JP2011158357A5 - - Google Patents

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Publication number
JP2011158357A5
JP2011158357A5 JP2010020451A JP2010020451A JP2011158357A5 JP 2011158357 A5 JP2011158357 A5 JP 2011158357A5 JP 2010020451 A JP2010020451 A JP 2010020451A JP 2010020451 A JP2010020451 A JP 2010020451A JP 2011158357 A5 JP2011158357 A5 JP 2011158357A5
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JP
Japan
Prior art keywords
gas
gas flow
supply port
flow path
plasma
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JP2010020451A
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English (en)
Japanese (ja)
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JP5423439B2 (ja
JP2011158357A (ja
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Priority to JP2010020451A priority Critical patent/JP5423439B2/ja
Priority claimed from JP2010020451A external-priority patent/JP5423439B2/ja
Priority to US13/010,166 priority patent/US8970221B2/en
Priority to CN201110034522.XA priority patent/CN102192952B/zh
Priority to CN201610542019.8A priority patent/CN106248778A/zh
Publication of JP2011158357A publication Critical patent/JP2011158357A/ja
Publication of JP2011158357A5 publication Critical patent/JP2011158357A5/ja
Application granted granted Critical
Publication of JP5423439B2 publication Critical patent/JP5423439B2/ja
Active legal-status Critical Current
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JP2010020451A 2010-02-01 2010-02-01 放電イオン化電流検出器 Active JP5423439B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2010020451A JP5423439B2 (ja) 2010-02-01 2010-02-01 放電イオン化電流検出器
US13/010,166 US8970221B2 (en) 2010-02-01 2011-01-20 Discharge ionization current detector
CN201110034522.XA CN102192952B (zh) 2010-02-01 2011-01-31 放电离子化电流检测器
CN201610542019.8A CN106248778A (zh) 2010-02-01 2011-01-31 放电离子化电流检测器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010020451A JP5423439B2 (ja) 2010-02-01 2010-02-01 放電イオン化電流検出器

Publications (3)

Publication Number Publication Date
JP2011158357A JP2011158357A (ja) 2011-08-18
JP2011158357A5 true JP2011158357A5 (enExample) 2012-06-28
JP5423439B2 JP5423439B2 (ja) 2014-02-19

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ID=44341054

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010020451A Active JP5423439B2 (ja) 2010-02-01 2010-02-01 放電イオン化電流検出器

Country Status (3)

Country Link
US (1) US8970221B2 (enExample)
JP (1) JP5423439B2 (enExample)
CN (2) CN102192952B (enExample)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7803880B2 (en) * 2003-09-19 2010-09-28 Nippon Shokubai Co., Ltd. Water absorbent and producing method of same
CN103403536B (zh) * 2011-06-07 2016-03-09 株式会社岛津制作所 放电电离电流检测器
EP2737291B1 (en) * 2011-07-26 2019-01-23 MKS Instruments, Inc. Cold cathode gauge fast response signal circuit
CN102938360B (zh) * 2011-08-15 2015-12-16 中国科学院大连化学物理研究所 一种大面积原位检测爆炸物的质谱电离源及其应用
JP5704065B2 (ja) * 2011-12-16 2015-04-22 株式会社島津製作所 放電イオン化電流検出器
JP5910161B2 (ja) * 2012-02-28 2016-04-27 株式会社島津製作所 放電イオン化電流検出器と試料ガス検出方法
WO2013136482A1 (ja) * 2012-03-15 2013-09-19 株式会社島津製作所 放電イオン化電流検出器及びそのエージング処理方法
WO2013140920A1 (ja) * 2012-03-21 2013-09-26 株式会社島津製作所 放電イオン化電流検出器を備えた分析装置
US8963554B2 (en) * 2012-08-23 2015-02-24 Valco Instruments Company, L.P. Pulsed discharge helium ionization detector with multiple combined bias/collecting electrodes for gas chromatography and method of use
JP5853914B2 (ja) * 2012-09-13 2016-02-09 株式会社島津製作所 放電イオン化電流検出器およびガスクロマトグラフ
JP5987969B2 (ja) 2013-02-15 2016-09-07 株式会社島津製作所 放電イオン化電流検出器
US9784714B2 (en) 2013-02-15 2017-10-10 Shimadzu Corporation Discharge ionization current detector and tuning method for the same
JP6255244B2 (ja) * 2014-01-08 2017-12-27 日本特殊陶業株式会社 微粒子センサ
WO2015107688A1 (ja) * 2014-01-20 2015-07-23 株式会社島津製作所 ガス状試料の分析装置
JP6303610B2 (ja) 2014-03-04 2018-04-04 株式会社島津製作所 誘電体バリア放電イオン化検出器及びその調整方法
US9533909B2 (en) 2014-03-31 2017-01-03 Corning Incorporated Methods and apparatus for material processing using atmospheric thermal plasma reactor
US20160200618A1 (en) 2015-01-08 2016-07-14 Corning Incorporated Method and apparatus for adding thermal energy to a glass melt
JP6350391B2 (ja) * 2015-05-22 2018-07-04 株式会社島津製作所 放電イオン化検出器
JP6711299B2 (ja) * 2017-02-22 2020-06-17 株式会社島津製作所 ガスクロマトグラフ
CN109084856B (zh) * 2018-07-19 2021-06-04 中国神华能源股份有限公司 开式循环水系统的流量测定方法
JP7408097B2 (ja) * 2020-09-29 2024-01-05 株式会社島津製作所 放電イオン化検出器およびガスクロマトグラフ分析装置
KR102802523B1 (ko) * 2022-08-31 2025-05-07 (주)센서테크 유전체 장벽 방전 이온화원을 사용하는 이온 이동도 분석장치

Family Cites Families (11)

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Publication number Priority date Publication date Assignee Title
JPS54130086A (en) 1978-03-31 1979-10-09 Hitachi Ltd Gas detector
US4311669A (en) * 1980-08-21 1982-01-19 The Bendix Corporation Membrane interface for ion mobility detector cells
US5394090A (en) * 1991-02-28 1995-02-28 Wentworth; Wayne E. Improved system for detecting compounds in a gaseous sample using induced photoionizations and electron capture detection
US5394092A (en) 1991-02-28 1995-02-28 Valco Instruments Co., Inc. System for identifying and quantifying selected constituents of gas samples using selective photoionization
EP0738388A1 (en) * 1994-01-03 1996-10-23 Valco Instruments Company, Inc. Improved pulsed discharge systems
US5889404A (en) * 1997-08-29 1999-03-30 Hewlett-Packard Company Discharge ionization detector having efficient transfer of metastables for ionization of sample molecules
US5892364A (en) * 1997-09-11 1999-04-06 Monagle; Matthew Trace constituent detection in inert gases
US6842008B2 (en) * 2003-03-11 2005-01-11 Stanley D. Stearns Gas detector with modular detection and discharge source calibration
JP4515135B2 (ja) * 2004-04-09 2010-07-28 株式会社日本エイピーアイ ガス分析方法、ガス分析装置及びこれを用いた検査装置
JP4156602B2 (ja) * 2005-02-18 2008-09-24 株式会社日立ハイテクサイエンスシステムズ 非放射線型電子捕獲検出器
CN101981441B (zh) * 2008-03-25 2013-03-13 国立大学法人大阪大学 放电电离电流检测器

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