JP2010066091A5 - - Google Patents

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Publication number
JP2010066091A5
JP2010066091A5 JP2008231892A JP2008231892A JP2010066091A5 JP 2010066091 A5 JP2010066091 A5 JP 2010066091A5 JP 2008231892 A JP2008231892 A JP 2008231892A JP 2008231892 A JP2008231892 A JP 2008231892A JP 2010066091 A5 JP2010066091 A5 JP 2010066091A5
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JP
Japan
Prior art keywords
semiconductor device
substrate
socket
testing
test method
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JP2008231892A
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English (en)
Japanese (ja)
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JP2010066091A (ja
JP5538697B2 (ja
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Priority claimed from JP2008231892A external-priority patent/JP5538697B2/ja
Publication of JP2010066091A publication Critical patent/JP2010066091A/ja
Publication of JP2010066091A5 publication Critical patent/JP2010066091A5/ja
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Publication of JP5538697B2 publication Critical patent/JP5538697B2/ja
Expired - Fee Related legal-status Critical Current
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JP2008231892A 2008-09-10 2008-09-10 半導体装置のテスト方法 Expired - Fee Related JP5538697B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2008231892A JP5538697B2 (ja) 2008-09-10 2008-09-10 半導体装置のテスト方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008231892A JP5538697B2 (ja) 2008-09-10 2008-09-10 半導体装置のテスト方法

Publications (3)

Publication Number Publication Date
JP2010066091A JP2010066091A (ja) 2010-03-25
JP2010066091A5 true JP2010066091A5 (https=) 2011-10-27
JP5538697B2 JP5538697B2 (ja) 2014-07-02

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ID=42191802

Family Applications (1)

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JP2008231892A Expired - Fee Related JP5538697B2 (ja) 2008-09-10 2008-09-10 半導体装置のテスト方法

Country Status (1)

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JP (1) JP5538697B2 (https=)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7800382B2 (en) 2007-12-19 2010-09-21 AEHR Test Ststems System for testing an integrated circuit of a device and its method of use
US8030957B2 (en) 2009-03-25 2011-10-04 Aehr Test Systems System for testing an integrated circuit of a device and its method of use
TWI782508B (zh) 2016-01-08 2022-11-01 美商艾爾測試系統 電子測試器中裝置之熱控制的方法與系統
EP3589965B1 (en) 2017-03-03 2023-12-06 AEHR Test Systems Electronics tester
JP6961632B2 (ja) * 2019-01-21 2021-11-05 株式会社アドバンテスト バーンインボード及びバーンイン装置
KR102949167B1 (ko) 2020-10-07 2026-04-06 에어 테스트 시스템즈 일렉트로닉스 테스터
CN121114724A (zh) 2022-12-30 2025-12-12 雅赫测试系统公司 电子测试器

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06317630A (ja) * 1993-05-06 1994-11-15 Mitsubishi Electric Corp 半導体恒温加速試験装置用基板
JPH11102756A (ja) * 1997-09-25 1999-04-13 Nippon Avionics Co Ltd Ｉｃソケットの取付装置
JP2003084030A (ja) * 2001-09-14 2003-03-19 Hitachi Ltd 半導体装置の製造方法

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