JP2010523961A5 - - Google Patents

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Publication number
JP2010523961A5
JP2010523961A5 JP2010501578A JP2010501578A JP2010523961A5 JP 2010523961 A5 JP2010523961 A5 JP 2010523961A5 JP 2010501578 A JP2010501578 A JP 2010501578A JP 2010501578 A JP2010501578 A JP 2010501578A JP 2010523961 A5 JP2010523961 A5 JP 2010523961A5
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JP
Japan
Prior art keywords
detection device
scene
detection apparatus
detection
reflecting means
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Application number
JP2010501578A
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English (en)
Japanese (ja)
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JP5248594B2 (ja
JP2010523961A (ja
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Priority claimed from GBGB0706301.9A external-priority patent/GB0706301D0/en
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Publication of JP2010523961A publication Critical patent/JP2010523961A/ja
Publication of JP2010523961A5 publication Critical patent/JP2010523961A5/ja
Application granted granted Critical
Publication of JP5248594B2 publication Critical patent/JP5248594B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2010501578A 2007-03-30 2008-03-31 検出装置 Active JP5248594B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
GBGB0706301.9A GB0706301D0 (en) 2007-03-30 2007-03-30 Reflective means
GB0706301.9 2007-03-30
GBGB0716481.7A GB0716481D0 (en) 2007-03-30 2007-08-23 Imaging device
GB0716481.7 2007-08-23
PCT/GB2008/001115 WO2008119971A1 (en) 2007-03-30 2008-03-31 Detection device

Publications (3)

Publication Number Publication Date
JP2010523961A JP2010523961A (ja) 2010-07-15
JP2010523961A5 true JP2010523961A5 (https=) 2011-05-06
JP5248594B2 JP5248594B2 (ja) 2013-07-31

Family

ID=38050601

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010501578A Active JP5248594B2 (ja) 2007-03-30 2008-03-31 検出装置

Country Status (7)

Country Link
US (1) US8536533B2 (https=)
EP (1) EP2140288B1 (https=)
JP (1) JP5248594B2 (https=)
AT (1) ATE544083T1 (https=)
CA (1) CA2682459C (https=)
GB (2) GB0706301D0 (https=)
WO (1) WO2008119971A1 (https=)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2794427B2 (ja) 1988-11-25 1998-09-03 秀雄 亀山 熱伝導性触媒体を用いた酸化燃焼方法
RU2406099C1 (ru) * 2009-06-29 2010-12-10 Алексей Юрьевич Зражевский Способ обнаружения предметов, скрытых под одеждой человека, и устройство для его реализации
WO2012145741A2 (en) 2011-04-22 2012-10-26 The University Of Memphis Reasearch Foundation Spatially-selective disks, submillimeter imaging devices, methods of submillimeter imaging profiling scanners, spectrometry devices, and methods of spectrometry
US9268017B2 (en) * 2011-07-29 2016-02-23 International Business Machines Corporation Near-field millimeter wave imaging
US9722316B2 (en) 2014-07-07 2017-08-01 Google Inc. Horn lens antenna
WO2016076796A1 (en) 2014-11-12 2016-05-19 Heptagon Micro Optics Pte. Ltd. Optoelectronic modules for distance measurements and/or multi-dimensional imaging
CN109870739B (zh) * 2018-12-29 2024-03-29 清华大学 毫米波/太赫兹波成像设备
TWI726404B (zh) * 2019-09-02 2021-05-01 為升電裝工業股份有限公司 車輛雷達裝置及其系統

Family Cites Families (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3403399A (en) * 1967-03-10 1968-09-24 Army Usa Millimeter wave imaging system
FR2382109A1 (fr) 1977-02-25 1978-09-22 Thomson Csf Transformateur de polarisation hyperfrequence
JP2508707B2 (ja) 1987-04-28 1996-06-19 三菱電機株式会社 光制御アンテナ装置
US5047783A (en) 1987-11-06 1991-09-10 Millitech Corporation Millimeter-wave imaging system
US5227800A (en) 1988-04-19 1993-07-13 Millitech Corporation Contraband detection system
NL9000369A (nl) 1990-02-16 1991-09-16 Hollandse Signaalapparaten Bv Antennesysteem met variabele bundelbreedte en bundelorientatie.
US5360973A (en) * 1990-02-22 1994-11-01 Innova Laboratories, Inc. Millimeter wave beam deflector
US5157538A (en) * 1990-06-29 1992-10-20 The United States Of America As Represented By The Secretary Of The Air Force Silicon spatial light modulator
US5170169A (en) 1991-05-31 1992-12-08 Millitech Corporation Quasi-optical transmission/reflection switch and millimeter-wave imaging system using the same
FR2678112B1 (fr) * 1991-06-18 1993-12-03 Thomson Csf Antenne hyperfrequence a balayage optoelectronique.
US5455590A (en) 1991-08-30 1995-10-03 Battelle Memorial Institute Real-time holographic surveillance system
DE4332042C1 (de) 1993-09-21 1995-03-30 Fraunhofer Ges Forschung Reflektor für elektromagnetische Strahlung
US5704355A (en) 1994-07-01 1998-01-06 Bridges; Jack E. Non-invasive system for breast cancer detection
EP1643264A1 (en) 1996-09-18 2006-04-05 MacAleese Companies, Inc. Concealed weapons detection system
US5822477A (en) 1997-04-17 1998-10-13 Raytheon Company Scannable semiconductor light-activated reflector for use at millimeter-wave frequencies
JPH1197925A (ja) 1997-09-19 1999-04-09 Denso Corp 電波走査装置
JPH11316283A (ja) * 1998-05-01 1999-11-16 Nohmi Bosai Ltd 減光式煙感知器
US6777684B1 (en) 1999-08-23 2004-08-17 Rose Research L.L.C. Systems and methods for millimeter and sub-millimeter wave imaging
JP2001066375A (ja) * 1999-08-31 2001-03-16 Communication Research Laboratory Mpt サブテラヘルツ電磁波を用いた粉粒体中異物検査装置およびその検査方法
GB9922468D0 (en) 1999-09-22 1999-11-24 B J R Systems Ltd Confocal imaging apparatus for turbid viewing
US6313803B1 (en) * 2000-01-07 2001-11-06 Waveband Corporation Monolithic millimeter-wave beam-steering antenna
US6621459B2 (en) 2001-02-02 2003-09-16 Raytheon Company Plasma controlled antenna
JP2002257932A (ja) 2001-03-06 2002-09-11 Nippon Telegr & Teleph Corp <Ntt> 反射電磁波検出型イメージング装置
GB0211353D0 (en) 2002-05-17 2002-06-26 Qinetiq Ltd Apparatus for redirecting radiation
JP3578214B2 (ja) * 2002-12-09 2004-10-20 オムロン株式会社 回帰反射型光電センサ
US6870162B1 (en) 2003-01-31 2005-03-22 Millivision, Inc. Weighted noise compensating method and camera used in millimeter wave imaging
JP4209766B2 (ja) * 2003-12-26 2009-01-14 潤一 西澤 テラヘルツ電磁波反射測定装置
CA2499043C (en) 2004-03-01 2010-09-14 Pathfinder Energy Services, Inc. Azimuthally focused electromagnetic measurement tool
US20070293752A1 (en) 2004-09-10 2007-12-20 Industrial Research Limited Synthetic Focusing Method
US6967612B1 (en) 2004-10-22 2005-11-22 Gorman John D System and method for standoff detection of human carried explosives
JP2006337635A (ja) * 2005-06-01 2006-12-14 Bridgestone Corp フォトエレクトロクロミック素子、並びに調光ガラス、透過率調整ガラス、熱線カットガラス及び画像表示デバイス
US20090294704A1 (en) 2005-06-08 2009-12-03 Eitan Zailer Active millimeter wave imaging system and method

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