュリンペプチドの定量分析方法、および分析用プログラム
US20220189751A1 (en) * 2019-04-24 2022-06-16 Shimadzu Corporation Imaging mass spectrometer
WO2022209075A1 (ja) * 2021-03-30 2022-10-06 株式会社島津製作所 分析システム及び分析システム用プログラム

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US6918309B2 (en) * 2001-01-17 2005-07-19 Irm Llc Sample deposition method and system
US7858387B2 (en) * 2003-04-30 2010-12-28 Perkinelmer Health Sciences, Inc. Method of scanning a sample plate surface mask in an area adjacent to a conductive area using matrix-assisted laser desorption and ionization mass spectrometry
JP4602374B2 (ja) * 2007-03-30 2010-12-22 株式会社日立ハイテクノロジーズ クロマトグラフィー質量分析方法、及びクロマトグラフ質量分析装置
JP4929149B2 (ja) * 2007-12-27 2012-05-09 株式会社日立ハイテクノロジーズ 質量分析スペクトル分析方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013195115A (ja) * 2012-03-16 2013-09-30 Shimadzu Corp 質量分析装置

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WO2012029900A1 (ja) 2012-03-08

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