JP2009214271A - Abrading tool for abrading apparatus, and grinding method - Google Patents

Abrading tool for abrading apparatus, and grinding method Download PDF

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JP2009214271A
JP2009214271A JP2008062973A JP2008062973A JP2009214271A JP 2009214271 A JP2009214271 A JP 2009214271A JP 2008062973 A JP2008062973 A JP 2008062973A JP 2008062973 A JP2008062973 A JP 2008062973A JP 2009214271 A JP2009214271 A JP 2009214271A
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polishing
tool
inner diameter
glass substrate
polished
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JP5428171B2 (en
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Masahito Uchida
雅人 内田
Shuji Takato
修二 高東
Mutsumi Asano
睦己 浅野
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Tosoh Corp
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Tosoh Corp
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Abstract

<P>PROBLEM TO BE SOLVED: To solve such a problem that need of repair and process for a polishing material surface is caused due to too small or too large wear amount of an inner diameter of a polishing material, and a glass substrate cannot be polished to a target shape after the glass substrate is polished by a polishing tool having the disc shape polishing material with an inner diameter portion. <P>SOLUTION: In the polishing tool for the polishing apparatus which fixes the disk-shaped polishing material 15d where the inner diameter hole 15c is formed in the center on one face side of a tool retaining disc 15b, and polishes a surface of the polished member that is brought into contact with the polishing material 15d by rotating the tool retaining disc 15b by the polishing apparatus, an inner/outer diameter ratio that is a ratio of an outer diameter to the inner diameter of the inner diameter hole 15c of the disk-shaped polishing material 15d is set to 10% or more and 20% or less. <P>COPYRIGHT: (C)2009,JPO&INPIT

Description

本発明は、ガラス板等の板状被加工物の表面を研磨する研磨装置に用いられる中心部に円形の内径穴の開いた円板状の研磨工具、およびこの研磨工具を用いた研磨方法に関する。   The present invention relates to a disc-shaped polishing tool having a circular inner diameter hole in a central portion used in a polishing apparatus for polishing the surface of a plate-like workpiece such as a glass plate, and a polishing method using the polishing tool. .

液晶ディスプレーの製造に際し、例えばR,G,Bのカラーフィルタのパターン、TFTアレイのパターンは、フォトマスク基板によりガラス基板上に露光されて形成される。このフォトマスク基板は、石英ガラス基板(以下、ガラス基板とする)の表面にマスクを形成したもので、ガラス基板の表面を研磨加工により高平坦度に研磨している。   In manufacturing a liquid crystal display, for example, R, G, and B color filter patterns and a TFT array pattern are formed on a glass substrate by exposure to a photomask substrate. This photomask substrate has a mask formed on the surface of a quartz glass substrate (hereinafter referred to as a glass substrate), and the surface of the glass substrate is polished to a high degree of flatness by polishing.

また、このガラス基板は矩形形状をしており、その表面研磨加工においては、化学機械研磨装置としてのオスカー式研磨機に糸巻き状の研磨軌跡を適用することが提案されている(特許文献1)。   In addition, this glass substrate has a rectangular shape, and in its surface polishing process, it has been proposed to apply a bobbin-shaped polishing locus to an Oscar type polishing machine as a chemical mechanical polishing apparatus (Patent Document 1). .

オスカー式研磨機は、垂直方向に回転軸を有し、該回転軸を中心に回転する下定盤と、前記下定盤に対してその径方向に揺動(往復動)すると共に垂直方向の回転軸を中心に自転する上定盤とを有し、下定盤には被加工物としてのガラス基板を保持し、上定盤には研磨工具を取り付けている。ガラス基板が平面矩形形状の場合、下定盤の1回転で上定盤が4往復動するように同期駆動させ、被加工物であるガラス基板の表面に矩形枠状の研磨軌跡(以下、矩形研磨軌跡と称す)を形成する。   The Oscar-type polishing machine has a rotary shaft in the vertical direction, a lower surface plate that rotates about the rotation shaft, and swings (reciprocates) in the radial direction with respect to the lower surface plate, and a vertical rotation shaft And an upper surface plate that rotates around the upper surface plate, a glass substrate as a workpiece is held on the lower surface plate, and a polishing tool is attached to the upper surface plate. When the glass substrate has a flat rectangular shape, it is driven synchronously so that the upper surface plate reciprocates four times with one rotation of the lower surface plate, and a rectangular frame-shaped polishing locus (hereinafter referred to as rectangular polishing) on the surface of the glass substrate that is the workpiece. Form a trajectory).

研磨工具は、回転砥石としての作用を有し、中心部に円形に開口された内径穴を有する円板形状に形成した研磨材を備えている。   The polishing tool has an abrasive material that has a function as a rotating grindstone and is formed in a disc shape having an inner diameter hole opened in a circular shape at the center.

また、ガラス基板の表面を高平坦度に加工する方法としては、予め測定したガラス基板の表面形状に基づいて、所望する平坦度を得るための研磨(研削)量を求め、この求めた研磨量に従って加工し、表面を目的とする形状に加工する修正加工方法がある。   Further, as a method of processing the surface of the glass substrate to a high flatness, a polishing (grinding) amount for obtaining the desired flatness is obtained based on the surface shape of the glass substrate measured in advance, and the obtained polishing amount There is a correction processing method in which the surface is processed into a desired shape.

そして、このようなガラス基板の表面を高平坦度に加工するための研磨工具としては、内径穴を有する円板形状の研磨材を備えた研磨工具が使用され、研磨工具は被加工物であるガラス基板に対して外周側から中心に向かって研磨軌跡を往復移動させながら自転すると共に、一定圧力をガラス基板に加えながら加工(定圧加工)し、あるいは研磨工具を一定量ずつ降下(切り込み加工)させながら研磨加工を行い、その際研磨剤を研磨工具の研磨材下面である工具面とガラス基板の間に介在させる。
特開2006−062055号公報
And as a polishing tool for processing the surface of such a glass substrate with high flatness, a polishing tool provided with a disc-shaped polishing material having an inner diameter hole is used, and the polishing tool is a workpiece. The glass substrate rotates while reciprocating the polishing path from the outer periphery to the center, and is processed while applying a constant pressure to the glass substrate (constant pressure processing), or the polishing tool is lowered by a certain amount (incision processing). In this case, polishing is performed, and an abrasive is interposed between the tool surface, which is the lower surface of the polishing material of the polishing tool, and the glass substrate.
JP 2006-062055 A

従来、ガラス基板の研磨加工では両面研磨機が使用され、1度に複数枚処理できるなどの利点がある。しかしながら、近年のガラス基板の大サイズ化に伴い装置が非常に大型化し研磨装置そのものが製作困難となっているため、装置サイズが比較的小さくて済むオスカー式研磨機が大型ガラス基板の研磨加工には向いていると言える。   Conventionally, a double-side polishing machine has been used in polishing a glass substrate, and there is an advantage that a plurality of sheets can be processed at a time. However, as the size of glass substrates has increased in size in recent years, the size of the apparatus has become very large, making it difficult to manufacture the polishing apparatus itself. Therefore, an Oscar type polishing machine that requires a relatively small apparatus size is suitable for polishing large glass substrates. Can be said to be suitable.

オスカー式研磨機において、内径穴を有する円板形状の研磨材を備えた研磨工具は、被加工物(被研磨部材)であるガラス基板の回転により予め設定している研磨軌跡上を研磨工具が移動しつつ、研磨工具およびガラス基板が回転する。その際、ガラス基板の表面が研磨されると同時に、研磨工具の工具面が磨耗する。   In an Oscar type polishing machine, a polishing tool provided with a disc-shaped polishing material having an inner diameter hole is formed on a polishing locus set in advance by rotation of a glass substrate which is a workpiece (member to be polished). The polishing tool and the glass substrate rotate while moving. At that time, the surface of the glass substrate is polished, and at the same time, the tool surface of the polishing tool is worn.

被加工物であるガラス基板の研磨量と研磨工具の工具面における磨耗量は、研磨工具と被加工物であるガラス基板との相対速度、被加工物に対する研磨工具の印加圧力、加工時間に比例する。   The amount of polishing of the glass substrate that is the workpiece and the amount of wear on the tool surface of the polishing tool are proportional to the relative speed between the polishing tool and the glass substrate that is the workpiece, the applied pressure of the polishing tool to the workpiece, and the processing time. To do.

また、研磨工具と被加工物であるガラス基板との相対速度は、自転する研磨工具の中心付近は回転速度がゼロに近いため、研磨工具を構成する研磨材の内径穴の直径(内径)が小さい、もしくは内径穴がないと、特に摩耗速度が比較的大きい研磨工具(例えば、鋳鉄製の研磨工具)の場合は、研磨工具の工具面である該研磨材の表面は内周側と外周側とでは磨耗量に差が生じ、研磨工具の工具面の形状(研磨材の形状)が著しく変形するため、工具形状の修正が必要となり、生産効率の低下を招くおそれがある。   In addition, the relative speed between the polishing tool and the glass substrate that is the workpiece is near the center of the rotating polishing tool, and the rotation speed is close to zero. Therefore, the diameter (inner diameter) of the inner diameter hole of the abrasive constituting the polishing tool is In the case of a polishing tool having a relatively small wear rate (for example, a cast iron polishing tool) without a small hole or an inner diameter hole, the surface of the abrasive material, which is the tool surface of the polishing tool, is an inner peripheral side and an outer peripheral side. Therefore, there is a difference in the amount of wear, and the shape of the tool surface of the polishing tool (the shape of the abrasive) is remarkably deformed. Therefore, the tool shape needs to be corrected, and the production efficiency may be reduced.

したがって、内径穴の直径を大きくすれば外周と内周の差が小さくなり、研磨工具の工具形状の変形を少なくすることができるが、研磨に供する工具面の幅が狭くなり、一度に研磨できる面積が小さくなる。特に、例えば1220mm×1400mm、あるいはそれ以上の大サイズのガラス基板の表面を平坦化のために研磨する際に、研磨時間の短縮化を図るためには、研磨工具の工具面の面積をできるだけ大きくすることが望まれている。   Therefore, if the diameter of the inner diameter hole is increased, the difference between the outer periphery and the inner periphery is reduced, and the deformation of the tool shape of the polishing tool can be reduced. However, the width of the tool surface used for polishing is reduced and polishing can be performed at a time. The area becomes smaller. In particular, in order to shorten the polishing time when polishing the surface of a large glass substrate having a size of, for example, 1220 mm × 1400 mm or larger, the area of the tool surface of the polishing tool should be as large as possible. It is hoped to do.

ところで、内径穴を備えた研磨工具によりガラス基板等の被研磨材を研磨すると、図5に示すように、ガラス基板等の被研磨材の表面の一部に突出部が形成される場合があった。なお、図5は、ガラス基板の表面を研磨工具により研磨した実線で示す加工面形状と、破線で示す突出部がないものとして内挿した形状(以下基準形状と称す)を示す。なお、x軸は基板面方向、y軸は基板厚さ方向を示す。   By the way, when a material to be polished such as a glass substrate is polished by a polishing tool having an inner diameter hole, a protrusion may be formed on a part of the surface of the material to be polished such as a glass substrate as shown in FIG. It was. FIG. 5 shows a processed surface shape indicated by a solid line obtained by polishing the surface of the glass substrate with a polishing tool, and a shape (hereinafter referred to as a reference shape) interpolated on the assumption that there is no protrusion indicated by a broken line. The x axis indicates the substrate surface direction, and the y axis indicates the substrate thickness direction.

上記突出部が形成される原因として、研磨工具を例えば揺動させてガラス基板を研磨処理する場合、ガラス基板の表面において、研磨工具の内径穴が通過する部分は、内径穴の通過しない部分に比べて研磨量が少なくなり、結果として該内径穴が通過する部分の基板形状が回りに比べて突出する。このような突出部の生成は、研磨工具の内径穴の直径(内径)が大きくなるに従って顕著となり、特に図2に示す研磨工具の移動幅Lが研磨工具の内径穴の直径よりも狭い範囲の場合に顕著となる。   As a cause of the formation of the protruding portion, when a polishing substrate is swung, for example, to polish the glass substrate, a portion of the surface of the glass substrate where the inner diameter hole of the polishing tool passes is a portion where the inner diameter hole does not pass. As a result, the amount of polishing is reduced, and as a result, the shape of the substrate through which the inner diameter hole passes protrudes as compared with the periphery. The generation of such protrusions becomes more significant as the diameter (inner diameter) of the inner diameter hole of the polishing tool becomes larger, and in particular, the movement width L of the polishing tool shown in FIG. 2 is in a range narrower than the diameter of the inner diameter hole of the polishing tool. The case becomes noticeable.

突出部の突出量を加工後におけるガラス基板の平均研磨量で規格化した数値を突出度(ガラス基板等の被研磨物の基準形状からの変化の度合い)とすると、ガラス基板の表面を高平坦度に加工するには突出度をできるだけ小さくする必要がある。しかし、単純に突出度を小さくするには、内径穴の直径を小さくすればよいが、この場合は上述のように工具形状の変形を招くことになる。   When the projection amount (the degree of change from the reference shape of an object to be polished such as a glass substrate) is a value obtained by standardizing the projection amount of the projection portion with the average polishing amount of the glass substrate after processing, the surface of the glass substrate is highly flat It is necessary to make the protrusion degree as small as possible in order to process at the same time. However, in order to simply reduce the protrusion degree, the diameter of the inner diameter hole may be reduced. In this case, however, the tool shape is deformed as described above.

また、自転するガラス基板に対して円形の研磨軌跡を描く場合には、ガラス基板の回転と工具の往復駆動との間に同期をとる必要がないため、工具の揺動範囲を大きくし、例えばガラス基板の回転半径を一往復の揺動範囲とすればよいが、これを矩形のガラス基板に適用した場合、基板の辺部、角部で研磨量に差が生じる不均一研磨となる。これを回避するためには、上述した矩形研磨軌跡を描いて研磨加工を行う必要がある。   In addition, when drawing a circular polishing locus on the rotating glass substrate, it is not necessary to synchronize between the rotation of the glass substrate and the reciprocating drive of the tool, so the swing range of the tool is increased, for example, The rotation radius of the glass substrate may be set to a reciprocating swing range. However, when this is applied to a rectangular glass substrate, non-uniform polishing in which a difference in polishing amount occurs between the sides and corners of the substrate. In order to avoid this, it is necessary to perform the polishing process by drawing the above-described rectangular polishing locus.

本発明の目的は、このような観点に鑑みなされたもので、研磨加工に伴う研磨工具の変形(偏摩耗)を抑えることができ、加工対象であるガラス基板等の被研磨部材の表面を目的形状に研磨加工できる研磨装置用の研磨工具を提供しようとするものである。   The object of the present invention is made in view of such a viewpoint, and can suppress the deformation (uneven wear) of the polishing tool accompanying the polishing process, and the object of the surface of the member to be polished such as a glass substrate to be processed. An object of the present invention is to provide a polishing tool for a polishing apparatus that can be polished into a shape.

本発明の他の目的は、内径穴を備えた研磨工具により被研磨部材の表面を突出部を形成することなく研磨処理できる研磨方法を提供しようとするものである。   Another object of the present invention is to provide a polishing method capable of polishing the surface of a member to be polished without forming a protrusion with a polishing tool having an inner diameter hole.

本発明の目的を実現する研磨装置用の研磨工具の構成は、中心に内径部が形成された円板状の研磨材を工具保持円盤の片面側に固定し、該工具保持円盤を研磨装置により回転させて該研磨材に当接する被研磨部材の表面を研磨する研磨装置用の研磨工具において、前記円板状の研磨材は、前記内径部の内径に対する研磨材の外径の比である内外径比を10%以上、20%以下としたことを特徴とする。   The structure of a polishing tool for a polishing apparatus that realizes the object of the present invention is to fix a disk-shaped abrasive having an inner diameter portion formed at the center to one side of a tool holding disk, and the tool holding disk is In a polishing tool for a polishing apparatus that rotates and polishes the surface of a member to be polished that is in contact with the polishing material, the disk-shaped polishing material is a ratio of the outer diameter of the polishing material to the inner diameter of the inner diameter portion. The diameter ratio is 10% or more and 20% or less.

本発明の目的を実現する研磨方法は、矩形状被研磨部材の表面を平坦に加工する研磨方法において、上記した研磨装置用の研磨工具を単一の研磨軌跡をトレースさせ、あるいは内径穴の直径よりも狭い移動幅で複数の研磨軌跡をトレースさせながら被研磨部材を研磨することを特徴とする。   A polishing method that realizes the object of the present invention is a polishing method for processing a surface of a rectangular object to be polished flat. The polishing tool for a polishing apparatus described above traces a single polishing locus, or the diameter of an inner diameter hole. The member to be polished is polished while tracing a plurality of polishing trajectories with a narrower movement width.

また、上記した研磨方法において、前記単一の研磨軌跡は、少なくとも対向する二辺が内側に向かって湾曲し、前記矩形状被研磨部材の四隅に向かって尖った形状としたことを特徴とする。   Further, in the above polishing method, the single polishing locus is characterized in that at least two opposite sides are curved inward and pointed toward the four corners of the rectangular member to be polished. .

本発明の研磨工具によれば、回転するガラス基板等の被研磨部材の表面に対し、研磨工具を往復揺動させながら研磨する際、研磨工具の研磨材は、研磨材の表面における形状が全体的にバランス良く摩耗する。このため、研磨後における研磨材の表面を修正加工する必要が殆どない。   According to the polishing tool of the present invention, when polishing is performed while reciprocally swinging the polishing tool against the surface of a member to be polished such as a rotating glass substrate, the polishing tool has an overall shape on the surface of the polishing material. Wear in a balanced manner. For this reason, there is almost no need to correct the surface of the abrasive after polishing.

また本発明による研磨方法によれば、突出部を形成することなくガラス基板等の被研磨部材の表面を目的とする形状に加工することができ、特に内径穴を有する研磨工具を単一の研磨軌跡をトレースさせながら被研磨部材を研磨することで、突出部を形成することなく目的とする表面形状に研磨することができる。   Further, according to the polishing method of the present invention, the surface of a member to be polished such as a glass substrate can be processed into a target shape without forming a protrusion, and a polishing tool having an inner diameter hole, in particular, can be polished to a single surface. By polishing the member to be polished while tracing the trajectory, it is possible to polish to the target surface shape without forming the protruding portion.

また、請求項3に係る発明によれば、研磨工具が糸巻き軌跡に沿ってトレースしながらガラス基板等の矩形形状に形成された被研磨部材の4隅を目的形状に研磨する際、研磨工具の内径穴の影響による突出部が発生することがなく、大型の矩形ガラス基板の表面を全体に目的の形状に研磨することができる。   According to the invention of claim 3, when polishing the four corners of the member to be polished formed in a rectangular shape such as a glass substrate while tracing along the thread winding locus, Protruding portions due to the influence of the inner diameter hole do not occur, and the surface of the large rectangular glass substrate can be polished to the target shape as a whole.

以下、本発明を図面に示す実施形態に基づいて詳細に説明する。
実施形態1
図1は本発明による研磨装置用の研磨工具の一実施形態を示す図、図2は図1の研磨工具と研磨対象であるガラス基板との関係を示す図、図3は本発明を実施できる研磨装置の実施形態を示し、(a)は概略上面図、(b)は概略正面図および制御ブロック図を示す。
Hereinafter, the present invention will be described in detail based on embodiments shown in the drawings.
Embodiment 1
FIG. 1 is a view showing an embodiment of a polishing tool for a polishing apparatus according to the present invention, FIG. 2 is a view showing the relationship between the polishing tool of FIG. 1 and a glass substrate to be polished, and FIG. Embodiment of a grinding | polishing apparatus is shown, (a) is a schematic top view, (b) shows a schematic front view and a control block diagram.

図3に示す研磨装置10は、不図示の基台に上下方向に回転軸11を有するワーク回転駆動機構12を取り付けている。   The polishing apparatus 10 shown in FIG. 3 has a work rotation drive mechanism 12 having a rotary shaft 11 in the vertical direction attached to a base (not shown).

ワーク回転駆動機構12は、回転数可変の駆動モータ12aと減速機12bとモータの回転角(角速度)を検出するロータリエンコーダ12c等により構成され、減速機12bの出力側に回転軸11を取り付け、この回転軸11の上端に水平回転テーブル13を取り付けている。   The work rotation drive mechanism 12 is composed of a drive motor 12a having a variable rotation speed, a speed reducer 12b, a rotary encoder 12c for detecting a rotation angle (angular velocity) of the motor, and the like, and a rotary shaft 11 is attached to the output side of the speed reducer 12b. A horizontal rotary table 13 is attached to the upper end of the rotary shaft 11.

水平回転テーブル13上には、ワーク保持手段14が設置され、このワーク保持手段14上にワークであるガラス基板1を水平姿勢に保持する。本実施形態において、ワーク保持手段14は、ポリウレタン等の粘弾性素材を平板状としたもの(以下、バッキングパッドと称す)を使用している。   A work holding means 14 is installed on the horizontal rotary table 13, and the glass substrate 1 as a work is held on the work holding means 14 in a horizontal posture. In the present embodiment, the work holding means 14 uses a viscoelastic material such as polyurethane having a flat plate shape (hereinafter referred to as a backing pad).

一方、水平回転テーブル13の上方には、上下方向に回転軸15aを有する研磨工具15が配置され、工具回転駆動機構16により研磨工具15を回転駆動する。工具回転駆動機構16は、工具昇降機構17を介して工具水平移動機構18に取り付けられ、工具水平移動機構18は水平案内手段19に支持案内されて水平方向に移動可能となっている。   On the other hand, a polishing tool 15 having a rotary shaft 15 a in the vertical direction is disposed above the horizontal rotary table 13, and the polishing tool 15 is driven to rotate by a tool rotation drive mechanism 16. The tool rotation drive mechanism 16 is attached to a tool horizontal movement mechanism 18 via a tool lifting / lowering mechanism 17, and the tool horizontal movement mechanism 18 is supported and guided by a horizontal guide means 19 and can move in the horizontal direction.

本実施形態において、研磨工具15は、図1に示すように、回転軸15aの先端に固定された金属製の工具保持円盤15bに、有底の内径穴15c(内径d1)を中心部に形成した例えば円板状に形成した鋳鉄製の研磨材15d(外径d2)を固定した構成としている。また、研磨工具15は回転軸15aに対して工具保持盤15bが直角に固定されている。なお、ワーク保持手段14はバッキングパッドに限定されるものではなく、真空吸着用の孔部が形成された鋼製の保持台等であっても良い。また、研磨工具15は、工具保持盤15bに対して研磨材を自由に首振りできる構成、あるいは回転軸15aに対して工具保持盤15bを自由に首振りできる構成であっても良い。   In this embodiment, as shown in FIG. 1, the polishing tool 15 is formed with a bottomed inner diameter hole 15c (inner diameter d1) in the center of a metal tool holding disk 15b fixed to the tip of the rotary shaft 15a. For example, a cast iron abrasive 15d (outer diameter d2) formed in a disk shape is fixed. Further, the polishing tool 15 has a tool holding plate 15b fixed at a right angle to the rotating shaft 15a. The work holding means 14 is not limited to a backing pad, and may be a steel holding table or the like in which a vacuum suction hole is formed. Further, the polishing tool 15 may have a configuration in which the abrasive can be freely swung with respect to the tool holding plate 15b, or a configuration in which the tool holding plate 15b can be freely swung with respect to the rotating shaft 15a.

工具回転駆動機構16は、パソコン19から受け取った制御データに基づいて制御装置20からの工具回転数指令により回転数を可変とし、また例えばロータリエンコーダにより研磨工具15の回転数を検出可能としている。   The tool rotation drive mechanism 16 makes the rotation speed variable by a tool rotation speed command from the control device 20 based on the control data received from the personal computer 19, and can detect the rotation speed of the polishing tool 15 by, for example, a rotary encoder.

工具昇降機構17は、不図示の位置センサにより工具15の昇降位置を検出可能とすると共に、不図示のパルスモータ等のアクチュエータに制御装置20より工具昇降指令信号を出力すると、指令信号に応じて研磨工具15を昇降させる。   The tool elevating mechanism 17 can detect the elevating position of the tool 15 by a position sensor (not shown) and outputs a tool elevating command signal from the control device 20 to an actuator such as a pulse motor (not shown). The polishing tool 15 is moved up and down.

工具水平移動機構18は、研磨工具15が水平回転テーブル13の回転中心を通る直径線上を移動軌跡として研磨工具15を往復移動(揺動)させ、不図示の位置センサにより研磨工具15の水平方向位置を検出可能としている。   The tool horizontal movement mechanism 18 causes the polishing tool 15 to reciprocate (swing) along the diameter line passing through the rotation center of the horizontal rotary table 13, and the horizontal direction of the polishing tool 15 by a position sensor (not shown). The position can be detected.

工具15の往復移動量と水平回転テーブル13の回転速度との関係を調節することにより、工具15がガラス基板1に対して種々の研磨軌跡を描いて研磨することができる。   By adjusting the relationship between the reciprocating amount of the tool 15 and the rotational speed of the horizontal rotary table 13, the tool 15 can polish the glass substrate 1 while drawing various polishing trajectories.

本実施形態において、工具15は、工具の内径と外形の比である内外径比を10%以上、20%以下、例えば外径700mm、工具内径100mmとしたものを使用している。   In the present embodiment, the tool 15 is a tool whose inner / outer diameter ratio, which is the ratio between the inner diameter and outer shape of the tool, is 10% or more and 20% or less, for example, an outer diameter of 700 mm and a tool inner diameter of 100 mm.

本実施形態において、研磨工具15が図2に示す矩形研磨軌跡tr(または同心的に多数の矩形研磨軌跡が設定されてもよい)をトレースして矩形平板状のガラス基板1を研磨する場合には、矩形研磨軌跡trは単一の研磨軌跡であるため、研磨工具15は当該矩形研磨軌跡上をトレースするためにガラス基板1の回転に同期して往復揺動する。この場合、上記した内外径比を有する工具15を使用することにより、工具15の内径孔に起因する突出部の形成は見られない。   In this embodiment, when the polishing tool 15 polishes the rectangular flat glass substrate 1 by tracing the rectangular polishing trajectory tr shown in FIG. 2 (or a plurality of concentric rectangular polishing trajectories may be set). Since the rectangular polishing locus tr is a single polishing locus, the polishing tool 15 reciprocates in synchronization with the rotation of the glass substrate 1 in order to trace the rectangular polishing locus. In this case, by using the tool 15 having the above-described inner / outer diameter ratio, the formation of the protrusion due to the inner diameter hole of the tool 15 is not seen.

なお、工具15は例えば図2を例にすると、研磨工具15の内径穴15cがガラス基板1の外周端から外側に出ない範囲で使用される。   For example, referring to FIG. 2, the tool 15 is used as long as the inner diameter hole 15 c of the polishing tool 15 does not protrude outward from the outer peripheral end of the glass substrate 1.

また、図2において、実際には多数の矩形研磨軌跡が設定されることもあり、説明容易のために代表的に1本の矩形研磨軌跡trを図示している。この矩形研磨軌跡trは4辺が内側に向かって湾曲し、ガラス基板1の4隅に向かって尖った形状としており、この矩形軌跡は全体的に糸巻きに似た形状としていることから糸巻き軌跡と呼ぶ。この糸巻き軌跡では、ガラス基板1の四隅近くまで研磨工具15が近付くので、ガラス基板1の四隅部分も他の部分と同様に研磨でき、ガラス基板1の表面を全体的に一様に研磨できる。ここで、ガラス基板1の中心から基板長手方向を0°方向としたとき、最外周軌跡の0°位置と最内周軌跡の0°位置の間隔Lを工具移動幅と称す。   In FIG. 2, a large number of rectangular polishing trajectories may actually be set, and one rectangular polishing trajectory tr is typically shown for easy explanation. This rectangular polishing locus tr has a shape in which four sides are curved inward and pointed toward the four corners of the glass substrate 1, and since this rectangular locus has a shape generally resembling a bobbin winding, Call. Since the polishing tool 15 approaches the four corners of the glass substrate 1 in this thread winding locus, the four corner portions of the glass substrate 1 can be polished in the same manner as other portions, and the surface of the glass substrate 1 can be uniformly polished as a whole. Here, when the substrate longitudinal direction from the center of the glass substrate 1 is set to 0 °, an interval L between the 0 ° position of the outermost track and the 0 ° position of the innermost track is referred to as a tool movement width.

そして、研磨工具15が一つの矩形研磨軌跡trのトレースを終了すると、例えば外側の矩形研磨軌跡から内側の矩形研磨軌跡に向けて研磨工具15を所定量だけ移動させ再び矩形研磨軌跡trをトレースしてガラス基板を研磨し、この一連の動作を繰り返し行い最終的に上述した工具移動幅Lだけ移動してガラス基板1に対する全ての研磨を終了する。   When the polishing tool 15 finishes tracing one rectangular polishing locus tr, for example, the polishing tool 15 is moved from the outer rectangular polishing locus toward the inner rectangular polishing locus by a predetermined amount, and the rectangular polishing locus tr is traced again. Then, the glass substrate is polished, this series of operations is repeated, and finally the tool movement width L is moved to complete the polishing of the glass substrate 1.

なお、本発明は矩形軌跡の4辺が内側に湾曲した糸巻き軌跡に限定されるものではなく、対向する2辺が内側に湾曲し、他の対向する2辺を直線状とした糸巻き軌跡としても良く、4辺を直線状とする軌跡としてもよく、また糸巻き状軌跡と4辺直線状の矩形軌跡とを組み合わせても良い。   The present invention is not limited to the bobbin winding locus in which four sides of the rectangular locus are curved inward, but may be a bobbin winding locus in which two opposite sides are curved inward and the other two opposite sides are linear. Alternatively, the trajectory may be a straight line with four sides, or a bobbin-shaped trajectory may be combined with a four-sided linear trajectory.

また、上記した実施形態では、閉鎖した軌跡であるいわゆる一筆書きの軌跡である単一の研磨軌跡として上述した矩形軌跡を例にしているが、本発明は単一の研磨軌跡として一筆書きでき、回転するガラス基板等の被研磨部材の回転に同期して研磨工具15の位置を制御することにより描ける閉鎖した軌跡であればどのようなものでも良く、例えば星形状、5角形以上の多角形、楕円形等の種々の形状の軌跡に対して適用することができる。   In the above-described embodiment, the above-described rectangular trajectory is taken as an example of a single polishing trajectory that is a so-called one-stroke trajectory that is a closed trajectory, but the present invention can be drawn as a single polishing trajectory, Any closed locus can be used as long as it can be drawn by controlling the position of the polishing tool 15 in synchronization with the rotation of a member to be polished such as a rotating glass substrate, for example, a star shape, a pentagon or more polygon, The present invention can be applied to trajectories having various shapes such as an ellipse.

また、本実施形態において、工具15を上方から下方へ段階(ステップ)的に降下させる切り込み加工を行う場合、切り込みのタイミング(工具15を1ステップ降下させるタイミング)として所定の加工時間毎で行っているが、回転テーブル13の周回数に応じて行うようにしても良い。   Further, in the present embodiment, when performing the cutting process in which the tool 15 is lowered stepwise from the upper side to the lower side, the cutting timing (timing to lower the tool 15 by one step) is performed every predetermined machining time. However, it may be performed according to the number of rotations of the rotary table 13.

上記切り込み加工において、工具15の総降下量(目標切り込み量)は基板表面形状の計測結果から、目的形状を得るのに要する修正加工量に基づいて求められる。   In the above-described cutting process, the total amount of descent (target cutting amount) of the tool 15 is obtained from the measurement result of the substrate surface shape based on the correction processing amount required to obtain the target shape.

工具の外形を700mmとし、工具の内径を200mm(比較例1)、100mm(実施例1)、50mm(比較例2)、0mm(比較例3)の各研磨工具によりガラス基板を研磨した。このとき図2に示す糸巻き軌跡(tr)を用いた。工具の材質としては、球状黒鉛鋳鉄を用いた。   The outer diameter of the tool was 700 mm, and the glass substrate was polished with each polishing tool having an inner diameter of 200 mm (Comparative Example 1), 100 mm (Example 1), 50 mm (Comparative Example 2), and 0 mm (Comparative Example 3). At this time, the bobbin trajectory (tr) shown in FIG. 2 was used. Spheroidal graphite cast iron was used as the material of the tool.

研磨後におけるガラス基板の突出量と突出度を基板中心から基板0゜方向と基板90゜方向の2か所についてそれぞれ求めた。結果を表1に示す。また、図4は工具内径と基板0゜方向の突出度との関係を示すグラフである。   The amount of protrusion and the degree of protrusion of the glass substrate after polishing were determined at two locations, the substrate 0 ° direction and the substrate 90 ° direction, from the substrate center. The results are shown in Table 1. FIG. 4 is a graph showing the relationship between the tool inner diameter and the degree of protrusion in the 0 ° direction of the substrate.

表1に示すように、同一外径の研磨工具において、基板0゜方向、基板90゜方向共に工具内径が大きいほど突出度が大きくなるが、凹部深さ値は小さくなる。突出度が大きいと基板を平坦化するために再度研磨する必要が生じ、凹部深さが大きいと下記に示すように工具修正が必要となる。   As shown in Table 1, in a polishing tool having the same outer diameter, the degree of protrusion increases as the tool inner diameter increases in both the substrate 0 ° direction and the substrate 90 ° direction, but the recess depth value decreases. When the degree of protrusion is large, it is necessary to polish again to flatten the substrate, and when the depth of the recess is large, tool correction is required as shown below.

図6(a)には、実施例1および比較例1〜3における工具内径と加工後の工具形状との関係、すなわち工具半径と工具形状(μm)との関係を示す。   FIG. 6A shows the relationship between the tool inner diameter and the processed tool shape in Example 1 and Comparative Examples 1 to 3, that is, the relationship between the tool radius and the tool shape (μm).

図6(a)において、比較例1〜3、及び実施例1の外周での工具形状(研磨材15dの形状)はいずれも12μm程度で、比較例1を除く他の工具では半径150mmの前後で工具形状(研磨材15dの形状)に凹部(実施例1:29μm程度、比較例2:26μm程度、比較例3:25μm程度)を有し、外周からこの凹部まで略同様の工具形状(研磨材15dの形状)を有している。   In FIG. 6A, the tool shape (the shape of the abrasive 15d) on the outer periphery of Comparative Examples 1 to 3 and Example 1 is about 12 μm, and other tools except Comparative Example 1 have a radius of around 150 mm. The tool shape (the shape of the abrasive 15d) has a recess (Example 1: about 29 μm, Comparative Example 2: about 26 μm, Comparative Example 3: about 25 μm), and a substantially similar tool shape (polishing) from the outer periphery to this recess. The shape of the material 15d).

また、図6(b)には、図6(a)における実施例1、比較例1〜3の凹部の深さのうち、工具形状の工具の最内周と最外周を通る直線を基準にしたときの工具半径と凹形状の深さとの関係を示し、その最大値を、凹部深さ値として表1に示した。   FIG. 6B shows a straight line passing through the innermost circumference and the outermost circumference of the tool-shaped tool among the depths of the recesses of the first embodiment and the first to third comparative examples in FIG. 6A. The relationship between the tool radius and the depth of the concave shape was shown, and the maximum value is shown in Table 1 as the concave depth value.

すなわち、実施例1、比較例2、3では研磨材15dの外周と内周の間である中周が窪んだ形状となる。   That is, in Example 1 and Comparative Examples 2 and 3, the middle circumference between the outer circumference and the inner circumference of the abrasive 15d is recessed.

ここで、工具(研磨材15d)は弾性体であるため、前記工具中周の凹部は印加圧力により変形しある程度は平らになっていくと考えられる。このときの変形は工具(研磨材15d)全体の形状が平らになる変形(工具内周と外周の差がなくなるような変形)と、工具中周の凹部が平らになる変形とがあるが、工具圧力が工具の回転中心の回転軸15aを中心とした圧力であるため、回転軸15aからずれた工具中周の変形は起き難い。つまり、工具の印加圧力により工具(研磨材15d)中周部の凹形状が研磨加工中に平らになることは殆どない。   Here, since the tool (abrasive 15d) is an elastic body, it is considered that the concave portion in the middle of the tool is deformed by the applied pressure and becomes flat to some extent. The deformation at this time includes a deformation that flattens the shape of the entire tool (abrasive 15d) (a deformation that eliminates the difference between the inner periphery and the outer periphery of the tool) and a deformation that flattenes the concave portion of the tool inner periphery. Since the tool pressure is a pressure centered on the rotation axis 15a of the rotation center of the tool, the deformation of the tool inner periphery deviating from the rotation axis 15a is unlikely to occur. That is, the concave shape of the middle peripheral portion of the tool (abrasive 15d) is hardly flattened during the polishing process by the applied pressure of the tool.

図6(a)において、比較例1(内径の半径:100mm)の内周における工具形状(研磨材15dの形状)は34μm程度と大きく、比較例2(内径の半径:25mm)の内周における工具形状(研磨材15dの形状)は13μm程度、比較例3の中心における工具形状(研磨材15dの形状)は6μm程度である。また、実施例1(内径の半径:50mm)の内周における工具形状(研磨材15dの形状)は20μm程度である。   6A, the tool shape (the shape of the abrasive 15d) in the inner periphery of Comparative Example 1 (inner diameter radius: 100 mm) is as large as about 34 μm, and the inner periphery of Comparative Example 2 (inner diameter radius: 25 mm). The tool shape (the shape of the abrasive 15d) is about 13 μm, and the tool shape (the shape of the abrasive 15d) at the center of Comparative Example 3 is about 6 μm. Further, the tool shape (the shape of the abrasive 15d) on the inner periphery of Example 1 (inner diameter radius: 50 mm) is about 20 μm.

すなわち、工具内周径が小さくなると工具内周(研磨材15dの内周)が摩耗しなくなる傾向にあり、比較例2に示すように、工具の内径が外径比10%未満であると工具内周(研磨材15dの内周)の摩耗量が極端に小さくなる。さらに比較例3では、工具内径の摩耗がさらに小さくなるため、工具形状が独楽状(工具全体が凸形状)となり工具全体を使用した研磨が不可能となってしまう。   That is, as the inner diameter of the tool becomes smaller, the inner diameter of the tool (the inner circumference of the abrasive 15d) tends not to be worn. As shown in Comparative Example 2, the tool has an inner diameter of less than 10% as shown in Comparative Example 2. The amount of wear on the inner circumference (the inner circumference of the abrasive 15d) becomes extremely small. Furthermore, in Comparative Example 3, since the wear on the inner diameter of the tool is further reduced, the tool shape becomes a top-down shape (the entire tool is a convex shape), and polishing using the entire tool becomes impossible.

このように、比較例2、3の研磨工具を用いて研磨したガラス基板の突出度は実施例1の研磨工具を用いた場合よりも小さいが、上述のように加工後の工具形状(研磨材15dの形状)の変形が著しく、比較例1の研磨工具を用いて研磨したガラス基板の突出度は実施例1よりもはるかに大きく、平坦度を効率よく向上させることが難しい。   Thus, although the protrusion degree of the glass substrate grind | polished using the grinding | polishing tool of the comparative examples 2 and 3 is smaller than the case where the grinding | polishing tool of Example 1 is used, as mentioned above, the tool shape after processing (abrasive material) 15d) is significantly deformed, and the protrusion degree of the glass substrate polished with the polishing tool of Comparative Example 1 is much larger than that of Example 1, and it is difficult to improve the flatness efficiently.

一方、実施例1のように、外径比が10%以上、20%以内では、基板突出度も基板90゜方向で5.17%と小さく(比較例2の突出度4.69%とさほど相違しない)、高平坦度の研磨加工に影響を与えるものではない。   On the other hand, as in Example 1, when the outer diameter ratio is 10% or more and within 20%, the substrate projecting degree is as small as 5.17% in the substrate 90 ° direction (the projecting degree of Comparative Example 2 is not so different from 4.69%). It does not affect the polishing process with high flatness.

すなわち、工具外径700mmで内径が100mm前後(工具内外径比が10%〜20%程度)の内径部を有する研磨工具では、研磨するガラス基板の基板突出度が小さく、また工具の摩耗形状のバランスが取れている。したがって、高平坦度にガラス基板を研磨でき、また研磨工具の研磨面もバランス良く摩耗するので、研磨面の修正加工を殆ど不要とする。   That is, in a polishing tool having an inner diameter portion with a tool outer diameter of 700 mm and an inner diameter of around 100 mm (tool inner / outer diameter ratio is about 10% to 20%), the degree of protrusion of the glass substrate to be polished is small, and the wear shape of the tool Balanced. Therefore, the glass substrate can be polished with a high degree of flatness, and the polishing surface of the polishing tool is worn in a well-balanced manner, so that almost no modification of the polishing surface is required.

本発明による研磨装置用の研磨工具の一実施例を示す図。The figure which shows one Example of the polishing tool for polishing apparatuses by this invention. 図1の研磨工具とガラス基板との関係を示す図。The figure which shows the relationship between the grinding | polishing tool of FIG. 1, and a glass substrate. 本発明を有効に実施できる研磨装置を示し、(a)は概略上面図、(b)は概略正面図および制御ブロック図を示す。The polishing apparatus which can implement this invention effectively is shown, (a) is a schematic top view, (b) shows a schematic front view and a control block diagram. 工具内径と基板0゜方向の突出度の関係を示す図。The figure which shows the relationship between a tool internal diameter and the protrusion degree of a board | substrate 0 degree direction. 基板突出部の模式図。The schematic diagram of a board | substrate protrusion part. (a)は工具内径と加工後の工具形状との関係を示す図、(b)は工具中周の凹部深さを示す図。(A) is a figure which shows the relationship between a tool internal diameter and the tool shape after a process, (b) is a figure which shows the recessed part depth of a tool inner periphery.

符号の説明Explanation of symbols

1 ガラス基板
12 ワーク回転駆動機構
13 水平回転テーブル
14 ワーク保持手段
15 研磨工具
16 工具回転駆動機構
17 工具昇降機構
18 工具水平移動機構
19 水平案内手段
20 制御装置
tr 研磨軌跡
DESCRIPTION OF SYMBOLS 1 Glass substrate 12 Work rotation drive mechanism 13 Horizontal rotation table 14 Work holding means 15 Polishing tool 16 Tool rotation drive mechanism 17 Tool raising / lowering mechanism 18 Tool horizontal movement mechanism 19 Horizontal guide means 20 Controller tr Polishing locus

Claims (3)

中心に内径部が形成された円板状の研磨材を工具保持円盤の片面側に固定し、該工具保持円盤を研磨装置により回転させて該研磨材に当接する被研磨部材の表面を研磨する研磨装置用の研磨工具において、
前記円板状の研磨材は、前記内径部の内径に対する研磨材の外径の比である内外径比を10%以上、20%以下としたことを特徴とする研磨装置用の研磨工具。
A disk-shaped abrasive having an inner diameter formed at the center is fixed to one side of the tool holding disk, and the tool holding disk is rotated by a polishing apparatus to polish the surface of the member to be polished that contacts the abrasive. In a polishing tool for a polishing apparatus,
The polishing tool for a polishing apparatus, wherein the disk-shaped abrasive has an inner / outer diameter ratio, which is a ratio of an outer diameter of the abrasive to an inner diameter of the inner diameter portion, of 10% or more and 20% or less.
矩形状被研磨部材の表面を平坦に加工する研磨方法において、請求項1に記載の研磨装置用の研磨工具を単一の研磨軌跡をトレースさせ、あるいは内径穴の直径よりも狭い範囲で複数の研磨軌跡をトレースさせながら被研磨部材を研磨することを特徴とする研磨方法。   In a polishing method for processing a surface of a rectangular member to be polished flat, a polishing tool for a polishing apparatus according to claim 1 is made to trace a single polishing locus, or a plurality of the polishing tools are narrower than the diameter of an inner diameter hole. A polishing method comprising polishing a member to be polished while tracing a polishing locus. 前記単一の研磨軌跡は、少なくとも対向する二辺が内側に向かって湾曲し、前記矩形状被研磨部材の四隅に向かって尖った形状としたことを特徴とする請求項2に記載の研磨方法。
3. The polishing method according to claim 2, wherein the single polishing locus has a shape in which at least two opposite sides are curved inward and pointed toward the four corners of the rectangular member to be polished. .
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Cited By (15)

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JP2011148026A (en) * 2010-01-20 2011-08-04 Dainippon Printing Co Ltd Method of making glass substrate for photomask
CN103052467A (en) * 2010-08-02 2013-04-17 Lg化学株式会社 Large substrate, and polishing method of large substrate for uniform polishing
JP2013535348A (en) * 2010-08-02 2013-09-12 エルジー・ケム・リミテッド Large substrate and polishing method for uniformly polishing the same
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JP2015223664A (en) * 2014-05-28 2015-12-14 株式会社ディスコ Griding device
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CN105312974B (en) * 2014-05-28 2019-05-31 株式会社迪思科 The method for grinding of grinding attachment and rectangular substrate
KR102185238B1 (en) * 2014-05-28 2020-12-01 가부시기가이샤 디스코 Grinding apparatus and method for grinding rectangular substrate
JP2018526822A (en) * 2015-08-14 2018-09-13 エム キューブド テクノロジーズ, インコーポレイテッド Wafer chuck characterized by a support surface with reduced friction
JP7041051B2 (en) 2015-08-14 2022-03-23 ツー-シックス デラウェア インコーポレイテッド Wafer chuck featuring a support surface with reduced friction

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