JP2009192524A5 - - Google Patents
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- Publication number
- JP2009192524A5 JP2009192524A5 JP2008300302A JP2008300302A JP2009192524A5 JP 2009192524 A5 JP2009192524 A5 JP 2009192524A5 JP 2008300302 A JP2008300302 A JP 2008300302A JP 2008300302 A JP2008300302 A JP 2008300302A JP 2009192524 A5 JP2009192524 A5 JP 2009192524A5
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- JP
- Japan
- Prior art keywords
- information
- terahertz
- unit
- frequency
- terahertz wave
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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- 239000006185 dispersion Substances 0.000 claims description 14
- 238000001514 detection method Methods 0.000 claims description 12
- 239000000523 sample Substances 0.000 claims description 10
- 238000000034 method Methods 0.000 claims description 8
- 238000005259 measurement Methods 0.000 claims description 5
- 230000001678 irradiating effect Effects 0.000 claims 5
- 230000005684 electric field Effects 0.000 claims 4
- 239000013078 crystal Substances 0.000 claims 3
- 230000010287 polarization Effects 0.000 claims 2
- 239000012491 analyte Substances 0.000 claims 1
- 239000000284 extract Substances 0.000 claims 1
- 238000009532 heart rate measurement Methods 0.000 claims 1
- 230000003287 optical effect Effects 0.000 claims 1
- 238000010521 absorption reaction Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 239000004698 Polyethylene Substances 0.000 description 2
- 229920001903 high density polyethylene Polymers 0.000 description 2
- 239000004700 high-density polyethylene Substances 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- -1 polyethylene Polymers 0.000 description 2
- 229920000573 polyethylene Polymers 0.000 description 2
- WQZGKKKJIJFFOK-GASJEMHNSA-N Glucose Natural products OC[C@H]1OC(O)[C@H](O)[C@@H](O)[C@@H]1O WQZGKKKJIJFFOK-GASJEMHNSA-N 0.000 description 1
- 239000004809 Teflon Substances 0.000 description 1
- 229920006362 Teflon® Polymers 0.000 description 1
- 238000000862 absorption spectrum Methods 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 239000003814 drug Substances 0.000 description 1
- 239000008103 glucose Substances 0.000 description 1
- 229910010272 inorganic material Inorganic materials 0.000 description 1
- 239000011147 inorganic material Substances 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 239000004038 photonic crystal Substances 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 239000002210 silicon-based material Substances 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008300302A JP5341488B2 (ja) | 2008-01-18 | 2008-11-26 | テラヘルツ波を測定するための装置及び方法 |
| PCT/JP2009/051019 WO2009091078A1 (en) | 2008-01-18 | 2009-01-16 | Apparatus and method for measuring terahertz wave |
| US12/742,905 US8207501B2 (en) | 2008-01-18 | 2009-01-16 | Apparatus and method for measuring terahertz wave |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008009896 | 2008-01-18 | ||
| JP2008009896 | 2008-01-18 | ||
| JP2008300302A JP5341488B2 (ja) | 2008-01-18 | 2008-11-26 | テラヘルツ波を測定するための装置及び方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2009192524A JP2009192524A (ja) | 2009-08-27 |
| JP2009192524A5 true JP2009192524A5 (OSRAM) | 2012-01-26 |
| JP5341488B2 JP5341488B2 (ja) | 2013-11-13 |
Family
ID=41074654
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2008300302A Expired - Fee Related JP5341488B2 (ja) | 2008-01-18 | 2008-11-26 | テラヘルツ波を測定するための装置及び方法 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US8207501B2 (OSRAM) |
| JP (1) | JP5341488B2 (OSRAM) |
Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5632599B2 (ja) | 2009-09-07 | 2014-11-26 | キヤノン株式会社 | 発振器 |
| US8053733B2 (en) * | 2009-09-30 | 2011-11-08 | Advantest Corporation | Electromagnetic wave measuring apparatus |
| JP5502564B2 (ja) * | 2010-03-31 | 2014-05-28 | 浜松ホトニクス株式会社 | 電磁波検出装置 |
| JP5609654B2 (ja) * | 2011-01-07 | 2014-10-22 | 株式会社村田製作所 | 被測定物の測定方法 |
| JP5735824B2 (ja) | 2011-03-04 | 2015-06-17 | キヤノン株式会社 | 情報取得装置及び情報取得方法 |
| KR101341706B1 (ko) | 2012-01-30 | 2013-12-16 | 한국과학기술원 | 전광물질을 이용한 테라헤르츠 광섬유 일점 검출장치 및 그 제조 방법 |
| WO2015112284A2 (en) * | 2013-12-17 | 2015-07-30 | Picometrix, Llc | System for transmitting and receiving electromagnetic radiation |
| WO2016022757A1 (en) * | 2014-08-06 | 2016-02-11 | University Of Massachusetts | Single channel terahertz endoscopy |
| US10092209B2 (en) * | 2014-10-03 | 2018-10-09 | Advantest Corporation | Non-invasive in situ glucose level sensing using electromagnetic radiation |
| CN104296884B (zh) | 2014-10-22 | 2017-12-12 | 上海交通大学 | 超高速光采样时钟的多通道失配测量方法及测量补偿装置 |
| JP6483453B2 (ja) * | 2015-01-30 | 2019-03-13 | 国立大学法人横浜国立大学 | テラヘルツ電場波形検出装置 |
| JP7362409B2 (ja) | 2019-10-17 | 2023-10-17 | キヤノン株式会社 | 照明装置およびカメラシステム |
| EP4131462A4 (en) * | 2020-03-26 | 2024-07-24 | SANYO Electric Co., Ltd. | NON-AQUEOUS ELECTROLYTE SECONDARY BATTERY |
| CN111537466B (zh) * | 2020-05-15 | 2022-07-05 | 西安理工大学 | 一种用于检测细胞和生物大分子的瞬态THz光谱仪 |
| CN112558334A (zh) * | 2020-12-01 | 2021-03-26 | 中国科学院上海光学精密机械研究所 | 一种超快光开关及光调制的结构 |
| JP2023157737A (ja) | 2022-04-15 | 2023-10-26 | キヤノン株式会社 | アンテナ装置、通信装置、及び、撮像システム |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01176920A (ja) * | 1987-12-31 | 1989-07-13 | Hamamatsu Photonics Kk | 分光計測装置 |
| US5144374A (en) * | 1990-04-27 | 1992-09-01 | Cselt - Centro Studi E Laboratori Telecommunicazioni S.P.A. | Optical spectroscopy system |
| US5623145A (en) * | 1995-02-15 | 1997-04-22 | Lucent Technologies Inc. | Method and apparatus for terahertz imaging |
| US5710430A (en) | 1995-02-15 | 1998-01-20 | Lucent Technologies Inc. | Method and apparatus for terahertz imaging |
| JP4136858B2 (ja) | 2003-09-12 | 2008-08-20 | キヤノン株式会社 | 位置検出装置、及び情報入力装置 |
| JP4217646B2 (ja) | 2004-03-26 | 2009-02-04 | キヤノン株式会社 | 認証方法及び認証装置 |
| JP4878180B2 (ja) | 2005-03-24 | 2012-02-15 | キヤノン株式会社 | 電磁波を用いる検査装置 |
| JP4898472B2 (ja) | 2006-04-11 | 2012-03-14 | キヤノン株式会社 | 検査装置 |
| US8067739B2 (en) | 2007-06-22 | 2011-11-29 | Canon Kabushiki Kaisha | Photoconductive element for generation and detection of terahertz wave |
| JP4975000B2 (ja) | 2007-12-07 | 2012-07-11 | キヤノン株式会社 | 電磁波発生素子、電磁波集積素子、及び電磁波検出装置 |
| JP4834718B2 (ja) | 2008-01-29 | 2011-12-14 | キヤノン株式会社 | パルスレーザ装置、テラヘルツ発生装置、テラヘルツ計測装置及びテラヘルツトモグラフィー装置 |
| JP5328319B2 (ja) | 2008-01-29 | 2013-10-30 | キヤノン株式会社 | テラヘルツ波を用いた検査装置及び検査方法 |
-
2008
- 2008-11-26 JP JP2008300302A patent/JP5341488B2/ja not_active Expired - Fee Related
-
2009
- 2009-01-16 US US12/742,905 patent/US8207501B2/en not_active Expired - Fee Related
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