JP2010519687A - 質量分析計 - Google Patents

質量分析計 Download PDF

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Publication number
JP2010519687A
JP2010519687A JP2009549804A JP2009549804A JP2010519687A JP 2010519687 A JP2010519687 A JP 2010519687A JP 2009549804 A JP2009549804 A JP 2009549804A JP 2009549804 A JP2009549804 A JP 2009549804A JP 2010519687 A JP2010519687 A JP 2010519687A
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JP
Japan
Prior art keywords
mass spectrometer
ions
electrode
conductive substrate
mass
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2009549804A
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English (en)
Japanese (ja)
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JP2010519687A5 (OSRAM
Inventor
イェルク・ミューラー
エリック・ヴァーペルホルスト
ヤン−ペーター・ハウスヒルト
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bayer AG
Original Assignee
Bayer Technology Services GmbH
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Filing date
Publication date
Application filed by Bayer Technology Services GmbH filed Critical Bayer Technology Services GmbH
Publication of JP2010519687A publication Critical patent/JP2010519687A/ja
Publication of JP2010519687A5 publication Critical patent/JP2010519687A5/ja
Pending legal-status Critical Current

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0013—Miniaturised spectrometers, e.g. having smaller than usual scale, integrated conventional components
    • H01J49/0018—Microminiaturised spectrometers, e.g. chip-integrated devices, Micro-Electro-Mechanical Systems [MEMS]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
    • H01J49/46—Static spectrometers
    • H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
    • H01J49/482—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter with cylindrical mirrors

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2009549804A 2007-02-19 2008-02-19 質量分析計 Pending JP2010519687A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP07003392A EP1959476A1 (de) 2007-02-19 2007-02-19 Massenspektrometer
PCT/EP2008/001287 WO2008101669A1 (de) 2007-02-19 2008-02-19 Massenspektrometer

Publications (2)

Publication Number Publication Date
JP2010519687A true JP2010519687A (ja) 2010-06-03
JP2010519687A5 JP2010519687A5 (OSRAM) 2011-02-24

Family

ID=38235375

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009549804A Pending JP2010519687A (ja) 2007-02-19 2008-02-19 質量分析計

Country Status (6)

Country Link
US (1) US8134120B2 (OSRAM)
EP (1) EP1959476A1 (OSRAM)
JP (1) JP2010519687A (OSRAM)
CN (1) CN101636814B (OSRAM)
CA (1) CA2678460A1 (OSRAM)
WO (1) WO2008101669A1 (OSRAM)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016017712A1 (ja) * 2014-07-29 2016-02-04 俊 保坂 超小型質量分析装置および超小型粒子加速装置
JP2020119901A (ja) * 2020-04-08 2020-08-06 俊 保坂 超小型加速器および超小型質量分析装置およびイオン注入装置

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102010018830A1 (de) 2010-04-29 2011-11-03 Bayer Technology Services Gmbh Flüssigkeitsverdampfer
CN101963596B (zh) * 2010-09-01 2012-09-05 中国科学院广州地球化学研究所 基于四极杆质谱的稀有气体测定系统
DE102011015595B8 (de) * 2011-03-30 2015-01-29 Krohne Messtechnik Gmbh Verfahren zur Ansteuerung eines synchronous ion shield Massenseparators
JP5813536B2 (ja) * 2012-03-02 2015-11-17 株式会社東芝 イオン源
US9418827B2 (en) * 2013-07-23 2016-08-16 Hamilton Sundstrand Corporation Methods of ion source fabrication
DE102014003356A1 (de) 2014-03-06 2015-09-10 Gregor Quiring Vorrichtung zur Ionentrennung durch selektive Beschleunigung

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02158047A (ja) * 1988-12-09 1990-06-18 Hitachi Ltd プラズマイオン源微量元素質量分析装置
JPH0589816A (ja) * 1991-04-25 1993-04-09 Hitachi Ltd 二次イオン質量分析装置
JPH09511614A (ja) * 1994-11-22 1997-11-18 ノースロップ グルマン コーポレーション ソリッドステート型の質量分析器汎用ガス検出センサ
JPH11250854A (ja) * 1998-03-02 1999-09-17 Ulvac Corp エッチングプラズマにおける基板入射イオンの分析法及び装置
JP2004501482A (ja) * 2000-04-18 2004-01-15 ウォーターズ・インヴェストメンツ・リミテッド 改良されたエレクトロスプレー及び他のｌｃ／ｍｓインターフェース
JP2004529461A (ja) * 2001-03-05 2004-09-24 ザ・チャールズ・スターク・ドレイパー・ラボラトリー・インコーポレイテッド クロマトグラフ高電界非対称波形イオン移動度分光測定の方法および装置
JP2007027131A (ja) * 2005-07-20 2007-02-01 Microsaic Systems Ltd 微細加工したナノスプレー電極システム
JP2008508693A (ja) * 2004-08-02 2008-03-21 オウルストーン リミテッド イオン移動度分光計

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5087815A (en) 1989-11-08 1992-02-11 Schultz J Albert High resolution mass spectrometry of recoiled ions for isotopic and trace elemental analysis
US5492867A (en) 1993-09-22 1996-02-20 Westinghouse Elect. Corp. Method for manufacturing a miniaturized solid state mass spectrograph
US5466932A (en) 1993-09-22 1995-11-14 Westinghouse Electric Corp. Micro-miniature piezoelectric diaphragm pump for the low pressure pumping of gases
US5481110A (en) 1993-09-22 1996-01-02 Westinghouse Electric Corp Thin film preconcentrator array
US5536939A (en) * 1993-09-22 1996-07-16 Northrop Grumman Corporation Miniaturized mass filter
US5386115A (en) 1993-09-22 1995-01-31 Westinghouse Electric Corporation Solid state micro-machined mass spectrograph universal gas detection sensor
US5486697A (en) * 1994-11-14 1996-01-23 California Institute Of Technology Array of micro-machined mass energy micro-filters for charged particles
DE19720278B4 (de) 1997-05-13 2007-08-02 Sls Micro Technology Gmbh Miniaturisiertes Massenspektrometer
GB2391694B (en) 2002-08-01 2006-03-01 Microsaic Systems Ltd Monolithic micro-engineered mass spectrometer
US7358593B2 (en) * 2004-05-07 2008-04-15 University Of Maine Microfabricated miniature grids

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02158047A (ja) * 1988-12-09 1990-06-18 Hitachi Ltd プラズマイオン源微量元素質量分析装置
JPH0589816A (ja) * 1991-04-25 1993-04-09 Hitachi Ltd 二次イオン質量分析装置
JPH09511614A (ja) * 1994-11-22 1997-11-18 ノースロップ グルマン コーポレーション ソリッドステート型の質量分析器汎用ガス検出センサ
JPH11250854A (ja) * 1998-03-02 1999-09-17 Ulvac Corp エッチングプラズマにおける基板入射イオンの分析法及び装置
JP2004501482A (ja) * 2000-04-18 2004-01-15 ウォーターズ・インヴェストメンツ・リミテッド 改良されたエレクトロスプレー及び他のｌｃ／ｍｓインターフェース
JP2004529461A (ja) * 2001-03-05 2004-09-24 ザ・チャールズ・スターク・ドレイパー・ラボラトリー・インコーポレイテッド クロマトグラフ高電界非対称波形イオン移動度分光測定の方法および装置
JP2008508693A (ja) * 2004-08-02 2008-03-21 オウルストーン リミテッド イオン移動度分光計
JP2007027131A (ja) * 2005-07-20 2007-02-01 Microsaic Systems Ltd 微細加工したナノスプレー電極システム

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016017712A1 (ja) * 2014-07-29 2016-02-04 俊 保坂 超小型質量分析装置および超小型粒子加速装置
US10249483B2 (en) 2014-07-29 2019-04-02 Takashi Hosaka Ultra-compact mass analysis device and ultra-compact particle acceleration device
US10804087B2 (en) 2014-07-29 2020-10-13 Takashi Hosaka Ultra-compact mass analysis device and ultra-compact particle acceleration device
JP2020119901A (ja) * 2020-04-08 2020-08-06 俊 保坂 超小型加速器および超小型質量分析装置およびイオン注入装置
JP7018090B2 (ja) 2020-04-08 2022-02-09 俊 保坂 超小型加速器および超小型質量分析装置およびイオン注入装置
JP2022079450A (ja) * 2020-04-08 2022-05-26 俊 保坂 超小型加速器および超小型質量分析装置およびイオン注入装置
JP2025000743A (ja) * 2020-04-08 2025-01-07 俊 保坂 超小型加速器および超小型質量分析装置およびイオン注入装置

Also Published As

Publication number Publication date
WO2008101669A8 (de) 2008-12-24
EP1959476A1 (de) 2008-08-20
CN101636814B (zh) 2013-01-23
US8134120B2 (en) 2012-03-13
CN101636814A (zh) 2010-01-27
CA2678460A1 (en) 2008-08-28
US20100090103A1 (en) 2010-04-15
WO2008101669A1 (de) 2008-08-28

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