JP2010036315A - End face grinding device of substrate - Google Patents

End face grinding device of substrate Download PDF

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JP2010036315A
JP2010036315A JP2008203651A JP2008203651A JP2010036315A JP 2010036315 A JP2010036315 A JP 2010036315A JP 2008203651 A JP2008203651 A JP 2008203651A JP 2008203651 A JP2008203651 A JP 2008203651A JP 2010036315 A JP2010036315 A JP 2010036315A
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substrate
polishing
load current
face
current value
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JP5235555B2 (en
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Tomoaki Obata
智昭 小幡
Koichi Okuwa
幸一 大桑
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Nakamura Tome Precision Industry Co Ltd
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Nakamura Tome Precision Industry Co Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a grinding device for grinding an end face of a brittle substrate such as a glass substrate. <P>SOLUTION: The end face grinding device includes a grinding wheel of which the peripheral edge part for grinding the end face of the substrate is made by elastic material, and a rotation driving means and feed control means of the grinding wheel. The rotation driving means has a load current detection means for detecting load current flowing while abutting to the end face of the substrate and a validity determination means of the load current value, The feed control means has a notch direction feed control means and a thrust direction feed control means to the end face of the substrate, and notch direction feed operation and thrust direction feed operation of the grinding wheel are controlled based on the validity determination means of the load current value. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

本発明はガラス基板等の脆性基板の切断した端面を研磨加工する研磨装置に関する。   The present invention relates to a polishing apparatus for polishing a cut end surface of a brittle substrate such as a glass substrate.

ガラス、水晶、セラミックス等の脆性基板の場合に切断した端面にカレットが発生したり、マイクロクラックを起点に割れが発生する恐れがあることから端面を鏡面状に仕上げることでカレット発生を抑え、端面強度向上を図っている。
従来は、図6に示すように、バフ研磨用の砥石101を用いて基板102を台103に載置し、一辺ずつ押し当てて研磨加工をしていた。
これでは、研磨量が不安定で工程数も多かった。
近年、この種の硬質の脆性材の端面を鏡面状に研磨するのに、周縁部が弾力性に富んだ研磨ホイールを用いることが提案されている。
市販されているものとして、繊維に樹脂を充填してあり、この樹脂に砥粒を分散させたものがある。
このような周縁部に弾性材を用いた研磨ホイールは、ホイールの外周面を基板の端面に摺接させる際の、なじみ性に優れ、鏡面仕上げ品質が安定する。
しかし、弾力性に富んでいる分、磨耗が速く、基板の当たり面に沿って凹部状にへこんだ磨耗溝が発生する。
従って、所定の基板枚数の研磨加工をすると、磨耗溝が深くなり過ぎて研磨ホイールの回転駆動抵抗が大きくなるために、研磨品質が不安定になり、不良品も発生しやすくなる。
この場合に、従来はオペレーターが研磨ホイールの周縁部の基板端面に当たる位置を変更していた。
これでは、その調整のために加工ラインが一時停止し、生産性が低下する要因の1つになっていた。
In the case of brittle substrates such as glass, quartz, ceramics, etc., cullet may occur on the cut end face, or cracks may occur starting from micro cracks. The strength is improved.
Conventionally, as shown in FIG. 6, a substrate 102 is placed on a base 103 using a buffing grindstone 101, and polishing is performed by pressing each side.
In this case, the polishing amount was unstable and the number of processes was large.
In recent years, it has been proposed to use a polishing wheel whose peripheral part is rich in elasticity to polish the end face of this kind of hard brittle material into a mirror surface.
As what is marketed, there is a resin in which fibers are filled and abrasive grains are dispersed in this resin.
Such a polishing wheel using an elastic material in the peripheral portion has excellent conformability when the outer peripheral surface of the wheel is brought into sliding contact with the end surface of the substrate, and the mirror finish quality is stable.
However, since it is rich in elasticity, the wear is fast, and a wear groove that is recessed in a concave shape is generated along the contact surface of the substrate.
Therefore, when a predetermined number of substrates are polished, the wear grooves become too deep and the rotational driving resistance of the polishing wheel increases, so that the polishing quality becomes unstable and defective products are likely to occur.
In this case, conventionally, the position where the operator hits the substrate end surface of the peripheral portion of the polishing wheel has been changed.
In this case, the processing line is temporarily stopped for the adjustment, which is one of the factors that decrease the productivity.

特許文献1,2には、砥石駆動モータの電力値に基づいて切り込み速度を調整する技術を開示するが研磨ホイールの磨耗溝を管理するものではない。   Patent Documents 1 and 2 disclose a technique for adjusting the cutting speed based on the power value of the grindstone drive motor, but do not manage the wear grooves of the grinding wheel.

特開2004−122259号公報JP 2004-122259 A 特開平7−171742号公報Japanese Patent Laid-Open No. 7-171742

本発明は、研磨ホイールの磨耗量を考慮した連続生産性の高い基板の端面研磨装置の提供を目的とする。   An object of the present invention is to provide a substrate end surface polishing apparatus with high continuous productivity in consideration of the wear amount of a polishing wheel.

本発明に係る基板の端面研磨装置は、基板の端面を研磨加工するための周縁部が弾性材からなる研磨ホイールと、当該研磨ホイールの回転駆動手段と送り制御手段を備え、回転駆動手段は、基板と端面接触する際に流れる負荷電流を検出するための負荷電流検出手段とその負荷電流値の適正判断手段を有し、送り制御手段は基板の端面に対して切り込み方向送り制御手段とスラスト方向送り制御手段とを有し、負荷電流値の適正判断手段に基づいて研磨ホイールの切り込み方向送り動作とスラスト方向送り動作とが制御されていることを特徴とする。   The substrate end surface polishing apparatus according to the present invention includes a polishing wheel having a peripheral edge made of an elastic material for polishing the end surface of the substrate, a rotation driving unit and a feed control unit of the polishing wheel, and the rotation driving unit includes: A load current detecting means for detecting a load current flowing when contacting the substrate and the end face and means for determining the appropriate value of the load current value are provided. And a feed control means, and the cutting direction feed operation and the thrust direction feed operation of the grinding wheel are controlled based on the load current value appropriateness judgment means.

周縁部が弾性材からなる研磨ホイールとは基板の端面を研磨加工するためのホイール外周部が少なくとも弾性材であることをいい、この弾性材に砥粒が含有されている。
砥粒には特に限定がなく、ダイヤモンド砥粒、シリコンカーバイト砥粒、CBN(立方晶窒化ホウ素)砥粒、酸化セリウム砥粒等が例として挙げられる。
また、弾性材は弾力性に富んだ構造や材質を用いてあればよく、上述した繊維に樹脂を充填したものに限定されない。
A polishing wheel having a peripheral edge made of an elastic material means that a wheel outer periphery for polishing the end surface of the substrate is at least an elastic material, and abrasive particles are contained in the elastic material.
The abrasive grains are not particularly limited, and examples thereof include diamond abrasive grains, silicon carbide abrasive grains, CBN (cubic boron nitride) abrasive grains, and cerium oxide abrasive grains.
Moreover, the elastic material should just use the structure and material rich in elasticity, and is not limited to what filled the resin into the fiber mentioned above.

負荷電流値の適正判断手段に基づいて研磨ホイールの切り込み方向送り動作とスラスト方向送り動作を制御する方策例としては、負荷電流値の適正判断手段が、基板端面の研磨加工時の負荷電流値が所定の値を越えたと判断した場合に、次の基板端面加工は、スラスト方向送り制御手段が研磨ホイールを所定のピッチだけ移動し、研磨加工を開始するようにする方法がある。
また、他の方策例としては、負荷電流値の適正判断手段が、基板端面の研磨加工時の負荷電流値が所定の範囲にあると判断した場合に、スラスト方向送り制御手段が研磨ホイールを所定の速度でトラバースさせながら研磨加工をする方法がある。
As an example of a measure for controlling the cutting wheel direction feed operation and the thrust direction feed operation of the polishing wheel based on the load current value appropriateness determination means, the load current value appropriateness determination means is configured such that the load current value at the time of polishing the substrate end face is When it is determined that the predetermined value has been exceeded, the next substrate end face processing includes a method in which the thrust direction feed control means moves the polishing wheel by a predetermined pitch and starts polishing.
As another example of measures, when the load current value appropriateness determining means determines that the load current value during polishing of the substrate end face is within a predetermined range, the thrust direction feed control means determines the polishing wheel to be predetermined. There is a method of polishing while traversing at a speed of.

ここで、研磨ホイールを所定のピッチだけ移動させるとは、回転駆動手段に設けた負荷電流検出手段にて検出した負荷電流値から、研磨ホイールに生じた磨耗溝が深くなり、これ以上使用できないと適正判断手段が判断すると、スラスト方向送り制御手段が、少なくとも基板の板厚以上に研磨ホイールをスラスト方向に移動し、新たな周縁部で研磨加工することをいう。
従って、この場合には研磨ホイールの周縁部には所定のピッチ毎に磨耗溝ができることになる。
これに対して、研磨ホイールを所定の速度でトラバースさせながら、研磨加工する方法は、負荷電流値の適正判断手段が研磨ホイールの周縁部が基板の端面に研磨加工できる状態に摺接していることを確認しながら、研磨ホイールをスラスト方向にトラバースさせつつ、基板の端面を研磨する方法である。
この場合には、研磨ホイールの周縁部はスラスト方向にまんべんなく磨耗することになる。
Here, moving the grinding wheel by a predetermined pitch means that the wear groove generated in the grinding wheel becomes deep from the load current value detected by the load current detection means provided in the rotation drive means, and cannot be used any more. When the appropriateness determining means determines, the thrust direction feed control means moves the polishing wheel in the thrust direction at least beyond the thickness of the substrate and polishes it at a new peripheral portion.
Therefore, in this case, wear grooves are formed at predetermined pitches on the peripheral edge of the grinding wheel.
On the other hand, in the method of polishing while traversing the polishing wheel at a predetermined speed, the load current value appropriate judgment means is in sliding contact with the edge of the polishing wheel in a state where the peripheral edge of the polishing wheel can be polished. This is a method for polishing the end face of the substrate while traversing the polishing wheel in the thrust direction while confirming the above.
In this case, the peripheral edge of the grinding wheel is worn evenly in the thrust direction.

本発明に係る研磨装置においては、研磨ホイールの回転駆動部に流れる負荷電流値に基づいて、研磨ホイールの周縁部に生じる磨耗量を検出及び考慮しつつ、研磨ホイールの切り込み方向の送りと、スラスト方向の送りを制御したので、従来の磨耗溝の深さをラインを一時停止して研磨ホイールの摺接位置を変更していたのに比較して、連続加工が可能になり、生産性が向上し、研磨品質も安定する。   In the polishing apparatus according to the present invention, the feed in the cutting direction of the polishing wheel and the thrust are detected and taken into account based on the load current value flowing through the rotational drive unit of the polishing wheel while detecting and taking into consideration the amount of wear generated at the peripheral edge of the polishing wheel. Since the feed of the direction is controlled, continuous machining is possible and productivity is improved compared to the conventional method where the wear groove depth is temporarily stopped and the sliding contact position of the grinding wheel is changed. In addition, the polishing quality is stable.

本発明者らは、まず、弾性研磨ホイール(住友スリーエム株式会社製,商品名DLOホイール)を用いて、ガラス基板の研磨加工枚数と研磨ホイール周縁部に現れる磨耗溝の深さを調査した。
その結果を図5の表に示す。
加工枚数の増大とともに溝深さが深くなり、約800枚を研磨加工すると、溝深さが約0.51mmになり、その時の研磨ホイールの回転駆動部に流れる負荷電流値は、研磨ホイールに磨耗溝が発生していないときに比較して平均約20%大きくなっていた。
さらに研磨加工枚数が増え、約2000枚になると、磨耗溝深さが1.0mmになり、その時の負荷電流値は磨耗溝が発生していない場合に比較して、平均約40%大きくなっていた。
この予備調査の結果から負荷電流値の変化から研磨ホイールの磨耗溝深さを予測できることが明らかになった。
The inventors first investigated the number of glass substrates polished and the depth of wear grooves appearing on the periphery of the polishing wheel using an elastic polishing wheel (manufactured by Sumitomo 3M Limited, trade name: DLO wheel).
The results are shown in the table of FIG.
As the number of processed sheets increases, the groove depth becomes deeper. When approximately 800 sheets are polished, the groove depth becomes approximately 0.51 mm, and the load current value that flows to the rotational drive portion of the polishing wheel at that time is worn by the polishing wheel. The average was about 20% larger than when no groove was formed.
Further, when the number of polishing processes increases to about 2000, the wear groove depth becomes 1.0 mm, and the load current value at that time is about 40% larger than the average when no wear groove is generated. It was.
From the result of this preliminary investigation, it became clear that the wear groove depth of the grinding wheel can be predicted from the change of the load current value.

次に、本発明に係る実施例を図面に基づいて説明する。
図3に研磨装置の要部構成図を模式的に示し、図4に、研磨ホイール1の基板2に対する切り込み方向の送り制御例を示す。
図3に示すように、回転駆動手段及び送り制御手段を備えた駆動部に連結された回転軸31に研磨ホイール1を軸支してある。
駆動部及びその制御部の図示は省略したが、研磨ホイール1の回転速度W、基板2の端面21に摺接しつつ、切り込み方向に送り制御(X軸制御)する切り込み方向送り制御手段を有し、さらには、基板2に対してスラスト方向に移動制御(Z軸制御)するスラスト方向送り制御手段を有している。
また、駆動部には研磨ホイール1が基板2の端面21に摺接する際の摩擦抵抗によって受ける負荷による負荷電流値を検出する負荷電流検出手段を備えている。
Next, an embodiment according to the present invention will be described with reference to the drawings.
FIG. 3 schematically shows the configuration of the main part of the polishing apparatus, and FIG. 4 shows an example of feed control in the cutting direction of the polishing wheel 1 with respect to the substrate 2.
As shown in FIG. 3, the grinding wheel 1 is pivotally supported on a rotary shaft 31 connected to a drive unit having a rotation drive means and a feed control means.
Yes Although illustrated drive unit and a control unit is omitted, the rotational speed W 1 of the grinding wheel 1, sliding contact with the end face 21 of the substrate 2, the infeed direction feed control means for controlling the feed to the cutting direction (X-axis control) In addition, there is a thrust direction feed control means for controlling the movement of the substrate 2 in the thrust direction (Z-axis control).
Further, the drive unit is provided with load current detection means for detecting a load current value due to a load received by the frictional resistance when the polishing wheel 1 is in sliding contact with the end surface 21 of the substrate 2.

図3に示した実施例ではガラス基板等の基板2が、上下移動制御された上クランパー40のクランプ部40aと下クランパー41のクランプ台41aとの間にクランプ保持されつつ、W方向に回転制御されている。
なお、基板2が保持されていれば本実施例に限定されるものではなく、クランプ台41aに吸着手段を設け、吸着保持してもよい。
本実施例に係る研磨装置は図4に示すように基板2が回転制御されつつ、例えば研磨ホイールの回転中心Oを基板2の一方のコーナー2cから側辺2b、他方のコーナー2dに対して順次O〜Oに移動制御するように極座標系を用いて制御した例であり、基板2を1回転させることで全周の端面を研磨できるようになっている。
本発明に係る研磨装置は本実施例に限定されるものではなく、X−Y座標系制御であってもよい。
Substrate 2 such as a glass substrate, in the embodiment shown in FIG. 3, while being clamped held between the clamp base 41a of the clamping portion 40a and the lower clamper 41 on the clamper 40 which is vertically moved control, rotate in W 2 direction It is controlled.
In addition, if the board | substrate 2 is hold | maintained, it will not be limited to a present Example, You may provide an adsorption | suction means in the clamp stand 41a, and may carry out adsorption holding.
In the polishing apparatus according to the present embodiment, as shown in FIG. 4, the rotation of the substrate 2 is controlled. For example, the rotation center O of the polishing wheel is sequentially changed from one corner 2c of the substrate 2 to the side 2b and the other corner 2d. In this example, the polar coordinate system is used to control the movement to O 1 to O 3 , and the entire end face can be polished by rotating the substrate 2 once.
The polishing apparatus according to the present invention is not limited to the present embodiment, and may be XY coordinate system control.

次に研磨ホイール1の磨耗管理方法について説明する。
図1に第1の実施例を示し、研磨ホイール1の断面及び基板2の端面21付近のみを示してある。
研磨ホイール1を切り込み方向制御手段(X軸)にて基板2の端面21を研磨すべく、切り込み制御すると加工枚数の増大に従って弾性材からなる周縁部1aに磨耗溝dが発生する。
磨耗溝dが深くなるにつれて回転駆動部の負荷電流値が大きくなることは予備調査で明らかになっているので、負荷電流値の増大量に基づいて磨耗溝の深さや研磨品質の良否を判断する負荷電流値の適正判断手段を設けた。
負荷電流値の適正判断手段は、例えば負荷電流値の変化から磨耗溝深さを演算する演算プログラムを有し、これに基づいて磨耗溝dの深さが限界であると判断すると、スラスト方向送り制御手段(Z軸)が次回の基板の研磨を開始する際に、ピッチPだけZ軸方向に移動するようになっている。
図1に示した例では、研磨ホイール1が想像線で示した基板2aの状態から実線で示した基板2の状態までピッチPだけ上昇する例になっているが、順次上から下に移動する方法でもよい。
ピッチPの寸法は基板2の厚みよりも大きければよく、図1ではわかりやすくするためにPを大きく表現してある。
Next, a method for managing wear of the grinding wheel 1 will be described.
FIG. 1 shows the first embodiment, in which only the cross section of the polishing wheel 1 and the vicinity of the end face 21 of the substrate 2 are shown.
When the cutting control is performed to polish the end surface 21 of the substrate 2 by the cutting direction control means (X axis) of the polishing wheel 1, a wear groove d is generated in the peripheral portion 1a made of an elastic material as the number of processed sheets increases.
Since it has been clarified in a preliminary investigation that the load current value of the rotary drive unit increases as the wear groove d becomes deeper, the depth of the wear groove and the quality of the polishing quality are judged based on the increase amount of the load current value. A means for determining the appropriateness of the load current value is provided.
The load current value appropriateness determining means has, for example, a calculation program for calculating the wear groove depth from the change of the load current value, and when it is determined that the depth of the wear groove d is the limit, the thrust direction feed When the control means (Z-axis) starts polishing the next substrate, the control means (Z-axis) moves in the Z-axis direction by the pitch P.
In the example shown in FIG. 1, the polishing wheel 1 is raised by the pitch P from the state of the substrate 2a shown by an imaginary line to the state of the substrate 2 shown by a solid line, but sequentially moves from top to bottom. The method may be used.
The dimension of the pitch P only needs to be larger than the thickness of the substrate 2. In FIG.

図2に示した第2の実施例は、研磨ホイール1、周縁部1aの摺接外周面が基板2の端面21に摺接研磨している状態を維持しつつ、研磨ホイール1をスラスト方向(図2では上方向)に移動制御した例である。
切り込み方向の送りは負荷電流の値から研磨圧が所定の適正範囲にあるように負荷電流値の適正判断手段が判断制御している。
In the second embodiment shown in FIG. 2, the polishing wheel 1 is moved in the thrust direction (in the thrust direction) while maintaining the state in which the sliding contact outer peripheral surface of the polishing wheel 1 and the peripheral portion 1a is slidingly polished to the end surface 21 of the substrate 2. In this example, the movement is controlled in the upward direction in FIG.
The feed in the cutting direction is judged and controlled by the load current value appropriate judgment means so that the polishing pressure is within a predetermined appropriate range from the load current value.

本発明に係る研磨装置の研磨ホイール制御方法例を示す。The example of the grinding | polishing wheel control method of the grinding | polishing apparatus which concerns on this invention is shown. 研磨ホイールをトラバース制御する例を示す。An example of traverse control of a grinding wheel is shown. 研磨装置の要部構成例を示す。The example of a principal part structure of a grinding | polishing apparatus is shown. 極座標研磨制御例を示す。An example of polar coordinate polishing control is shown. 基板の研磨加工枚数と磨耗溝深さの調査結果を示す。The results of the investigation of the number of substrates polished and wear groove depth are shown. 従来の研磨方法例を示す。The example of the conventional grinding | polishing method is shown.

符号の説明Explanation of symbols

1 研磨ホイール
1a 周縁部
2 基板
10 切り込み方向送り制御手段(X軸)
20 スラスト方向送り制御手段(Z軸)
30 回転駆動手段
DESCRIPTION OF SYMBOLS 1 Polishing wheel 1a Peripheral part 2 Substrate 10 Cutting direction feed control means (X axis)
20 Thrust direction feed control means (Z axis)
30 Rotation drive means

Claims (3)

基板の端面を研磨加工するための周縁部が弾性材からなる研磨ホイールと、当該研磨ホイールの回転駆動手段と送り制御手段を備え、
回転駆動手段は、基板と端面接触する際に流れる負荷電流を検出するための負荷電流検出手段とその負荷電流値の適正判断手段を有し、
送り制御手段は基板の端面に対して切り込み方向送り制御手段とスラスト方向送り制御手段とを有し、負荷電流値の適正判断手段に基づいて研磨ホイールの切り込み方向送り動作とスラスト方向送り動作とが制御されていることを特徴とする基板の端面研磨装置。
A polishing wheel having a peripheral edge made of an elastic material for polishing the end surface of the substrate, a rotation driving means and a feed control means of the polishing wheel,
The rotation drive means has a load current detection means for detecting a load current flowing when contacting the end face with the substrate, and an appropriate judgment means for the load current value,
The feed control means has a cutting direction feed control means and a thrust direction feed control means with respect to the end face of the substrate, and the cutting direction feed operation and the thrust direction feed operation of the polishing wheel are performed based on the load current value appropriate judgment means. An apparatus for polishing an end face of a substrate, which is controlled.
負荷電流値の適正判断手段が、基板端面の研磨加工時の負荷電流値が所定の値を越えたと判断した場合に、
次の基板端面加工は、スラスト方向送り制御手段が研磨ホイールを所定のピッチだけ移動し、研磨加工を開始するものであることを特徴とする請求項1記載の基板の端面研磨装置。
When the load current value appropriateness determining means determines that the load current value during polishing of the substrate end face exceeds a predetermined value,
2. The substrate end surface polishing apparatus according to claim 1, wherein in the next substrate end surface processing, the thrust direction feed control means moves the polishing wheel by a predetermined pitch and starts polishing processing.
負荷電流値の適正判断手段が、基板端面の研磨加工時の負荷電流値が所定の範囲にあると判断した場合に、スラスト方向送り制御手段が研磨ホイールを所定の速度でトラバースさせながら研磨加工をするものであることを特徴とする請求項1記載の基板の端面研磨装置。   When the load current value appropriateness determining means determines that the load current value at the time of polishing the substrate end face is within a predetermined range, the thrust direction feed control means performs polishing while traversing the polishing wheel at a predetermined speed. The apparatus for polishing an end face of a substrate according to claim 1, wherein:
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