JP2010537163A5 - - Google Patents

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Publication number
JP2010537163A5
JP2010537163A5 JP2010520635A JP2010520635A JP2010537163A5 JP 2010537163 A5 JP2010537163 A5 JP 2010537163A5 JP 2010520635 A JP2010520635 A JP 2010520635A JP 2010520635 A JP2010520635 A JP 2010520635A JP 2010537163 A5 JP2010537163 A5 JP 2010537163A5
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JP
Japan
Prior art keywords
radiation
intensity
data
detection system
intensity data
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Application number
JP2010520635A
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English (en)
Japanese (ja)
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JP2010537163A (ja
JP5670730B2 (ja
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Priority claimed from GBGB0716045.0A external-priority patent/GB0716045D0/en
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Publication of JP2010537163A publication Critical patent/JP2010537163A/ja
Publication of JP2010537163A5 publication Critical patent/JP2010537163A5/ja
Application granted granted Critical
Publication of JP5670730B2 publication Critical patent/JP5670730B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2010520635A 2007-08-17 2008-08-15 物質の検査のための方法及び装置 Expired - Fee Related JP5670730B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB0716045.0 2007-08-17
GBGB0716045.0A GB0716045D0 (en) 2007-08-17 2007-08-17 Method and apparatus for inspection of materials
PCT/GB2008/050710 WO2009024817A1 (en) 2007-08-17 2008-08-15 Method and apparatus for inspection of materials

Publications (3)

Publication Number Publication Date
JP2010537163A JP2010537163A (ja) 2010-12-02
JP2010537163A5 true JP2010537163A5 (enExample) 2011-07-14
JP5670730B2 JP5670730B2 (ja) 2015-02-18

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ID=38566535

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010520635A Expired - Fee Related JP5670730B2 (ja) 2007-08-17 2008-08-15 物質の検査のための方法及び装置

Country Status (5)

Country Link
US (1) US8233588B2 (enExample)
EP (1) EP2179274A1 (enExample)
JP (1) JP5670730B2 (enExample)
GB (1) GB0716045D0 (enExample)
WO (1) WO2009024817A1 (enExample)

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