JP2010021215A - Cleaning system and method for circulating cleaning fluid - Google Patents

Cleaning system and method for circulating cleaning fluid Download PDF

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JP2010021215A
JP2010021215A JP2008178456A JP2008178456A JP2010021215A JP 2010021215 A JP2010021215 A JP 2010021215A JP 2008178456 A JP2008178456 A JP 2008178456A JP 2008178456 A JP2008178456 A JP 2008178456A JP 2010021215 A JP2010021215 A JP 2010021215A
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cleaning
tank
liquid
cleaning liquid
regeneration
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Hajime Onoda
始 小野田
Korei Yamada
浩玲 山田
Hiroyasu Iimori
弘恭 飯森
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Toshiba Corp
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Toshiba Corp
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a cleaning system and a method for circulating the cleaning fluid which can limit the exchange frequency of a filter. <P>SOLUTION: A cleaning system comprises a cleaning tub 11 which receives cleaning fluid 101 containing sulphuric acid and hydrogen peroxide solution, a cleaning circulation line 29 through which the cleaning fluid 101 can be discharged from the outlet of the cleaning tub 11, and passed through heating equipment 21 and a filter 25 or a bypass line 28 before being returned to the inlet of the cleaning tub 11, and a regenerating circulation line 55 through which heated cleaning fluid 101 can be discharged from the outlet of the cleaning tub 11, passed through a cooler 33, introduced to the inlet of a regeneration tub 35 which raises the concentration of sulphuric acid to a predetermined level by heating, discharged from the outlet of the regeneration tub 35, passed through a cooler 41, and stored in a buffer tub 51 before being returned from the buffer tub 51 to the inlet of the cleaning tub 11. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

本発明は、半導体ウェーハを洗浄する洗浄システム及び洗浄液循環方法に関する。   The present invention relates to a cleaning system and a cleaning liquid circulation method for cleaning a semiconductor wafer.

半導体ウェーハのレジストの剥離、有機物の除去等の洗浄処理は、通常、半導体ウェーハを洗浄槽の中の洗浄液に浸漬して行われる。   Cleaning treatments such as resist stripping of the semiconductor wafer and removal of organic substances are usually performed by immersing the semiconductor wafer in a cleaning solution in a cleaning tank.

洗浄液は、硫酸及び過酸化水素水の混合液(SPM洗浄液、sulfuric acid-hydrogen peroxide mixture)が使用される。例えば、レジストの剥離の場合、レジストの剥離性を向上させるために、洗浄液は100℃以上の高温が保たれる。過酸化水素水(H)の沸点は約150℃であるが、100℃以上の高温では、熱分解によって水(HO)と酸素(O)の生成が進む。つまり、SPM洗浄液は、熱分解によって、次第に水が増加して、硫酸濃度が低下するために、酸化力による洗浄能力の低下、すなわち、レジスト剥離性が弱くなる。 As the cleaning liquid, a mixed liquid of sulfuric acid and hydrogen peroxide water (SPM cleaning liquid, sulfuric acid-hydrogen peroxide mixture) is used. For example, in the case of resist peeling, the cleaning liquid is kept at a high temperature of 100 ° C. or higher in order to improve the resist peeling property. The boiling point of hydrogen peroxide water (H 2 O 2 ) is about 150 ° C., but at a high temperature of 100 ° C. or higher, the generation of water (H 2 O) and oxygen (O 2 ) proceeds by thermal decomposition. That is, in the SPM cleaning liquid, water gradually increases due to thermal decomposition and the sulfuric acid concentration decreases, so that the cleaning ability is reduced by the oxidizing power, that is, the resist stripping property is weakened.

そこで、硫酸濃度が低下したSPM洗浄液の硫酸濃度を上げる技術、SPM洗浄液の再生が行われている。例えば、石英ガラス製の反応槽(再生槽)に、洗浄能力の落ちたウェーハ洗浄液(SPM洗浄液)を入れ、150〜315℃に加熱して、残留過酸化水素水及び過酸化水素水の分解により生ずる水等を除去して、硫酸を濃縮して濃縮硫酸とした後、冷却槽で約80℃まで冷却され、濃縮硫酸を有するウェーハ洗浄液を再びウェーハ処理槽(洗浄槽)に戻して、ウェーハ洗浄に再利用する硫酸リサイクル装置(洗浄システム)が開示されている(例えば、特許文献1参照。)。このウェーハ処理槽の濃縮硫酸を有するSPM洗浄液は、原料輸送ポンプにより、フィルタを介して洗浄槽の内槽と外層とを循環可能である。   Therefore, a technique for increasing the sulfuric acid concentration of the SPM cleaning liquid in which the sulfuric acid concentration is reduced, and regeneration of the SPM cleaning liquid are performed. For example, a quartz glass reaction tank (regeneration tank) is filled with a wafer cleaning solution (SPM cleaning solution) with reduced cleaning ability, heated to 150 to 315 ° C., and decomposed with residual hydrogen peroxide solution and hydrogen peroxide solution. After removing the water, etc., and concentrating sulfuric acid to make concentrated sulfuric acid, it is cooled to about 80 ° C in a cooling tank, and the wafer cleaning liquid containing concentrated sulfuric acid is returned to the wafer processing tank (cleaning tank) again to clean the wafer. A sulfuric acid recycling apparatus (cleaning system) that is reused is disclosed (for example, see Patent Document 1). The SPM cleaning liquid having concentrated sulfuric acid in the wafer processing tank can be circulated between the inner tank and the outer layer of the cleaning tank through a filter by a raw material transport pump.

この開示された洗浄システムは、SPM洗浄液の硫酸を濃縮し再利用可能とするものの、再生後、濃縮硫酸を有するSPM洗浄液は温度が低下すると溶解したレジスト成分が析出する。冷却された濃縮硫酸を有するSPM洗浄液を洗浄槽に送り、フィルタを介して洗浄槽の内槽と外層を循環させると、フィルタにレジスト成分が捕捉されて、フィルタが詰まり、流量の低下を起こしたり、フィルタの交換頻度が高くなる等の問題が生じる。
特開2002−68715号公報(第4〜6頁、図1)
The disclosed cleaning system concentrates and reuses the sulfuric acid of the SPM cleaning solution, but after regeneration, the SPM cleaning solution having concentrated sulfuric acid precipitates the dissolved resist component when the temperature decreases. When the SPM cleaning liquid containing cooled concentrated sulfuric acid is sent to the cleaning tank and circulated through the inner tank and the outer layer of the cleaning tank through the filter, the resist component is captured by the filter, the filter is clogged, and the flow rate is reduced. There arises a problem that the replacement frequency of the filter is increased.
JP 2002-68715 A (pages 4 to 6, FIG. 1)

本発明は、フィルタの交換頻度を抑制することが可能な洗浄システム及び洗浄液循環方法を提供する。   The present invention provides a cleaning system and a cleaning liquid circulation method capable of suppressing the frequency of filter replacement.

本発明の一態様の部品の洗浄システムは、第1の薬液及び第2の薬液が含まれる洗浄液を収容する洗浄槽と、前記洗浄液が、前記洗浄槽の排出口から排出され、加熱手段を通過して、切り替えて使用される濾過手段またはバイパス手段を通過して、前記洗浄槽の導入口に戻される洗浄循環ラインと、前記洗浄液が、前記洗浄槽の排出口から排出され、第1の冷却手段を通過した後、加熱することにより前記第1の薬液の濃度を所定の濃度に高める再生槽の導入口に導入され、前記再生槽の排出口から排出され、第2の冷却手段を通過して、バッファ槽に貯留され、前記バッファ槽から前記洗浄槽の導入口に戻される再生循環ラインとを有することを特徴とする。   The component cleaning system according to one aspect of the present invention includes a cleaning tank that contains a cleaning liquid containing a first chemical liquid and a second chemical liquid, and the cleaning liquid is discharged from an outlet of the cleaning tank and passes through a heating unit. The cleaning circulation line returned to the introduction port of the cleaning tank after passing through the filtering means or the bypass means used by switching, and the cleaning liquid are discharged from the discharge port of the cleaning tank, and the first cooling After passing through the means, it is introduced into the introduction port of the regeneration tank that raises the concentration of the first chemical liquid to a predetermined concentration by heating, is discharged from the discharge port of the regeneration tank, and passes through the second cooling means. And a regeneration circulation line stored in the buffer tank and returned from the buffer tank to the inlet of the cleaning tank.

また、本発明の別の態様の洗浄システムは、第1の薬液及び第2の薬液が含まれる洗浄液を収容する洗浄槽と、加熱された前記洗浄液が、前記洗浄槽の排出口から排出され、第1の加熱手段を通過して、濾過手段を通過して、前記洗浄槽の導入口に戻される洗浄循環ラインと、前記洗浄液が、前記洗浄槽の排出口から排出され、第1の冷却手段を通過した後、加熱することにより前記第1の薬液の濃度を所定の濃度に高める再生槽の導入口に導入され、前記再生槽の排出口から排出され、第2の冷却手段を通過して、バッファ槽に貯留され、前記バッファ槽から、前記洗浄槽の導入口に接近して配置された第2の加熱手段を通過して、前記洗浄槽の導入口に戻される再生循環ラインとを有することを特徴とする。   Further, in the cleaning system according to another aspect of the present invention, the cleaning tank containing the cleaning liquid containing the first chemical liquid and the second chemical liquid, and the heated cleaning liquid are discharged from the discharge port of the cleaning tank, A cleaning circulation line that passes through the first heating means, passes through the filtering means, and is returned to the inlet of the cleaning tank, and the cleaning liquid is discharged from the outlet of the cleaning tank, and the first cooling means Is passed through the inlet of the regeneration tank that raises the concentration of the first chemical liquid to a predetermined concentration by heating, is discharged from the outlet of the regeneration tank, passes through the second cooling means And a regeneration circulation line that is stored in the buffer tank and passes from the buffer tank through the second heating means disposed close to the inlet of the cleaning tank and returned to the inlet of the cleaning tank. It is characterized by that.

また、本発明の別の態様の洗浄液循環方法は、第1の薬液及び第2の薬液が含まれる洗浄液を、洗浄槽から排出して、加熱手段と濾過手段とを通して前記洗浄槽に戻す循環を行い、室温より高い洗浄処理温度で洗浄処理を行う工程と、前記第1の薬液の濃度が低下した前記洗浄液を第1の冷却手段で冷却した後に再生槽に移し、前記再生槽において、前記洗浄処理温度より高温で前記第1の薬液の濃度を所定の濃度に高めて前記洗浄液を再生する工程と、再生された前記洗浄液を第2の冷却手段で冷却してバッファ槽に移し、再生された前記洗浄液を前記バッファ槽から前記洗浄槽に移す工程と、再生された前記洗浄液を前記洗浄槽から排出して、前記加熱手段と前記濾過手段を迂回したバイパス手段とを通して前記洗浄槽に戻す循環を行い前記洗浄処理温度に高める工程とを有することを特徴とする。   Moreover, the cleaning liquid circulation method according to another aspect of the present invention is a circulation in which the cleaning liquid containing the first chemical liquid and the second chemical liquid is discharged from the cleaning tank and returned to the cleaning tank through the heating means and the filtering means. Performing a cleaning process at a cleaning process temperature higher than room temperature, and transferring the cleaning liquid having a reduced concentration of the first chemical solution to a regeneration tank after being cooled by a first cooling means. The step of regenerating the cleaning liquid by increasing the concentration of the first chemical liquid to a predetermined concentration at a temperature higher than the processing temperature, and the regenerated cleaning liquid is cooled by the second cooling means, transferred to the buffer tank, and regenerated. A step of transferring the cleaning liquid from the buffer tank to the cleaning tank, and a circulation of discharging the regenerated cleaning liquid from the cleaning tank and returning it to the cleaning tank through the heating means and the bypass means bypassing the filtering means. Conduct Characterized by a step of increasing the serial cleaning process temperature.

また、本発明の別の態様の洗浄液循環方法は、第1の薬液及び第2の薬液が含まれる洗浄液を、洗浄槽から排出して、第1の加熱手段と濾過手段とを通して前記洗浄槽に戻す循環を行い、室温より高い洗浄処理温度で洗浄処理を行う工程と、前記第1の薬液の濃度が低下した前記洗浄液を第1の冷却手段で冷却した後に再生槽に移し、前記再生槽において、前記洗浄処理温度より高温で前記第1の薬液の濃度を所定の濃度に高めて前記洗浄液を再生する工程と、再生された前記洗浄液を第2の冷却手段で冷却してバッファ槽に移し、再生された前記洗浄液を、第2の加熱手段を介して、前記バッファ槽から前記洗浄槽に移す工程とを有することを特徴とする。   Moreover, the cleaning liquid circulation method according to another aspect of the present invention is configured to discharge the cleaning liquid containing the first chemical liquid and the second chemical liquid from the cleaning tank and pass the first heating means and the filtering means to the cleaning tank. Performing a return circulation, performing a cleaning process at a cleaning process temperature higher than room temperature, and transferring the cleaning liquid having a reduced concentration of the first chemical solution to the regeneration tank after being cooled by the first cooling means; A step of increasing the concentration of the first chemical liquid to a predetermined concentration at a temperature higher than the cleaning treatment temperature and regenerating the cleaning liquid; cooling the regenerated cleaning liquid with a second cooling means; And a step of transferring the regenerated cleaning liquid from the buffer tank to the cleaning tank via a second heating means.

本発明によれば、フィルタの交換頻度を抑制することが可能な洗浄システム及び洗浄液循環方法を提供できる。   ADVANTAGE OF THE INVENTION According to this invention, the washing | cleaning system and washing | cleaning-liquid circulation method which can suppress the replacement frequency of a filter can be provided.

以下の各実施例においては、洗浄液として硫酸と過酸化水素水の混合液であるSPM洗浄液を選択した場合について説明するが、温度が低下すると溶解したレジスト成分等の固形物が析出する他の薬液の混合液からなる洗浄液についても、同様に適用することができるのは勿論である。   In each of the following examples, a case where an SPM cleaning liquid that is a mixed liquid of sulfuric acid and hydrogen peroxide solution is selected as the cleaning liquid will be described. However, when the temperature is lowered, other chemical liquids in which a solid such as a dissolved resist component is precipitated. Of course, the same can be applied to the cleaning liquid composed of the above mixed liquid.

以下、本発明の実施例について、図面を参照しながら説明する。以下に示す図では、同一の構成要素には同一の符号を付している。   Embodiments of the present invention will be described below with reference to the drawings. In the figure shown below, the same code | symbol is attached | subjected to the same component.

本発明の実施例1に係る洗浄システム及び洗浄液循環方法について、図1及び図2を参照しながら説明する。図1は、洗浄システムを模式的に示す構成図である。図2は、洗浄液循環方法の概略手順を示すフローチャートである。   A cleaning system and a cleaning liquid circulation method according to Embodiment 1 of the present invention will be described with reference to FIGS. 1 and 2. FIG. 1 is a configuration diagram schematically showing a cleaning system. FIG. 2 is a flowchart showing a schematic procedure of the cleaning liquid circulation method.

図1に示すように、洗浄システム1は、第1の薬液である硫酸と第2の薬液である過酸化水素水の混合液であるSPM洗浄液(以下、洗浄液101という)を収容する洗浄槽11と、洗浄槽11の排出口と洗浄槽11の導入口との間に、洗浄槽11の排出口から順に、洗浄液101の加熱手段である加熱装置21と濾過手段であるフィルタ25またはバイパス手段であるバイパスライン28とを有する洗浄循環ライン29と、洗浄槽11の排出口と洗浄槽11の導入口との間に、洗浄槽11の排出口から順に、第1の冷却手段である冷却装置33、洗浄液101の硫酸濃度を所定の濃度に高める再生槽35、第2の冷却手段である冷却装置41、及びバッファ槽51を有する再生循環ライン55とを備えている。   As shown in FIG. 1, the cleaning system 1 includes a cleaning tank 11 that stores an SPM cleaning liquid (hereinafter referred to as a cleaning liquid 101) that is a mixed liquid of sulfuric acid that is a first chemical liquid and hydrogen peroxide water that is a second chemical liquid. Between the discharge port of the cleaning tank 11 and the introduction port of the cleaning tank 11, in order from the discharge port of the cleaning tank 11, a heating device 21 that is a heating means of the cleaning liquid 101 and a filter 25 that is a filtering means or a bypass means. A cooling device 33 which is a first cooling means in order from the outlet of the cleaning tank 11 between the cleaning circulation line 29 having a certain bypass line 28, and the outlet of the cleaning tank 11 and the inlet of the cleaning tank 11. And a regeneration tank 35 for increasing the sulfuric acid concentration of the cleaning liquid 101 to a predetermined concentration, a cooling device 41 as a second cooling means, and a regeneration circulation line 55 having a buffer tank 51.

洗浄槽11は、例えば、石英ガラス製の有底箱型で、内槽13と内槽13を取り巻くように配置された外槽14とからなる二重構造となっている。内槽13は、半導体ウェーハ(図示略)を浸漬して洗浄処理できるように、所定の容量の洗浄液101を貯留する。貯留された洗浄液101は、内槽13から外槽14にオーバフローが可能である。洗浄槽11は、図示を省略しているが、内槽13または外槽14に接続された配管により、硫酸及び過酸化水素水がそれぞれ供給される。なお、洗浄槽11は、全部または一部をフッ素樹脂製とすることは可能である。   The cleaning tank 11 is, for example, a bottomed box type made of quartz glass and has a double structure including an inner tank 13 and an outer tank 14 arranged so as to surround the inner tank 13. The inner tank 13 stores a predetermined volume of cleaning liquid 101 so that a semiconductor wafer (not shown) can be immersed and cleaned. The stored cleaning liquid 101 can overflow from the inner tank 13 to the outer tank 14. Although not shown, the cleaning tank 11 is supplied with sulfuric acid and hydrogen peroxide water through pipes connected to the inner tank 13 or the outer tank 14, respectively. The cleaning tank 11 can be entirely or partially made of fluororesin.

図示を省略しているが、洗浄槽11は、洗浄液101の温度を測定する温度センサ、洗浄液101の液面を測定する液面センサ、洗浄液101の濃度を測定する濃度センサ等が配置されている。また、洗浄槽11は、その外側底部または内側底部に洗浄液101を加熱するための補助的な洗浄槽ヒータが配置されることは可能である。   Although not shown, the cleaning tank 11 includes a temperature sensor that measures the temperature of the cleaning liquid 101, a liquid level sensor that measures the liquid level of the cleaning liquid 101, a concentration sensor that measures the concentration of the cleaning liquid 101, and the like. . Further, the washing tank 11 can be provided with an auxiliary washing tank heater for heating the cleaning liquid 101 at the outer bottom or the inner bottom.

洗浄循環ライン29は、外槽14に配管された排出口と洗浄槽11下部の内槽13に配管された導入口とを接続している。外槽14の排出口は、ポンプ17の一端に接続され、ポンプ17の他端は、バルブ19を介して、加熱装置21の一端に接続されている。加熱装置21の他端は、2つに分岐されて、一方がバルブ23を介して、フィルタ25の一端に接続され、他方が、バルブ27を有するバイパスライン28の一端に接続されている。フィルタ25の他端及びバイパスライン28の他端は、互いに接続されて、内槽13の導入口に接続されている。洗浄循環ライン29は、高温(例えば、約120℃)の洗浄液101を循環させるために、洗浄槽11の近傍に、配管距離ができるだけ短くなるように配置されている。   The cleaning circulation line 29 connects the discharge port piped to the outer tank 14 and the inlet port piped to the inner tank 13 below the cleaning tank 11. The outlet of the outer tub 14 is connected to one end of the pump 17, and the other end of the pump 17 is connected to one end of the heating device 21 via the valve 19. The other end of the heating device 21 is branched into two, one connected to one end of the filter 25 via the valve 23, and the other connected to one end of the bypass line 28 having the valve 27. The other end of the filter 25 and the other end of the bypass line 28 are connected to each other and connected to the inlet of the inner tank 13. The cleaning circulation line 29 is arranged in the vicinity of the cleaning tank 11 so that the piping distance is as short as possible in order to circulate the cleaning liquid 101 at a high temperature (for example, about 120 ° C.).

ポンプ17は、圧力を加えて洗浄液101を外槽14から内槽13に循環させている。フィルタ25は、洗浄液101内の一定以上のパーティクルを除去する。バイパスライン28は、洗浄循環ライン29の配管と同様な内径の配管を有し、バルブ27を開き、バルブ23を閉じることにより、フィルタ25を迂回できる。   The pump 17 applies pressure to circulate the cleaning liquid 101 from the outer tank 14 to the inner tank 13. The filter 25 removes particles above a certain level in the cleaning liquid 101. The bypass line 28 has a pipe having an inner diameter similar to that of the cleaning circulation line 29, and the filter 25 can be bypassed by opening the valve 27 and closing the valve 23.

洗浄液101は、洗浄処理中、内槽13を満たし、洗浄循環ライン29が絶え間なく駆動する程度の量が供給されている。   The cleaning liquid 101 is supplied in such an amount that the inner tank 13 is filled and the cleaning circulation line 29 is continuously driven during the cleaning process.

洗浄液101は加熱装置21により加熱されて、所定の温度(例えば、内槽13で約120℃)になる。半導体ウェーハの洗浄処理が行われているときは、バルブ27が閉じられ、バルブ23が開かれて、洗浄液101はフィルタ25を通して循環される。   The cleaning liquid 101 is heated by the heating device 21 and reaches a predetermined temperature (for example, about 120 ° C. in the inner tank 13). When the semiconductor wafer is being cleaned, the valve 27 is closed, the valve 23 is opened, and the cleaning liquid 101 is circulated through the filter 25.

次に、再生循環ライン55は、外槽14に配管された排出口及び洗浄槽11下部の内槽13に配管された排出口と、洗浄槽11下部の内槽13に配管された導入口とを接続している。バルブ16を介した内槽13の排出口、及び外槽14の排出口は、共にポンプ17の一端に接続され、ポンプ17の他端は、バルブ31を介して、冷却装置33の一端に接続されている。冷却装置33の他端は、再生槽35の一端に接続され、再生槽35の他端は、冷却装置41の一端に接続されている。冷却装置41の他端は、貯留のためのバッファ槽51の一端に接続され、バッファ槽51の他端は、ポンプ53の一端に接続され、ポンプ53の他端は、内槽13の導入口に接続されている。   Next, the regeneration circulation line 55 includes a discharge port connected to the outer tank 14 and a discharge port connected to the inner tank 13 below the cleaning tank 11, and an introduction port connected to the inner tank 13 below the cleaning tank 11. Is connected. The outlet of the inner tank 13 via the valve 16 and the outlet of the outer tank 14 are both connected to one end of the pump 17, and the other end of the pump 17 is connected to one end of the cooling device 33 via the valve 31. Has been. The other end of the cooling device 33 is connected to one end of the regeneration tank 35, and the other end of the regeneration tank 35 is connected to one end of the cooling device 41. The other end of the cooling device 41 is connected to one end of a buffer tank 51 for storage, the other end of the buffer tank 51 is connected to one end of a pump 53, and the other end of the pump 53 is an inlet of the inner tank 13. It is connected to the.

外槽14に配管された排出口からポンプ17の他端のバルブ19とバルブ31との分岐までは、洗浄循環ライン29と共用されている。なお、再生槽35の排出口から、バッファ槽51の導入口までは、高低差を利用しているが、この間にポンプを設けることは可能である。   From the outlet port piped to the outer tub 14 to the branch of the valve 19 and the valve 31 at the other end of the pump 17, it is shared with the cleaning circulation line 29. In addition, although the height difference is utilized from the discharge port of the regeneration tank 35 to the inlet port of the buffer tank 51, it is possible to provide a pump in the meantime.

洗浄槽11から冷却装置33に至るまで、洗浄液101は高温である可能性があり、この間の配管は洗浄循環ライン29と同様に、配管距離ができるだけ短くなるように洗浄槽11の近傍に配置されている。つまり、冷却装置33は洗浄循環ライン29の近傍に配置されている。   There is a possibility that the cleaning liquid 101 is hot from the cleaning tank 11 to the cooling device 33, and the piping between them is arranged in the vicinity of the cleaning tank 11 so that the piping distance is as short as possible, like the cleaning circulation line 29. ing. That is, the cooling device 33 is disposed in the vicinity of the cleaning circulation line 29.

冷却装置33は、例えば、再生循環ライン55の配管の内側の洗浄液101を配管の外側に配置された水等の冷媒により熱を取り除く構造を有し、洗浄液101を50℃以下に冷却することが可能である。冷却装置33は、より好ましくは室温まで冷却できるとよい。冷却装置33は、例えば、再生槽35が階下に置かれる場合など、洗浄槽11から再生槽35までの距離が長い場合、安全上必要である。   The cooling device 33 has, for example, a structure in which the cleaning liquid 101 inside the pipe of the regeneration circulation line 55 is removed by a coolant such as water disposed outside the pipe, and the cleaning liquid 101 can be cooled to 50 ° C. or lower. Is possible. More preferably, the cooling device 33 can cool to room temperature. The cooling device 33 is necessary for safety when the distance from the cleaning tank 11 to the regeneration tank 35 is long, for example, when the regeneration tank 35 is placed downstairs.

再生槽35は、石英ガラス製からなり、150℃乃至それ以上に加熱して、洗浄液101の中の過酸化水素水の分解により生じた水及び過酸化水素水を蒸発除去して、洗浄液101の硫酸の濃度を高める(再生する)ことが可能である。50℃以下で再生槽35に送られた洗浄液101は、例えば、250℃乃至それ以上に加熱されて、再生槽35から排出される。なお、再生槽35は、洗浄液101と接する一部が石英ガラス製であってもよい。   The regeneration tank 35 is made of quartz glass and is heated to 150 ° C. or higher to evaporate and remove water and hydrogen peroxide water generated by the decomposition of the hydrogen peroxide solution in the cleaning solution 101. It is possible to increase (regenerate) the concentration of sulfuric acid. The cleaning liquid 101 sent to the regeneration tank 35 at 50 ° C. or less is heated to, for example, 250 ° C. or more and discharged from the regeneration tank 35. In addition, the regeneration tank 35 may be made of quartz glass in part in contact with the cleaning liquid 101.

冷却装置41は、例えば、冷却装置33と同様な構造を有し、再生された洗浄液101を50℃以下に冷却することが可能である。冷却装置41は、より好ましくは室温まで冷却できるとよい。冷却装置41は、配管距離ができるだけ短くなるように再生槽35の近傍に配置されている。   The cooling device 41 has the same structure as the cooling device 33, for example, and can cool the regenerated cleaning liquid 101 to 50 ° C. or lower. More preferably, the cooling device 41 can cool to room temperature. The cooling device 41 is disposed in the vicinity of the regeneration tank 35 so that the piping distance is as short as possible.

バッファ槽51は、石英ガラス製またはフッ素樹脂製からなり、例えば、洗浄槽11の容量及び洗浄循環ライン29一杯の洗浄液101を収納できる大きさである。   The buffer tank 51 is made of quartz glass or fluororesin, and has a size that can accommodate, for example, the capacity of the cleaning tank 11 and the cleaning liquid 101 full of the cleaning circulation line 29.

バッファ槽51に貯留され、ほぼ室温の再生された洗浄液101は、ポンプ53により、圧力を加えられて内槽13に送られる。   The cleaning liquid 101 stored in the buffer tank 51 and regenerated at approximately room temperature is supplied with pressure by the pump 53 to the inner tank 13.

洗浄液101の温度が50℃以下となる冷却装置33と再生槽35との間の距離、及び冷却装置41から洗浄槽11までの距離は、比較的長く取ることが可能であり、再生槽35及びバッファ槽51は洗浄槽11とは離して配置することが可能である。その結果、再生槽35及びバッファ槽51は、複数の洗浄槽11と接続して、切り替えて洗浄液101の再生を行うことが可能である。   The distance between the cooling device 33 and the regeneration tank 35 at which the temperature of the cleaning liquid 101 is 50 ° C. or less, and the distance from the cooling device 41 to the cleaning tank 11 can be relatively long. The buffer tank 51 can be arranged separately from the cleaning tank 11. As a result, the regeneration tank 35 and the buffer tank 51 can be connected to the plurality of cleaning tanks 11 and switched to regenerate the cleaning liquid 101.

上述した再生循環ライン55は、洗浄液101の洗浄能力の低下及び再生可能という判定に基づいて稼働する。稼働する場合、再生循環ライン55との共用部以外の洗浄循環ライン29は止められる。内槽13及び外槽14内の洗浄液101は、冷却装置33で冷却されて、再生槽35の処理能力に合わせて、再生槽35に送られる。再生槽35で高温処理され再生された洗浄液101は、冷却装置41で冷却されて、バッファ槽51に送られて、バッファ槽51に溜められる。バッファ槽51に溜まった洗浄液101は、ほぼ室温の状態で内槽13の導入口に戻される。   The above-described regeneration circulation line 55 operates based on the determination that the cleaning ability of the cleaning liquid 101 is reduced and regeneration is possible. When operating, the cleaning circulation line 29 other than the common part with the regeneration circulation line 55 is stopped. The cleaning liquid 101 in the inner tank 13 and the outer tank 14 is cooled by the cooling device 33 and sent to the regeneration tank 35 in accordance with the processing capacity of the regeneration tank 35. The cleaning liquid 101 that has been subjected to the high temperature treatment and regenerated in the regeneration tank 35 is cooled by the cooling device 41, sent to the buffer tank 51, and stored in the buffer tank 51. The cleaning liquid 101 collected in the buffer tank 51 is returned to the inlet of the inner tank 13 at a substantially room temperature.

洗浄循環ライン29及び再生循環ライン55について説明したが、次に、洗浄循環、再生循環、及びこれら両循環の間に行われる洗浄液101の加熱のための循環を加えて、洗浄システム1の全体の洗浄液循環方法を説明する。   The cleaning circulation line 29 and the regeneration circulation line 55 have been described. Next, the cleaning circulation, the regeneration circulation, and the circulation for heating the cleaning liquid 101 performed between these two circulations are added to the entire cleaning system 1. A cleaning liquid circulation method will be described.

図2に示すように、フィルタ25を通る洗浄循環ライン29を稼働させて、洗浄液101は、外槽14と内槽13との間で循環され、低下の方向に動く温度を加熱装置21により加熱して、所定の洗浄処理温度(例えば、内槽13で約120℃)に管理される(ステップS11)。洗浄循環ライン29にあるバルブ19及びバルブ23は開き、バルブ27は閉じている。再生循環ライン55にあるバルブ16及びバルブ31は閉じている。   As shown in FIG. 2, the cleaning circulation line 29 passing through the filter 25 is operated, and the cleaning liquid 101 is circulated between the outer tub 14 and the inner tub 13, and the temperature that moves in the decreasing direction is heated by the heating device 21. Then, it is managed at a predetermined cleaning processing temperature (for example, about 120 ° C. in the inner tank 13) (step S11). The valve 19 and the valve 23 in the cleaning circulation line 29 are opened, and the valve 27 is closed. The valves 16 and 31 in the regeneration circulation line 55 are closed.

内槽13に半導体ウェーハからなる洗浄ロットを投入して、半導体ウェーハの表面の、例えば、レジストを洗浄処理する(ステップS12)。   A cleaning lot made of a semiconductor wafer is put into the inner tank 13 to clean, for example, a resist on the surface of the semiconductor wafer (step S12).

洗浄処理後、洗浄ロットを内槽13から搬出する(ステップS13)。   After the cleaning process, the cleaning lot is carried out from the inner tank 13 (step S13).

洗浄液101の洗浄処理の回数、および/または、洗浄液101の比重測定等に基づき、洗浄液101を、継続使用可能か、再生する必要があるか、使用不可能かを判定する(ステップS14)。   Based on the number of cleaning processes of the cleaning liquid 101 and / or measurement of the specific gravity of the cleaning liquid 101, it is determined whether the cleaning liquid 101 can be used continuously, needs to be regenerated, or cannot be used (step S14).

再生する必要がある場合、内槽13と外槽14の洗浄液101を冷却装置33により冷却後、再生槽35に移送する(ステップS15)。洗浄循環ライン29にあるバルブ19は閉じ、再生循環ライン55にあるバルブ16及びバルブ31は開く。なお、再生槽35の容量が小さい場合、例えば、バルブ31の開閉により再生槽35に適する量の洗浄液101が送られる。   When it is necessary to regenerate, the cleaning liquid 101 in the inner tank 13 and the outer tank 14 is cooled by the cooling device 33 and then transferred to the regeneration tank 35 (step S15). The valve 19 in the cleaning circulation line 29 is closed, and the valves 16 and 31 in the regeneration circulation line 55 are opened. When the capacity of the regeneration tank 35 is small, for example, an amount of the cleaning liquid 101 suitable for the regeneration tank 35 is sent by opening and closing the valve 31.

再生槽35で洗浄液101を250℃乃至それ以上で高温処理して、硫酸濃度を高める(再生する)(ステップS16)。   The cleaning liquid 101 is treated at a high temperature at 250 ° C. or higher in the regeneration tank 35 to increase (regenerate) the sulfuric acid concentration (step S16).

再生された洗浄液101を冷却装置41により冷却後、バッファ槽51に移送する(ステップS17)。   The regenerated cleaning liquid 101 is cooled by the cooling device 41 and then transferred to the buffer tank 51 (step S17).

再生された洗浄液101を、バッファ槽51から内槽13に移送する(ステップS18)。   The regenerated cleaning liquid 101 is transferred from the buffer tank 51 to the inner tank 13 (step S18).

バルブ23を閉じてフィルタ25を不通として、バルブ27を開いてバイパスライン28を通るように設定した後、洗浄循環ライン29を稼働させて、加熱装置21により洗浄液101の昇温を行う(ステップS19)。洗浄循環ライン29を循環しながら洗浄液101は昇温されて、析出したレジスト成分が、再溶解する。   After the valve 23 is closed and the filter 25 is disabled, the valve 27 is opened and set to pass through the bypass line 28, the cleaning circulation line 29 is operated, and the heating device 21 raises the temperature of the cleaning liquid 101 (step S19). ). While the cleaning liquid 101 is circulated through the cleaning circulation line 29, the temperature of the cleaning liquid 101 is increased, and the deposited resist components are dissolved again.

ステップS19の後、ステップS11に戻る。つまり、洗浄循環ライン29は、バイパスライン28からフィルタ25を通るラインに切り替えられる。   After step S19, the process returns to step S11. That is, the cleaning circulation line 29 is switched from the bypass line 28 to a line passing through the filter 25.

また、洗浄液101は、ステップS14で継続使用が可能と判定された場合、ステップS11に戻る。   If it is determined in step S14 that the cleaning liquid 101 can be used continuously, the process returns to step S11.

また、洗浄液101は、ステップS14で使用不可能と判定された場合、別のラインまたは洗浄循環ライン29に設けられた排出口から廃液として排出され、処理される(ステップS20)。図示を省略してあるが、洗浄液101が廃液として処理された後、新しい洗浄液101が洗浄槽11に補充された後、ステップS11からスタートする。   If it is determined in step S14 that the cleaning liquid 101 cannot be used, the cleaning liquid 101 is discharged as waste liquid from a discharge port provided in another line or the cleaning circulation line 29 and processed (step S20). Although not shown, after the cleaning liquid 101 is treated as a waste liquid, the cleaning tank 11 is replenished with a new cleaning liquid 101, and then the process starts from step S11.

上述したように、ほぼ室温の再生された洗浄液101は、洗浄槽11に戻されて、昇温中はバイパスライン28を循環されるので、フィルタ25を詰まらせる可能性はなく、洗浄処理温度になると、切り替えられてフィルタ25を通る洗浄循環ライン29を循環するが、この段階では、析出したレジスト成分は再溶解しているので、レジスト成分がフィルタ25を詰まらせる可能性は抑えられる。   As described above, the regenerated cleaning liquid 101 at approximately room temperature is returned to the cleaning tank 11 and circulated through the bypass line 28 during the temperature rise, so that there is no possibility of clogging the filter 25 and the cleaning processing temperature is reached. Then, it is switched and circulates in the cleaning circulation line 29 passing through the filter 25. At this stage, since the deposited resist component is redissolved, the possibility that the resist component clogs the filter 25 is suppressed.

つまり、再生した洗浄液101は、析出したレジストが再溶解するまでバイパスライン28を循環されて、洗浄処理温度になってからフィルタ25を通るので、洗浄システム1は、洗浄液101中のレジスト成分によってフィルタ25の交換が頻繁になることを抑制できる。また、洗浄液101の中のレジスト成分が増加しても、溶解度内であれば、再溶解されるので、洗浄液101は複数回にわたって使用可能となる。   That is, the regenerated cleaning liquid 101 is circulated through the bypass line 28 until the deposited resist is redissolved and passes through the filter 25 after reaching the cleaning processing temperature. Therefore, the cleaning system 1 filters the resist component in the cleaning liquid 101. The frequent exchange of 25 can be suppressed. Further, even if the resist component in the cleaning liquid 101 increases, it is dissolved again within the solubility, so that the cleaning liquid 101 can be used multiple times.

また、洗浄システム1の再生循環ライン55には、冷却装置33が配置されているので、冷却装置33を通過した洗浄液101を比較的遠くまで、安全に移送することが可能である。その結果、1組の再生槽35とバッファ槽51等は、複数の洗浄槽11と接続して、時差を設けて、切り替えて洗浄液101の再生を行うことが可能である。複数の洗浄槽11を必要とする場合、洗浄システム1はより効率的なシステムとして構成することが可能となる。また、洗浄槽11と再生槽35及びバッファ槽51等とは、離して置くことが可能なので、製造ライン等のレイアウトの自由度が高められる。   Further, since the cooling device 33 is disposed in the regeneration circulation line 55 of the cleaning system 1, the cleaning liquid 101 that has passed through the cooling device 33 can be safely transferred to a relatively long distance. As a result, the one set of the regeneration tank 35 and the buffer tank 51 can be connected to the plurality of cleaning tanks 11 and switched to regenerate the cleaning liquid 101 with a time difference. When a plurality of cleaning tanks 11 are required, the cleaning system 1 can be configured as a more efficient system. Moreover, since the washing tank 11, the regeneration tank 35, the buffer tank 51, and the like can be placed apart from each other, the degree of freedom in the layout of the production line and the like is increased.

本発明の実施例2に係る洗浄システム及び洗浄液循環方法について、図3及び図4を参照しながら説明する。図3は洗浄システムを模式的に示す構成図である。図4は洗浄システムの予備加熱装置を模式的に示す構成図である。洗浄循環ラインはフィルタを通り、再生循環ラインは予備加熱装置が接続されている点が、実施例1とは異なる。以下、実施例1と同一構成部分には同一の符号を付して、その説明は省略し、異なる構成部分について説明する。   A cleaning system and a cleaning liquid circulation method according to Embodiment 2 of the present invention will be described with reference to FIGS. FIG. 3 is a configuration diagram schematically showing the cleaning system. FIG. 4 is a configuration diagram schematically showing a preheating device of the cleaning system. The cleaning circulation line passes through the filter, and the regeneration circulation line is different from the first embodiment in that a preheating device is connected. In the following, the same components as those in the first embodiment are denoted by the same reference numerals, description thereof will be omitted, and different components will be described.

図3に示すように、洗浄システム2は、洗浄液101を収容する洗浄槽11と、洗浄槽11の排出口と洗浄槽11の導入口との間に、順に、第1の加熱手段である加熱装置21とフィルタ25とを有する洗浄循環ライン71と、洗浄槽11の排出口と洗浄槽11の導入口との間に、順に、冷却装置33、洗浄液101の硫酸濃度を所定の濃度に高める再生槽35、冷却装置41、バッファ槽51、及び第2の加熱手段である予備加熱装置73を有する再生循環ライン75とを備えている。   As shown in FIG. 3, the cleaning system 2 includes heating that is a first heating unit in order between the cleaning tank 11 that stores the cleaning liquid 101, and the discharge port of the cleaning tank 11 and the introduction port of the cleaning tank 11. Regeneration in which the sulfuric acid concentration of the cooling device 33 and the cleaning liquid 101 is increased to a predetermined concentration in order between the cleaning circulation line 71 having the apparatus 21 and the filter 25, and the discharge port of the cleaning tank 11 and the introduction port of the cleaning tank 11. A tank 35, a cooling device 41, a buffer tank 51, and a regeneration circulation line 75 having a preheating device 73 as a second heating means are provided.

洗浄循環ライン71は、実施例1の洗浄システム1の洗浄循環ライン29と比較して異なる点において、バイパスライン28を除去し、更にフィルタ25の直前に配置されたバルブ23を除去した構成である。   The cleaning circulation line 71 is different from the cleaning circulation line 29 of the cleaning system 1 of the first embodiment in that the bypass line 28 is removed and the valve 23 disposed immediately before the filter 25 is removed. .

再生循環ライン75は、実施例1の洗浄システム1の再生循環ライン55と比較して異なる点において、ポンプ53の送出側が、予備加熱装置73を介して、洗浄槽11下部の内槽13の導入口に配管されている。予備加熱装置73は、加熱された洗浄液101を送り出すので洗浄槽11に近接して配置される。   The regeneration circulation line 75 differs from the regeneration circulation line 55 of the cleaning system 1 of the first embodiment in that the delivery side of the pump 53 introduces the inner tank 13 below the cleaning tank 11 via the preheating device 73. It is piped to the mouth. Since the preheating device 73 sends out the heated cleaning liquid 101, the preheating device 73 is disposed in the vicinity of the cleaning tank 11.

図4に示すように、予備加熱装置73は、再生循環ライン75から洗浄液101を導入する導入口を有する昇温槽77と、昇温槽77に配管された排出口、ポンプ81、バルブ83、及び加熱装置79を順に通り、昇温槽77に配管された導入口に戻る加熱循環ライン87とを備えている。加熱循環ライン87は、ポンプ81とバルブ83との間で分岐されて、バルブ85及び再生循環ライン75を介して、洗浄槽11へ接続されている。   As shown in FIG. 4, the preheating device 73 includes a heating tank 77 having an introduction port for introducing the cleaning liquid 101 from the regeneration circulation line 75, a discharge port piped to the heating tank 77, a pump 81, a valve 83, And a heating circulation line 87 that passes through the heating device 79 in order and returns to the inlet port piped to the temperature raising tank 77. The heating circulation line 87 is branched between the pump 81 and the valve 83 and is connected to the cleaning tank 11 via the valve 85 and the regeneration circulation line 75.

ほぼ室温の洗浄液101は、再生ライン75から昇温槽77に導入された後、ポンプ81で圧力を加えられて、開かれているバルブ83を通り、加熱装置79で加熱され、昇温槽77の導入口に戻される。この洗浄液101を加熱するとき、バルブ85は閉じられている。所定の温度になった洗浄液101は、バルブ85が開かれ、バルブ83が閉じられて、加熱循環ライン87から分岐した再生ライン75を通って、内槽13の導入口に送られる。洗浄液101は、内槽13における洗浄処理に必要な温度にまで高められることが可能である。   After the cleaning liquid 101 at substantially room temperature is introduced from the regeneration line 75 into the heating tank 77, pressure is applied by the pump 81, the heated valve 83 passes through the opened valve 83, and the heating tank 79 is heated. Returned to the entrance. When the cleaning liquid 101 is heated, the valve 85 is closed. The cleaning liquid 101 at a predetermined temperature is sent to the inlet of the inner tank 13 through the regeneration line 75 branched from the heating circulation line 87 with the valve 85 opened and the valve 83 closed. The cleaning liquid 101 can be raised to a temperature necessary for the cleaning process in the inner tank 13.

次に、洗浄循環、再生循環、及びこれら両循環の間に行われる洗浄液101の加熱のための循環を加えて、洗浄システム3の全体の洗浄液循環方法を、図2に示すフローチャートを基に、異なる部分を説明する。   Next, a cleaning circulation, a regeneration circulation, and a circulation for heating the cleaning liquid 101 performed between these two circulations are added, and the entire cleaning liquid circulation method of the cleaning system 3 is based on the flowchart shown in FIG. The different parts will be explained.

図2に示すステップS11と同様に、フィルタ25を通る洗浄循環ライン71を稼働させて、洗浄液101は、外槽14と内槽13との間で循環され、低下の方向に動く温度を加熱装置21により加熱して、一定温度に管理される(ステップS11)。再生循環ライン75にあるバルブ16、及びバルブ31は閉じている。   As in step S11 shown in FIG. 2, the cleaning circulation line 71 passing through the filter 25 is operated, and the cleaning liquid 101 is circulated between the outer tank 14 and the inner tank 13, and the temperature that moves in the decreasing direction is heated. It is heated by 21 and managed at a constant temperature (step S11). The valve 16 and the valve 31 in the regeneration circulation line 75 are closed.

ステップS15と同様に、再生する必要がある場合、内槽13と外槽14の洗浄液101を冷却装置33により冷却後、再生槽35に移送する(ステップS15)。洗浄循環ライン71にあるバルブ19は閉じ、再生循環ライン75にあるバルブ16、及びバルブ31は開く。   As in step S15, when it is necessary to regenerate, the cleaning liquid 101 in the inner tank 13 and the outer tank 14 is cooled by the cooling device 33 and then transferred to the regeneration tank 35 (step S15). The valve 19 in the cleaning circulation line 71 is closed, and the valve 16 and the valve 31 in the regeneration circulation line 75 are opened.

ステップS18とは少し異なり、バッファ槽51でほぼ室温に保持されて、洗浄液101を予備加熱装置73を介して、内槽13に移す(ステップS18a)。洗浄液101は、例えば、ほぼ洗浄処理に必要な温度にまで高められる。   A little different from step S18, it is kept at about room temperature in the buffer tank 51, and the cleaning liquid 101 is transferred to the inner tank 13 via the preheating device 73 (step S18a). For example, the cleaning liquid 101 is raised to a temperature substantially necessary for the cleaning process.

ステップS19とは少し異なり、バルブ16、及びバルブ31を閉じて、バルブ19を開いた後、洗浄循環ライン71を稼働させて、加熱装置21により洗浄液101の昇温または調整を行う(ステップS19a)。   A little different from step S19, the valve 16 and the valve 31 are closed and the valve 19 is opened, then the cleaning circulation line 71 is operated, and the heating device 21 raises or adjusts the cleaning liquid 101 (step S19a). .

上述したように、洗浄システム2は、実施例1の洗浄システム1と比較して、予備加熱装置73を有して、加熱された洗浄液101が洗浄槽11に導入されるので、バイパスライン28が不要となっている。再生した洗浄液101を予備加熱装置73によりほぼ洗浄処理に必要な温度にまで高められるので、洗浄循環ライン71により所定の温度に到達する時間は大幅に短縮可能である。その他は、ほとんど同様な構成となっており、洗浄システム2は、洗浄システム1が有する効果を同様に有している。   As described above, the cleaning system 2 includes the preheating device 73 as compared with the cleaning system 1 of the first embodiment, and the heated cleaning liquid 101 is introduced into the cleaning tank 11. It is unnecessary. Since the regenerated cleaning liquid 101 is raised to a temperature substantially necessary for the cleaning process by the preheating device 73, the time for reaching the predetermined temperature by the cleaning circulation line 71 can be greatly shortened. The rest of the configuration is almost the same, and the cleaning system 2 has the same effects as the cleaning system 1.

以上、本発明は上記実施例に限定されるものではなく、本発明の要旨を逸脱しない範囲内で種々変形して実施することができる。   As mentioned above, this invention is not limited to the said Example, In the range which does not deviate from the summary of this invention, it can change and implement variously.

例えば、本実施例では、洗浄液がSPM洗浄液である例を示したが、他の洗浄等に使われる水を含む組成の異なる処理液であっても可能である。この場合、他の処理液は、循環して使用され、処理温度より高温で石英ガラスを有する高温加熱槽(再生槽)内で、例えば、再生処理がなされる。   For example, in the present embodiment, an example in which the cleaning liquid is an SPM cleaning liquid has been described, but a processing liquid having a different composition including water used for other cleaning or the like is also possible. In this case, other processing liquids are used in a circulating manner, and, for example, regeneration processing is performed in a high-temperature heating tank (regeneration tank) having quartz glass at a temperature higher than the processing temperature.

本発明は、以下の付記に記載されているような構成が考えられる。
(付記1) 第1の薬液及び第2の薬液が含まれる洗浄液を収容する洗浄槽と、加熱された前記洗浄液が、前記洗浄槽の排出口から排出され、第1の加熱手段を通過して、濾過手段を通過して、前記洗浄槽の導入口に戻される洗浄循環ラインと、前記洗浄液が、前記洗浄槽の排出口から排出され、第1の冷却手段を通過した後、加熱することにより前記第1の薬液の濃度を所定の濃度に高める再生槽の導入口に導入され、前記再生槽の排出口から排出され、第2の冷却手段を通過して、バッファ槽に貯留され、前記バッファ槽から、前記洗浄槽の導入口に接近して配置された第2の加熱手段を通過して、前記洗浄槽の導入口に戻される再生循環ラインとを有する洗浄システム。
The present invention can be configured as described in the following supplementary notes.
(Additional remark 1) The washing tank which accommodates the washing | cleaning liquid containing a 1st chemical | medical solution and a 2nd chemical | medical solution, and the said heated washing | cleaning liquid are discharged | emitted from the discharge port of the said washing tank, and pass a 1st heating means. The cleaning circulation line that passes through the filtering means and is returned to the inlet of the cleaning tank, and the cleaning liquid is discharged from the outlet of the cleaning tank, passes through the first cooling means, and then heated. The first chemical solution is introduced into an introduction port of the regeneration tank that raises the concentration to a predetermined concentration, is discharged from the discharge port of the regeneration tank, passes through a second cooling means, is stored in the buffer tank, and is stored in the buffer tank. A cleaning system having a regeneration circulation line that passes through a second heating means disposed close to the inlet of the cleaning tank and returned to the inlet of the cleaning tank.

(付記2) 前記バッファ槽は、ほぼ室温に保持される付記1に記載の洗浄システム。 (Additional remark 2) The said buffer tank is a washing | cleaning system of Additional remark 1 maintained at substantially room temperature.

(付記3) 前記第2の加熱手段は、昇温槽、ポンプ、及び加熱装置を有する加熱循環ラインをなしている付記1に記載の洗浄システム。 (Additional remark 3) The said 2nd heating means is a washing | cleaning system of Additional remark 1 which has comprised the heating circulation line which has a temperature rising tank, a pump, and a heating apparatus.

本発明の実施例1に係る洗浄システムを模式的に示す構成図。BRIEF DESCRIPTION OF THE DRAWINGS The block diagram which shows typically the washing | cleaning system which concerns on Example 1 of this invention. 本発明の実施例1に係る洗浄液循環方法の概略手順を示すフローチャート。The flowchart which shows the schematic procedure of the washing | cleaning-liquid circulation method which concerns on Example 1 of this invention. 本発明の実施例2に係る洗浄システムを模式的に示す構成図。The block diagram which shows typically the washing | cleaning system which concerns on Example 2 of this invention. 本発明の実施例2に係る洗浄システムの予備加熱装置を模式的に示す構成図。The block diagram which shows typically the preheating apparatus of the washing | cleaning system which concerns on Example 2 of this invention.

符号の説明Explanation of symbols

1、2 洗浄システム
11 洗浄槽
13 内槽
14 外槽
16、19、23、27、31、83、85 バルブ
17、53、81 ポンプ
21、79 加熱装置
25 フィルタ
28 バイパスライン
29、71 洗浄循環ライン
33、41 冷却装置
35 再生槽
51 バッファ槽
55、75 再生循環ライン
73 予備加熱装置
77 昇温槽
87 加熱循環ライン
101 洗浄液
1, 2 Cleaning system 11 Cleaning tank 13 Inner tank 14 Outer tank 16, 19, 23, 27, 31, 83, 85 Valve 17, 53, 81 Pump 21, 79 Heating device 25 Filter 28 Bypass line 29, 71 Cleaning circulation line 33, 41 Cooling device 35 Regeneration tank 51 Buffer tank 55, 75 Regeneration circulation line 73 Preheating device 77 Temperature raising tank 87 Heating circulation line 101 Cleaning liquid

Claims (5)

第1の薬液及び第2の薬液が含まれる洗浄液を収容する洗浄槽と、
前記洗浄液が、前記洗浄槽の排出口から排出され、加熱手段を通過して、切り替えて使用される濾過手段またはバイパス手段を通過して、前記洗浄槽の導入口に戻される洗浄循環ラインと、
前記洗浄液が、前記洗浄槽の排出口から排出され、第1の冷却手段を通過した後、加熱することにより前記第1の薬液の濃度を所定の濃度に高める再生槽の導入口に導入され、前記再生槽の排出口から排出され、第2の冷却手段を通過して、バッファ槽に貯留され、前記バッファ槽から前記洗浄槽の導入口に戻される再生循環ラインと、
を有することを特徴とする洗浄システム。
A cleaning tank containing a cleaning liquid containing the first chemical liquid and the second chemical liquid;
The cleaning liquid is discharged from the outlet of the cleaning tank, passes through the heating means, passes through the filtering means or bypass means that is used by switching, and is returned to the inlet of the cleaning tank, and a cleaning circulation line;
The cleaning liquid is discharged from the outlet of the cleaning tank, and after passing through the first cooling means, is introduced into the inlet of the regeneration tank that raises the concentration of the first chemical liquid to a predetermined concentration by heating, A regeneration circulation line that is discharged from the discharge port of the regeneration tank, passes through the second cooling means, is stored in the buffer tank, and is returned from the buffer tank to the introduction port of the cleaning tank;
A cleaning system comprising:
第1の薬液及び第2の薬液が含まれる洗浄液を収容する洗浄槽と、
加熱された前記洗浄液が、前記洗浄槽の排出口から排出され、第1の加熱手段を通過して、濾過手段を通過して、前記洗浄槽の導入口に戻される洗浄循環ラインと、
前記洗浄液が、前記洗浄槽の排出口から排出され、第1の冷却手段を通過した後、加熱することにより前記第1の薬液の濃度を所定の濃度に高める再生槽の導入口に導入され、前記再生槽の排出口から排出され、第2の冷却手段を通過して、バッファ槽に貯留され、前記バッファ槽から、前記洗浄槽の導入口に接近して配置された第2の加熱手段を通過して、前記洗浄槽の導入口に戻される再生循環ラインと、
を有することを特徴とする洗浄システム。
A cleaning tank containing a cleaning liquid containing the first chemical liquid and the second chemical liquid;
The heated cleaning liquid is discharged from the discharge outlet of the cleaning tank, passes through the first heating means, passes through the filtering means, and is returned to the inlet of the cleaning tank; and
The cleaning liquid is discharged from the outlet of the cleaning tank, and after passing through the first cooling means, is introduced into the inlet of the regeneration tank that raises the concentration of the first chemical liquid to a predetermined concentration by heating, The second heating means that is discharged from the discharge port of the regeneration tank, passes through the second cooling means, is stored in the buffer tank, and is disposed close to the inlet of the cleaning tank from the buffer tank. A regeneration circulation line that passes through and is returned to the inlet of the washing tank;
A cleaning system comprising:
前記第1の薬液は硫酸であり、前記第2の薬液は過酸化水素水であることを特徴とする請求項1または2に記載の洗浄システム。   The cleaning system according to claim 1 or 2, wherein the first chemical solution is sulfuric acid and the second chemical solution is hydrogen peroxide solution. 第1の薬液及び第2の薬液が含まれる洗浄液を、洗浄槽から排出して、加熱手段と濾過手段とを通して前記洗浄槽に戻す循環を行い、室温より高い洗浄処理温度で洗浄処理を行う工程と、
前記第1の薬液の濃度が低下した前記洗浄液を第1の冷却手段で冷却した後に再生槽に移し、前記再生槽において、前記洗浄処理温度より高温で前記第1の薬液の濃度を所定の濃度に高めて前記洗浄液を再生する工程と、
再生された前記洗浄液を第2の冷却手段で冷却してバッファ槽に移し、再生された前記洗浄液を前記バッファ槽から前記洗浄槽に移す工程と、
再生された前記洗浄液を前記洗浄槽から排出して、前記加熱手段と前記濾過手段を迂回したバイパス手段とを通して前記洗浄槽に戻す循環を行い前記洗浄処理温度に高める工程と、
を有することを特徴とする洗浄液循環方法。
A step of discharging the cleaning liquid containing the first chemical liquid and the second chemical liquid from the cleaning tank, returning the cleaning liquid to the cleaning tank through the heating means and the filtering means, and performing the cleaning process at a cleaning process temperature higher than room temperature. When,
The cleaning liquid in which the concentration of the first chemical liquid is lowered is cooled by a first cooling means and then transferred to a regeneration tank. In the regeneration tank, the concentration of the first chemical liquid is set to a predetermined concentration at a temperature higher than the cleaning processing temperature. And regenerating the cleaning liquid to a high level,
Cooling the regenerated cleaning liquid with a second cooling means and transferring it to a buffer tank; and transferring the regenerated cleaning liquid from the buffer tank to the cleaning tank;
Discharging the regenerated cleaning liquid from the cleaning tank and circulating it back to the cleaning tank through the heating means and bypass means bypassing the filtering means to raise the cleaning treatment temperature;
A cleaning liquid circulation method characterized by comprising:
第1の薬液及び第2の薬液が含まれる洗浄液を、洗浄槽から排出して、第1の加熱手段と濾過手段とを通して前記洗浄槽に戻す循環を行い、室温より高い洗浄処理温度で洗浄処理を行う工程と、
前記第1の薬液の濃度が低下した前記洗浄液を第1の冷却手段で冷却した後に再生槽に移し、前記再生槽において、前記洗浄処理温度より高温で前記第1の薬液の濃度を所定の濃度に高めて前記洗浄液を再生する工程と、
再生された前記洗浄液を第2の冷却手段で冷却してバッファ槽に移し、再生された前記洗浄液を、第2の加熱手段を介して、前記バッファ槽から前記洗浄槽に移す工程と、
を有することを特徴とする洗浄液循環方法。
The cleaning liquid containing the first chemical liquid and the second chemical liquid is discharged from the cleaning tank and circulated back to the cleaning tank through the first heating means and the filtering means, and the cleaning process is performed at a cleaning temperature higher than room temperature. A process of performing
The cleaning liquid in which the concentration of the first chemical liquid is lowered is cooled by a first cooling means and then transferred to a regeneration tank. In the regeneration tank, the concentration of the first chemical liquid is set to a predetermined concentration at a temperature higher than the cleaning processing temperature. And regenerating the cleaning liquid to a high level,
Cooling the regenerated cleaning liquid with a second cooling means and transferring it to a buffer tank; and transferring the regenerated cleaning liquid from the buffer tank to the cleaning tank via a second heating means;
A cleaning liquid circulation method characterized by comprising:
JP2008178456A 2008-07-08 2008-07-08 Cleaning system and method for circulating cleaning fluid Pending JP2010021215A (en)

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