JP2010175558A - Inspection device - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide an inspection device for efficiently and accurately determining the quality of an inspecting object. <P>SOLUTION: This inspection device includes an irradiation section 2 for radiating light for inspection to the inspecting object conveyed by a conveying means, an image taking section 3 for taking an image of the inspecting object irradiated with the light for inspection of the irradiation section 2, and a determination processing section 4 for determining the quality of the inspecting object based on the image taken by the image taking section 3. The irradiation section 2 includes a blue irradiating means 5 for radiating blue light, and a red irradiating means 6 for radiating red light. The image taking section 3 includes a color image taking section for taking a color image of the inspecting object irradiated by two kinds of irradiating means of different colors. The light for inspection from the blue irradiating means 5 radiates the outer surface of the inspecting object. The blue irradiating means 5 and the red irradiating means 6 are arranged so that the light for inspection from the red irradiating means 6 comes into the inspecting object. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

  The present invention relates to an inspection apparatus for sequentially inspecting the appearance and the inside of an inspection object mainly composed of electronic components such as a large number of chip capacitors and chip light emitting diodes conveyed by a conveying means.

  As the inspection device, for example, blue light is irradiated from the upper side to the upper end surface of a chip capacitor conveyed by a conveying device such as a belt conveyor, and red light is irradiated from the lateral side to the lateral side surface of the chip capacitor. An irradiation unit is arranged to irradiate simultaneously with the blue light, and a chip capacitor irradiated with two kinds of light is captured as a single image by a monochrome camera arranged immediately above the irradiation unit, The quality of the chip capacitor is determined by processing the captured image in the control unit.

  In the above configuration, a chip type capacitor irradiated with light of two kinds of colors can be captured as a single image by a single monochrome camera, so that compared to capturing two images irradiated with each color. Thus, there is an advantage that the capture time can be shortened.

  By the way, the light of two kinds of colors is radiated by highlighting the features on the image such as scratches, cracks or chips generated on the external surface of the chip capacitor with blue light, and the chip type This is because the feature on the image such as the internal crack of the capacitor or the lifting of the electrode is emphasized with red light. However, when the image is picked up by a monochrome camera while irradiating two types of colors at the same time, the feature on the image of the defect emphasized by one color may be weakened by the other color. In some cases, defective defects could not be detected.

  Therefore, a monochrome CCD camera that captures an image of the inspection object conveyed by the conveying means, a state where the optical axis of the blue light emitting diode and the optical axis of the red light emitting diode are inclined with respect to the optical axis of the camera, specifically Two types of light emitting diodes are arranged and inspected so that the tilt angle between the optical axis of the blue light emitting diode and the optical axis of the camera is smaller than the tilt angle between the optical axis of the red light emitting diode and the optical axis of the camera. When the object is transported to a predetermined position in the imaging area of the camera, for example, the blue light emitting diode is turned on to image the inspection object, and then the blue light emitting diode is turned off and the red light emitting diode is turned on. The above-mentioned inconvenience is solved by re-imaging the inspection object and determining pass / fail of the inspection object based on the two captured images captured for each color. It is possible manner (e.g., see Patent Document 1).

Japanese Unexamined Patent Publication No. 2007-64801 (see FIGS. 1 to 3)

  In the configuration of the above-mentioned Patent Document 1, since it is necessary to capture the image of the inspection object irradiated with two kinds of colors twice, it takes a lot of time to capture compared to the case where the image is captured once. The inspection could not be performed efficiently. In addition, since the inspection object is conveyed, when the image is captured twice, the position of the inspection object at the time of the two captures is different, resulting in an image in which the imaging direction of the object is different. Therefore, an image suitable for performing arithmetic processing between two images such as subtraction cannot be obtained.

  In view of the above-described situation, an object of the present invention is to provide an inspection apparatus that can efficiently and accurately determine the quality of an inspection object.

  In order to solve the above-described problems, the inspection apparatus according to the present invention includes an irradiation unit that irradiates inspection light onto an inspection target such as an electronic component that has been transported by a transport unit, and inspection light from the irradiation unit. An inspection apparatus including an image capturing unit for capturing an image of an irradiated inspection object, and a determination processing unit that determines the quality of the inspection object based on the image captured by the image capturing unit. The irradiation unit includes a blue irradiation unit that emits blue light and a red irradiation unit that emits red light, and the image capturing unit is irradiated by a plurality of irradiation units having different colors. A color image capturing unit for capturing a color image of the inspection object, and the determination processing unit is based on an image obtained by separating the image captured by the color image capturing unit for each color. It is configured to judge the quality of things. That.

  By configuring the image capturing unit from the color image capturing unit as described above, it is possible to capture a color image of the inspection object irradiated by a plurality of irradiation means having different colors at a time. The captured plurality of color images can be divided into colors to form a plurality of images, and the inspection means can detect the inspection object based on the image of the inspection object irradiated by the blue irradiation means. While inspecting the surface layer surface, it is possible to inspect the inner layer portion of the inspection object based on the image of the inspection object irradiated by the red irradiation means. The surface layer here refers to the imaging target surface of the inspection object when viewed from the camera side, and the inner layer portion diffuses the irradiated light inside the inspection object, and the diffused light is imaged on the camera side. This indicates a region having a certain depth from the surface layer that can be formed, and indicates a layered region close to the surface.

  Further, in the inspection apparatus according to the present invention, at least the red irradiation unit of the blue irradiation unit and the red irradiation unit is arranged with respect to the optical axis of the color image capturing unit whose irradiation axis is directed toward the inspection object. It may be arranged so as to be inclined, and the inclination angle between the irradiation axis of the red irradiation means and the optical axis may be set larger than the inclination angle between the irradiation axis of the blue irradiation means and the optical axis.

  The inspection apparatus according to the present invention may include a green irradiation unit that emits green light in addition to the blue irradiation unit and the red irradiation unit. According to such a configuration, since the outline line of the inspection object can be sharply imaged, cracks (breaks) or chippings on the outer periphery (particularly corners) of the inspection object that could not be found with the two types of colors. Can be detected effectively. The inclination angle between the irradiation axis of the green irradiation means and the optical axis of the color image capturing unit is smaller than the inclination angle between the irradiation axis of the red irradiation means and the optical axis, and the blue irradiation means By simply setting the tilt angle larger than the tilt angle between the irradiation axis and the optical axis, it is possible to irradiate the inspection object in an optimum state, and the inspection can be performed with high accuracy.

  In the inspection apparatus according to the present invention, each of the blue irradiation unit, the green irradiation unit, and the red irradiation unit may be configured by a number of light emitting diodes. According to such a configuration, not only the irradiation unit can be reduced in size but also advantageous in terms of both durability and power consumption without running out of balls. In addition, on the inner surface of the support member provided with a curved surface located on the inner side toward the upper end side provided with an image capturing opening of the color image capturing unit at the center of the upper end, the red irradiation means in order from the lower side By arranging the diodes so that the light emitting diodes, the green irradiation unit diodes, the blue irradiation unit diodes are positioned, and are arranged in an annular shape with respect to the optical axis of the color image capturing unit, The angle of each light emitting diode can be adjusted to the curved surface of the support member, which is advantageous in terms of manufacturing.

  By configuring the image capturing unit from a color image capturing unit, it is possible to capture a color image of the inspection object irradiated by a plurality of irradiating means having different colors at a time. As compared with the above, the take-in time can be shortened, and the inspection of the surface layer surface and the inspection of the inner layer portion can be performed efficiently without slowing the conveying speed. Moreover, since the images divided for each color are obtained by imaging the inspection object at the same position, the images for each color have the same imaging direction, and calculation is performed between a plurality of images such as subtraction. An image suitable for the above can be obtained. As a result, only the feature of the defect can be emphasized, and an accurate inspection can be performed.

  At least the red irradiation means of the blue irradiation means and the red irradiation means is arranged so that its irradiation axis is inclined with respect to the optical axis of the color image capturing unit directed toward the inspection object, By simply setting the inclination angle between the irradiation axis and the optical axis to be larger than the inclination angle between the irradiation axis of the blue irradiation means and the optical axis, it is possible to irradiate the inspection object in an optimum state and perform the inspection. It can be performed with high accuracy.

(A) is a vertical side view of the inspection apparatus, and (b) is a plan view of the inspection apparatus. (A), (b), (c) is explanatory drawing which shows the example of various defects of a chip-type capacitor | condenser. It is a longitudinal cross-sectional view which shows a part of other test | inspection apparatus.

  1 and 2 show an inspection apparatus of the present invention. This inspection apparatus irradiates, for example, a belt conveyor 1 as a conveying means for conveying a chip capacitor C, which is an example of an inspection object, in the direction of the arrow, and a chip capacitor C conveyed by the belt conveyor 1 from above. Irradiation unit 2, color CCD camera 3 (color image capture unit) as an image capture unit for capturing an image of the inspection object irradiated with the inspection light from the irradiation unit 2, and this color CCD camera 3 And a determination processing unit 4 that determines whether the chip capacitor C is good or bad based on the image captured in step (1). As the inspection object, in addition to the chip capacitor C, it is possible to inspect electronic components including chip type light emitting diodes or chip type dielectrics and internal electrodes, but surface layer inspection and inner layer inspection As long as it is necessary, it may be other than electronic components. If the determination processing unit 4 determines that the product is defective, the defective product is collected in a defective product collection unit (not shown). If the product is determined to be good, the good product is collected. The determination result from the determination processing unit 4 is output to the control unit S so as to collect the defective product collection unit (not shown) or the non-defective product collection unit (not shown). It is configured to operate.

  Although the belt conveyor 1 is used as the transport means, the belt conveyor 1 may be a turntable that can rotate around the vertical axis, or may be other various transport devices. Here, the case where the quality of the chip capacitor C is detected from above is shown, but the quality of the chip capacitor C is detected from any of the left, right, bottom side, front side, front side, and rear side. The direction of detection can be freely changed.

  The irradiation unit 2 includes a blue irradiation unit 5 that emits blue light, a green irradiation unit 6 that emits green light, and a red irradiation unit 7 that emits red light. Each of the green illuminating means 6 and the red radiating means 7 is composed of a large number of light emitting diodes, and has an opening 8A for capturing an image of the color CCD camera 3 at the center of the upper end, and extends almost straight upward from the lower end. The upper curved surface 8W of the circular support member 8 having a vertically-facing lower inner surface 8U and an upper curved surface 8W positioned inward from the upper end to the upper end of the lower inner surface 8U on the upper end side thereof, The light emitting diode 7 of the red irradiation unit, the diode 6 of the green irradiation unit, and the diode 5 of the blue irradiation unit are located in order from the lower side, and are arranged in an annular shape with respect to the optical axis X of the color CCD camera 3. Thus, by arranging the diodes 7, 6 and 5, the irradiation distance from the diodes 7, 6 and 5 to the chip capacitor C is not greatly different, but the lower end is not as shown in FIG. The light emitting diodes 7, 6 and 5 may be attached to the inner surface 9H of the opened vertically long support member 9 so as to be located at substantially the same position in the vertical direction, and the attachment position of the light emitting diodes can be freely changed. An opening 9A for image capture is formed at the center of the upper end of the support member 9. In addition to the light-emitting diode, a color fluorescent lamp may be used as the irradiation means, or various colors may be output using a color filter to various white lamps such as a fluorescent lamp and an incandescent lamp. .

  The blue illuminating means 5, the green illuminating means 6 and the red illuminating means 7 are arranged so that the illuminating axis Y1 thereof is inclined with respect to the optical axis X of the color CCD camera 3 directed toward the inspection object. The inspection light from the irradiation means 5 irradiates the surface of the chip capacitor C, and the inspection light from the green irradiation means 6 irradiates the outer shape of the chip capacitor C, and the inspection light from the red irradiation means 7. Enters the inside of the chip capacitor C. And among the images captured by the color CCD camera 3, based on the image of the inspection object irradiated by the blue irradiation means, the surface layer surface (imaging target surface) of the inspection object is inspected, Based on the image of the inspection object irradiated by the red irradiation means, the inner layer portion of the inspection object (a region having a certain depth from the surface layer surface that can be imaged on the camera side) is inspected.

As shown in FIG. 1A, the inclination angle θ ₂ between the irradiation axis Y2 of the green irradiation unit 6 and the optical axis X of the color image capturing unit 3 is set as the irradiation axis Y3 of the red irradiation unit 7 and the optical axis X. It is set smaller than the inclination angle θ ₃ with respect to the optical axis X and larger than the inclination angle θ ₁ between the irradiation axis Y 1 of the blue irradiation means 5 and the optical axis X. Specifically, the inclination angle θ ₁ between the irradiation axis Y1 of the blue irradiation means 5 and the optical axis X of the color image capturing unit 3 is set to 30 degrees, for example, but within a range of 0 to 30 degrees. Any angle can be set. In addition, the inclination angle θ ₂ between the irradiation axis Y2 of the green irradiation means 6 and the optical axis X of the color image capturing section 3 is set to 45 degrees, but any angle is within the range of 30 degrees to 60 degrees. It may be set to. Further, the inclination angle θ ₃ between the irradiation axis Y3 of the red irradiation means 7 and the optical axis X of the color image capturing section 3 is set to 60 degrees, but any angle is within the range of 50 degrees to 90 degrees. It may be set to. When the inclination angle θ ₃ is set between 50 degrees and 60 degrees, the inclination angle θ ₂ is set to an angle smaller than the inclination angle θ ₃ .

As described above, the inclination angle θ ₁ between the irradiation axis Y 1 of the blue irradiation means 5 and the optical axis X of the color image capturing unit 3 is changed from 0 degrees to 30 degrees, so that the upper end surface of the chip capacitor C is changed. As shown in FIG. 2 (b), it is possible to reliably detect scratches and cracks K2 on the upper end surface of the chip type capacitor C. Yes. Further, the inclination angle θ ₂ between the irradiation axis Y2 of the green irradiation means 6 and the optical axis X of the color image capturing unit 3 is changed from 30 degrees to 60 degrees so that the outer periphery of the chip capacitor C is inclined to the outer periphery. Irradiation can be performed from the upper side to the lower side, and as shown in FIG. 2C, scratches, cracks, or chips K3 on the outer peripheral edge of the chip capacitor C can be reliably detected. Further, the inclination angle θ ₃ between the irradiation axis Y3 of the red irradiation means 7 and the optical axis X of the color image capturing section 3 is changed from 50 degrees to 90 degrees, so that the inclination close to the lateral side of the chip capacitor C is obtained. Irradiation can be performed from an angle, and irradiation light can enter inside the chip capacitor C. As shown in FIG. 2A, internal cracks K1 generated between the laminated dielectrics and internal electrodes The lift can be reliably detected.

  As shown in FIGS. 1A and 1B, a photoelectric sensor 10 for detecting the chip capacitor C is provided on the front side of the irradiation unit 2 in the conveyance direction (arrow direction) of the chip capacitor C. When the chip-type capacitor C is detected by the photoelectric sensor 10, it is assumed that the chip-type capacitor C is located immediately below the irradiation unit 2 after the set time has elapsed, and the irradiation unit 2 is operated after the set time has elapsed. The chip capacitor C is irradiated with irradiation light, and an image of the chip capacitor C irradiated by the color CCD camera 3 is taken. In the photoelectric sensor 10, the light emitting unit 10A and the light receiving unit 10B are arranged on both sides in the transport width direction orthogonal to the passage path of the chip capacitor C, and the chip capacitor C receives light from the light emitting unit 10A. The passage of the chip capacitor C can be detected by blocking the arrival at the part 10B.

  The image of the chip-type capacitor C picked up by the color CCD camera 3 is decomposed into the images for each of the three colors, and then each image is compared with pre-stored image data. Whether the chip capacitor C is defective or not is determined by the control unit S by determining whether there is at least one defective image, for example. Only when one image is defective, the chip capacitor C may be determined to be defective, and the determination criteria can be freely changed.

  In addition to using the color CCD camera 3 as the color image capturing unit, a color CMOS camera or the like may be used.

  DESCRIPTION OF SYMBOLS 1 ... Belt conveyor, 2 ... Irradiation part, 3 ... Camera, 4 ... Determination processing part, 5 ... Blue irradiation means, 6 ... Green irradiation means, 7 ... Red irradiation means, 5, 6, 7 ... Light emitting diode, 8 ... Support Member: 8A: Opening, 8W: Curved surface, 9: Supporting member, 10: Photoelectric sensor, C: Chip type capacitor, X: Optical axis, Y1, Y2, Y3: Irradiation axis

Claims (2)

An irradiation unit for irradiating the inspection object such as an electronic component conveyed by the conveying unit with the inspection light, and an image capturing unit for capturing an image of the inspection object irradiated with the inspection light of the irradiation unit And an inspection apparatus including a determination processing unit that determines the quality of the inspection object based on the image captured by the image capturing unit,
The irradiation unit includes a blue irradiation unit that emits blue light and a red irradiation unit that emits red light,
The image capturing unit is composed of a color image capturing unit for capturing a color image of the inspection object irradiated by a plurality of irradiation means having different colors,
An inspection apparatus, wherein the determination processing unit is configured to determine pass / fail of an inspection object based on an image obtained by separating the image captured by the color image capturing unit for each color.   At least the red irradiation means of the blue irradiation means and the red irradiation means is arranged so that its irradiation axis is inclined with respect to the optical axis of the color image capturing unit directed toward the inspection object, 2. The inspection apparatus according to claim 1, wherein an inclination angle between the irradiation axis and the optical axis is set larger than an inclination angle between the irradiation axis of the blue irradiation means and the optical axis.

Images