JP2013517466A5 - - Google Patents

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Publication number
JP2013517466A5
JP2013517466A5 JP2012548474A JP2012548474A JP2013517466A5 JP 2013517466 A5 JP2013517466 A5 JP 2013517466A5 JP 2012548474 A JP2012548474 A JP 2012548474A JP 2012548474 A JP2012548474 A JP 2012548474A JP 2013517466 A5 JP2013517466 A5 JP 2013517466A5
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JP
Japan
Prior art keywords
radiation
standard
data set
calibration
data
Prior art date
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JP2012548474A
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English (en)
Japanese (ja)
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JP5671059B2 (ja
JP2013517466A (ja
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Publication date
Priority claimed from GBGB1000446.3A external-priority patent/GB201000446D0/en
Priority claimed from GBGB1014220.6A external-priority patent/GB201014220D0/en
Application filed filed Critical
Priority claimed from PCT/GB2011/050021 external-priority patent/WO2011086366A2/en
Publication of JP2013517466A publication Critical patent/JP2013517466A/ja
Publication of JP2013517466A5 publication Critical patent/JP2013517466A5/ja
Application granted granted Critical
Publication of JP5671059B2 publication Critical patent/JP5671059B2/ja
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JP2012548474A 2010-01-12 2011-01-10 データセットの校正 Active JP5671059B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
GB1000446.3 2010-01-12
GBGB1000446.3A GB201000446D0 (en) 2010-01-12 2010-01-12 Calibration of radiation scanning apparatus
GB1014220.6 2010-08-26
GBGB1014220.6A GB201014220D0 (en) 2010-08-26 2010-08-26 Calibration of dataset
PCT/GB2011/050021 WO2011086366A2 (en) 2010-01-12 2011-01-10 Calibration of dataset

Publications (3)

Publication Number Publication Date
JP2013517466A JP2013517466A (ja) 2013-05-16
JP2013517466A5 true JP2013517466A5 (enExample) 2014-01-16
JP5671059B2 JP5671059B2 (ja) 2015-02-18

Family

ID=44304728

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012548474A Active JP5671059B2 (ja) 2010-01-12 2011-01-10 データセットの校正

Country Status (4)

Country Link
US (1) US9188550B2 (enExample)
EP (1) EP2524208B1 (enExample)
JP (1) JP5671059B2 (enExample)
WO (1) WO2011086366A2 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB201310924D0 (en) * 2013-06-19 2013-07-31 Johnson Matthey Plc Radiation source container
CN105203569B (zh) * 2014-06-09 2018-06-12 北京君和信达科技有限公司 双能辐射系统和提高双能辐射系统材料识别能力的方法
JP6861990B2 (ja) * 2017-03-14 2021-04-21 株式会社イシダ Ｘ線検査装置
WO2021231888A1 (en) * 2020-05-14 2021-11-18 Cignal Llc Creating imagery for al model training in security screening
US12493003B2 (en) 2023-07-13 2025-12-09 General Electric Company Detector with focally aligned pixels

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62240846A (ja) * 1986-04-14 1987-10-21 Seiko Instr & Electronics Ltd 螢光ｘ線測定装置の校正方法
US4864842A (en) * 1988-07-29 1989-09-12 Troxler Electronic Laboratories, Inc. Method and system for transferring calibration data between calibrated measurement instruments
FR2705786B1 (fr) * 1993-05-28 1995-08-25 Schlumberger Ind Sa Procédé et dispositif pour la reconnaissance de matériaux déterminés dans la composition d'un objet.
JP3609034B2 (ja) * 2001-03-16 2005-01-12 イオン加速器株式会社 元素分析方法及び特性解析プログラム
JP4348412B2 (ja) * 2001-04-26 2009-10-21 東京エレクトロン株式会社 計測システムクラスター
CA2448332C (en) * 2001-05-25 2009-04-14 Analytica Of Branford, Inc. Multiple detection systems
US7186022B2 (en) * 2002-01-31 2007-03-06 The Johns Hopkins University X-ray source and method for more efficiently producing selectable x-ray frequencies
EP1605824A2 (en) * 2003-03-25 2005-12-21 Imaging Therapeutics, Inc. Methods for the compensation of imaging technique in the processing of radiographic images
US7355709B1 (en) * 2004-02-23 2008-04-08 Kla-Tencor Technologies Corp. Methods and systems for optical and non-optical measurements of a substrate
JP2006153498A (ja) * 2004-11-25 2006-06-15 Konica Minolta Sensing Inc 標準面試料および光学特性測定システム
JP4127698B2 (ja) * 2005-04-25 2008-07-30 アンリツ産機システム株式会社 Ｘ線検査装置
GB0716045D0 (en) 2007-08-17 2007-09-26 Durham Scient Crystals Ltd Method and apparatus for inspection of materials
WO2008142446A2 (en) 2007-05-17 2008-11-27 Durham Scientific Crystals Ltd Energy dispersive x-ray absorption spectroscopy in scanning transmission mode involving the calculation of the intensity ratios between successive frequency bands
US7693261B2 (en) * 2007-05-17 2010-04-06 Durham Scientific Crystals Limited Method and apparatus for inspection of materials
WO2009024818A1 (en) 2007-08-17 2009-02-26 Durham Scientific Crystals Limited Method and apparatus for identification and detection of liquids
EP2382457A2 (en) * 2009-01-27 2011-11-02 Kromek Limited Prescan of an object with the object in motion and subsequent localized scan of the object with the object at rest

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