JP2010518750A - 集積型障害出力/障害応答遅延回路 - Google Patents
集積型障害出力/障害応答遅延回路 Download PDFInfo
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- JP2010518750A JP2010518750A JP2009549153A JP2009549153A JP2010518750A JP 2010518750 A JP2010518750 A JP 2010518750A JP 2009549153 A JP2009549153 A JP 2009549153A JP 2009549153 A JP2009549153 A JP 2009549153A JP 2010518750 A JP2010518750 A JP 2010518750A
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- time delay
- output
- fault
- circuit
- indication signal
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- 239000003990 capacitor Substances 0.000 claims abstract description 21
- 230000005669 field effect Effects 0.000 claims description 8
- 238000001514 detection method Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000001914 filtration Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000003213 activating effect Effects 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000001052 transient effect Effects 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
- G01R31/31937—Timing aspects, e.g. measuring propagation delay
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3177—Testing of logic operation, e.g. by logic analysers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
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- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Semiconductor Integrated Circuits (AREA)
- Pulse Circuits (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
Description
Claims (6)
- 集積回路(IC)を備える時間遅延障害装置であって、
前記集積回路は、
障害表示信号出力を有する電子回路と、
前記障害表示信号出力に接続された入力、および遅延障害表示信号出力を生成するための出力を有し、前記遅延障害表示信号の時間遅延を設定するために前記遅延障害表示信号出力に結合された抵抗器コンデンサ回路網からの外部基準信号に応答する、時間遅延回路と、
を備える、時間遅延障害装置。 - 前記時間遅延回路は、
内部障害信号によってトグルする接地への定電流源と、
ゲート、接地に接続されたドレイン、および前記時間遅延回路の前記出力に接続されたソースを有する電界効果トランジスタと、
入力、および前記電界効果トランジスタの前記ゲートに接続された切り換え可能な出力を有するラッチと、
前記ラッチの前記入力に接続された出力、ならびに第1および第2の入力を有し、前記第1の入力は内部基準信号に接続され、前記第2の入力は前記時間遅延回路の前記出力に接続されている比較器と、
を備える、請求項1に記載の時間遅延障害装置。 - 前記時間遅延回路を完成するために、抵抗器と直列に接続されたコンデンサを備えた、前記集積回路の外部の抵抗器コンデンサ回路網をさらに備える、請求項2に記載の時間遅延障害装置。
- 集積回路(IC)を備える時間遅延障害装置であって、
前記集積回路は、
障害表示信号出力を有する電子回路と、
前記障害表示信号出力に接続された入力、および遅延障害表示信号出力を生成するための出力を有し、前記遅延障害表示信号の時間遅延を設定するために前記遅延障害表示信号出力に結合された抵抗器コンデンサ回路網からの外部基準信号に応答する、時間遅延回路と、を備え、
前記時間遅延回路は、
内部障害信号によってトグルする接地への定電流源と、
ゲート、接地に接続されたドレイン、および前記時間遅延回路の前記出力に接続されたソースを有する電界効果トランジスタと、
入力、および前記電界効果トランジスタの前記ゲートに接続された切り換え可能な出力を有するラッチと、
前記ラッチの前記入力に接続された出力、そして第1および第2の入力を有し、前記第1の入力は内部基準信号に接続され、前記第2の入力は前記時間遅延回路の前記出力に接続されている比較器と
を備える、時間遅延障害装置。 - 前記時間遅延回路を完成するために、抵抗器と直列に接続されたコンデンサを備えた、前記集積回路の外部の抵抗器コンデンサ回路網を備える、請求項4に記載の時間遅延障害装置。
- 障害表示信号出力を有する電子回路と、
前記障害表示信号出力に接続された入力、および遅延障害表示信号出力を生成するための出力を有し、前記遅延障害表示信号の時間遅延を設定するために前記遅延障害表示信号出力に結合された抵抗器コンデンサ回路網からの外部基準信号に応答する、時間遅延回路と、を備える集積回路(IC)とを含み、
前記時間遅延回路は、
内部障害信号によってトグルする接地への定電流源と、
ゲート、接地に接続されたドレイン、および前記時間遅延回路の前記出力に接続されたソースを有する電界効果トランジスタと、
入力、および前記電界効果トランジスタの前記ゲートに接続された切り換え可能な出力を有するラッチと、
前記ラッチの前記入力に接続された出力、そして第1および第2の入力を有し、前記第1の入力は内部基準信号に接続され、前記第2の入力は前記時間遅延回路の前記出力に接続された比較器と
を備える、集積回路と、
前記時間遅延回路を完成するように、抵抗器と直列に接続されたコンデンサを備える、前記集積回路の外部の抵抗器−コンデンサ回路網と
を備える、時間遅延障害装置。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/672,739 US7573393B2 (en) | 2007-02-08 | 2007-02-08 | Integrated fault output/fault response delay circuit |
US11/672,739 | 2007-02-08 | ||
PCT/US2008/050569 WO2008097678A1 (en) | 2007-02-08 | 2008-01-09 | Integrated fault output/fault response delay circuit |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2010518750A true JP2010518750A (ja) | 2010-05-27 |
JP4887432B2 JP4887432B2 (ja) | 2012-02-29 |
Family
ID=39432870
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2009549153A Active JP4887432B2 (ja) | 2007-02-08 | 2008-01-09 | 集積型障害出力/障害応答遅延回路 |
Country Status (6)
Country | Link |
---|---|
US (1) | US7573393B2 (ja) |
JP (1) | JP4887432B2 (ja) |
KR (1) | KR101366768B1 (ja) |
DE (1) | DE112008000151B4 (ja) |
TW (1) | TWI352210B (ja) |
WO (1) | WO2008097678A1 (ja) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101865974B (zh) * | 2009-04-20 | 2013-06-12 | 普诚科技股份有限公司 | 逻辑测试机以及同时测量多个受测装置的延迟时间的方法 |
US10101410B2 (en) | 2015-10-21 | 2018-10-16 | Allegro Microsystems, Llc | Methods and apparatus for sensor having fault trip level setting |
US9935452B2 (en) | 2015-11-13 | 2018-04-03 | Allegro Microsystems, Llc | Circuits and techniques for signaling between devices |
US11598655B2 (en) | 2021-07-13 | 2023-03-07 | Allegro Microsystems, Llc | Magnetic-field sensor with test pin for control of signal range and/or offset |
US11525705B1 (en) | 2021-07-13 | 2022-12-13 | Allegro Microsystems, Llc | Magnetic-field sensor with test pin for diagnostic assessment of target validity, target placement and/or control of signal range and/or offset |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5169976A (en) * | 1974-12-16 | 1976-06-17 | Hitachi Ltd | Noizu fuirutaa |
JPS5518871A (en) * | 1978-07-27 | 1980-02-09 | Showa Electric Wire & Cable Co | Ultralow frequency high voltage generator |
JPS5619223A (en) | 1979-07-25 | 1981-02-23 | Mitsubishi Electric Corp | Pulse duration expanding device |
JPS5647123A (en) * | 1979-09-25 | 1981-04-28 | Toshiba Corp | Monostable multivibrator |
JPS57176825A (en) * | 1981-04-24 | 1982-10-30 | Nec Corp | Monostable multivibrator circuit |
JPS5870625A (ja) * | 1981-10-23 | 1983-04-27 | Hitachi Ltd | 単安定マルチバイブレ−タ回路 |
JPS59103422A (ja) | 1982-12-06 | 1984-06-14 | Seiko Epson Corp | Cr時定数制御回路 |
FR2653610B1 (fr) | 1989-10-25 | 1991-12-27 | Etude Realisa Disjoncteurs | Interrupteur differentiel selectif a courant de defaut. |
US5332973A (en) * | 1992-05-01 | 1994-07-26 | The University Of Manitoba | Built-in fault testing of integrated circuits |
US5673028A (en) * | 1993-01-07 | 1997-09-30 | Levy; Henry A. | Electronic component failure indicator |
JPH07193477A (ja) | 1993-11-19 | 1995-07-28 | Nec Eng Ltd | 遅延回路 |
US5469476A (en) * | 1994-03-21 | 1995-11-21 | Motorola, Inc. | Circuit and method for filtering voltage spikes |
DE19507772A1 (de) * | 1995-03-06 | 1996-09-12 | Horstmann Gmbh Dipl Ing H | Kurzschlußanzeiger |
DE10258511A1 (de) * | 2002-12-14 | 2004-07-08 | Infineon Technologies Ag | Integrierte Schaltung sowie zugehörige gehäuste integrierte Schaltung |
-
2007
- 2007-02-08 US US11/672,739 patent/US7573393B2/en active Active
-
2008
- 2008-01-09 KR KR1020097013973A patent/KR101366768B1/ko active IP Right Grant
- 2008-01-09 WO PCT/US2008/050569 patent/WO2008097678A1/en active Application Filing
- 2008-01-09 DE DE112008000151.0T patent/DE112008000151B4/de active Active
- 2008-01-09 JP JP2009549153A patent/JP4887432B2/ja active Active
- 2008-01-17 TW TW097101805A patent/TWI352210B/zh active
Also Published As
Publication number | Publication date |
---|---|
WO2008097678A1 (en) | 2008-08-14 |
DE112008000151B4 (de) | 2018-12-06 |
JP4887432B2 (ja) | 2012-02-29 |
KR20090115710A (ko) | 2009-11-05 |
DE112008000151T5 (de) | 2009-12-24 |
US7573393B2 (en) | 2009-08-11 |
US20080191865A1 (en) | 2008-08-14 |
KR101366768B1 (ko) | 2014-02-21 |
TWI352210B (en) | 2011-11-11 |
TW200846689A (en) | 2008-12-01 |
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