JP2009530866A5 - - Google Patents

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Publication number
JP2009530866A5
JP2009530866A5 JP2009501587A JP2009501587A JP2009530866A5 JP 2009530866 A5 JP2009530866 A5 JP 2009530866A5 JP 2009501587 A JP2009501587 A JP 2009501587A JP 2009501587 A JP2009501587 A JP 2009501587A JP 2009530866 A5 JP2009530866 A5 JP 2009530866A5
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JP
Japan
Prior art keywords
diffraction
profile
wavelengths
diffraction order
selecting
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JP2009501587A
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English (en)
Japanese (ja)
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JP5096452B2 (ja
JP2009530866A (ja
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Priority claimed from US11/388,265 external-priority patent/US7428060B2/en
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Publication of JP2009530866A5 publication Critical patent/JP2009530866A5/ja
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Publication of JP5096452B2 publication Critical patent/JP5096452B2/ja
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JP2009501587A 2006-03-24 2007-03-20 ２次元構造についての回折次数選択の最適化 Active JP5096452B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11/388,265 US7428060B2 (en) 2006-03-24 2006-03-24 Optimization of diffraction order selection for two-dimensional structures
US11/388,265 2006-03-24
PCT/US2007/007292 WO2007112022A2 (en) 2006-03-24 2007-03-20 Optimization of diffraction order selection for two-dimensional structures

Publications (3)

Publication Number Publication Date
JP2009530866A JP2009530866A (ja) 2009-08-27
JP2009530866A5 true JP2009530866A5 (enExample) 2010-04-22
JP5096452B2 JP5096452B2 (ja) 2012-12-12

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009501587A Active JP5096452B2 (ja) 2006-03-24 2007-03-20 ２次元構造についての回折次数選択の最適化

Country Status (6)

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US (1) US7428060B2 (enExample)
JP (1) JP5096452B2 (enExample)
KR (1) KR101342847B1 (enExample)
CN (1) CN101410692B (enExample)
TW (1) TWI365284B (enExample)
WO (1) WO2007112022A2 (enExample)

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US7515283B2 (en) * 2006-07-11 2009-04-07 Tokyo Electron, Ltd. Parallel profile determination in optical metrology
US20080013107A1 (en) * 2006-07-11 2008-01-17 Tokyo Electron Limited Generating a profile model to characterize a structure to be examined using optical metrology
US7469192B2 (en) * 2006-07-11 2008-12-23 Tokyo Electron Ltd. Parallel profile determination for an optical metrology system
US8040511B1 (en) * 2008-01-29 2011-10-18 Kla-Tencor Corporation Azimuth angle measurement
US9625937B2 (en) * 2008-08-18 2017-04-18 Kla-Tencor Corporation Computation efficiency by diffraction order truncation
US8560270B2 (en) * 2008-12-09 2013-10-15 Tokyo Electron Limited Rational approximation and continued-fraction approximation approaches for computation efficiency of diffraction signals
US20110276319A1 (en) * 2010-05-06 2011-11-10 Jonathan Michael Madsen Determination of material optical properties for optical metrology of structures
US9523800B2 (en) * 2010-05-21 2016-12-20 Kla-Tencor Corporation Computation efficiency by iterative spatial harmonics order truncation
US9239522B2 (en) 2010-10-08 2016-01-19 Kla-Tencor Corporation Method of determining an asymmetric property of a structure
TWI603070B (zh) * 2011-01-03 2017-10-21 諾發測量儀器股份有限公司 使用於複雜之圖案化結構的量測之方法及系統
US8577820B2 (en) * 2011-03-04 2013-11-05 Tokyo Electron Limited Accurate and fast neural network training for library-based critical dimension (CD) metrology
US9127927B2 (en) 2011-12-16 2015-09-08 Kla-Tencor Corporation Techniques for optimized scatterometry
US8762100B1 (en) * 2012-02-10 2014-06-24 Tokyo Electron Limited Numerical aperture integration for optical critical dimension (OCD) metrology
US10255385B2 (en) 2012-03-28 2019-04-09 Kla-Tencor Corporation Model optimization approach based on spectral sensitivity
US10386729B2 (en) 2013-06-03 2019-08-20 Kla-Tencor Corporation Dynamic removal of correlation of highly correlated parameters for optical metrology
US11175589B2 (en) 2013-06-03 2021-11-16 Kla Corporation Automatic wavelength or angle pruning for optical metrology
US10481088B2 (en) 2013-06-04 2019-11-19 Kla-Tencor Corporation Automatic determination of fourier harmonic order for computation of spectral information for diffraction structures
US10895810B2 (en) 2013-11-15 2021-01-19 Kla Corporation Automatic selection of sample values for optical metrology
US9588066B2 (en) 2014-01-23 2017-03-07 Revera, Incorporated Methods and systems for measuring periodic structures using multi-angle X-ray reflectance scatterometry (XRS)
US10185303B2 (en) * 2015-02-21 2019-01-22 Kla-Tencor Corporation Optimizing computational efficiency by multiple truncation of spatial harmonics
JP6377582B2 (ja) * 2015-08-06 2018-08-22 株式会社リガク Ｘ線分析の操作ガイドシステム、操作ガイド方法、及び操作ガイドプログラム
CN105674909B (zh) * 2015-12-31 2018-06-26 天津市兆瑞测控技术有限公司 一种高精度二维轮廓测量方法

Family Cites Families (12)

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Publication number Priority date Publication date Assignee Title
US5671050A (en) * 1994-11-07 1997-09-23 Zygo Corporation Method and apparatus for profiling surfaces using diffracative optics
IL130874A (en) * 1999-07-09 2002-12-01 Nova Measuring Instr Ltd System and method for measuring pattern structures
US6891626B2 (en) * 2000-01-26 2005-05-10 Timbre Technologies, Inc. Caching of intra-layer calculations for rapid rigorous coupled-wave analyses
US6943900B2 (en) * 2000-09-15 2005-09-13 Timbre Technologies, Inc. Generation of a library of periodic grating diffraction signals
US6913900B2 (en) * 2001-08-29 2005-07-05 Nippon Zoki Pharmaceutical Co., Ltd. Plasma prekallikrein activation and kallikrein production assay
US7330279B2 (en) * 2002-07-25 2008-02-12 Timbre Technologies, Inc. Model and parameter selection for optical metrology
US7427521B2 (en) * 2002-10-17 2008-09-23 Timbre Technologies, Inc. Generating simulated diffraction signals for two-dimensional structures
US20040090629A1 (en) * 2002-11-08 2004-05-13 Emmanuel Drege Diffraction order selection for optical metrology simulation
US7630873B2 (en) * 2003-02-26 2009-12-08 Tokyo Electron Limited Approximating eigensolutions for use in determining the profile of a structure formed on a semiconductor wafer
US7064829B2 (en) * 2003-03-20 2006-06-20 Timbre Technologies, Inc. Generic interface for an optical metrology system
US7388677B2 (en) * 2004-03-22 2008-06-17 Timbre Technologies, Inc. Optical metrology optimization for repetitive structures
US7321426B1 (en) * 2004-06-02 2008-01-22 Kla-Tencor Technologies Corporation Optical metrology on patterned samples

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