JP2011257396A5 - - Google Patents

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Publication number
JP2011257396A5
JP2011257396A5 JP2011125925A JP2011125925A JP2011257396A5 JP 2011257396 A5 JP2011257396 A5 JP 2011257396A5 JP 2011125925 A JP2011125925 A JP 2011125925A JP 2011125925 A JP2011125925 A JP 2011125925A JP 2011257396 A5 JP2011257396 A5 JP 2011257396A5
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JP
Japan
Prior art keywords
electrical signal
distribution
signal set
measured
conductivity
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JP2011125925A
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English (en)
Japanese (ja)
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JP5739731B2 (ja
JP2011257396A (ja
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Priority claimed from US12/797,653 external-priority patent/US8054094B1/en
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Publication of JP2011257396A publication Critical patent/JP2011257396A/ja
Publication of JP2011257396A5 publication Critical patent/JP2011257396A5/ja
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Publication of JP5739731B2 publication Critical patent/JP5739731B2/ja
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JP2011125925A 2010-06-10 2011-06-06 束縛条件付き最大化に基づく画像再構成 Expired - Fee Related JP5739731B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US12/797,653 US8054094B1 (en) 2010-06-10 2010-06-10 Image reconstruction based constrained maximization
US12/797,653 2010-06-10

Publications (3)

Publication Number Publication Date
JP2011257396A JP2011257396A (ja) 2011-12-22
JP2011257396A5 true JP2011257396A5 (https=) 2014-07-17
JP5739731B2 JP5739731B2 (ja) 2015-06-24

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JP2011125925A Expired - Fee Related JP5739731B2 (ja) 2010-06-10 2011-06-06 束縛条件付き最大化に基づく画像再構成

Country Status (5)

Country Link
US (1) US8054094B1 (https=)
EP (1) EP2395347B1 (https=)
JP (1) JP5739731B2 (https=)
CN (1) CN102364334B (https=)
BR (1) BRPI1102867A2 (https=)

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JPH0647224B2 (ja) * 1987-08-11 1994-06-22 アミテック株式会社 矩形枠体用研削装置
WO2013081845A1 (en) * 2011-11-30 2013-06-06 General Electric Company High-side current measurement technique for multi-phase fluid
JP2013195343A (ja) * 2012-03-22 2013-09-30 Ihi Corp トモグラフィ装置及びトモグラフィ計測方法
WO2014046971A1 (en) * 2012-09-19 2014-03-27 Corning Incorporated Methods and devices for measuring resistance of device structures and materials
JP6492005B2 (ja) * 2013-04-08 2019-03-27 株式会社日立製作所 Ｘ線ｃｔ装置、再構成演算装置、及び再構成演算方法
JP2014202722A (ja) * 2013-04-10 2014-10-27 株式会社豊田中央研究所 混相状態分布計測装置
GB201416182D0 (en) * 2014-09-12 2014-10-29 Ind Tomography Systems Plc Density measurement system and method
GB201416280D0 (en) * 2014-09-15 2014-10-29 Univ Leeds Tomography apparatus and method
WO2017105432A1 (en) * 2015-12-16 2017-06-22 Halliburton Energy Services, Inc. Electrical impedance tomography using a switchable array
AU2017387061B2 (en) 2016-12-27 2019-08-22 Panametrics Llc Portable moisture analyzer for natural gas
USD822514S1 (en) 2016-12-27 2018-07-10 General Electric Company Portable natural gas moisture analyzer
WO2018165274A1 (en) * 2017-03-07 2018-09-13 Ohio University Phase wetting detection and water layer thickness characterization in multiphase oil-water and oil-water-gas flow

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IL62861A (en) 1981-05-13 1988-01-31 Yeda Res & Dev Method and apparatus for carrying out electric tomography
CA1196691A (en) 1982-01-12 1985-11-12 Bradley Fry Reconstruction system and methods for impedance imaging
US4920490A (en) 1988-01-28 1990-04-24 Rensselaer Polytechnic Institute Process and apparatus for distinguishing conductivities by electric current computed tomography
US5381333A (en) 1991-07-23 1995-01-10 Rensselaer Polytechnic Institute Current patterns for electrical impedance tomography
JPH06168A (ja) * 1992-06-22 1994-01-11 Hitachi Ltd 電気インピ−ダンス分布測定方法およびその装置
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