JP2010197385A5 - - Google Patents

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Publication number
JP2010197385A5
JP2010197385A5 JP2010024869A JP2010024869A JP2010197385A5 JP 2010197385 A5 JP2010197385 A5 JP 2010197385A5 JP 2010024869 A JP2010024869 A JP 2010024869A JP 2010024869 A JP2010024869 A JP 2010024869A JP 2010197385 A5 JP2010197385 A5 JP 2010197385A5
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JP
Japan
Prior art keywords
outliers
test data
outlier
threshold
identifying
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JP2010024869A
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English (en)
Japanese (ja)
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JP5907649B2 (ja
JP2010197385A (ja
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Publication of JP2010197385A5 publication Critical patent/JP2010197385A5/ja
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JP2010024869A 2006-02-17 2010-02-05 データ解析のための方法および装置 Expired - Fee Related JP5907649B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US77468206P 2006-02-17 2006-02-17
US60/774,682 2006-02-17

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP2008555533A Division JP2009527903A (ja) 2006-02-17 2007-02-17 データ解析のための方法および装置

Publications (3)

Publication Number Publication Date
JP2010197385A JP2010197385A (ja) 2010-09-09
JP2010197385A5 true JP2010197385A5 (enExample) 2013-04-25
JP5907649B2 JP5907649B2 (ja) 2016-04-26

Family

ID=38438077

Family Applications (3)

Application Number Title Priority Date Filing Date
JP2008555533A Pending JP2009527903A (ja) 2006-02-17 2007-02-17 データ解析のための方法および装置
JP2009091599A Active JP5080526B2 (ja) 2006-02-17 2009-04-03 データ解析のための方法および装置
JP2010024869A Expired - Fee Related JP5907649B2 (ja) 2006-02-17 2010-02-05 データ解析のための方法および装置

Family Applications Before (2)

Application Number Title Priority Date Filing Date
JP2008555533A Pending JP2009527903A (ja) 2006-02-17 2007-02-17 データ解析のための方法および装置
JP2009091599A Active JP5080526B2 (ja) 2006-02-17 2009-04-03 データ解析のための方法および装置

Country Status (4)

Country Link
EP (1) EP1989561A2 (enExample)
JP (3) JP2009527903A (enExample)
IL (1) IL193447A (enExample)
WO (1) WO2007098426A2 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5537346B2 (ja) * 2010-09-06 2014-07-02 株式会社日立メディコ 画像診断支援装置、画像診断支援方法
JP5767963B2 (ja) * 2011-12-28 2015-08-26 株式会社キーエンス 外観検査装置、外観検査方法及びコンピュータプログラム
JP6532373B2 (ja) * 2015-10-16 2019-06-19 株式会社Ｎｔｔファシリティーズ 蓄電池劣化推定システム、蓄電池劣化推定方法および蓄電池劣化推定プログラム
JP6752661B2 (ja) * 2016-09-05 2020-09-09 日置電機株式会社 処理装置、検査システムおよび処理プログラム
EP3451219A1 (en) * 2017-08-31 2019-03-06 KBC Groep NV Improved anomaly detection
US20200004619A1 (en) * 2018-06-28 2020-01-02 Honeywell International Inc. System and method for detecting a shift in real data trend using the configurable adaptive threshold
US11157346B2 (en) * 2018-09-26 2021-10-26 Palo Alto Rsearch Center Incorporated System and method for binned inter-quartile range analysis in anomaly detection of a data series
CN113486003B (zh) * 2021-06-02 2024-03-19 广州数说故事信息科技有限公司 数据可视化时考虑异常值的企业数据集处理方法及系统
US11907088B2 (en) * 2021-12-15 2024-02-20 Synopsys, Inc. Testing of hardware queue systems using on device test generation
CN118131054B (zh) * 2024-01-12 2024-09-03 东莞市丰晖电子有限公司 一种钠离子电池荷电状态智能监测方法及系统

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0352247A (ja) * 1989-07-20 1991-03-06 Seiko Instr Inc 半導体試験装置
JPH04283046A (ja) * 1991-03-12 1992-10-08 Nec Corp 作業順序制御方式
JP2002016118A (ja) * 2000-06-29 2002-01-18 Agilent Technologies Japan Ltd 半導体パラメトリック試験装置
US7356430B2 (en) * 2001-05-24 2008-04-08 Test Advantage, Inc. Methods and apparatus for data analysis
US6792373B2 (en) * 2001-05-24 2004-09-14 Test Advantage, Inc. Methods and apparatus for semiconductor testing
US8417477B2 (en) * 2001-05-24 2013-04-09 Test Acuity Solutions, Inc. Methods and apparatus for local outlier detection
JP2006146459A (ja) * 2004-11-18 2006-06-08 Renesas Technology Corp 半導体デバイスの製造方法および製造システム
JP5116307B2 (ja) * 2007-01-04 2013-01-09 ルネサスエレクトロニクス株式会社 集積回路装置異常検出装置、方法およびプログラム

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