JP5102304B2 - 要求ベーステスト生成 - Google Patents

要求ベーステスト生成 Download PDF

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Publication number
JP5102304B2
JP5102304B2 JP2009539430A JP2009539430A JP5102304B2 JP 5102304 B2 JP5102304 B2 JP 5102304B2 JP 2009539430 A JP2009539430 A JP 2009539430A JP 2009539430 A JP2009539430 A JP 2009539430A JP 5102304 B2 JP5102304 B2 JP 5102304B2
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Japan
Prior art keywords
block
test
input
output
data flow
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English (en)
Japanese (ja)
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JP2010511250A (ja
JP2010511250A5 (enExample
Inventor
ヒックマン，スティーヴン・オー
バット，デヴェシュ
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Honeywell International Inc
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Honeywell International Inc
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/261—Functional testing by simulating additional hardware, e.g. fault simulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31704—Design for test; Design verification
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequences by preliminary fault modelling, e.g. analysis, simulation
    • G01R31/318357—Simulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318364—Generation of test inputs, e.g. test vectors, patterns or sequences as a result of hardware simulation, e.g. in an HDL environment
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Prevention of errors by analysis, debugging or testing of software
    • G06F11/3668—Testing of software
    • G06F11/3672—Test management
    • G06F11/3684—Test management for test design, e.g. generating new test cases

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Debugging And Monitoring (AREA)
  • Stored Programmes (AREA)
  • Tests Of Electronic Circuits (AREA)
JP2009539430A 2006-11-27 2007-11-27 要求ベーステスト生成 Active JP5102304B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US86112106P 2006-11-27 2006-11-27
US60/861,121 2006-11-27
US11/945,021 2007-11-26
US11/945,021 US7644334B2 (en) 2006-11-27 2007-11-26 Requirements-based test generation
PCT/US2007/085555 WO2008067265A2 (en) 2006-11-27 2007-11-27 Requirements-based test generation

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2012206948A Division JP5608203B2 (ja) 2006-11-27 2012-09-20 要求ベーステスト生成

Publications (3)

Publication Number Publication Date
JP2010511250A JP2010511250A (ja) 2010-04-08
JP2010511250A5 JP2010511250A5 (enExample) 2010-11-04
JP5102304B2 true JP5102304B2 (ja) 2012-12-19

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ID=39465260

Family Applications (2)

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JP2009539430A Active JP5102304B2 (ja) 2006-11-27 2007-11-27 要求ベーステスト生成
JP2012206948A Active JP5608203B2 (ja) 2006-11-27 2012-09-20 要求ベーステスト生成

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2012206948A Active JP5608203B2 (ja) 2006-11-27 2012-09-20 要求ベーステスト生成

Country Status (4)

Country Link
US (1) US7644334B2 (enExample)
EP (1) EP2087427A2 (enExample)
JP (2) JP5102304B2 (enExample)
WO (1) WO2008067265A2 (enExample)

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US8423879B2 (en) 2008-05-14 2013-04-16 Honeywell International Inc. Method and apparatus for test generation from hybrid diagrams with combined data flow and statechart notation
US8732838B2 (en) * 2008-06-26 2014-05-20 Microsoft Corporation Evaluating the effectiveness of a threat model
US9141518B2 (en) * 2008-12-10 2015-09-22 Microsoft Technology Licensing, Llc GUI testing
US20100192128A1 (en) * 2009-01-27 2010-07-29 Honeywell International Inc. System and methods of using test points and signal overrides in requirements-based test generation
US20100293618A1 (en) * 2009-05-12 2010-11-18 Microsoft Corporation Runtime analysis of software privacy issues
US20100333073A1 (en) * 2009-06-29 2010-12-30 Honeywell International Inc. Systems and methods for automated generation of software tests based on modeling the software test domain
US8370809B2 (en) * 2010-03-18 2013-02-05 Salesforce.Com, Inc. System, method and computer program product for automated test case generation and scheduling
US9098619B2 (en) * 2010-04-19 2015-08-04 Honeywell International Inc. Method for automated error detection and verification of software
US20110271258A1 (en) * 2010-04-30 2011-11-03 Microsoft Corporation Software Development Tool
US8661424B2 (en) * 2010-09-02 2014-02-25 Honeywell International Inc. Auto-generation of concurrent code for multi-core applications
US20120102458A1 (en) * 2010-10-22 2012-04-26 Microsoft Corporation Generating documentation from tests
US8984488B2 (en) * 2011-01-14 2015-03-17 Honeywell International Inc. Type and range propagation through data-flow models
US8984343B2 (en) 2011-02-14 2015-03-17 Honeywell International Inc. Error propagation in a system model
US8448146B2 (en) 2011-03-31 2013-05-21 Infosys Limited Generation of functional tests for re-hosted applications
US8930758B2 (en) 2012-01-16 2015-01-06 Siemens Aktiengesellschaft Automated testing of mechatronic systems
US9323650B2 (en) 2012-07-23 2016-04-26 Infosys Limited Methods for generating software test input data and devices thereof
US9244982B2 (en) * 2012-12-20 2016-01-26 Oracle International Corporation Static analysis of PL/SQL objects and SQL queries
US9262308B2 (en) * 2014-01-23 2016-02-16 Accenture Global Services Limited Test paths generation for a physical system
US20150241864A1 (en) * 2014-02-21 2015-08-27 Chung-Shan Institute Of Science And Technology, Armaments Bureau, M.N.D Zero sequence current control apparatus and method for parallel power converters
US10108536B2 (en) 2014-12-10 2018-10-23 General Electric Company Integrated automated test case generation for safety-critical software
US9747079B2 (en) 2014-12-15 2017-08-29 General Electric Company Method and system of software specification modeling
CN106326093A (zh) * 2015-06-26 2017-01-11 中兴通讯股份有限公司 自动化测试系统及测试方法
US9940222B2 (en) * 2015-11-20 2018-04-10 General Electric Company System and method for safety-critical software automated requirements-based test case generation
US10025696B2 (en) 2016-02-09 2018-07-17 General Electric Company System and method for equivalence class analysis-based automated requirements-based test case generation
US10169217B2 (en) 2016-04-06 2019-01-01 General Electric Company System and method for test generation from software specification models that contain nonlinear arithmetic constraints over real number ranges
US10936289B2 (en) 2016-06-03 2021-03-02 Ab Initio Technology Llc Format-specific data processing operations
US10120785B2 (en) * 2016-10-21 2018-11-06 Rosemount Aerospace Inc. Automatic generation of data coupling and control coupling test conditions
US9740543B1 (en) 2016-10-27 2017-08-22 Red Hat, Inc. Multi-endpoint method implementation
US10776250B2 (en) * 2017-04-12 2020-09-15 Salesforce.Com, Inc. Switchable environments for test cases
US10585779B2 (en) 2018-07-30 2020-03-10 General Electric Company Systems and methods of requirements chaining and applications thereof
US10503632B1 (en) * 2018-09-28 2019-12-10 Amazon Technologies, Inc. Impact analysis for software testing
US20210191845A1 (en) * 2019-12-23 2021-06-24 Ab Initio Technology Llc Unit testing of components of dataflow graphs
CN112181849B (zh) * 2020-10-23 2023-07-25 网易（杭州）网络有限公司 测试用例识别方法、装置、设备及存储介质
CN112462739B (zh) * 2020-11-19 2021-06-29 北京京航计算通讯研究所 一种双通道耦合飞行控制程序的故障检测系统
CN112416766B (zh) * 2020-11-19 2021-06-22 北京京航计算通讯研究所 双通道耦合飞行控制软件的故障模式分析和检测方法
CN112345869A (zh) * 2020-11-25 2021-02-09 武汉光庭信息技术股份有限公司 一种汽车电子设备测试方法、系统、电子设备及存储介质
US11775878B2 (en) 2020-12-22 2023-10-03 Sas Institute Inc. Automated machine learning test system
CN115248769B (zh) * 2021-04-27 2025-08-29 中移(苏州)软件技术有限公司 一种测试用例优化方法、装置、设备及存储介质
CN114116452B (zh) * 2021-10-29 2024-11-26 北京达佳互联信息技术有限公司 测试用例生成方法、装置、电子设备及存储介质
US11307852B1 (en) 2021-10-29 2022-04-19 Snowflake Inc. Automated generation of dependency graph based on input and output requirements of information
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JP2005352670A (ja) * 2004-06-09 2005-12-22 Denso Corp シミュレーション装置及び検査装置
JP2006024006A (ja) * 2004-07-08 2006-01-26 Denso Corp テストケース生成装置、テストケース生成プログラム、モデルベース開発プログラム、ソースコード生成妥当性診断装置、ソースコード生成妥当性診断プログラム、およびモデルベース開発方法。
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Also Published As

Publication number Publication date
WO2008067265A3 (en) 2008-09-18
US7644334B2 (en) 2010-01-05
JP2013033487A (ja) 2013-02-14
JP2010511250A (ja) 2010-04-08
US20080126902A1 (en) 2008-05-29
WO2008067265A2 (en) 2008-06-05
EP2087427A2 (en) 2009-08-12
JP5608203B2 (ja) 2014-10-15

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