GB0716045D0 - Method and apparatus for inspection of materials - Google Patents

Method and apparatus for inspection of materials

Info

Publication number
GB0716045D0
GB0716045D0 GBGB0716045.0A GB0716045A GB0716045D0 GB 0716045 D0 GB0716045 D0 GB 0716045D0 GB 0716045 A GB0716045 A GB 0716045A GB 0716045 D0 GB0716045 D0 GB 0716045D0
Authority
GB
United Kingdom
Prior art keywords
inspection
materials
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
GBGB0716045.0A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Durham Scientific Crystals Ltd
Original Assignee
Durham Scientific Crystals Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Durham Scientific Crystals Ltd filed Critical Durham Scientific Crystals Ltd
Priority to GBGB0716045.0A priority Critical patent/GB0716045D0/en
Publication of GB0716045D0 publication Critical patent/GB0716045D0/en
Priority to PCT/GB2008/050358 priority patent/WO2008142446A2/en
Priority to EP08788681A priority patent/EP2179274A1/en
Priority to PCT/GB2008/050710 priority patent/WO2009024817A1/en
Priority to JP2010520635A priority patent/JP5670730B2/ja
Priority to US12/452,840 priority patent/US8233588B2/en
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays

Landscapes

  • Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Geophysics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
GBGB0716045.0A 2007-05-17 2007-08-17 Method and apparatus for inspection of materials Ceased GB0716045D0 (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
GBGB0716045.0A GB0716045D0 (en) 2007-08-17 2007-08-17 Method and apparatus for inspection of materials
PCT/GB2008/050358 WO2008142446A2 (en) 2007-05-17 2008-05-19 Energy dispersive x-ray absorption spectroscopy in scanning transmission mode involving the calculation of the intensity ratios between successive frequency bands
EP08788681A EP2179274A1 (en) 2007-08-17 2008-08-15 Method and apparatus for inspection of materials
PCT/GB2008/050710 WO2009024817A1 (en) 2007-08-17 2008-08-15 Method and apparatus for inspection of materials
JP2010520635A JP5670730B2 (ja) 2007-08-17 2008-08-15 物質の検査のための方法及び装置
US12/452,840 US8233588B2 (en) 2007-08-17 2008-08-15 Method and apparatus for inspection of materials

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GBGB0716045.0A GB0716045D0 (en) 2007-08-17 2007-08-17 Method and apparatus for inspection of materials

Publications (1)

Publication Number Publication Date
GB0716045D0 true GB0716045D0 (en) 2007-09-26

Family

ID=38566535

Family Applications (1)

Application Number Title Priority Date Filing Date
GBGB0716045.0A Ceased GB0716045D0 (en) 2007-05-17 2007-08-17 Method and apparatus for inspection of materials

Country Status (5)

Country Link
US (1) US8233588B2 (enExample)
EP (1) EP2179274A1 (enExample)
JP (1) JP5670730B2 (enExample)
GB (1) GB0716045D0 (enExample)
WO (1) WO2009024817A1 (enExample)

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US9113839B2 (en) 2003-04-25 2015-08-25 Rapiscon Systems, Inc. X-ray inspection system and method
GB0525593D0 (en) 2005-12-16 2006-01-25 Cxr Ltd X-ray tomography inspection systems
US8243876B2 (en) 2003-04-25 2012-08-14 Rapiscan Systems, Inc. X-ray scanners
US7949101B2 (en) 2005-12-16 2011-05-24 Rapiscan Systems, Inc. X-ray scanners and X-ray sources therefor
US20100223016A1 (en) * 2007-08-17 2010-09-02 Gary Gibson Method and apparatus for identification and detection of liquids
GB0807473D0 (en) * 2008-04-24 2008-12-03 Durham Scient Crystals Ltd Method and Apparatus for Inspection of Materials
GB0807474D0 (en) * 2008-04-24 2008-12-03 Durham Scient Crystals Ltd Determination of Composition of Liquids
CN101647706B (zh) * 2008-08-13 2012-05-30 清华大学 高能双能ct系统的图象重建方法
GB0817487D0 (en) * 2008-09-24 2008-10-29 Durham Scient Crystals Ltd Radiographic data interpretation
JP5559471B2 (ja) * 2008-11-11 2014-07-23 浜松ホトニクス株式会社 放射線検出装置、放射線画像取得システム、放射線検査システム、及び放射線検出方法
ES2487620T3 (es) * 2009-05-26 2014-08-22 Kromek Limited Método para la identificación de materiales en un recipiente
GB2482819B (en) * 2009-05-26 2014-02-12 Rapiscan Systems Inc X-ray tomographic inspection systems for the identification of specific target items
CN102483965B (zh) * 2009-05-26 2015-02-04 拉皮斯坎系统股份有限公司 识别特定目标项目的x 射线层析检查系统
FR2953603A1 (fr) * 2009-12-09 2011-06-10 Commissariat Energie Atomique Procede et dispositif de reconnaissance d'un materiau a l'aide de sa fonction de transmission
JP2011128007A (ja) * 2009-12-17 2011-06-30 Ihi Corp Ｘ線透視装置及びｘ線透視方法
WO2011086366A2 (en) 2010-01-12 2011-07-21 Kromek Limited Calibration of dataset
JP2012068143A (ja) * 2010-09-24 2012-04-05 Ishida Co Ltd Ｘ線検査装置
JP5651007B2 (ja) * 2010-12-28 2015-01-07 アンリツ産機システム株式会社 Ｘ線検査装置
GB2501661B (en) 2011-02-22 2017-04-12 Rapiscan Systems Inc X-ray inspection system and method
FR2977321B1 (fr) * 2011-06-30 2015-01-23 Commissariat Energie Atomique Procede et dispositif d'identification d'un materiau par analyse spectrale de rayonnements electromagnetiques traversant ce materiau
WO2013019023A2 (en) 2011-07-29 2013-02-07 Lg Innotek Co., Ltd. Lighting device and liquid crystal display device having the same
US9415240B2 (en) * 2011-10-21 2016-08-16 Accuray Incorporated Apparatus for generating multi-energy x-ray images and methods of using the same
GB201119257D0 (en) * 2011-11-08 2011-12-21 Eshtech Ltd X-ray detection apparatus
US9189703B2 (en) 2012-07-09 2015-11-17 Canon Kabushiki Kaisha Systems and methods for colorimetric and spectral material estimation
GB201308876D0 (en) * 2013-05-16 2013-07-03 Ibex Innovations Ltd X-Ray imaging apparatus and methods
US10254436B2 (en) 2013-10-01 2019-04-09 Voti Inc. Scanning system, method, and corresponding bracket
CN104749199B (zh) * 2013-12-30 2019-02-19 同方威视技术股份有限公司 双能/双视角的高能x射线透视成像系统
JP6397690B2 (ja) * 2014-08-11 2018-09-26 株式会社日立ハイテクノロジーズ Ｘ線透過検査装置及び異物検出方法
DE102015200014A1 (de) * 2015-01-05 2016-07-07 Robert Bosch Gmbh Vorrichtung und Verfahren zum Bestimmen einer Eigenschaft eines Objekts
GB201503022D0 (en) * 2015-02-24 2015-04-08 Kromek Ltd Determination of density
CN109997029B (zh) * 2016-11-29 2022-12-13 莱特拉姆有限责任公司 对输送机上的异物进行探测的多能量x射线吸收成像
JP2018155643A (ja) * 2017-03-17 2018-10-04 株式会社イシダ Ｘ線検出装置
CA3064428A1 (en) * 2017-05-23 2018-11-29 Materialytics, LLC Distributed ledger for physical material
US11009622B2 (en) * 2018-05-18 2021-05-18 Lawrence Livermore National Security, Llc Multifaceted radiation detection and classification system
WO2020082171A1 (en) 2018-10-22 2020-04-30 Voti Inc. Tray insert for screening tray
JP7185596B2 (ja) * 2019-06-11 2022-12-07 キヤノン株式会社 画像処理装置および画像処理方法、プログラム
JP7360841B2 (ja) * 2019-08-09 2023-10-13 株式会社日立ソリューションズ Ｘ線画像処理システムおよびその方法、そのプログラム
US12181422B2 (en) 2019-09-16 2024-12-31 Rapiscan Holdings, Inc. Probabilistic image analysis
US11885752B2 (en) 2021-06-30 2024-01-30 Rapiscan Holdings, Inc. Calibration method and device therefor
US12019035B2 (en) 2021-07-16 2024-06-25 Rapiscan Holdings, Inc. Material detection in x-ray security screening

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JPH06121791A (ja) 1992-10-13 1994-05-06 Matsushita Electric Ind Co Ltd Ｘ線定量装置およびｘ線定量方法
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JPH08178873A (ja) 1994-12-21 1996-07-12 Tokyo Metropolis マルチエネルギー放射線透過試験方法
JPH0944659A (ja) * 1995-07-27 1997-02-14 Fuji Photo Film Co Ltd エネルギーサブトラクション処理方法および装置
FR2740561B1 (fr) * 1995-10-27 1997-12-19 Inst Francais Du Petrole Methode pour evaluer la variation d'intensite d'un rayonnement polychromatique ayant un spectre de frequence connu, apres traversee d'un corps absorbant
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US6018562A (en) * 1995-11-13 2000-01-25 The United States Of America As Represented By The Secretary Of The Army Apparatus and method for automatic recognition of concealed objects using multiple energy computed tomography
JP3754933B2 (ja) 2001-06-19 2006-03-15 キヤノン株式会社 画像処理装置、画像処理システム、画像処理方法、プログラム及び記憶媒体
BR0214114A (pt) 2001-11-16 2004-12-21 Schlumberger Surenco Sa Método para identificar incrustações sobre a superfìcie de uma passagem através da qual um fluìdo é passante
JP2004008460A (ja) * 2002-06-06 2004-01-15 Kawasaki Heavy Ind Ltd Ｘ線エネルギー分析イメージング装置
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WO2007122770A1 (ja) * 2006-04-13 2007-11-01 Shimadzu Corporation 透過ｘ線を用いた三次元定量方法

Also Published As

Publication number Publication date
JP2010537163A (ja) 2010-12-02
US8233588B2 (en) 2012-07-31
WO2009024817A1 (en) 2009-02-26
US20100220835A1 (en) 2010-09-02
EP2179274A1 (en) 2010-04-28
JP5670730B2 (ja) 2015-02-18

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Legal Events

Date Code Title Description
AT Applications terminated before publication under section 16(1)