JP2009188349A5 - - Google Patents

Download PDF

Info

Publication number
JP2009188349A5
JP2009188349A5 JP2008029477A JP2008029477A JP2009188349A5 JP 2009188349 A5 JP2009188349 A5 JP 2009188349A5 JP 2008029477 A JP2008029477 A JP 2008029477A JP 2008029477 A JP2008029477 A JP 2008029477A JP 2009188349 A5 JP2009188349 A5 JP 2009188349A5
Authority
JP
Japan
Prior art keywords
plasma
insulating film
processing
range
forming
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2008029477A
Other languages
English (en)
Japanese (ja)
Other versions
JP5374749B2 (ja
JP2009188349A (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from JP2008029477A external-priority patent/JP5374749B2/ja
Priority to JP2008029477A priority Critical patent/JP5374749B2/ja
Priority to KR1020107017596A priority patent/KR101248651B1/ko
Priority to PCT/JP2009/052447 priority patent/WO2009099254A1/ja
Priority to TW098103865A priority patent/TWI445083B/zh
Priority to US12/865,969 priority patent/US8034179B2/en
Publication of JP2009188349A publication Critical patent/JP2009188349A/ja
Publication of JP2009188349A5 publication Critical patent/JP2009188349A5/ja
Publication of JP5374749B2 publication Critical patent/JP5374749B2/ja
Application granted granted Critical
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2008029477A 2008-02-08 2008-02-08 絶縁膜の形成方法、コンピュータ読み取り可能な記憶媒体および処理システム Expired - Fee Related JP5374749B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2008029477A JP5374749B2 (ja) 2008-02-08 2008-02-08 絶縁膜の形成方法、コンピュータ読み取り可能な記憶媒体および処理システム
US12/865,969 US8034179B2 (en) 2008-02-08 2009-02-06 Method for insulating film formation, storage medium from which information is readable with computer, and processing system
PCT/JP2009/052447 WO2009099254A1 (ja) 2008-02-08 2009-02-06 絶縁膜の形成方法、コンピュータ読み取り可能な記憶媒体および処理システム
TW098103865A TWI445083B (zh) 2008-02-08 2009-02-06 Insulation film formation method, the computer can read the memory media and processing system
KR1020107017596A KR101248651B1 (ko) 2008-02-08 2009-02-06 절연막의 형성 방법, 컴퓨터 판독 가능한 기억 매체 및 처리 시스템

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008029477A JP5374749B2 (ja) 2008-02-08 2008-02-08 絶縁膜の形成方法、コンピュータ読み取り可能な記憶媒体および処理システム

Publications (3)

Publication Number Publication Date
JP2009188349A JP2009188349A (ja) 2009-08-20
JP2009188349A5 true JP2009188349A5 (fi) 2011-03-17
JP5374749B2 JP5374749B2 (ja) 2013-12-25

Family

ID=41071263

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008029477A Expired - Fee Related JP5374749B2 (ja) 2008-02-08 2008-02-08 絶縁膜の形成方法、コンピュータ読み取り可能な記憶媒体および処理システム

Country Status (1)

Country Link
JP (1) JP5374749B2 (fi)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5813303B2 (ja) 2009-11-20 2015-11-17 株式会社日立国際電気 半導体装置の製造方法、基板処理方法および基板処理装置
JP6419762B2 (ja) * 2016-09-06 2018-11-07 株式会社Kokusai Electric 半導体装置の製造方法、基板処理装置およびプログラム
JP6456893B2 (ja) 2016-09-26 2019-01-23 株式会社Kokusai Electric 半導体装置の製造方法、記録媒体および基板処理装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100760078B1 (ko) * 2000-03-13 2007-09-18 다다히로 오미 산화막의 형성 방법, 질화막의 형성 방법, 산질화막의 형성 방법, 산화막의 스퍼터링 방법, 질화막의 스퍼터링 방법, 산질화막의 스퍼터링 방법, 게이트 절연막의 형성 방법
JP2005303074A (ja) * 2004-04-13 2005-10-27 Renesas Technology Corp 薄膜形成装置および薄膜形成方法

Similar Documents

Publication Publication Date Title
TWI674328B (zh) 藉由原子層沉積疏水化含矽薄膜表面的方法
JP2018503259A5 (fi)
JP2015053445A5 (fi)
JP2011192872A5 (fi)
JP2013545275A5 (fi)
JP2019508883A5 (fi)
JP2008091409A5 (fi)
JP2009206500A (ja) 薄膜形成方法、薄膜形成装置及びプログラム
JP2010267925A5 (ja) 半導体装置の製造方法、基板処理方法及び基板処理装置
JP2007088454A5 (fi)
JP2014208883A5 (fi)
JP2011097029A5 (fi)
JP2018166142A5 (fi)
JP2009545895A5 (fi)
KR101498496B1 (ko) 박막 형성 방법, 박막 형성 장치 및 프로그램이 기록된 기록 매체
TW200703505A (en) Manufacturing method of gate insulating film and of semiconductor device
JP2010171128A5 (fi)
JP2009094115A5 (fi)
JP2007042884A5 (fi)
JP2007035740A (ja) 成膜方法、成膜装置及び記憶媒体
JP2009188349A5 (fi)
JP2015529011A5 (fi)
JP2012072475A5 (fi)
JP2008535243A5 (fi)
JP2009188348A5 (fi)