JP2012047739A - コーティングを評価するための熱画像化方法および装置 - Google Patents

コーティングを評価するための熱画像化方法および装置 Download PDF

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Publication number
JP2012047739A
JP2012047739A JP2011181048A JP2011181048A JP2012047739A JP 2012047739 A JP2012047739 A JP 2012047739A JP 2011181048 A JP2011181048 A JP 2011181048A JP 2011181048 A JP2011181048 A JP 2011181048A JP 2012047739 A JP2012047739 A JP 2012047739A
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JP
Japan
Prior art keywords
coating
time
thickness
flash lamp
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2011181048A
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English (en)
Japanese (ja)
Other versions
JP2012047739A5 (https=
Inventor
Harry Israel Ringermacher
ハリー・イスレイル・リンジャーマッハー
Donald Robert Howard
ドナルド・ロバート・ハワード
Edward Knight Bryon
ブリョン・エドワード・ナイト
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General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of JP2012047739A publication Critical patent/JP2012047739A/ja
Publication of JP2012047739A5 publication Critical patent/JP2012047739A5/ja
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/08—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness
    • G01B21/085—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness using thermal means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0658—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of emissivity or reradiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/0088—Radiation pyrometry, e.g. infrared or optical thermometry in turbines
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/08—Optical arrangements
    • G01J5/0896—Optical arrangements using a light source, e.g. for illuminating a surface
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/48—Thermography; Techniques using wholly visual means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Radiation Pyrometers (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2011181048A 2010-08-27 2011-08-23 コーティングを評価するための熱画像化方法および装置 Pending JP2012047739A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US12/869,893 2010-08-27
US12/869,893 US8692887B2 (en) 2010-08-27 2010-08-27 Thermal imaging method and apparatus for evaluating coatings

Publications (2)

Publication Number Publication Date
JP2012047739A true JP2012047739A (ja) 2012-03-08
JP2012047739A5 JP2012047739A5 (https=) 2014-10-02

Family

ID=44719289

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011181048A Pending JP2012047739A (ja) 2010-08-27 2011-08-23 コーティングを評価するための熱画像化方法および装置

Country Status (5)

Country Link
US (1) US8692887B2 (https=)
EP (1) EP2423638A2 (https=)
JP (1) JP2012047739A (https=)
CN (1) CN102445155A (https=)
BR (1) BRPI1103714A2 (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2022136245A (ja) * 2017-11-27 2022-09-15 株式会社豊田中央研究所 計測装置、計測方法、及びプログラム

Families Citing this family (53)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9143703B2 (en) * 2011-06-10 2015-09-22 Flir Systems, Inc. Infrared camera calibration techniques
KR101709282B1 (ko) * 2011-11-15 2017-02-24 삼성전자주식회사 이미지 센서, 이의 동작 방법, 및 이를 포함하는 장치들
US9413988B2 (en) * 2012-07-24 2016-08-09 Fluke Corporation Thermal imaging camera with graphical temperature plot
CN102954968A (zh) * 2012-11-05 2013-03-06 西安交通大学 热障涂层部件电磁涡流热成像无损检测系统及检测方法
EP2962061B1 (en) * 2013-03-01 2017-12-06 United Technologies Corporation Flash thermography double wall thickness measurement
US8759770B1 (en) * 2013-04-08 2014-06-24 General Electric Company System and method for qualifying usability risk associated with subsurface defects in a multilayer coating
US9500611B2 (en) 2013-09-26 2016-11-22 General Electric Company Lamp assembly for a thermographic nondestructive evaluation system
US9476798B2 (en) * 2014-02-21 2016-10-25 General Electric Company On-line monitoring of hot gas path components of a gas turbine
US10768128B2 (en) * 2014-07-22 2020-09-08 The Boeing Company Systems and methods of monitoring a thermal protection system
US10142565B2 (en) * 2015-04-13 2018-11-27 Siemens Energy, Inc. Flash thermography borescope
US10690581B2 (en) * 2015-12-07 2020-06-23 The Boeing Company Infrared thermographic porosity quantification in composite structures
US10201831B2 (en) * 2015-12-09 2019-02-12 General Electric Company Coating inspection method
US10242439B1 (en) * 2016-08-17 2019-03-26 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Contrast based imaging and analysis computer-implemented method to analyze pulse thermography data for nondestructive evaluation
US10648937B2 (en) * 2016-10-27 2020-05-12 General Electric Company Nondestructive inspection method for coatings and ceramic matrix composites
US20180292313A1 (en) * 2017-04-11 2018-10-11 Novelis Inc. Systems and methods of detecting coatings on metal substrates
GB2565079A (en) 2017-07-31 2019-02-06 Erodex Uk Ltd Inspection system and method for turbine vanes and blades
DE102017213371A1 (de) * 2017-08-02 2019-02-07 Sms Group Gmbh Vorrichtung und Verfahren zum einseitigen und/oder beidseitigen Beschichten eines metallischen Bandsubstrats
US20190064119A1 (en) * 2017-08-28 2019-02-28 Siemens Energy, Inc. Laser ultrasonic thermography inspection
US10274429B2 (en) * 2017-09-18 2019-04-30 United Technologies Corporation Method and system for detecting precursor to coating spallation
US10641720B2 (en) * 2017-10-06 2020-05-05 General Electric Company Thermal barrier coating spallation detection system
EP3710813B1 (en) * 2017-11-13 2023-09-20 Illumina, Inc. System and method for large sample analysis of thin film
KR101877480B1 (ko) * 2017-11-24 2018-08-07 한국과학기술원 도막 두께 분포 시각화 방법 및 이를 위한 능동형 열화상 장치
CN108106585B (zh) * 2017-12-21 2020-06-12 爱德森（厦门）电子有限公司 一种金属基材表面覆层的检测方法
WO2019129523A1 (en) * 2017-12-26 2019-07-04 Robert Bosch Gmbh System and method for detecting a thickness of a layer
JP6907951B2 (ja) * 2018-01-11 2021-07-21 トヨタ自動車株式会社 ヒートシンクの検査方法、検査装置及び生産方法、生産システム
US10845253B2 (en) * 2018-04-02 2020-11-24 General Electric Company Turbine thermal monitoring systems and methods
US11015252B2 (en) * 2018-04-27 2021-05-25 Applied Materials, Inc. Protection of components from corrosion
US10943320B2 (en) 2018-05-04 2021-03-09 Raytheon Technologies Corporation System and method for robotic inspection
US10685433B2 (en) 2018-05-04 2020-06-16 Raytheon Technologies Corporation Nondestructive coating imperfection detection system and method therefor
US10473593B1 (en) 2018-05-04 2019-11-12 United Technologies Corporation System and method for damage detection by cast shadows
US11268881B2 (en) 2018-05-04 2022-03-08 Raytheon Technologies Corporation System and method for fan blade rotor disk and gear inspection
US10928362B2 (en) 2018-05-04 2021-02-23 Raytheon Technologies Corporation Nondestructive inspection using dual pulse-echo ultrasonics and method therefor
US10914191B2 (en) 2018-05-04 2021-02-09 Raytheon Technologies Corporation System and method for in situ airfoil inspection
US11079285B2 (en) 2018-05-04 2021-08-03 Raytheon Technologies Corporation Automated analysis of thermally-sensitive coating and method therefor
US10958843B2 (en) 2018-05-04 2021-03-23 Raytheon Technologies Corporation Multi-camera system for simultaneous registration and zoomed imagery
US10488371B1 (en) 2018-05-04 2019-11-26 United Technologies Corporation Nondestructive inspection using thermoacoustic imagery and method therefor
US10902664B2 (en) 2018-05-04 2021-01-26 Raytheon Technologies Corporation System and method for detecting damage using two-dimensional imagery and three-dimensional model
CN108955608A (zh) * 2018-05-18 2018-12-07 云南电网有限责任公司电力科学研究院 绝缘子表面rtv涂层涂覆效果评估方法、装置及系统
CN110702725B (zh) * 2018-07-09 2024-02-20 浙江清华柔性电子技术研究院 高温风洞的成像系统
US10800553B2 (en) * 2018-11-30 2020-10-13 The Boeing Company Solar radiography for non-destructive inspection
US11280751B2 (en) * 2018-12-04 2022-03-22 General Electric Company System and method for optimizing a manufacturing process based on an inspection of a component
US10670539B1 (en) * 2018-12-11 2020-06-02 General Electric Company Coating quality inspection system and method
DE102019104260B4 (de) * 2019-02-20 2025-09-11 Stefan Böttger Photothermisches Verfahren und Vorrichtung zur Bestimmung einer Schichtdicke einer auf ein Substrat aufgebrachten Schicht
DE102019116103B4 (de) 2019-06-13 2021-04-22 Notion Systems GmbH Verfahren zum Beschriften einer Leiterplatte durch Erzeugen von Schattierungen in einer funktionalen Lackschicht
EP3751368B1 (en) 2019-06-14 2023-09-27 General Electric Company Additive manufacturing-coupled digital twin ecosystem based on a surrogate model of measurement
EP3751370B1 (en) 2019-06-14 2024-07-24 General Electric Company Additive manufacturing-coupled digital twin ecosystem based on multi-variant distribution model of performance
EP3751369B1 (en) 2019-06-14 2024-07-24 General Electric Company Additive manufacturing-coupled digital twin ecosystem
KR102256181B1 (ko) * 2019-12-30 2021-05-27 한국과학기술원 강구조물의 도막 상태 검사 및 평가 방법과 이를 위한 시스템
CN111412850B (zh) * 2020-03-23 2021-09-21 昆明理工大学 一种基于单摄像头的高温三维数字图像相关测量系统及方法
US11810288B2 (en) * 2020-09-04 2023-11-07 General Electric Company Systems and methods for generating a single observation image to analyze coating defects
CN115908859B (zh) * 2022-09-08 2026-02-10 重庆广仁能源装备股份有限公司 基于脉冲耦合神经网络的绝缘子图像污秽特征提取方法
US20240240864A1 (en) * 2023-01-13 2024-07-18 Quantum IR Technologies, LLC Rotary kiln interior coating analytics and monitoring systems
US20250290859A1 (en) * 2024-03-12 2025-09-18 General Electric Company Electromagnetic inspection systems and methods

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003512596A (ja) * 1999-04-16 2003-04-02 ゼネラル・エレクトリック・カンパニイ 金属層の厚さの過渡サーモグラフィ測定方法
JP2003168115A (ja) * 2001-12-03 2003-06-13 Nippon Telegr & Teleph Corp <Ntt> モーションキャプチャ方法及び装置
JP2005043369A (ja) * 2003-07-24 2005-02-17 General Electric Co <Ge> 能動消光式ランプ、赤外線サーモグラフィ・イメージング・システム、及びフラッシュ持続時間を能動的に制御する方法
JP2007178429A (ja) * 2005-12-16 2007-07-12 General Electric Co <Ge> 絶縁塗膜の非破壊評価の装置

Family Cites Families (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4679946A (en) * 1984-05-21 1987-07-14 Therma-Wave, Inc. Evaluating both thickness and compositional variables in a thin film sample
US5719395A (en) * 1996-09-12 1998-02-17 Stress Photonics Inc. Coating tolerant thermography
US5711603A (en) * 1996-10-30 1998-01-27 United Technologies Corporation Nondestructive testing: transient depth thermography
DE19749984C2 (de) * 1997-11-12 2000-05-25 Fraunhofer Ges Forschung Verfahren und Vorrichtungen zum photothermischen Untersuchen eines Prüfkörpers
US6956963B2 (en) * 1998-07-08 2005-10-18 Ismeca Europe Semiconductor Sa Imaging for a machine-vision system
DE19837400C1 (de) * 1998-08-18 1999-11-18 Siemens Ag Verfahren und Vorrichtung zur Beschichtung von Hochtemperaturbauteilen mittels Plasmaspritzens
US6367968B1 (en) * 1999-07-21 2002-04-09 General Electric Company Thermal resonance imaging method
US6367969B1 (en) * 1999-07-21 2002-04-09 General Electric Company Synthetic reference thermal imaging method
JP2001128769A (ja) * 1999-10-29 2001-05-15 Aisin Seiki Co Ltd シートバック角度調整システム
US6407512B1 (en) * 1999-11-19 2002-06-18 Fuji Photo Film Co., Ltd. Flashing device of an automatic light-regulation type
US7690840B2 (en) * 1999-12-22 2010-04-06 Siemens Energy, Inc. Method and apparatus for measuring on-line failure of turbine thermal barrier coatings
US6593705B1 (en) * 2000-01-07 2003-07-15 Cyberoptics Corporation Rapid-firing flashlamp discharge circuit
US6575620B1 (en) * 2000-02-15 2003-06-10 The United States Of America As Represented By The Secretary Of The Air Force Method and device for visually measuring structural fatigue using a temperature sensitive coating
DE10013172C2 (de) 2000-03-17 2002-05-16 Wagner Internat Ag Altstaetten Verfahren und Vorrichtung zur photothermischen Analyse einer Materialschicht, insbesondere zur Schichtdickenmessung
US6542849B2 (en) * 2001-01-19 2003-04-01 The University Of Chicago Method for determining defect depth using thermal imaging
US6517236B2 (en) * 2001-02-15 2003-02-11 The University Of Chicago Method and apparatus for automated thermal imaging of combustor liners and other products
US6856765B2 (en) * 2001-12-07 2005-02-15 Olympus Optical Co., Ltd. Camera with light emission function, camera part inspection apparatus, camera adjustment apparatus, and camera part unit
US6712502B2 (en) * 2002-04-10 2004-03-30 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Synchronized electronic shutter system and method for thermal nondestructive evaluation
US7064331B2 (en) * 2002-09-13 2006-06-20 Siemens Power Generation, Inc. Method for calibrating and enhancing flaw detection of an acoustic thermography system
US7425093B2 (en) * 2003-07-16 2008-09-16 Cabot Corporation Thermography test method and apparatus for bonding evaluation in sputtering targets
US7186981B2 (en) * 2003-07-29 2007-03-06 Thermal Wave Imaging, Inc. Method and apparatus for thermographic imaging using flash pulse truncation
US7129492B2 (en) * 2003-07-29 2006-10-31 Toyota Motor Manufacturing North America, Inc. Systems and methods for inspecting coatings
DE602004030728D1 (de) 2004-10-04 2011-02-03 Siemens Ag Verfahren zur Bestimmung von Materialparametern eines Objekts von Temperature-versus-Time-Daten
US7419298B2 (en) * 2005-05-24 2008-09-02 United Technologies Corporation Thermal imaging method and apparatus
US7632012B2 (en) * 2005-09-01 2009-12-15 Siemens Energy, Inc. Method of measuring in situ differential emissivity and temperature
US7538938B2 (en) * 2006-06-13 2009-05-26 Uchicago Argonne, Llc Optical filter for flash lamps in pulsed thermal imaging
US7751061B2 (en) * 2006-07-20 2010-07-06 Nanometrics Incorporated Non-contact apparatus and method for measuring a property of a dielectric layer on a wafer
US8055054B2 (en) 2006-12-15 2011-11-08 General Electric Company Method and apparatus for thermographic nondestructive evaluation of an object
US7549789B2 (en) 2007-06-20 2009-06-23 General Electric Company Method and apparatus for thermographic nondestructive evaluation of an object
US7915586B2 (en) * 2008-08-08 2011-03-29 The Boeing Company Method for performing mid-IR spectroscopy measurements to measure film coating thickness, weight and/or film composition

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003512596A (ja) * 1999-04-16 2003-04-02 ゼネラル・エレクトリック・カンパニイ 金属層の厚さの過渡サーモグラフィ測定方法
JP2003168115A (ja) * 2001-12-03 2003-06-13 Nippon Telegr & Teleph Corp <Ntt> モーションキャプチャ方法及び装置
JP2005043369A (ja) * 2003-07-24 2005-02-17 General Electric Co <Ge> 能動消光式ランプ、赤外線サーモグラフィ・イメージング・システム、及びフラッシュ持続時間を能動的に制御する方法
JP2007178429A (ja) * 2005-12-16 2007-07-12 General Electric Co <Ge> 絶縁塗膜の非破壊評価の装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2022136245A (ja) * 2017-11-27 2022-09-15 株式会社豊田中央研究所 計測装置、計測方法、及びプログラム
JP7363989B2 (ja) 2017-11-27 2023-10-18 株式会社豊田中央研究所 計測装置、計測方法、及びプログラム

Also Published As

Publication number Publication date
CN102445155A (zh) 2012-05-09
US8692887B2 (en) 2014-04-08
US20120050537A1 (en) 2012-03-01
BRPI1103714A2 (pt) 2013-01-22
EP2423638A2 (en) 2012-02-29

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