JP2011524659A - (ccd)シフトレジスタ内残留電荷排出 - Google Patents
(ccd)シフトレジスタ内残留電荷排出 Download PDFInfo
- Publication number
- JP2011524659A JP2011524659A JP2011508509A JP2011508509A JP2011524659A JP 2011524659 A JP2011524659 A JP 2011524659A JP 2011508509 A JP2011508509 A JP 2011508509A JP 2011508509 A JP2011508509 A JP 2011508509A JP 2011524659 A JP2011524659 A JP 2011524659A
- Authority
- JP
- Japan
- Prior art keywords
- charge
- shift register
- image
- ccd shift
- reset drain
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000009825 accumulation Methods 0.000 claims abstract description 55
- 238000012546 transfer Methods 0.000 claims abstract description 37
- 238000000034 method Methods 0.000 claims abstract description 27
- 238000007599 discharging Methods 0.000 claims abstract description 5
- 230000007246 mechanism Effects 0.000 claims description 17
- 230000003213 activating effect Effects 0.000 claims 2
- 238000010586 diagram Methods 0.000 description 9
- 230000010365 information processing Effects 0.000 description 6
- 230000006870 function Effects 0.000 description 5
- 238000003384 imaging method Methods 0.000 description 5
- 230000001413 cellular effect Effects 0.000 description 3
- 238000012937 correction Methods 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 239000011159 matrix material Substances 0.000 description 2
- 238000005036 potential barrier Methods 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 230000005236 sound signal Effects 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 230000003321 amplification Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000009877 rendering Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000007619 statistical method Methods 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/15—Charge-coupled device [CCD] image sensors
- H10F39/158—Charge-coupled device [CCD] image sensors having arrangements for blooming suppression
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/62—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels
- H04N25/626—Reduction of noise due to residual charges remaining after image readout, e.g. to remove ghost images or afterimages
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
- H04N25/713—Transfer or readout registers; Split readout registers or multiple readout registers
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/118,131 | 2008-05-09 | ||
| US12/118,131 US8134630B2 (en) | 2008-05-09 | 2008-05-09 | System and method for draining residual charge from charge-coupled device (CCD) shift registers in image sensors having reset drains |
| PCT/US2009/002843 WO2009137079A1 (en) | 2008-05-09 | 2009-05-07 | Draining residual charge from (ccd) shift registers |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2011524659A true JP2011524659A (ja) | 2011-09-01 |
| JP2011524659A5 JP2011524659A5 (enExample) | 2012-06-21 |
Family
ID=40983322
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011508509A Pending JP2011524659A (ja) | 2008-05-09 | 2009-05-07 | (ccd)シフトレジスタ内残留電荷排出 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US8134630B2 (enExample) |
| EP (1) | EP2301073B1 (enExample) |
| JP (1) | JP2011524659A (enExample) |
| KR (1) | KR20110006677A (enExample) |
| CN (1) | CN102017155B (enExample) |
| WO (1) | WO2009137079A1 (enExample) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10462391B2 (en) * | 2015-08-14 | 2019-10-29 | Kla-Tencor Corporation | Dark-field inspection using a low-noise sensor |
| CN108174116B (zh) * | 2017-12-28 | 2019-11-15 | 中国科学院西安光学精密机械研究所 | 一种ccd曝光时间控制方法 |
| US11494628B2 (en) * | 2018-03-02 | 2022-11-08 | Aistorm, Inc. | Charge domain mathematical engine and method |
| CN113661536B (zh) * | 2020-01-21 | 2023-01-31 | 京东方科技集团股份有限公司 | 电子装置、驱动方法和采集方法 |
| CN112383726B (zh) * | 2020-10-30 | 2021-07-23 | 厦门大学 | 一种ccd高速信号采集方法和装置 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002112122A (ja) * | 2000-10-04 | 2002-04-12 | Fuji Film Microdevices Co Ltd | 電荷転送装置、ccdイメージセンサおよびccd撮像システム |
| JP2002335450A (ja) * | 2001-05-09 | 2002-11-22 | Fuji Film Microdevices Co Ltd | 固体撮像素子の駆動方法および固体撮像素子 |
| JP2003224255A (ja) * | 2002-01-28 | 2003-08-08 | Fuji Film Microdevices Co Ltd | 固体撮像素子およびこれを用いた撮像装置 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4593303A (en) * | 1981-07-10 | 1986-06-03 | Fairchild Camera & Instrument Corporation | Self-aligned antiblooming structure for charge-coupled devices |
| DE69410147T2 (de) | 1993-03-03 | 1998-12-03 | Philips Electronics N.V., Eindhoven | Ladungsgekoppelte Anordnung |
| JP3213529B2 (ja) * | 1995-11-30 | 2001-10-02 | 三洋電機株式会社 | 撮像装置 |
| US6693671B1 (en) | 2000-03-22 | 2004-02-17 | Eastman Kodak Company | Fast-dump structure for full-frame image sensors with lod antiblooming structures |
| US7492404B2 (en) * | 2004-08-27 | 2009-02-17 | Eastman Kodak Company | Fast flush structure for solid-state image sensors |
-
2008
- 2008-05-09 US US12/118,131 patent/US8134630B2/en active Active
-
2009
- 2009-05-07 EP EP09743066.4A patent/EP2301073B1/en not_active Not-in-force
- 2009-05-07 WO PCT/US2009/002843 patent/WO2009137079A1/en not_active Ceased
- 2009-05-07 JP JP2011508509A patent/JP2011524659A/ja active Pending
- 2009-05-07 CN CN200980115859.4A patent/CN102017155B/zh not_active Expired - Fee Related
- 2009-05-07 KR KR1020107025157A patent/KR20110006677A/ko not_active Withdrawn
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002112122A (ja) * | 2000-10-04 | 2002-04-12 | Fuji Film Microdevices Co Ltd | 電荷転送装置、ccdイメージセンサおよびccd撮像システム |
| JP2002335450A (ja) * | 2001-05-09 | 2002-11-22 | Fuji Film Microdevices Co Ltd | 固体撮像素子の駆動方法および固体撮像素子 |
| JP2003224255A (ja) * | 2002-01-28 | 2003-08-08 | Fuji Film Microdevices Co Ltd | 固体撮像素子およびこれを用いた撮像装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN102017155B (zh) | 2013-07-17 |
| EP2301073A1 (en) | 2011-03-30 |
| US8134630B2 (en) | 2012-03-13 |
| EP2301073B1 (en) | 2014-11-19 |
| KR20110006677A (ko) | 2011-01-20 |
| CN102017155A (zh) | 2011-04-13 |
| WO2009137079A1 (en) | 2009-11-12 |
| US20090278971A1 (en) | 2009-11-12 |
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