JP2009206115A - Package for electronic component storage - Google Patents

Package for electronic component storage Download PDF

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JP2009206115A
JP2009206115A JP2008043872A JP2008043872A JP2009206115A JP 2009206115 A JP2009206115 A JP 2009206115A JP 2008043872 A JP2008043872 A JP 2008043872A JP 2008043872 A JP2008043872 A JP 2008043872A JP 2009206115 A JP2009206115 A JP 2009206115A
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ceramic
electronic component
coating layer
recess
insulating layer
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JP4969486B2 (en
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Masahiro Onishi
正浩 大西
Masataka Mitsutake
正孝 光武
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Kyocera Corp
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Kyocera Corp
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item

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Abstract

<P>PROBLEM TO BE SOLVED: To provide a package for electronic component storage which includes a recess for electronic component storage penetrating a ceramic insulating layer, the package for electronic component storage suppressing a fall of a ceramic particle from a recess inner surface. <P>SOLUTION: The package 9 for electronic component storage includes, on an upper surface of an insulating base 1 formed by laminating a plurality of ceramic insulating layers 1a, the recess 2 for electronic component storage formed penetrating center portions of some of the ceramic insulating layers 1a along the thickness, the inner surface of the recess 2 being coated with a ceramic coating layer 3. The ceramic coating layer 3 suppresses a fall of a ceramic particle from the inner surface of the recess 2. Consequently, even when an electronic component 4 whose function is apt to be disturbed by sticking of the ceramic particle like a high-precision optical semiconductor element, an MEMS element, etc., is stored, reliability as an electronic device is easily enhanced. <P>COPYRIGHT: (C)2009,JPO&INPIT

Description

本発明は、光半導体素子等の半導体素子や半導体基板上に微細な電子機械機構を備えてなるマイクロマシン(いわゆるMEMS素子)や圧電素子等の電子部品を気密に収納するための凹部を絶縁基体の上面に有する電子部品収納用パッケージに関するものである。   The present invention provides a semiconductor element such as an optical semiconductor element, a micromachine (so-called MEMS element) provided with a fine electromechanical mechanism on a semiconductor substrate, and a recess for airtightly storing an electronic component such as a piezoelectric element. The present invention relates to an electronic component storage package on an upper surface.

従来、光半導体素子等の半導体素子や圧電素子等の電子部品を気密に収納するための電子部品収納用パッケージとして、酸化アルミニウム質焼結体やガラスセラミック焼結体等のセラミック材料からなる複数の絶縁層が積層されてなる絶縁基体の上面に、電子部品収納用の凹部(いわゆるキャビティ)を形成したものが知られている。   Conventionally, as an electronic component storage package for hermetically storing an electronic component such as a semiconductor element such as an optical semiconductor element or a piezoelectric element, a plurality of ceramic materials such as an aluminum oxide sintered body and a glass ceramic sintered body are used. 2. Description of the Related Art There is known a structure in which a concave portion (so-called cavity) for storing an electronic component is formed on the upper surface of an insulating substrate formed by laminating insulating layers.

この凹部内に電子部品を収容するとともに、金属板等からなる蓋体を絶縁基体に接合して凹部を塞ぐことにより、絶縁基体の凹部と蓋体とにより構成される容器の内部に電子部品が気密封止される。   The electronic component is accommodated in the recess, and a lid made of a metal plate or the like is joined to the insulating base to close the recess, so that the electronic component is placed inside the container constituted by the recess of the insulating base and the lid. Hermetically sealed.

このような電子部品収納用パッケージは、例えば酸化アルミニウムや酸化カルシウム等のセラミック原料粉末を有機溶剤およびバインダとともにシート状に成形して四角板状のセラミックグリーンシートを複数枚作製し、一部のセラミックグリーンシートを、中央部を金型を用いた打ち抜き加工により貫通させて、枠状に成形した後、この枠状のセラミックグリーンシートが上層になるように複数のセラミックグリーンシートを積層し、この積層体を焼成することにより製作される。
特開2004−247334号公報 特開2007−43050号公報
Such an electronic component storage package is formed by forming a plurality of square plate-like ceramic green sheets by forming a ceramic raw material powder such as aluminum oxide and calcium oxide into a sheet shape together with an organic solvent and a binder. After the green sheet is punched through the center and formed into a frame shape, multiple ceramic green sheets are stacked so that the frame-shaped ceramic green sheet is the upper layer. Manufactured by firing the body.
JP 2004-247334 A JP 2007-43050

しかしながら、このような従来の電子部品収納用パッケージは、セラミック絶縁層となるセラミックグリーンシートに打ち抜き加工を施すことにより凹部となる貫通孔が形成されるため、凹部の内側面となる、打ち抜かれて露出した面(枠状の部分の内側面)に破断面が生じやすい。このような破断面は表面が粗く、また、いわゆるささくれが生じやすいため、内側面の一部が剥がれて、例えば外形寸法が数十μm程度の微細なセラミック粒子が脱落する可能性があるという問題があった。なお、このような破断面は、例えば図2に示すように、方向Aに打ち抜き加工を施している途中(金型がセラミックグリーンシート1bを完全には貫通していない段階)で、セラミックグリーンシート1bが厚み方向に破断することにより生じる。なお、図2は、セラミック絶縁層となるセラミックグリーンシート1bに、金型を用いて打ち抜き加工を施している状況を模式的に示す断面図である。   However, in such a conventional electronic component storage package, a punching process is performed on the ceramic green sheet serving as a ceramic insulating layer, so that a through hole serving as a recess is formed. A fracture surface is likely to occur on the exposed surface (the inner surface of the frame-shaped portion). Such a fractured surface has a rough surface, and so-called scalding is likely to occur, so that a part of the inner surface may be peeled off, and for example, fine ceramic particles having an outer dimension of about several tens of μm may fall off. was there. For example, as shown in FIG. 2, such a fractured surface is obtained when the ceramic green sheet is being punched in the direction A (the stage where the mold does not completely penetrate the ceramic green sheet 1 b). It occurs when 1b breaks in the thickness direction. FIG. 2 is a cross-sectional view schematically showing a state in which the ceramic green sheet 1b serving as the ceramic insulating layer is punched using a mold.

このようなセラミック粒子の脱落が生じると、セラミック粒子が凹部に収納された電子部品の表面に付着して不具合を生じさせる可能性がある。特に、収納する電子部品が、最近の高集積化(高画素数化)が進んでいる撮像素子であるような場合には、微細なセラミック粒子の付着でも多くの画素において撮像が妨げられるようになるため、撮像の不良等の問題を発生させる可能性が高い。   If such ceramic particles fall off, the ceramic particles may adhere to the surface of the electronic component housed in the recess and cause a problem. In particular, in the case where the electronic component to be stored is an image sensor that has recently been highly integrated (higher number of pixels), imaging is prevented in many pixels even if fine ceramic particles are attached. Therefore, there is a high possibility of causing problems such as imaging defects.

また、電子部品として、半導体基板上に、機械的な動作によるスイッチング機構や、加速度等の物理量に応じて動く振動部のような可動式の微細な構造を形成してなる加速度センサ素子等のマイクロマシン素子(いわゆるMEMS素子)が収納される場合には、このような微細な可動部分にセラミック粒子が付着することにより可動部分の機械的な動きが妨げられ、電子部品としての正常な機能が妨げられる可能性が高くなる。   Moreover, as an electronic component, a micromachine such as an acceleration sensor element formed by forming a switching mechanism by mechanical operation on a semiconductor substrate and a movable fine structure such as a vibration part that moves according to a physical quantity such as acceleration. When an element (so-called MEMS element) is accommodated, the ceramic particles adhere to such a fine movable part, thereby preventing the mechanical movement of the movable part and preventing the normal function as an electronic component. The possibility increases.

本発明は、このような従来の問題点に鑑み案出されたもので、その目的は、セラミック絶縁層が厚み方向に貫通されてなる電子部品収納用の凹部を有する電子部品収納用パッケージにおいて、凹部の内側面からのセラミック粒子の脱落が効果的に抑制された電子部品収納用パッケージを提供することにある。   The present invention has been devised in view of such conventional problems, and an object of the present invention is to provide an electronic component storage package having a recess for storing an electronic component in which a ceramic insulating layer is penetrated in the thickness direction. An object of the present invention is to provide an electronic component storage package in which the falling of ceramic particles from the inner surface of a recess is effectively suppressed.

本発明の電子部品収納用パッケージは、複数のセラミック絶縁層が積層されてなる絶縁基体の上面に、一部の前記セラミック絶縁層の中央部が厚み方向に貫通されて形成された電子部品収納用の凹部を有し、該凹部の内側面がセラミック被覆層で被覆されていることを特徴とするものである。   The electronic component storage package of the present invention is an electronic component storage package formed on the upper surface of an insulating substrate formed by laminating a plurality of ceramic insulating layers, with a central portion of a portion of the ceramic insulating layer penetrating in the thickness direction. And the inner side surface of the recess is coated with a ceramic coating layer.

また、本発明の電子部品収納用パッケージは、上記構成において、前記セラミック被覆層が、前記セラミック絶縁層よりも多い割合でガラス成分を含有していることを特徴とするものである。   Moreover, the electronic component storage package of the present invention is characterized in that, in the above configuration, the ceramic coating layer contains a glass component in a larger proportion than the ceramic insulating layer.

また、本発明の電子部品収納用パッケージは、上記構成において、前記セラミック被覆層は、前記セラミック絶縁層のセラミック材料と同じセラミック材料を主成分としていることを特徴とするものである。   The electronic component storage package according to the present invention is characterized in that, in the above configuration, the ceramic coating layer is mainly composed of the same ceramic material as the ceramic material of the ceramic insulating layer.

本発明の電子部品収納用パッケージによれば、複数のセラミック絶縁層が積層されてなる絶縁基体の上面に、一部の前記セラミック絶縁層の中央部が厚み方向に貫通されて形成された電子部品収納用の凹部を有し、その凹部の内側面がセラミック被覆層で被覆されていることから、凹部の内側面から脱落しようとするセラミック粒子があったとしても、そのセラミック粒子をセラミック被覆層で被覆しているので、脱落しないように保持しておくことができる。そのため、凹部の内側面からのセラミック粒子の脱落が効果的に抑制された電子部品収納用パッケージを提供することができる。   According to the electronic component storage package of the present invention, an electronic component formed by penetrating the central portion of a part of the ceramic insulating layer in the thickness direction on the upper surface of an insulating base formed by laminating a plurality of ceramic insulating layers. Since it has a recess for storage and the inner surface of the recess is coated with a ceramic coating layer, even if there are ceramic particles that are about to fall off from the inner surface of the recess, the ceramic particles are covered with the ceramic coating layer. Since it is covered, it can be held so as not to fall off. Therefore, it is possible to provide an electronic component storage package in which the falling of ceramic particles from the inner surface of the recess is effectively suppressed.

また、本発明の電子部品収納用パッケージは、上記構成において、セラミック被覆層が、セラミック絶縁層よりも多い割合でガラス成分を含有している場合には、ガラス成分を介してセラミック被覆層がセラミック絶縁層に対してより強固に接合することができる。そのため、凹部の内側面をより有効に被覆し、セラミック粒子の脱落を抑制することができる。したがって、この場合には、より一層効果的に絶縁基体の凹部の内側面からのセラミック粒子の脱落が抑制された電子部品収納用パッケージを提供することができる。   In the electronic component storage package according to the present invention, in the above configuration, when the ceramic coating layer contains a glass component in a larger proportion than the ceramic insulating layer, the ceramic coating layer is ceramic via the glass component. It is possible to bond more firmly to the insulating layer. Therefore, it is possible to more effectively coat the inner surface of the concave portion and suppress the ceramic particles from falling off. Therefore, in this case, it is possible to provide an electronic component storage package in which the ceramic particles are prevented from dropping off from the inner surface of the concave portion of the insulating base.

また、この場合には、セラミック被覆層自体も、より多くのガラス成分を介してセラミック絶縁層に接合されるので、セラミック被覆層自体のセラミック絶縁層からの剥がれ等をより有効に抑制することもできる。   In this case, since the ceramic coating layer itself is also bonded to the ceramic insulating layer through a larger glass component, it is possible to more effectively suppress peeling of the ceramic coating layer itself from the ceramic insulating layer. it can.

また、本発明の電子部品収納用パッケージは、上記構成において、セラミック被覆層は、セラミック絶縁層のセラミック成分と同じセラミック成分を主成分としている場合には、同じセラミック成分同士が焼成時に焼結して接合することにより、セラミック絶縁層に対してより強固に接合される。また、セラミック被覆層の熱膨張率(線膨張係数)をセラミック絶縁層の熱膨張率に近似させることが容易であるため、セラミック被覆層とセラミック絶縁層との間で両者の熱膨張率の差に起因する大きな熱応力が生じることを効果的に抑制することも容易である。そのため、このようなセラミック被覆層のセラミック絶縁層に対する接合をより強固で信頼性の高いものとすることができる。したがって、この場合には、セラミック被覆層自体のセラミック絶縁層からの剥がれがより有効に抑制された電子部品収納用パッケージを提供することができる。   In the electronic component storage package of the present invention, in the above configuration, when the ceramic coating layer is mainly composed of the same ceramic component as the ceramic component of the ceramic insulating layer, the same ceramic component is sintered during firing. By joining together, the ceramic insulation layer is more firmly joined. In addition, since it is easy to approximate the thermal expansion coefficient (linear expansion coefficient) of the ceramic coating layer to that of the ceramic insulating layer, the difference in thermal expansion coefficient between the ceramic coating layer and the ceramic insulating layer is different. It is also easy to effectively suppress the occurrence of a large thermal stress due to. Therefore, the bonding of such a ceramic coating layer to the ceramic insulating layer can be made stronger and more reliable. Therefore, in this case, it is possible to provide an electronic component storage package in which peeling of the ceramic coating layer itself from the ceramic insulating layer is more effectively suppressed.

本発明の電子部品収納用パッケージについて、添付の図面を参照しつつ説明する。   The electronic component storage package of the present invention will be described with reference to the accompanying drawings.

図1は本発明の電子部品収納用パッケージの実施の形態の一例を示す断面図である。図1において、1は複数のセラミック絶縁層1aが積層されてなる絶縁基体であり、2は凹部である。複数のセラミック絶縁層1aが積層されてなる絶縁基体1の上面に、一部のセラミック絶縁層1aの中央部が厚み方向に貫通されて電子部品収納用の凹部2が形成されて電子部品収納用パッケージ9が基本的に構成されている。また、この電子部品収納用パッケージ9に電子部品4が実装されることにより、各種の電子機器の部品として使用される電子装置(符号なし)が製作される。   FIG. 1 is a cross-sectional view showing an example of an embodiment of an electronic component storage package according to the present invention. In FIG. 1, reference numeral 1 denotes an insulating substrate formed by laminating a plurality of ceramic insulating layers 1a, and 2 denotes a recess. On the upper surface of the insulating substrate 1 formed by laminating a plurality of ceramic insulating layers 1a, a central portion of a part of the ceramic insulating layers 1a is penetrated in the thickness direction so as to form a recess 2 for storing electronic components. The package 9 is basically configured. In addition, by mounting the electronic component 4 on the electronic component storage package 9, an electronic device (no symbol) used as a component of various electronic devices is manufactured.

絶縁基体1は、例えば縦横の辺の長さが約3〜30μm、高さが約1〜3mmの直方体状であり、CCD(Charge Coupled Device)型またはCMOS(Complementary MOS)型の撮像素子等の光半導体素子を含む半導体素子や、スイッチング素子,加速度センサ素子等のマイクロマシン素子(MEMS素子)や、弾性表面波素子等の圧電素子等の電子部品4を収納するための凹部2を上面に有している。この絶縁基体1は、電子部品4を気密に収納する容器の一部として機能する。   The insulating substrate 1 has, for example, a rectangular parallelepiped shape having a length of about 3 to 30 μm in length and width and a height of about 1 to 3 mm, such as a CCD (Charge Coupled Device) type or a CMOS (Complementary MOS) type imaging device. The upper surface has a recess 2 for accommodating an electronic component 4 such as a semiconductor element including an optical semiconductor element, a micromachine element (MEMS element) such as a switching element or an acceleration sensor element, or a piezoelectric element such as a surface acoustic wave element. ing. The insulating base 1 functions as a part of a container for storing the electronic component 4 in an airtight manner.

凹部2は、例えば、電子部品4を効率よく(できるだけ無駄な空間が生じないように)収納するために、電子部品4に対応した形状で、電子部品4よりも少し大きな寸法で形成される。この実施の形態の例では、収納される電子部品4は四角板状の撮像素子またはMEMS素子であり、凹部2はそれよりも少し大きな四角柱状に形成されている。なお、凹部2内の段状の部分(符号なし)については後述する。   For example, the recess 2 is formed in a shape corresponding to the electronic component 4 and slightly larger than the electronic component 4 in order to efficiently store the electronic component 4 (so as not to create a useless space as much as possible). In the example of this embodiment, the electronic component 4 to be accommodated is a square plate-like imaging element or a MEMS element, and the recess 2 is formed in a rectangular column shape slightly larger than that. In addition, the step-shaped part (no code | symbol) in the recessed part 2 is mentioned later.

この実施の形態の例では、凹部2の底面が電子部品4の搭載部(符合なし)になっており、この搭載部に電子部品4が、ガラスやろう材,樹脂等の接着材を介して接着固定される。   In the example of this embodiment, the bottom surface of the concave portion 2 is a mounting portion (no symbol) of the electronic component 4, and the electronic component 4 is attached to the mounting portion via an adhesive such as glass, brazing material, or resin. Bonded and fixed.

そして、例えば鉄−ニッケル−コバルト合金や銅合金等の金属板等からなる蓋体(図示せず)を絶縁基体1の上面に凹部2を塞ぐように接合することにより、絶縁基体1の凹部2と蓋体とで構成される容器(符号なし)の内部に電子部品4が気密封止される。電子部品収納用パッケージ9に電子部品4が気密封止されてなる電子装置(符号なし)は、デジタルカメラや画像検査装置等の撮像機器や、通信機器のスイッチングデバイス、車両用等の加速度検知器や角速度検知器等の各種のセンサ機器等の電子機器(図示せず)に部品として実装される。   Then, a lid (not shown) made of, for example, a metal plate such as an iron-nickel-cobalt alloy or a copper alloy is joined to the upper surface of the insulating base 1 so as to close the concave 2, thereby forming the concave 2 of the insulating base 1. The electronic component 4 is hermetically sealed inside a container (not shown) composed of a lid and a lid. An electronic device (no symbol) in which the electronic component 4 is hermetically sealed in the electronic component storage package 9 is an imaging device such as a digital camera or an image inspection device, a switching device of a communication device, an acceleration detector for a vehicle, etc. And an electronic device (not shown) such as various sensor devices such as an angular velocity detector.

なお、この実施の形態の例では、凹部2の内側から外側にかけて配線導体5が形成されている。配線導体5は、凹部2内に気密封止される電子部品4と電気的に接続され、これを凹部2の外側に電気的に導出する導電路として機能する。配線導体5のうち凹部2の内側に位置する部位に電子部品4の電極(図示せず)を、ボンディングワイヤ6等を介して電気的に接続するとともに、凹部2の外側に位置する部位を外部の電気回路(図示せず)にはんだ等を介して電気的に接続することにより、電子部品4が外部の電気回路と電気的に接続される。   In the example of this embodiment, the wiring conductor 5 is formed from the inside to the outside of the recess 2. The wiring conductor 5 is electrically connected to the electronic component 4 that is hermetically sealed in the recess 2, and functions as a conductive path that electrically leads it to the outside of the recess 2. An electrode (not shown) of the electronic component 4 is electrically connected to a portion of the wiring conductor 5 located inside the recess 2 via a bonding wire 6 or the like, and a portion located outside the recess 2 is externally connected. The electronic component 4 is electrically connected to an external electrical circuit by being electrically connected to the electrical circuit (not shown) via solder or the like.

また、この実施の形態の例では、凹部2の内側面に、前述したように段状の部分が設けられている。この段状の部分は、その上面に配線導体5を形成するためのものであり、電子部品4の厚さと同じ程度の高さである。このような段状の部分の上面に配線導体5を設けておくと、電子部品4の上面の電極と配線導体5との間の距離が短くなり、高低差も小さくなるので、ボンディングワイヤ6を介した電極と配線導体5との接続を容易に行なうことができる。また、ボンディングワイヤ6の長さを抑えることができるため、接続抵抗を下げたり、接続信頼性を向上させたりすることができる。   Moreover, in the example of this embodiment, the stepped portion is provided on the inner surface of the recess 2 as described above. This step-shaped portion is for forming the wiring conductor 5 on the upper surface thereof, and is as high as the thickness of the electronic component 4. If the wiring conductor 5 is provided on the upper surface of such a stepped portion, the distance between the electrode on the upper surface of the electronic component 4 and the wiring conductor 5 is shortened and the height difference is also reduced. The connection between the interposed electrode and the wiring conductor 5 can be easily performed. Further, since the length of the bonding wire 6 can be suppressed, the connection resistance can be lowered and the connection reliability can be improved.

段状の部分は、例えば、凹部2となる打ち抜き部分の寸法を一部のセラミックグリーンシートについて他のセラミックグリーンシートよりも小さくしておいて、この打ち抜き部分の寸法の小さいセラミックグリーンシートが下層側に位置するように積層することにより形成することができる。   The stepped portion is, for example, the size of the punched portion that becomes the recess 2 is made smaller for some ceramic green sheets than the other ceramic green sheets, and the ceramic green sheet with the smaller size of the punched portion is the lower layer side It can form by laminating | stacking so that it may be located in.

このような電子部品収納用パッケージ9の絶縁基体1を形成するセラミック絶縁層1aは、酸化アルミニウム質焼結体やムライト質焼結体,窒化アルミニウム質焼結体,窒化ケイ素質焼結体,ガラスセラミック焼結体等のセラミック焼結体からなる。   The ceramic insulating layer 1a forming the insulating base 1 of the electronic component storage package 9 is composed of an aluminum oxide sintered body, a mullite sintered body, an aluminum nitride sintered body, a silicon nitride sintered body, glass, or the like. It consists of a ceramic sintered body such as a ceramic sintered body.

また、絶縁基体1の上面の凹部2は、一部のセラミック絶縁層1aの中央部が厚み方向に貫通されて形成されている。   Further, the concave portion 2 on the upper surface of the insulating base 1 is formed by penetrating the central portion of a part of the ceramic insulating layer 1a in the thickness direction.

このようなセラミック絶縁層1aが複数積層されてなる絶縁基体1は、例えば、酸化アルミニウム質焼結体から成る場合であれば、酸化アルミニウムや酸化ケイ素,酸化ホウ素,酸化マグネシウム,酸化カルシウム等の原料粉末に適当な有機バインダおよび溶剤等を添加混合して泥漿物を作るとともに、この泥漿物をドクターブレード法やカレンダーロール法を採用することによってセラミックグリーンシートに成形し、その後、セラミックグリーンシートを複数枚積層し、この積層体を約1600℃の温度で焼成することによって製作される。   If the insulating substrate 1 formed by laminating a plurality of such ceramic insulating layers 1a is made of an aluminum oxide sintered body, for example, a raw material such as aluminum oxide, silicon oxide, boron oxide, magnesium oxide, calcium oxide or the like. A suitable organic binder and solvent are added to the powder to make a slurry, and this slurry is formed into a ceramic green sheet by adopting a doctor blade method or a calender roll method. It is manufactured by laminating sheets and firing the laminate at a temperature of about 1600 ° C.

また、凹部2は、最上層のセラミック絶縁層1aや最上層から下側に連続する複数のセラミック絶縁層1a等の一部のセラミック絶縁層1aの中央部を厚み方向に貫通することにより形成されている。つまり、セラミック絶縁層1aとなるセラミックグリーンシートのうち積層したときに最上層となるものやその下側に連続する複数のものについて、その中央部を厚み方向に打ち抜いて枠状に加工し、この枠状に加工したセラミックグリーンシートを、打ち抜き加工を施していないセラミックグリーンシートの上に積層することにより凹部2が形成される。   The concave portion 2 is formed by penetrating through a central portion of a part of the ceramic insulating layer 1a such as the uppermost ceramic insulating layer 1a or a plurality of ceramic insulating layers 1a continuous from the uppermost layer in the thickness direction. ing. That is, among the ceramic green sheets that become the ceramic insulating layer 1a, the one that becomes the uppermost layer when laminated or a plurality of continuous ones below the ceramic green sheet are punched in the thickness direction and processed into a frame shape. The concave portion 2 is formed by laminating a ceramic green sheet processed into a frame shape on a ceramic green sheet that has not been punched.

セラミックグリーンシートの打ち抜き加工は、例えば、所定の打ち抜きパターンを備えた打ち抜き加工用の金型を用いて行なわれる。打ち抜き加工用の金型は、例えば上下に可動する上パンチと、その下側に配置されるセラミックグリーンシートの位置決め用の台板とを備えている。そして、台板上にセラミックグリーンシートを位置決めセットし、上パンチを下方に降ろしてセラミックグリーンシートを厚み方向に貫通させて打ち抜くことによって、打ち抜き加工(いわゆる穴あけ加工)が行なわれる。   The ceramic green sheet is punched using, for example, a punching die having a predetermined punching pattern. The die for punching includes, for example, an upper punch that is movable up and down, and a base plate for positioning a ceramic green sheet that is disposed below the upper punch. Then, the ceramic green sheet is positioned and set on the base plate, the upper punch is lowered, and the ceramic green sheet is punched through the thickness direction to perform punching (so-called punching).

また、この電子部品収納用パッケージ9においては、図3に要部拡大断面図で示すように、凹部2の内側面がセラミック被覆層3で被覆されている。このように凹部2の内側面がセラミック被覆層3で被覆されていることから、凹部2の内側面となっているセラミック絶縁層1aの表面から脱落しようとするセラミック粒子Cがあったとしても、そのセラミック粒子Cをセラミック被覆層3で覆って保持しておくことができる。そのため、凹部2の内側面からのセラミック粒子Cの脱落が抑制された電子部品収納用パッケージ9を提供することができる。なお、図3は、図1に示す電子部品収納用パッケージ9の要部を拡大して示す要部拡大断面図である。図3において図1と同様の部位には同様の符号を付している。   In the electronic component storage package 9, the inner surface of the recess 2 is covered with the ceramic coating layer 3 as shown in an enlarged cross-sectional view of the main part in FIG. 3. Since the inner surface of the recess 2 is covered with the ceramic coating layer 3 in this way, even if there are ceramic particles C that are about to fall off from the surface of the ceramic insulating layer 1a that is the inner surface of the recess 2, The ceramic particles C can be covered and held with the ceramic coating layer 3. Therefore, it is possible to provide the electronic component storage package 9 in which the ceramic particles C are prevented from dropping from the inner surface of the recess 2. FIG. 3 is an enlarged cross-sectional view of the main part showing the main part of the electronic component storage package 9 shown in FIG. In FIG. 3, the same parts as those in FIG.

セラミック被覆層3は、セラミック粒子Cを含むセラミック絶縁層1aのセラミック材料(セラミック成分)と接合し得るセラミック材料からなるセラミック粉末を主成分とし、これに、セラミック粉末同士を結合させたり、セラミック被覆層3とセラミック絶縁層1aとの接合を補強したりするためのガラス成分や助剤等が添加されて構成されている。セラミック絶縁層1aのセラミック成分とセラミック被覆層3のセラミック成分との接合は、両者の焼結によるものであり、前述のガラス成分を介した液相焼結を含む。   The ceramic coating layer 3 is mainly composed of ceramic powder made of a ceramic material that can be bonded to the ceramic material (ceramic component) of the ceramic insulating layer 1a containing the ceramic particles C, and the ceramic powder is bonded to the ceramic coating layer. A glass component, an auxiliary agent, or the like for reinforcing the bonding between the layer 3 and the ceramic insulating layer 1a is added. The joining of the ceramic component of the ceramic insulating layer 1a and the ceramic component of the ceramic coating layer 3 is due to sintering of both, and includes liquid phase sintering via the glass component described above.

セラミック被覆層3は、凹部2の内側面を、セラミック粒子Cの脱落を効果的に抑制して被覆するために、少なくとも凹部2の内側面の表面の粗さ(最大粗さ:Rmax)程度の厚さであることが好ましい。例えば、セラミック絶縁層1aが酸化アルミニウムの含有率95〜99質量%程度の酸化アルミニウム質焼結体や、酸化ホウ素,酸化ケイ素等のガラス成分を約40〜60体積%含有するガラスセラミック焼結体である場合には、打ち抜かれて露出した側面の最大粗さが約10〜15μm程度になるため、セラミック被覆層3の厚さを約15μm以上に設定すればよい。また、セラミック被覆層3は、厚くなり過ぎると凹部2の内側面から剥がれやすくなる可能性があるため、約15〜50μm程度の範囲とすることが好ましい。また、セラミック被覆層3を形成するセラミック材料の粒径(平均粒径)は、前述したセラミック被覆層3の厚みに対して約1/5〜1/10程度にしておけばよい。   The ceramic coating layer 3 covers at least the surface roughness (maximum roughness: Rmax) of the inner surface of the recess 2 in order to cover the inner surface of the recess 2 while effectively suppressing the falling of the ceramic particles C. A thickness is preferred. For example, the ceramic insulating layer 1a contains an aluminum oxide sintered body having an aluminum oxide content of about 95 to 99% by mass, or a glass ceramic sintered body containing about 40 to 60% by volume of a glass component such as boron oxide or silicon oxide. In this case, since the maximum roughness of the side surface that is punched and exposed is about 10 to 15 μm, the thickness of the ceramic coating layer 3 may be set to about 15 μm or more. Moreover, since the ceramic coating layer 3 may become easy to peel from the inner surface of the recessed part 2 when it becomes too thick, it is preferable to set it as the range of about 15-50 micrometers. The particle size (average particle size) of the ceramic material forming the ceramic coating layer 3 may be about 1/5 to 1/10 of the thickness of the ceramic coating layer 3 described above.

このようなセラミック被覆層3を形成するセラミック材料としては、酸化アルミニウム質焼結体やムライト質焼結体,窒化アルミニウム質焼結体,窒化ケイ素質焼結体,ガラスセラミック焼結体等のセラミック材料を用いることができる。なお、セラミック被覆層3は、セラミック絶縁層1a(絶縁基体1)との同時焼成により形成するためには、セラミック絶縁層1aと同様の組成のものとしておくことが好ましい。   Ceramic materials for forming the ceramic coating layer 3 include ceramics such as an aluminum oxide sintered body, a mullite sintered body, an aluminum nitride sintered body, a silicon nitride sintered body, and a glass ceramic sintered body. Materials can be used. In order to form the ceramic coating layer 3 by co-firing with the ceramic insulating layer 1a (insulating base 1), it is preferable to have the same composition as the ceramic insulating layer 1a.

セラミック被覆層3は、前述のように、これらのセラミック材料にガラス材料や焼結助剤等が添加されて構成されており,必要に応じて着色用の金属酸化物等が混合されていてもよい。   As described above, the ceramic coating layer 3 is configured by adding a glass material, a sintering aid, or the like to these ceramic materials, and if necessary, a metal oxide for coloring may be mixed. Good.

添加するガラス材料としては、例えばセラミック絶縁層1aおよびセラミック被覆層3がともに酸化アルミニウム質焼結体や酸化物系ガラスを含むガラスセラミック焼結体,ムライト質焼結体等の酸化物系材料からなる場合であれば、酸化ケイ素や酸化ホウ素,酸化カルシウム,酸化リチウム等の酸化物系のガラス材料を用いることができる。   As the glass material to be added, for example, the ceramic insulating layer 1a and the ceramic coating layer 3 are made of an oxide-based material such as an aluminum oxide sintered body, a glass ceramic sintered body containing an oxide-based glass, or a mullite sintered body. In such a case, an oxide-based glass material such as silicon oxide, boron oxide, calcium oxide, or lithium oxide can be used.

また、セラミック絶縁層1aおよびセラミック被覆層3がともに窒化アルミニウム質焼結体からなる場合であれば、酸化カルシウムや酸化ストロンチウム,酸化バリウム,酸化イットリウム等の焼結助剤を添加することができる。また、セラミック絶縁層1aおよびセラミック被覆層3がともに窒化ケイ素質焼結体からなる場合であれば、酸化イットリウム等の希土類金属の酸化物等の焼結助剤を混合することができる。   Further, if both the ceramic insulating layer 1a and the ceramic coating layer 3 are made of an aluminum nitride sintered body, a sintering aid such as calcium oxide, strontium oxide, barium oxide, yttrium oxide, or the like can be added. Further, if both the ceramic insulating layer 1a and the ceramic coating layer 3 are made of a silicon nitride sintered body, a sintering aid such as an oxide of a rare earth metal such as yttrium oxide can be mixed.

また、着色剤としては、酸化クロムや酸化モリブデン等の金属の酸化物を用いることができる。このような着色剤でセラミック被覆層3を暗緑色や暗褐色等に着色しておけば、凹部2内での余計な光の反射を抑えることができるので、電子部品4が撮像素子であるような場合には、より信頼性の高い電子装置を製作することが可能な電子部品収納用パッケージ9とすることができる。   As the colorant, a metal oxide such as chromium oxide or molybdenum oxide can be used. If the ceramic coating layer 3 is colored in dark green or dark brown with such a colorant, it is possible to suppress the reflection of extra light in the recess 2, so that the electronic component 4 is an imaging device. In such a case, the electronic component storage package 9 that can manufacture an electronic device with higher reliability can be obtained.

セラミック被覆層3は、例えば、このようなセラミック材料とガラス材料等の原料粉末を有機溶剤およびバインダとともに混練してペースト状の混合物を作製し、この混合物を凹部2の内側面となる部位(打ち抜き加工されたセラミックグリーンシートの枠状の部分の内側面)に塗布することにより形成することができる。また、ペースト状の混合物の粘度を、有機溶剤の添加量を増やすこと等で下げておいて、凹部2の内側面となる部位に吹き付けて被着させるようにしてもよい。また、セラミック絶縁層1aは、このような原料粉末の混合物をシート状に成形し、これを凹部2の内側面となる部位に位置決めして貼り付けておき、絶縁基体1(セラミックグリーンシートの積層体)と同時焼成することにより形成することもできる。   The ceramic coating layer 3 is prepared, for example, by kneading such a ceramic material and a raw material powder such as a glass material together with an organic solvent and a binder to prepare a paste-like mixture, and this mixture is a portion (punched) that becomes the inner surface of the recess 2. It can be formed by applying to the inner surface of the processed ceramic green sheet. Alternatively, the viscosity of the paste-like mixture may be lowered by increasing the amount of the organic solvent added, etc., and sprayed onto the portion that will be the inner surface of the recess 2 for deposition. Further, the ceramic insulating layer 1a is formed by forming a mixture of such raw material powders into a sheet shape, and positioning and affixing the mixture to a portion serving as the inner side surface of the recess 2 to form the insulating substrate 1 (lamination of ceramic green sheets). Body) and simultaneous firing.

なお、例えばセラミック被覆層3を、セラミック材料とガラス材料とを混合した原料粉末を用いて作製したペースト状の混合物の塗布で形成する場合は、その塗布は、打ち抜き加工された個々のセラミックグリーンシートに(積層する前に)行なってもよく、セラミックグリーンシートの積層体のうち凹部2の内側面となる部位に一括して塗布するようにしてもよい。   For example, when the ceramic coating layer 3 is formed by application of a paste-like mixture prepared using a raw material powder obtained by mixing a ceramic material and a glass material, the application is performed by punching individual ceramic green sheets. (Before lamination), or may be applied collectively to a portion of the laminated body of ceramic green sheets which will be the inner surface of the recess 2.

また、この電子部品収納用パッケージ9は、上記構成において、セラミック被覆層3が、セラミック絶縁層1aよりも多い割合でガラス成分を含有している場合には、セラミック被覆層3がより多くのガラス成分を介してセラミック絶縁層1aに接合し、被覆することができる。したがって、この場合には、より一層効果的に絶縁基体1の凹部2の内側面からのセラミック粒子Cの脱落が防止された電子部品収納用パッケージ9を提供することができる。   In the electronic component storage package 9, in the above configuration, when the ceramic coating layer 3 contains a glass component in a larger proportion than the ceramic insulating layer 1 a, the ceramic coating layer 3 contains more glass. It can be bonded to and coated on the ceramic insulating layer 1a via components. Therefore, in this case, it is possible to provide the electronic component storage package 9 in which the ceramic particles C are prevented from dropping off from the inner surface of the recess 2 of the insulating base 1 even more effectively.

また、この場合には、セラミック被覆層3自体も、より多くのガラス成分を介してセラミック絶縁層1aに接合されるので、セラミック被覆層3自体のセラミック絶縁層1aからの剥がれ等をより有効に抑制することもできる。   Further, in this case, the ceramic coating layer 3 itself is also bonded to the ceramic insulating layer 1a through more glass components, so that the ceramic coating layer 3 itself can be more effectively removed from the ceramic insulating layer 1a. It can also be suppressed.

なお、セラミック絶縁層1aが含有するガラス成分とは、例えば、前述した酸化アルミニウム質焼結体からなるセラミック絶縁層1aに添加される酸化ケイ素や酸化ホウ素等のガラス成分や、ガラスセラミック焼結体を構成するガラス成分(酸化ケイ素や酸化ホウ素,酸化リチウム等)である。   The glass component contained in the ceramic insulating layer 1a is, for example, a glass component such as silicon oxide or boron oxide added to the ceramic insulating layer 1a made of the above-described aluminum oxide sintered body, or a glass ceramic sintered body. Are glass components (silicon oxide, boron oxide, lithium oxide, etc.).

例えば、セラミック被覆層3およびセラミック絶縁層1aがともに酸化アルミニウム質焼結体であり、含有するガラス成分が同じ(酸化ケイ素や酸化ホウ素,酸化カルシウム等)であれば、セラミック被覆層3中のガラス成分は、セラミック絶縁層1a中のガラス成分に対して体積比で約1.1〜2倍程度にしておけばよい。セラミック被覆層3およびセラミック絶縁層1aがともにガラスセラミック焼結体(酸化アルミニウムと酸化ケイ素や酸化ホウ素等のガラス成分との焼結体)からなる場合、つまりセラミック絶縁層1aのガラス成分が比較的多い場合であれば、セラミック被覆層3中のガラス成分は、セラミック絶縁層1a中のガラス成分に対して体積比で約1.05〜1.2倍程度にしておけばよい。   For example, if the ceramic coating layer 3 and the ceramic insulating layer 1a are both aluminum oxide sintered bodies and the glass components contained are the same (silicon oxide, boron oxide, calcium oxide, etc.), the glass in the ceramic coating layer 3 The component may be about 1.1 to 2 times the volume of the glass component in the ceramic insulating layer 1a. When both the ceramic coating layer 3 and the ceramic insulating layer 1a are made of a glass ceramic sintered body (a sintered body of aluminum oxide and a glass component such as silicon oxide or boron oxide), that is, the glass component of the ceramic insulating layer 1a is relatively In many cases, the glass component in the ceramic coating layer 3 may be about 1.05 to 1.2 times in volume ratio with respect to the glass component in the ceramic insulating layer 1a.

また、このような、セラミック被覆層3にセラミック絶縁層1aよりも多い割合で含有させるガラス成分は、セラミック被覆層3およびセラミック絶縁層1aの両方で同様の組成としておいて、両者の接合をより容易に、かつ強固にすることが好ましい。   Moreover, the glass component contained in the ceramic coating layer 3 in a proportion higher than that of the ceramic insulating layer 1a is set to the same composition in both the ceramic coating layer 3 and the ceramic insulating layer 1a, and the bonding between the two is more performed. It is preferable to make it easy and strong.

具体例を挙げると、図1に示すような構造の電子部品収納用パッケージ9において、各セラミック絶縁層1aを、厚みが約0.25mmで酸化アルミニウムの含有量が約97質量%の酸化アルミニウム質焼結体からなるものとした場合には、凹部2の内側面の最大粗さが約10μmになり、約10μm程度の寸法のセラミック粒子が脱落する可能性がある。この場合に、厚さが約30μmのセラミック被覆層3で凹部2の内側面を被覆することにより、約1200個の電子部品収納用パッケージにおいて、凹部2内に収納した電子部品4に不具合が発生せず、セラミック粒子の脱落を抑えることができたことが確認されている。このときのセラミック被覆層3は、酸化アルミニウム(平均粒径が約3μmの粒子)を主成分として約95質量%含有し、他にガラス成分として酸化ケイ素,酸化ホウ素および酸化カルシウムを含有するものであった。また、このときの電子部品4は、携帯電話用のカメラ等に使用される、外形寸法が約7×5mmの四角板状で、画素サイズが2.2×2.2μm(300万画素)のCMOS型撮像素子であった。   As a specific example, in the electronic component storage package 9 having the structure shown in FIG. 1, each ceramic insulating layer 1a is made of an aluminum oxide-based material having a thickness of about 0.25 mm and an aluminum oxide content of about 97% by mass. When it is made of a knot, the maximum roughness of the inner surface of the recess 2 is about 10 μm, and ceramic particles having a size of about 10 μm may fall off. In this case, when the inner surface of the recess 2 is covered with the ceramic coating layer 3 having a thickness of about 30 μm, a defect occurs in the electronic component 4 stored in the recess 2 in about 1200 electronic component storage packages. It was confirmed that the falling of the ceramic particles could be suppressed. The ceramic coating layer 3 at this time contains about 95% by mass of aluminum oxide (particles having an average particle diameter of about 3 μm) as a main component, and also contains silicon oxide, boron oxide and calcium oxide as glass components. there were. In addition, the electronic component 4 at this time is a square plate shape having an outer dimension of about 7 × 5 mm and a pixel size of 2.2 × 2.2 μm (3 million pixels) used for a mobile phone camera or the like. It was an element.

また、このような電子部品収納用パッケージ9は、上記構成において、セラミック被覆層3は、セラミック絶縁層1aのセラミック成分と同じセラミック成分を主成分としている場合には、同じセラミック成分同士が接合することにより、セラミック絶縁層1aに対してより強固に接合される。また、セラミック被覆層3の熱膨張率(線膨張係数)をセラミック絶縁層1aの熱膨張率に近似させることが容易であるため、セラミック被覆層3とセラミック絶縁層1aとの間で両者の熱膨張率の差に起因する大きな熱応力が生じることを効果的に抑制することも容易である。そのため、このような熱応力等の応力によるセラミック被覆層3のセラミック絶縁層1aに対する接合の強度の低下をより効果的に抑制することができる。したがって、この場合には、セラミック被覆層3自体の剥がれがより有効に抑制された電子部品収納用パッケージ9を提供することができる。   Further, in the electronic component storage package 9 having the above-described configuration, when the ceramic coating layer 3 is mainly composed of the same ceramic component as the ceramic component of the ceramic insulating layer 1a, the same ceramic components are bonded to each other. Thereby, it joins more firmly with respect to the ceramic insulating layer 1a. Moreover, since it is easy to approximate the thermal expansion coefficient (linear expansion coefficient) of the ceramic coating layer 3 to the thermal expansion coefficient of the ceramic insulating layer 1a, the heat of both between the ceramic coating layer 3 and the ceramic insulating layer 1a is obtained. It is also easy to effectively suppress the occurrence of a large thermal stress due to the difference in expansion coefficient. Therefore, it is possible to more effectively suppress a decrease in the strength of bonding of the ceramic coating layer 3 to the ceramic insulating layer 1a due to such stress as thermal stress. Therefore, in this case, it is possible to provide the electronic component storage package 9 in which peeling of the ceramic coating layer 3 itself is more effectively suppressed.

例えば、セラミック絶縁層1aが、酸化アルミニウムの含有率が95〜99質量%程度の酸化アルミニウム質焼結体からなる場合には、セラミック被覆層3は、酸化アルミニウム粒子を主成分として形成するようにすればよい。なお、この場合、酸化アルミニウム粒子の含有量は、セラミック絶縁層1aとセラミック被覆層3との間で熱膨張率を合わせる上では同じ程度であることが好ましい。また、前述したように、ガラス成分を多くすることによるセラミック被覆層3のセラミック絶縁層1aに対する接合を強固とする効果を得る上では、セラミック被覆層3側の酸化アルミニウム粒子の含有率を相対的に少なく(ガラス成分を多く)しておくことが好ましい。このような場合には、セラミック被覆層3の酸化アルミニウム粒子の含有量は、例えば約90〜99質量%程度の範囲で、セラミック絶縁層1aの厚さやセラミックペーストの印刷のしやすさ等の条件に応じて、適宜設定すればよい。   For example, when the ceramic insulating layer 1a is made of an aluminum oxide sintered body having an aluminum oxide content of about 95 to 99% by mass, the ceramic coating layer 3 is formed with aluminum oxide particles as the main component. do it. In this case, it is preferable that the content of the aluminum oxide particles is approximately the same in order to match the coefficient of thermal expansion between the ceramic insulating layer 1a and the ceramic coating layer 3. Further, as described above, in order to obtain an effect of strengthening the bonding of the ceramic coating layer 3 to the ceramic insulating layer 1a by increasing the glass component, the content ratio of the aluminum oxide particles on the ceramic coating layer 3 side is relatively set. It is preferable that the amount is small (the glass component is large). In such a case, the content of the aluminum oxide particles in the ceramic coating layer 3 is, for example, in the range of about 90 to 99% by mass, and the conditions such as the thickness of the ceramic insulating layer 1a and the ease of printing of the ceramic paste. It may be set appropriately according to the above.

また、セラミック被覆層3は、凹部2の内側面のうち、貫通されたセラミック絶縁層1a(セラミックグリーンシート)の破断面となっている部分における厚さを、他の部分における厚さよりも厚くしてもよい。   Moreover, the ceramic coating layer 3 makes the thickness in the part which becomes the torn surface of the ceramic insulating layer 1a (ceramic green sheet) penetrated among the inner surfaces of the recessed part 2 larger than the thickness in another part. May be.

例えば、配線基板9は、図4(a)に断面図で示すように、打ち抜き加工したセラミックグリーンシートを、凹部2内の段状の部分と、それよりも上の層および下の層とに分けて分割積層体11〜13を作製した後、この分割積層体11〜13のうち上側に積層される分割積層体12,13のそれぞれの所定部位P2,P3に打ち抜き加工を施し、打ち抜いた後の凹部2の内側面となるそれぞれの面にセラミック被覆層3となるペースト状の混合物を塗布して、その後、これらを積層して焼成するような方法で製作する場合がある。なお、図4(a)は、本発明の電子部品収納用パッケージの製造工程の一例を模式的に示す断面図であり、図4(b)は(a)の製造工程を経て製作された電子部品収納用パッケージ9の要部を拡大して示す要部拡大断面図である。図4において図1と同様の部位には同様の符号を付している。   For example, as shown in a sectional view of FIG. 4A, the wiring board 9 is formed by punching a ceramic green sheet into a stepped portion in the recess 2, and a layer above and below the stepped portion. After the divided laminates 11 to 13 are separately manufactured, the punching process is performed on the predetermined portions P2 and P3 of the divided laminates 12 and 13 that are laminated on the upper side of the divided laminates 11 to 13, and the die is punched. In some cases, a paste-like mixture that becomes the ceramic coating layer 3 is applied to each of the inner surfaces of the recesses 2 and then laminated and fired. 4A is a cross-sectional view schematically showing an example of the manufacturing process of the electronic component storage package of the present invention, and FIG. 4B is an electronic diagram manufactured through the manufacturing process of FIG. FIG. 4 is an enlarged cross-sectional view of a main part showing an enlarged main part of a component storage package 9. 4, parts similar to those in FIG. 1 are denoted by the same reference numerals.

このような場合には、分割積層体12,13のそれぞれで、打ち抜き時に下側となる部分が破断面になりやすい(その部分よりも上側はいわゆる剪断面となり、表面の粗さが小さく、ささくれも生じにくい)。これに対し、図4(b)に示すように、凹部2の内側面のうち破断面となりやすい下側部分でセラミック被覆層3を厚くしておけば、そのような部分でより有効にセラミック粒子(図4では図示せず)をセラミック被覆層3で覆って保持し、セラミック絶縁層1aからの脱落を効果的に抑制することができる。   In such a case, in each of the divided laminates 12 and 13, the lower part is likely to have a fractured surface at the time of punching (the upper part becomes a so-called shear surface, the roughness of the surface is small, and caressed. Is less likely to occur). On the other hand, as shown in FIG. 4B, if the ceramic coating layer 3 is thickened at the lower portion of the inner surface of the recess 2 that tends to be a fracture surface, the ceramic particles are more effectively produced at such a portion. (Not shown in FIG. 4) is covered and held by the ceramic coating layer 3, and the falling off from the ceramic insulating layer 1a can be effectively suppressed.

また、このような場合には、セラミック被覆層3を全体的に厚くする場合に比べて、セラミック被覆層3に生じる可能性のある内部応力(焼成時の残留応力等)をより小さく抑えることができる。そのため、セラミック被覆層3自体のセラミック絶縁層1aに対する接合の強度を確保しながら、凹部2の内側面からのセラミック粉末の脱落を効果的に抑制することが可能な電子部品収納用パッケージ9とすることができる。   In such a case, internal stress (such as residual stress during firing) that may occur in the ceramic coating layer 3 can be suppressed to a smaller value than when the ceramic coating layer 3 is made thick overall. it can. Therefore, the electronic component storage package 9 is capable of effectively suppressing the falling of the ceramic powder from the inner surface of the recess 2 while ensuring the strength of bonding of the ceramic coating layer 3 itself to the ceramic insulating layer 1a. be able to.

本発明の電子部品収納用パッケージの実施の形態の一例を示す断面図である。It is sectional drawing which shows an example of embodiment of the electronic component storage package of this invention. セラミックグリーンシートに金型を用いて打ち抜き加工を施している状況を模式的に示す断面図である。It is sectional drawing which shows typically the condition which has punched the ceramic green sheet using the metal mold | die. 図1に示す電子部品収納用パッケージの要部を拡大して示す要部拡大断面図である。It is a principal part expanded sectional view which expands and shows the principal part of the electronic component storage package shown in FIG. (a)は本発明の電子部品収納用パッケージの製造工程の一例を模式的に示す断面図であり、(b)は(a)の製造工程を経て製作された電子部品収納用パッケージの要部を拡大して示す要部拡大断面図である。(A) is sectional drawing which shows typically an example of the manufacturing process of the electronic component storage package of this invention, (b) is the principal part of the electronic component storage package manufactured through the manufacturing process of (a). It is a principal part expanded sectional view which expands and shows.

符号の説明Explanation of symbols

1・・・・・絶縁基体
1a・・・・セラミック絶縁層
1b・・・・セラミックグリーンシート
2・・・・・凹部
3・・・・・セラミック被覆層
4・・・・・電子部品
5・・・・・配線導体
6・・・・・ボンディングワイヤ
9・・・・・電子部品収納用パッケージ
11〜13・・・分割積層体
C・・・・・セラミック粉末
P2,P3・打ち抜き加工する所定部位
DESCRIPTION OF SYMBOLS 1 ... Insulating base | substrate 1a ... Ceramic insulating layer 1b ... Ceramic green sheet 2 ... Recess 3 ... Ceramic coating layer 4 ... Electronic component 5 .... Wiring conductor 6 ... Bonding wire 9 ... Package for storing electronic components
11-13 ... Divided laminate C ... Ceramic powder P2, P3-Predetermined part to be punched

Claims (3)

複数のセラミック絶縁層が積層されてなる絶縁基体の上面に、一部の前記セラミック絶縁層の中央部が厚み方向に貫通されて形成された電子部品収納用の凹部を有し、該凹部の内側面がセラミック被覆層で被覆されていることを特徴とする電子部品収納用パッケージ。 On the upper surface of an insulating substrate formed by laminating a plurality of ceramic insulating layers, there is a recess for storing an electronic component formed by penetrating a central portion of a part of the ceramic insulating layer in the thickness direction. A package for storing electronic parts, wherein the side surface is coated with a ceramic coating layer. 前記セラミック被覆層が、前記セラミック絶縁層よりも多い割合でガラス成分を含有していることを特徴とする請求項1記載の電子部品収納用パッケージ。 The electronic component storage package according to claim 1, wherein the ceramic coating layer contains a glass component in a larger proportion than the ceramic insulating layer. 前記セラミック被覆層は、前記セラミック絶縁層のセラミック材料と同じセラミック材料を主成分としていることを特徴とする請求項1記載の電子部品収納用パッケージ。 2. The electronic component storing package according to claim 1, wherein the ceramic coating layer is mainly composed of the same ceramic material as the ceramic material of the ceramic insulating layer.
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