JP2009532690A - 形状を測定/認識する方法 - Google Patents
形状を測定/認識する方法 Download PDFInfo
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- JP2009532690A JP2009532690A JP2009503604A JP2009503604A JP2009532690A JP 2009532690 A JP2009532690 A JP 2009532690A JP 2009503604 A JP2009503604 A JP 2009503604A JP 2009503604 A JP2009503604 A JP 2009503604A JP 2009532690 A JP2009532690 A JP 2009532690A
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- 238000000034 method Methods 0.000 title claims abstract description 47
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/10—Investigating individual particles
- G01N15/14—Optical investigation techniques, e.g. flow cytometry
- G01N15/1429—Signal processing
- G01N15/1433—Signal processing using image recognition
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/50—Depth or shape recovery
- G06T7/55—Depth or shape recovery from multiple images
- G06T7/586—Depth or shape recovery from multiple images from multiple light sources, e.g. photometric stereo
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/10—Investigating individual particles
- G01N15/14—Optical investigation techniques, e.g. flow cytometry
- G01N15/1468—Optical investigation techniques, e.g. flow cytometry with spatial resolution of the texture or inner structure of the particle
- G01N2015/1472—Optical investigation techniques, e.g. flow cytometry with spatial resolution of the texture or inner structure of the particle with colour
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/10—Investigating individual particles
- G01N15/14—Optical investigation techniques, e.g. flow cytometry
- G01N2015/1497—Particle shape
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- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Theoretical Computer Science (AREA)
- Dispersion Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Signal Processing (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Testing Of Coins (AREA)
- Polarising Elements (AREA)
- Measurement Of The Respiration, Hearing Ability, Form, And Blood Characteristics Of Living Organisms (AREA)
Abstract
Description
Claims (12)
- 2つの異なる方向から測定対象物に向けられている少なくとも2つの電磁振動(1,2)と、照射されている対象物の画像をデジタル形式において撮像するための手段(3)とを用いる形状を測定/認識する方法において、
デジタル形式における上記画像の画像マトリクスを、画素ごとに読み取り、
2つの異なる方向からの上記電磁振動の強さの値を互いに比較し、
それぞれの画素における2つの波長の強さの値の差に、読み取り方向に対してすぐ前にある画素の対応する差を加えることを特徴とする形状を測定/認識する方法。 - 2つの異なる方向にある電磁放射線の波長は、基本的に同一であることを特徴とする請求項1に記載の形状を測定/認識する方法。
- 2つの異なる方向にある電磁放射線の波長は、異なることを特徴とする請求項1に記載の形状を測定/認識する方法。
- デジタル形式における画像の画像マトリクスの読み取りは、1つの画素について、一対の光源の方向に対して同時に実行されることを特徴とする請求項1に記載の形状を測定/認識する方法。
- 表面の隆起、陥没、または平面形状を、上記強さの値間の差から決定することを特徴とする請求項1に記載の形状を測定/認識する方法。
- 少なくとも2つの可視光の波長を、形状を明確にする対象物のイメージングに用いることを特徴とする請求項1に記載の形状を測定/認識する方法。
- 形状を明確にする対象物のイメージングにおいて、赤色、青色、および緑色の群のうち、少なくとも2つを組み合わせた光を用いることを特徴とする請求項1〜6のいずれか1項に記載の形状を測定/認識する方法。
- 形状を明確にする対象物のイメージングにおいて、赤色、青色、および緑色の対象物の画像を同時に撮像する手段である、いわゆるデジタルカメラを用いることを特徴とする請求項1〜7のいずれか1項に記載の形状を測定/認識する方法。
- カメラの方向に対して照射されている個々の電磁振動を、対象物の全体画像を撮像するために用いることを特徴とする請求項1〜8のいずれか1項に記載の形状を測定/認識する方法。
- 上記全体画像を、対象物の3次元画像プログラムの作成に用いることを特徴とする請求項9に記載の形状を測定/認識する方法。
- 請求項1〜10のいずれか1項に記載の形状を測定/認識する方法を、粒子サイズを測定するために用いる方法であって、
少なくとも3つの画素の配置が粒子表面に基づいて決定され、かつ、粒子サイズが上記画素に近似であることを特徴とする方法。 - ミラー、プリズム、フィルタ、偏光器、およびそれらに類する手段を、電磁放射線に作用させるために用いることを特徴とする請求項1〜11のいずれか1項に記載の形状を測定/認識する方法。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI20060331A FI20060331A0 (fi) | 2006-04-05 | 2006-04-05 | Menetelmä ja laitteisto muodon mittauksen/tunnistukseen |
PCT/FI2007/000085 WO2007113377A1 (en) | 2006-04-05 | 2007-04-05 | Method for measuring/recognizing a shape |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2009532690A true JP2009532690A (ja) | 2009-09-10 |
Family
ID=36293730
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2009503604A Pending JP2009532690A (ja) | 2006-04-05 | 2007-04-05 | 形状を測定/認識する方法 |
Country Status (8)
Country | Link |
---|---|
US (1) | US20100128990A1 (ja) |
EP (1) | EP2032938B1 (ja) |
JP (1) | JP2009532690A (ja) |
CN (1) | CN101438129A (ja) |
AT (1) | ATE541273T1 (ja) |
CA (1) | CA2648381A1 (ja) |
FI (1) | FI20060331A0 (ja) |
WO (1) | WO2007113377A1 (ja) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20130342684A1 (en) * | 2011-01-19 | 2013-12-26 | Teknologian Tutkimuskeskus Vtt | Method and System for Determining Particle Size Information |
CN102798583B (zh) * | 2012-07-13 | 2014-07-30 | 长安大学 | 一种基于改进的ferret的矿岩块度测量方法 |
JP2014163690A (ja) * | 2013-02-21 | 2014-09-08 | Mitsutoyo Corp | 形状測定装置 |
WO2014160510A2 (en) * | 2013-03-13 | 2014-10-02 | Massachusetts Institute Of Technology | Photometric stereo endoscopy |
CN107341808B (zh) * | 2017-06-08 | 2020-08-18 | 沈阳理工大学 | 基于车辙图像的模拟月壤硬度视觉检测系统及测量方法 |
CN111553358B (zh) * | 2019-12-12 | 2020-11-13 | 电子科技大学中山学院 | 包含图案标识的产品功能耐久性测试自学习方法 |
CN111664815A (zh) * | 2020-06-12 | 2020-09-15 | 云谷(固安)科技有限公司 | 半导体膜层上凸峰高度的测量方法及测量装置 |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
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JPS5952735A (ja) * | 1982-09-20 | 1984-03-27 | Kawasaki Steel Corp | 熱間鋼片の表面欠陥検出方法 |
JPH0682389A (ja) * | 1992-09-03 | 1994-03-22 | Nippon Steel Corp | 表面欠陥検出方法 |
JPH06269589A (ja) * | 1993-03-18 | 1994-09-27 | Juki Corp | 布端検出装置 |
JPH11148807A (ja) * | 1997-07-29 | 1999-06-02 | Toshiba Corp | バンプ高さ測定方法及びバンプ高さ測定装置 |
JPH11287628A (ja) * | 1998-04-02 | 1999-10-19 | Omron Corp | 高さ測定装置および高さ測定方法および観測装置 |
JP2003215055A (ja) * | 2002-01-24 | 2003-07-30 | Mitsubishi Materials Corp | 検査装置 |
JP2003269931A (ja) * | 2002-03-13 | 2003-09-25 | Rozefu Technol:Kk | 欠陥の立体形状検出装置 |
JP2005037203A (ja) * | 2003-07-18 | 2005-02-10 | Seiwa Electric Mfg Co Ltd | 棒状物体の検査装置及び検査方法 |
Family Cites Families (15)
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FI493A (fi) | 1894-01-13 | Maskin för tillverkning av trådrullor, spolar och bobiner | ||
US5239358A (en) | 1991-02-12 | 1993-08-24 | Hajime Industries | Powder material inspection apparatus |
US5402234A (en) * | 1992-08-31 | 1995-03-28 | Zygo Corporation | Method and apparatus for the rapid acquisition of data in coherence scanning interferometry |
US6028672A (en) | 1996-09-30 | 2000-02-22 | Zheng J. Geng | High speed three dimensional imaging method |
DE19528513A1 (de) * | 1995-08-03 | 1997-02-06 | Haeusler Gerd | Verfahren zur berührungslosen, schnellen und genauen Erfassung der Oberflächengestalt von Objekten |
US6122043A (en) | 1996-06-06 | 2000-09-19 | Gn Nettest (New York) Inc. | Method and apparatus for electrically reducing coherence/polarization noise in reflectometers |
JP3605627B2 (ja) | 1996-06-21 | 2004-12-22 | エーザイ株式会社 | 造粒物の粒径測定装置 |
SE511985C2 (sv) * | 1999-01-28 | 2000-01-10 | Skogsind Tekn Foskningsinst | Topografisk bestämning av en av infallande ljus belyst yta |
DE19962779B4 (de) | 1999-12-23 | 2009-06-25 | Byk-Gardner Gmbh | Vorrichtung zur quantifizierten Bestimmung der Qualität von Oberflächen |
US6556706B1 (en) | 2000-01-28 | 2003-04-29 | Z. Jason Geng | Three-dimensional surface profile imaging method and apparatus using single spectral light condition |
PE20030956A1 (es) | 2002-01-23 | 2003-12-31 | Market Demand Trading 13 Proprietary Ltd | Metodo y aparato para analizar y obtener informacion de un mineral granular |
CN1320334C (zh) * | 2002-03-14 | 2007-06-06 | 泰勒·霍布森有限公司 | 表面成型设备和获得数据方法,数据处理设备及其相关器 |
JP3889992B2 (ja) * | 2002-05-17 | 2007-03-07 | 株式会社ミツトヨ | リング照明装置 |
US6974964B1 (en) | 2002-06-17 | 2005-12-13 | Bu-Chin Wang | Method and apparatus for three-dimensional surface scanning and measurement of a moving object |
WO2005027015A2 (en) * | 2003-09-10 | 2005-03-24 | Bioimagene, Inc. | Method and system for quantitatively analyzing biological samples |
-
2006
- 2006-04-05 FI FI20060331A patent/FI20060331A0/fi not_active Application Discontinuation
-
2007
- 2007-04-05 CA CA002648381A patent/CA2648381A1/en not_active Abandoned
- 2007-04-05 EP EP07730554A patent/EP2032938B1/en not_active Not-in-force
- 2007-04-05 CN CNA2007800163596A patent/CN101438129A/zh active Pending
- 2007-04-05 JP JP2009503604A patent/JP2009532690A/ja active Pending
- 2007-04-05 WO PCT/FI2007/000085 patent/WO2007113377A1/en active Application Filing
- 2007-04-05 US US12/295,897 patent/US20100128990A1/en not_active Abandoned
- 2007-04-05 AT AT07730554T patent/ATE541273T1/de active
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5952735A (ja) * | 1982-09-20 | 1984-03-27 | Kawasaki Steel Corp | 熱間鋼片の表面欠陥検出方法 |
JPH0682389A (ja) * | 1992-09-03 | 1994-03-22 | Nippon Steel Corp | 表面欠陥検出方法 |
JPH06269589A (ja) * | 1993-03-18 | 1994-09-27 | Juki Corp | 布端検出装置 |
JPH11148807A (ja) * | 1997-07-29 | 1999-06-02 | Toshiba Corp | バンプ高さ測定方法及びバンプ高さ測定装置 |
JPH11287628A (ja) * | 1998-04-02 | 1999-10-19 | Omron Corp | 高さ測定装置および高さ測定方法および観測装置 |
JP2003215055A (ja) * | 2002-01-24 | 2003-07-30 | Mitsubishi Materials Corp | 検査装置 |
JP2003269931A (ja) * | 2002-03-13 | 2003-09-25 | Rozefu Technol:Kk | 欠陥の立体形状検出装置 |
JP2005037203A (ja) * | 2003-07-18 | 2005-02-10 | Seiwa Electric Mfg Co Ltd | 棒状物体の検査装置及び検査方法 |
Also Published As
Publication number | Publication date |
---|---|
EP2032938A1 (en) | 2009-03-11 |
ATE541273T1 (de) | 2012-01-15 |
EP2032938B1 (en) | 2012-01-11 |
WO2007113377A1 (en) | 2007-10-11 |
CA2648381A1 (en) | 2007-10-11 |
EP2032938A4 (en) | 2010-10-06 |
FI20060331A0 (fi) | 2006-04-05 |
US20100128990A1 (en) | 2010-05-27 |
CN101438129A (zh) | 2009-05-20 |
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