JP5671059B2 - データセットの校正 - Google Patents

データセットの校正 Download PDF

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Publication number
JP5671059B2
JP5671059B2 JP2012548474A JP2012548474A JP5671059B2 JP 5671059 B2 JP5671059 B2 JP 5671059B2 JP 2012548474 A JP2012548474 A JP 2012548474A JP 2012548474 A JP2012548474 A JP 2012548474A JP 5671059 B2 JP5671059 B2 JP 5671059B2
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JP
Japan
Prior art keywords
data
calibration
radiation
data set
standard
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2012548474A
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English (en)
Japanese (ja)
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JP2013517466A (ja
JP2013517466A5 (enExample
Inventor
デイヴィッド エドワード ジョイス
デイヴィッド エドワード ジョイス
ティモシー サイモン ライト
ティモシー サイモン ライト
イアン ラドリー
イアン ラドリー
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Durham Scientific Crystals Ltd
Kromek Ltd
Original Assignee
Durham Scientific Crystals Ltd
Kromek Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Priority claimed from GBGB1000446.3A external-priority patent/GB201000446D0/en
Priority claimed from GBGB1014220.6A external-priority patent/GB201014220D0/en
Application filed by Durham Scientific Crystals Ltd, Kromek Ltd filed Critical Durham Scientific Crystals Ltd
Publication of JP2013517466A publication Critical patent/JP2013517466A/ja
Publication of JP2013517466A5 publication Critical patent/JP2013517466A5/ja
Application granted granted Critical
Publication of JP5671059B2 publication Critical patent/JP5671059B2/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G01N23/087—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays using polyenergetic X-rays

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  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2012548474A 2010-01-12 2011-01-10 データセットの校正 Active JP5671059B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
GBGB1000446.3A GB201000446D0 (en) 2010-01-12 2010-01-12 Calibration of radiation scanning apparatus
GB1000446.3 2010-01-12
GB1014220.6 2010-08-26
GBGB1014220.6A GB201014220D0 (en) 2010-08-26 2010-08-26 Calibration of dataset
PCT/GB2011/050021 WO2011086366A2 (en) 2010-01-12 2011-01-10 Calibration of dataset

Publications (3)

Publication Number Publication Date
JP2013517466A JP2013517466A (ja) 2013-05-16
JP2013517466A5 JP2013517466A5 (enExample) 2014-01-16
JP5671059B2 true JP5671059B2 (ja) 2015-02-18

Family

ID=44304728

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012548474A Active JP5671059B2 (ja) 2010-01-12 2011-01-10 データセットの校正

Country Status (4)

Country Link
US (1) US9188550B2 (enExample)
EP (1) EP2524208B1 (enExample)
JP (1) JP5671059B2 (enExample)
WO (1) WO2011086366A2 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB201310924D0 (en) * 2013-06-19 2013-07-31 Johnson Matthey Plc Radiation source container
CN105203569B (zh) * 2014-06-09 2018-06-12 北京君和信达科技有限公司 双能辐射系统和提高双能辐射系统材料识别能力的方法
JP6861990B2 (ja) * 2017-03-14 2021-04-21 株式会社イシダ Ｘ線検査装置
US11893088B2 (en) * 2020-05-14 2024-02-06 Cignal Llc Method and apparatus for creating high-fidelity, synthetic imagery for artificial intelligence model training and inference in security and screening applications
US12493003B2 (en) 2023-07-13 2025-12-09 General Electric Company Detector with focally aligned pixels

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62240846A (ja) * 1986-04-14 1987-10-21 Seiko Instr & Electronics Ltd 螢光ｘ線測定装置の校正方法
US4864842A (en) * 1988-07-29 1989-09-12 Troxler Electronic Laboratories, Inc. Method and system for transferring calibration data between calibrated measurement instruments
FR2705786B1 (fr) * 1993-05-28 1995-08-25 Schlumberger Ind Sa Procédé et dispositif pour la reconnaissance de matériaux déterminés dans la composition d'un objet.
JP3609034B2 (ja) * 2001-03-16 2005-01-12 イオン加速器株式会社 元素分析方法及び特性解析プログラム
US6999164B2 (en) * 2001-04-26 2006-02-14 Tokyo Electron Limited Measurement system cluster
US7265346B2 (en) * 2001-05-25 2007-09-04 Analytica Of Brandford, Inc. Multiple detection systems
CA2464712A1 (en) * 2002-01-31 2003-08-07 The Johns Hopkins University X-ray source and method for producing selectable x-ray wavelength
JP2007524438A (ja) * 2003-03-25 2007-08-30 イメージング セラピューティクス，インコーポレーテッド 放射線画像処理技術における補償の方法
US7355709B1 (en) * 2004-02-23 2008-04-08 Kla-Tencor Technologies Corp. Methods and systems for optical and non-optical measurements of a substrate
JP2006153498A (ja) * 2004-11-25 2006-06-15 Konica Minolta Sensing Inc 標準面試料および光学特性測定システム
JP4127698B2 (ja) * 2005-04-25 2008-07-30 アンリツ産機システム株式会社 Ｘ線検査装置
US7693261B2 (en) * 2007-05-17 2010-04-06 Durham Scientific Crystals Limited Method and apparatus for inspection of materials
WO2008142446A2 (en) 2007-05-17 2008-11-27 Durham Scientific Crystals Ltd Energy dispersive x-ray absorption spectroscopy in scanning transmission mode involving the calculation of the intensity ratios between successive frequency bands
GB0716045D0 (en) 2007-08-17 2007-09-26 Durham Scient Crystals Ltd Method and apparatus for inspection of materials
WO2009024818A1 (en) * 2007-08-17 2009-02-26 Durham Scientific Crystals Limited Method and apparatus for identification and detection of liquids
WO2010086636A2 (en) 2009-01-27 2010-08-05 Durham Scientific Crystals Limited Object scanning protocol

Also Published As

Publication number Publication date
EP2524208B1 (en) 2021-09-29
JP2013517466A (ja) 2013-05-16
EP2524208A2 (en) 2012-11-21
WO2011086366A3 (en) 2011-10-06
WO2011086366A2 (en) 2011-07-21
US20130013242A1 (en) 2013-01-10
US9188550B2 (en) 2015-11-17

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