JP2010511250A5 - - Google Patents

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Publication number
JP2010511250A5
JP2010511250A5 JP2009539430A JP2009539430A JP2010511250A5 JP 2010511250 A5 JP2010511250 A5 JP 2010511250A5 JP 2009539430 A JP2009539430 A JP 2009539430A JP 2009539430 A JP2009539430 A JP 2009539430A JP 2010511250 A5 JP2010511250 A5 JP 2010511250A5
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JP
Japan
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block
flow diagram
data flow
input
test
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JP2009539430A
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English (en)
Japanese (ja)
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JP5102304B2 (ja
JP2010511250A (ja
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Priority claimed from US11/945,021 external-priority patent/US7644334B2/en
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JP2009539430A 2006-11-27 2007-11-27 要求ベーステスト生成 Active JP5102304B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US86112106P 2006-11-27 2006-11-27
US60/861,121 2006-11-27
US11/945,021 US7644334B2 (en) 2006-11-27 2007-11-26 Requirements-based test generation
US11/945,021 2007-11-26
PCT/US2007/085555 WO2008067265A2 (en) 2006-11-27 2007-11-27 Requirements-based test generation

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2012206948A Division JP5608203B2 (ja) 2006-11-27 2012-09-20 要求ベーステスト生成

Publications (3)

Publication Number Publication Date
JP2010511250A JP2010511250A (ja) 2010-04-08
JP2010511250A5 true JP2010511250A5 (enExample) 2010-11-04
JP5102304B2 JP5102304B2 (ja) 2012-12-19

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JP2009539430A Active JP5102304B2 (ja) 2006-11-27 2007-11-27 要求ベーステスト生成
JP2012206948A Active JP5608203B2 (ja) 2006-11-27 2012-09-20 要求ベーステスト生成

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JP2012206948A Active JP5608203B2 (ja) 2006-11-27 2012-09-20 要求ベーステスト生成

Country Status (4)

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US (1) US7644334B2 (enExample)
EP (1) EP2087427A2 (enExample)
JP (2) JP5102304B2 (enExample)
WO (1) WO2008067265A2 (enExample)

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US10025696B2 (en) * 2016-02-09 2018-07-17 General Electric Company System and method for equivalence class analysis-based automated requirements-based test case generation
US10169217B2 (en) 2016-04-06 2019-01-01 General Electric Company System and method for test generation from software specification models that contain nonlinear arithmetic constraints over real number ranges
US10936289B2 (en) 2016-06-03 2021-03-02 Ab Initio Technology Llc Format-specific data processing operations
US10120785B2 (en) * 2016-10-21 2018-11-06 Rosemount Aerospace Inc. Automatic generation of data coupling and control coupling test conditions
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US10585779B2 (en) 2018-07-30 2020-03-10 General Electric Company Systems and methods of requirements chaining and applications thereof
US10503632B1 (en) * 2018-09-28 2019-12-10 Amazon Technologies, Inc. Impact analysis for software testing
US20210191845A1 (en) * 2019-12-23 2021-06-24 Ab Initio Technology Llc Unit testing of components of dataflow graphs
CN112181849B (zh) * 2020-10-23 2023-07-25 网易（杭州）网络有限公司 测试用例识别方法、装置、设备及存储介质
CN112416766B (zh) * 2020-11-19 2021-06-22 北京京航计算通讯研究所 双通道耦合飞行控制软件的故障模式分析和检测方法
CN112462739B (zh) * 2020-11-19 2021-06-29 北京京航计算通讯研究所 一种双通道耦合飞行控制程序的故障检测系统
CN112345869A (zh) * 2020-11-25 2021-02-09 武汉光庭信息技术股份有限公司 一种汽车电子设备测试方法、系统、电子设备及存储介质
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