JP2011237370A5 - - Google Patents

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Publication number
JP2011237370A5
JP2011237370A5 JP2010111025A JP2010111025A JP2011237370A5 JP 2011237370 A5 JP2011237370 A5 JP 2011237370A5 JP 2010111025 A JP2010111025 A JP 2010111025A JP 2010111025 A JP2010111025 A JP 2010111025A JP 2011237370 A5 JP2011237370 A5 JP 2011237370A5
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JP
Japan
Prior art keywords
allowable value
orientation
ultrasonic probe
storage unit
deviation
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Application number
JP2010111025A
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English (en)
Japanese (ja)
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JP2011237370A (ja
JP5586317B2 (ja
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Priority to JP2010111025A priority Critical patent/JP5586317B2/ja
Priority claimed from JP2010111025A external-priority patent/JP5586317B2/ja
Publication of JP2011237370A publication Critical patent/JP2011237370A/ja
Publication of JP2011237370A5 publication Critical patent/JP2011237370A5/ja
Application granted granted Critical
Publication of JP5586317B2 publication Critical patent/JP5586317B2/ja
Expired - Fee Related legal-status Critical Current
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JP2010111025A 2010-05-13 2010-05-13 超音波探傷システムおよび超音波探傷方法 Expired - Fee Related JP5586317B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2010111025A JP5586317B2 (ja) 2010-05-13 2010-05-13 超音波探傷システムおよび超音波探傷方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010111025A JP5586317B2 (ja) 2010-05-13 2010-05-13 超音波探傷システムおよび超音波探傷方法

Publications (3)

Publication Number Publication Date
JP2011237370A JP2011237370A (ja) 2011-11-24
JP2011237370A5 true JP2011237370A5 (enExample) 2013-06-06
JP5586317B2 JP5586317B2 (ja) 2014-09-10

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ID=45325501

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010111025A Expired - Fee Related JP5586317B2 (ja) 2010-05-13 2010-05-13 超音波探傷システムおよび超音波探傷方法

Country Status (1)

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JP (1) JP5586317B2 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9003880B2 (en) * 2012-12-31 2015-04-14 General Electric Company Reference speed measurement for a non-destructive testing system
JP2016212767A (ja) * 2015-05-13 2016-12-15 三菱電機株式会社 点検支援システムおよび点検支援方法
JP7083528B1 (ja) 2021-01-06 2022-06-13 三男 眞鍋 位置測定装置
CN114460173A (zh) * 2022-02-08 2022-05-10 苏州伟恒检测技术有限公司 一种轨道超声探伤系统及应用

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62134556A (ja) * 1985-12-06 1987-06-17 Hitachi Ltd 超音波探傷装置
JP2755651B2 (ja) * 1989-02-06 1998-05-20 東京電力株式会社 超音波探傷装置
JPH09257405A (ja) * 1996-03-26 1997-10-03 Matsushita Electric Works Ltd 埋設物の位置検出装置
JP2000046810A (ja) * 1998-07-30 2000-02-18 Nkk Corp 超音波探傷装置
JP2001265538A (ja) * 2000-03-16 2001-09-28 Matsushita Electric Ind Co Ltd ディスク装置の故障を予測する故障予測装置、媒体、および情報集合体
JP4576289B2 (ja) * 2005-05-31 2010-11-04 オリンパス株式会社 キャリブレーション装置
JP2007101192A (ja) * 2005-09-30 2007-04-19 Sado Electronics:Kk レール探傷器
JP2010032393A (ja) * 2008-07-29 2010-02-12 Jfe Steel Corp 超音波によるスポット溶接部の評価方法及び装置

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