JP2009123726A - Production process of aggregate of electronic component and aggregate of electronic component - Google Patents

Production process of aggregate of electronic component and aggregate of electronic component Download PDF

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JP2009123726A
JP2009123726A JP2007292741A JP2007292741A JP2009123726A JP 2009123726 A JP2009123726 A JP 2009123726A JP 2007292741 A JP2007292741 A JP 2007292741A JP 2007292741 A JP2007292741 A JP 2007292741A JP 2009123726 A JP2009123726 A JP 2009123726A
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electronic component
holding member
chip
electronic components
type electronic
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Takehiko Kai
岳彦 甲斐
Masaya Shimamura
雅哉 島村
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Taiyo Yuden Co Ltd
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Taiyo Yuden Co Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To propose a method for obtaining an aggregate of electronic components which can achieve a smaller interval between components than before, and to propose an aggregate of electronic components which can be obtained by that method. <P>SOLUTION: The production method of an aggregate of electronic components comprises a step for arranging a plurality of chip type components to be brought into contact with one another; a step for making a holding member hold the chip type components thus arranged; a step for extending the holding member holding the plurality of chip type components, to form a gap between respective chip type components; a step for feeding curable insulating resin, in a state where the holding member is extended and coating the plurality of chip type components with the insulating resin, while filling the gap with the insulating resin; and a step for removing the holding member, after the insulating resin is cured. <P>COPYRIGHT: (C)2009,JPO&INPIT

Description

本発明は、複数のチップ型電子部品を一体化した電子部品集合体の製造方法と、その製造方法によって形成される電子部品集合体に関するものである。   The present invention relates to an electronic component assembly manufacturing method in which a plurality of chip-type electronic components are integrated, and an electronic component assembly formed by the manufacturing method.

近年、携帯電話等の通信機器は小型化、高機能化が進んできている。このような通信機器は、配線基板上にICやLSI等の半導体部品、コンデンサやチップ抵抗器等の受動部品及びその他の機構部品を搭載した回路装置で構成されている。そしてこのような回路装置にも小型化の要求が高まってきている。また、この回路装置は、高機能化の要求に応えるために、搭載される部品点数が増加する傾向にある。そのため回路装置は、小型化の要求と相俟って、単位面積あたりの部品点数すなわち実装密度が高くなってきている。   In recent years, communication devices such as mobile phones have been reduced in size and functionality. Such a communication device is composed of a circuit device in which a semiconductor component such as an IC or LSI, a passive component such as a capacitor or a chip resistor, and other mechanical components are mounted on a wiring board. Such circuit devices are also increasingly required to be miniaturized. Further, this circuit device tends to increase the number of components mounted in order to meet the demand for higher functionality. For this reason, the number of parts per unit area, that is, the mounting density of the circuit device has been increased due to the demand for miniaturization.

このような回路装置は、配線基板上の接合パッドにクリーム半田を印刷塗布する工程と、この接合パッド上にマウンタによって電子部品を搭載する工程と、電子部品を搭載した配線基板をリフロー炉で加熱してクリーム半田を溶融させて、電子部品を半田付けするリフロー工程と、を経ることによって形成される。そのため、回路装置の実装密度は、部品の小型化の進行の他に、部品の寸法の誤差(公差)、マウンタの搭載位置の誤差やクリーム半田の印刷誤差の影響を受ける。現状では、これらの影響のために、回路装置の部品間の間隔は、0402タイプ(長さ×幅が0.4mm×0.2mm)の電子部品で0.1mm程度となっている。そのため電子部品の寸法に対する部品間の間隔の比率が高くなって、デッドスペースが多くなるという問題がでてきている。 Such a circuit device includes a step of printing and applying cream solder on a bonding pad on a wiring board, a step of mounting an electronic component on the bonding pad by a mounter, and a heating of the wiring substrate on which the electronic component is mounted in a reflow furnace. Then, the cream solder is melted and the electronic component is soldered to the reflow process. For this reason, the mounting density of circuit devices is influenced by component size errors (tolerances), mounter mounting position errors, and cream solder printing errors in addition to the progress of miniaturization of components. At present, due to these effects, the distance between the components of the circuit device is about 0.1 mm for electronic components of the 0402 type (length × width is 0.4 mm × 0.2 mm). Therefore, the ratio of the interval between components to the size of the electronic component is increased, and there is a problem that the dead space is increased.

このような問題を解決する手段として、アレイ型電子部品を使用する方法が挙げられる。アレイ型電子部品は、例えばコンデンサアレイであれば一個の部品中に2個以上のコンデンサが形成されているものである。例えば2010タイプ(2.0mm×1.0mm)の4連コンデンサアレイは、1005タイプ(1.0mm×0.5mm)のコンデンサを4個並べたものと同等のものである。コンデンサアレイは、個別のコンデンサを並べて搭載する場合に比べて、少なくとも部品間の間隔を必要としない分だけ実装面積が小さくなる。よってアレイ型電子部品は実装密度の高密度化に有利である。しかし、アレイ型電子部品は部品の種類(コンデンサ、抵抗器等)や部品の電気特性(静電容量、抵抗値等)が固定化されている。そのため、アレイ型電子部品は部品の種類や電気特性の選択の幅が狭くなるという問題を有している。 As a means for solving such a problem, there is a method using an array type electronic component. An array type electronic component is, for example, a capacitor array in which two or more capacitors are formed in one component. For example, a 2010 type (2.0 mm × 1.0 mm) quadruple capacitor array is equivalent to an array of four 1005 type (1.0 mm × 0.5 mm) capacitors. The capacitor array has a smaller mounting area than the case where individual capacitors are mounted side by side, so that at least an interval between components is not required. Therefore, the array-type electronic component is advantageous for increasing the mounting density. However, in the array type electronic component, the type of component (capacitor, resistor, etc.) and the electrical characteristics (capacitance, resistance value, etc.) of the component are fixed. Therefore, the array type electronic component has a problem that the range of selection of the component type and the electrical characteristics is narrowed.

そこで、部品の種類の選択や部品の電気特性の選択の幅を広げることが可能な手段として、複数の個別のチップ型電子部品を樹脂モールド等によって一体化した電子部品集合体を形成する方法が挙げられる。この電子部品集合体は、個別のチップ型電子部品を組み合わせて形成されるので、部品の種類の選択や部品の電気特性の選択の自由度が高くなる。電子部品集合体の形態としては、特開2004−179317号公報に開示されているような、保持部材に予め決められた位置関係で複数の電子部品を並べた形態のものがあり、特開2002−057434号公報に開示されているような、複数の保持用凹部を有するブロック体に電子部品を保持する形態のものがある。 Therefore, as a means for expanding the range of selection of component types and electrical characteristics of components, there is a method of forming an electronic component assembly in which a plurality of individual chip type electronic components are integrated by a resin mold or the like Can be mentioned. Since this electronic component assembly is formed by combining individual chip-type electronic components, the degree of freedom in selecting the type of component and selecting the electrical characteristics of the component is increased. As a form of the electronic component assembly, there is a configuration in which a plurality of electronic components are arranged in a predetermined positional relationship on the holding member as disclosed in Japanese Patent Application Laid-Open No. 2004-179317. There exists a form of hold | maintaining an electronic component in the block body which has the some recessed part for holding | maintenance as disclosed by -057434 gazette.

特開2004−179317号公報JP 2004-179317 A 特開2002−057434号公報JP 2002-057434 A

しかしながら、特開2004−179317号公報に開示されている電子部品集合体は、チップ型電子部品を並べる際に、部品装着機すなわちマウンタを使用するため、部品間の間隔が通常の回路装置の部品間の間隔と同等にとどまり、実装密度のさらなる高密度化が困難であった。 However, since the electronic component assembly disclosed in Japanese Patent Application Laid-Open No. 2004-179317 uses a component mounting machine, that is, a mounter, when arranging chip-type electronic components, the interval between components is a component of a normal circuit device. However, it was difficult to further increase the mounting density.

また、特開2002−057434号公報に開示されている電子部品集合体は、実装密度の高密度化を達成するには、ブロック体の保持用凹部間の間隔を現状の部品間の間隔より小さくする必要がある。しかし、その場合ブロック体の保持用凹部間の厚さが非常に薄くなるため、ブロック体の形成が非常に困難になってしまう。また、ブロック体の強度が弱くなり、チップ型電子部品を保持用凹部に挿入することが困難になってしまう。 Further, in the electronic component assembly disclosed in Japanese Patent Application Laid-Open No. 2002-057434, in order to achieve high packaging density, the interval between the holding recesses of the block body is smaller than the current interval between components. There is a need to. However, in this case, since the thickness between the holding recesses of the block body becomes very thin, the formation of the block body becomes very difficult. Further, the strength of the block body becomes weak, and it becomes difficult to insert the chip-type electronic component into the holding recess.

本発明は、部品の種類の選択や部品の電気特性の選択の幅を広げることが可能であるという利点を生かしつつ、現状の部品間の間隔よりも小さな間隔が実現可能な電子集合体を得ることができる方法、及びその方法によって得られる電子部品集合体を提案するものである。 The present invention obtains an electronic assembly capable of realizing an interval smaller than the current interval between components while taking advantage of the possibility of expanding the range of selection of component types and electrical characteristics of components. A method that can be used, and an electronic component assembly obtained by the method are proposed.

本発明では第一の解決手段として、複数のチップ型電子部品を樹脂モールドによって一体化した電子部品集合体の製造方法において、複数のチップ型電子部品を保持部材上に詰めて並べて保持させるステップと、前記複数のチップ型電子部品を保持させた前記保持部材を平面方向に延伸させて、前記複数のチップ型電子部品の各々の間に隙間を形成するステップと、前記保持部材を延伸させた状態で硬化性の絶縁性樹脂を流し込み、前記複数のチップ型電子部品を被覆すると共に、前記隙間に前記絶縁性樹脂を充填するステップと、前記絶縁性樹脂を硬化させた後、前記保持部材を除去するステップと、を有する電子部品集合体の製造方法を提案する。なお、保持部材を平面方向に延伸させる手段としては、保持部材を加熱して熱膨張させる方法、または保持部材に張力を加えて引き伸ばす方法がある。   In the present invention, as a first solution, in a method of manufacturing an electronic component assembly in which a plurality of chip-type electronic components are integrated by a resin mold, a step of packing and holding a plurality of chip-type electronic components on a holding member; Extending the holding member holding the plurality of chip-type electronic components in a planar direction to form a gap between each of the plurality of chip-type electronic components; and extending the holding member And a step of pouring a curable insulating resin to cover the plurality of chip-type electronic components and filling the gap with the insulating resin; and after the insulating resin is cured, the holding member is removed. And a step of manufacturing the electronic component assembly. In addition, as a means for extending the holding member in the plane direction, there are a method in which the holding member is heated and thermally expanded, or a method in which tension is applied to the holding member and the holding member is extended.

上記第一の解決手段は、一旦チップ型電子部品を互いに接触した状態で並べて、保持部材を平面方向に延伸させるによって部品間の隙間を形成するものである。隙間の大きさの制御は、保持部材の熱膨張率(線膨張率)と加熱温度による制御、または保持部材を引き伸ばす時の張力による制御が可能である。これによって部品間の間隔を従来の実装密度のレベル(0402タイプで0.1mmの間隔)よりもさらに小さくすることが可能になる。 In the first solution, the chip-type electronic components are once arranged in contact with each other and the holding member is extended in the plane direction to form a gap between the components. The size of the gap can be controlled by the coefficient of thermal expansion (linear expansion coefficient) of the holding member and the heating temperature, or by the tension when the holding member is stretched. As a result, the interval between components can be made smaller than the level of conventional mounting density (0.12 mm interval for the 0402 type).

また、本発明では第ニの解決手段として、上記第一の解決手段のステップを経て形成された電子部品集合体を提案する。この第二の解決手段による電子部品集合体は、部品間の間隔が従来の実装密度のレベル(0402タイプで0.1mmの間隔)よりもさらに小さく形成されるので、さらなる高密度実装が可能となる。また、この電子部品集合体は、異なる形状の電子部品を含んでいても良い。これにより、回路設計に対応した電子部品集合体を得ることができる。 In the present invention, an electronic component assembly formed through the steps of the first solution is proposed as the second solution. The electronic component assembly according to the second solution means that the interval between the components is formed even smaller than the conventional mounting density level (0.12 mm interval for the 0402 type), so that further high-density mounting is possible. Become. Moreover, this electronic component assembly may include electronic components having different shapes. Thereby, an electronic component assembly corresponding to the circuit design can be obtained.

本発明の製造方法によれば、部品の種類の選択や部品の電気特性の選択の幅を広げることが可能であるという利点を生かしつつ、現状の部品間の間隔よりも小さな間隔が実現可能な電子集合体を得ることができる。また、本発明の電子部品集合体によれば、現状の実装密度よりもさらに高い実装密度を実現することができる。   According to the manufacturing method of the present invention, it is possible to realize an interval smaller than the current interval between components while taking advantage of the possibility of widening the selection of component types and the selection of electrical characteristics of components. An electronic assembly can be obtained. Moreover, according to the electronic component assembly of the present invention, a mounting density higher than the current mounting density can be realized.

本発明の電子部品集合体に係る実施の形態について、図面に基づいて説明する。図1は本発明の製造方法によって形成された電子部品集合体を示しており、図1(a)は側面方向から見たもの、図1(b)は下面方向から見たものである。   Embodiments according to the electronic component assembly of the present invention will be described with reference to the drawings. 1A and 1B show an electronic component assembly formed by the manufacturing method of the present invention. FIG. 1A is a side view, and FIG. 1B is a bottom view.

電子部品集合体1は、複数のチップ型電子部品2が長さ方向W1、幅方向W2の間隔で並べられており、この並べられた複数のチップ型電子部品2が絶縁性樹脂で形成された樹脂モールド3によって一体化された構造を有する。そして、この電子部品集合体1の下面には、配線基板上の接合パッドと接続するために、複数のチップ型電子部品2の端子電極2aの一部が露出している。   In the electronic component assembly 1, a plurality of chip-type electronic components 2 are arranged at intervals in the length direction W1 and the width direction W2, and the plurality of arranged chip-type electronic components 2 are formed of an insulating resin. It has a structure integrated by the resin mold 3. A part of the terminal electrodes 2a of the plurality of chip-type electronic components 2 is exposed on the lower surface of the electronic component assembly 1 in order to connect to the bonding pads on the wiring board.

チップ型電子部品2は、部品の種類としては例えば積層コンデンサ、積層インダクタ、抵抗チップ、チップバリスタ等が挙げられる。チップ型電子部品2の形状は、角型や円筒型等があるが、角型が好ましい。図1の電子部品集合体1は、同じサイズの9個のチップ型電子部品2が3個×3個の格子状に方向を揃えて整列されているが、図2に示す電子部品集合体1’のように、部品の種類、部品のサイズ(長さ、幅、高さ)及び部品の向きは揃っていなくても良く、回路設計に応じて様々に変更が可能である。   The chip type electronic component 2 includes, for example, a multilayer capacitor, a multilayer inductor, a resistor chip, a chip varistor, and the like as a component type. The shape of the chip-type electronic component 2 includes a square shape and a cylindrical shape, but a square shape is preferable. In the electronic component assembly 1 of FIG. 1, nine chip-type electronic components 2 of the same size are aligned in a 3 × 3 lattice pattern, and the electronic component assembly 1 shown in FIG. Like ', the type of component, the size (length, width, height) of the component and the orientation of the component do not have to be uniform and can be variously changed according to the circuit design.

本発明の電子部品集合体1は、チップ型電子部品2間の間隔W1及びW2が、0.1mmよりも小さく形成されている。現状のマウンタによる実装密度のレベルでは、部品間の間隔の限界が0402タイプで0.1mmなので、本発明の電子部品集合体1は、従来よりもさらに高密度の実装が可能となる。   In the electronic component assembly 1 of the present invention, the intervals W1 and W2 between the chip-type electronic components 2 are formed to be smaller than 0.1 mm. At the mounting density level by the current mounter, the limit of the interval between components is 0402 type and 0.1 mm, so that the electronic component assembly 1 of the present invention can be mounted at a higher density than before.

樹脂モールド3は、エポキシ樹脂やフェノール樹脂等の、硬化性の絶縁性樹脂で形成される。絶縁性樹脂は、光硬化性、紫外線硬化性または熱硬化性のものが使用される。絶縁性樹脂は、0.1mmよりも小さい部品間の隙間に入り込むことができるように、粘度等が適宜調整されて使用される。 The resin mold 3 is formed of a curable insulating resin such as an epoxy resin or a phenol resin. As the insulating resin, a photocurable, ultraviolet curable or thermosetting resin is used. The insulating resin is used with its viscosity and the like adjusted as appropriate so that it can enter a gap between parts smaller than 0.1 mm.

本発明の電子部品集合体1を配線基板に実装した状態を図3に示す。電子部品集合体1の下面に露出したチップ型電子部品2の端子電極2aが、配線基板4上の接合パッド4aに接合される。接合パッド4a同士の間隔も最小で0.1mmよりも狭くなるため、接合パッドの大きさは通常の配線基板の接合パッドよりも小さく設計される。   FIG. 3 shows a state where the electronic component assembly 1 of the present invention is mounted on a wiring board. The terminal electrode 2 a of the chip-type electronic component 2 exposed on the lower surface of the electronic component assembly 1 is bonded to the bonding pad 4 a on the wiring substrate 4. Since the distance between the bonding pads 4a is also a minimum and smaller than 0.1 mm, the size of the bonding pad is designed to be smaller than that of a normal wiring board.

次に本発明の電子部品集合体の第一のプロセスに係る実施形態について説明する。なお、以下の説明では1005タイプ(長さ1.0mm、幅0.5mm、高さ0.5mm)のチップ型電子部品を0.01〜0.02mmの間隔で3個×3個の格子状に並べた電子部品集合体を例にとって説明する。   Next, an embodiment according to a first process of the electronic component assembly of the present invention will be described. In the following description, chip type electronic components of 1005 type (length 1.0 mm, width 0.5 mm, height 0.5 mm) are arranged in a 3 × 3 lattice pattern at intervals of 0.01 to 0.02 mm. The electronic component assembly arranged in the above will be described as an example.

まず、図4に示すように、9個のチップ型電子部品2を、格子状に詰めて並べる。チップ型電子部品2を並べる方法としては、リニアフィーダ等の部品供給装置や既存の整列治具等を用いる方法がある。なお、「詰めて並べる」とは、チップ型電子部品2が互いに接触するかまたはそれに近い状態にして並べることを言う。また、「それに近い状態」とは、互いに接する状態よりも若干隙間があいている状態を言う。ここでは0.01mmよりも小さい隙間があいている状態とする。   First, as shown in FIG. 4, nine chip-type electronic components 2 are arranged in a grid pattern. As a method of arranging the chip-type electronic components 2, there are a method of using a component supply device such as a linear feeder, an existing alignment jig, or the like. Note that “packed and arranged” means that the chip-type electronic components 2 are arranged in contact with each other or close to each other. In addition, the “state close to that” refers to a state where there is a slight gap compared to a state where they are in contact with each other. Here, a gap smaller than 0.01 mm is provided.

続いて、図5に示すように、接着部材5aを付与したPTFE(ポリテトラフルオロエチレン:線膨張率=約100ppm/℃)の保持部材5を用意し、整列させたチップ型電子部品2を保持させる。チップ型電子部品2は接着部材5aに接着されて保持部材5に保持される。この場合、図4に示すように、チップ型電子部品2が接着部材5aに食い込むようにしても良い。保持部材5は、ここではPTFEの板材を用いたが、加熱して膨張する板状のものであれば材質に特に制限はない。ただし所望の部品間の間隔を得るための加熱温度が、樹脂モールド用の絶縁性樹脂に悪影響を与えない温度になるような部材を選択することが望ましい。接着部材5aは、例えばシリコン系の接着シート等が好ましい。また、接着部材5aは、保持部材5の熱膨張に追随可能な材質であることが好ましい。なお、本実施形態ではチップ型電子部品2を並べてから保持部材5に保持されている例を示しているが、保持部材5上で直接チップ型電子部品2を並べても良い。   Subsequently, as shown in FIG. 5, a PTFE (polytetrafluoroethylene: linear expansion coefficient = about 100 ppm / ° C.) holding member 5 provided with an adhesive member 5a is prepared, and the aligned chip-type electronic components 2 are held. Let The chip-type electronic component 2 is bonded to the bonding member 5 a and held by the holding member 5. In this case, as shown in FIG. 4, the chip-type electronic component 2 may bite into the adhesive member 5a. Here, the PTFE plate material is used as the holding member 5, but there is no particular limitation on the material as long as it is a plate-like member that expands when heated. However, it is desirable to select a member such that the heating temperature for obtaining a desired interval between components is a temperature that does not adversely affect the insulating resin for resin molding. The adhesive member 5a is preferably a silicon-based adhesive sheet, for example. The adhesive member 5 a is preferably made of a material that can follow the thermal expansion of the holding member 5. In this embodiment, the chip type electronic component 2 is arranged and then held by the holding member 5. However, the chip type electronic component 2 may be arranged directly on the holding member 5.

続いて、図6に示すように、保持部材5を加熱して熱膨張させる。PTFE製の保持部材5を約200℃で加熱することにより、チップ型電子部品2間の間隔が0.01〜0.02mmに広がる。チップ型電子部品2間の間隔は、保持部材5の膨張率によって制御することができる。保持部材5の膨張率は、保持部材5の線膨張率と加熱温度によって制御することができる。よって線膨張率がわかっている材質を保持部材5として用い、加熱温度を制御することによってチップ型電子部品2間の間隔を制御することができる。   Subsequently, as shown in FIG. 6, the holding member 5 is heated and thermally expanded. By heating the PTFE holding member 5 at about 200 ° C., the distance between the chip-type electronic components 2 is increased to 0.01 to 0.02 mm. The distance between the chip-type electronic components 2 can be controlled by the expansion coefficient of the holding member 5. The expansion coefficient of the holding member 5 can be controlled by the linear expansion coefficient of the holding member 5 and the heating temperature. Therefore, the material between the chip-type electronic components 2 can be controlled by using a material whose linear expansion coefficient is known as the holding member 5 and controlling the heating temperature.

続いて、図7に示すように、チップ型電子部品2を樹脂モールド3で被覆して一体化させる。このとき、チップ型電子部品2間の間隔を保っておく必要があるため、保持部材5を熱膨張させたままの状態にする必要がある。そのため、保持部材5を加熱した状態で硬化性の絶縁性樹脂を流し込む。絶縁性樹脂を流し込む場合、チップ型電子部品2間に絶縁性樹脂を充填するために、真空チャンバ等を用いて減圧下で行っても良い。硬化性の絶縁性樹脂が熱硬化性であれば、そのまま加熱して硬化させる。光硬化性または紫外線硬化性であれば、保持部材5を加熱した状態で光または紫外線を照射して硬化させる。絶縁性樹脂を硬化させた後、保持部材5及び接着部材5aを除去する。このようにして、図1に示す電子部品集合体1が得られる。   Subsequently, as shown in FIG. 7, the chip-type electronic component 2 is covered with a resin mold 3 and integrated. At this time, since it is necessary to keep a space between the chip-type electronic components 2, it is necessary to keep the holding member 5 in a state of being thermally expanded. Therefore, a curable insulating resin is poured in the state where the holding member 5 is heated. When the insulating resin is poured, in order to fill the insulating resin between the chip-type electronic components 2, it may be performed under reduced pressure using a vacuum chamber or the like. If the curable insulating resin is thermosetting, it is heated and cured as it is. If it is photocurable or ultraviolet curable, the holding member 5 is heated and irradiated with light or ultraviolet rays to be cured. After the insulating resin is cured, the holding member 5 and the adhesive member 5a are removed. In this way, the electronic component assembly 1 shown in FIG. 1 is obtained.

なお、上記実施形態では、電子部品集合体1を1個ずつ形成する方法を示してきたが、図8に示すように、さらに多数個のチップ型電子部品2を格子状に並べて、上記の実施形態と同様にして樹脂モールド3を形成した後、ダイシングソーやレーザ加工機等を用いて、切断線CLに沿って切断分割する方法を用いても良い。   In the above-described embodiment, the method of forming the electronic component assemblies 1 one by one has been shown. However, as shown in FIG. 8, a larger number of chip-type electronic components 2 are arranged in a lattice pattern to perform the above-described implementation. After forming the resin mold 3 in the same manner as the embodiment, a method of cutting and dividing along a cutting line CL using a dicing saw, a laser processing machine, or the like may be used.

次に本発明の電子部品集合体の第ニのプロセスに係る実施形態について説明する。この第二のプロセスは、保持部材5の材質、チップ型電子部品2間の間隔の形成方法が異なる以外は、第一のプロセスと同じである。よって、ここでは第一のプロセスと異なる部分について説明する。   Next, an embodiment according to the second process of the electronic component assembly of the present invention will be described. This second process is the same as the first process except that the material of the holding member 5 and the method of forming the interval between the chip-type electronic components 2 are different. Therefore, a different part from a 1st process is demonstrated here.

第一のプロセスと同様にして整列させたチップ型電子部品2を、図9に示すように保持部材5に保持させる。この保持部材5は、半導体ウェハ用のダイシングシートに用いられるものと同等のものである。材質としては、ポリオレフィン系のものが用いられる。ここでは便宜上円形で描かれているが、略矩形状のシートでもよい。保持部材5には接着剤が付与されているので、チップ型電子部品2はこの接着剤によって保持部材5に保持される。   The chip-type electronic components 2 aligned in the same manner as in the first process are held by the holding member 5 as shown in FIG. This holding member 5 is equivalent to that used for a dicing sheet for a semiconductor wafer. As the material, a polyolefin-based material is used. Here, for the sake of convenience, the drawing is circular, but a substantially rectangular sheet may be used. Since the holding member 5 is provided with an adhesive, the chip-type electronic component 2 is held by the holding member 5 with this adhesive.

続いて、図10に示すように、保持部材5に張力を加えて引き伸ばす。このとき、張力が均等にかかるようにして引き伸ばす。張力を均等にかけることにより、チップ型電子部品2間の間隔が略同じになるようにする。このようにして、チップ型電子部品2間の間隔が0.02mmになるまで保持部材5を引き伸ばす。チップ型電子部品2間の間隔の制御は、張力を制御することによって行うことができる。なお、保持部材5を引き伸ばす方法としては、例えば(株)テクノビジョン製TEX−21BG等のウェハエキスパンダを使用するのが好ましい。   Subsequently, as shown in FIG. 10, the holding member 5 is stretched by applying tension. At this time, it is stretched so that tension is evenly applied. By applying the tension evenly, the distance between the chip-type electronic components 2 is made substantially the same. In this way, the holding member 5 is stretched until the distance between the chip-type electronic components 2 becomes 0.02 mm. Control of the distance between the chip-type electronic components 2 can be performed by controlling the tension. In addition, as a method of extending the holding member 5, it is preferable to use, for example, a wafer expander such as TEX-21BG manufactured by Technovision.

この後、第一のプロセスと同様にして樹脂モールドによって一体化して、電子部品集合体1が得られる。なお、第二のプロセスで用いた保持部材5はフィルム状であるので、樹脂モールドを形成する際は、保持部材5を剛体の板状部材の上に固定して行うのが好ましい。   Thereafter, the electronic component assembly 1 is obtained by integration with a resin mold in the same manner as in the first process. Since the holding member 5 used in the second process is in the form of a film, it is preferable to fix the holding member 5 on a rigid plate-like member when forming the resin mold.

以上説明したプロセスによって得られた電子部品集合体は、従来の実装密度よりもさらに高い実装密度を実現することができるものである。   The electronic component assembly obtained by the process described above can realize a higher mounting density than the conventional mounting density.

本発明の製造方法によって形成された電子部品集合体を示す模式図で、(a)は側面図、(b)は底面図である。It is a schematic diagram which shows the electronic component assembly formed by the manufacturing method of this invention, (a) is a side view, (b) is a bottom view. 本発明の製造方法によって形成された電子部品集合体の別例を示す模式図で、(a)は側面図、(b)は底面図である。It is a schematic diagram which shows another example of the electronic component assembly formed by the manufacturing method of this invention, (a) is a side view, (b) is a bottom view. 本発明の製造方法によって形成された電子部品集合体を配線基板上に実装した状態を示す模式図である。It is a schematic diagram which shows the state which mounted the electronic component assembly formed by the manufacturing method of this invention on the wiring board. 本発明の電子部品集合体の第一の製造プロセスを示す模式図で、(a)は側面図、(b)は平面図である。It is a schematic diagram which shows the 1st manufacturing process of the electronic component assembly of this invention, (a) is a side view, (b) is a top view. 本発明の電子部品集合体の第一の製造プロセスを示す模式図で、(a)は側面図、(b)は平面図である。It is a schematic diagram which shows the 1st manufacturing process of the electronic component assembly of this invention, (a) is a side view, (b) is a top view. 本発明の電子部品集合体の第一の製造プロセスを示す模式図で、(a)は側面図、(b)は平面図である。It is a schematic diagram which shows the 1st manufacturing process of the electronic component assembly of this invention, (a) is a side view, (b) is a top view. 本発明の電子部品集合体の第一の製造プロセスを示す模式図で、(a)は側面図、(b)は平面図である。It is a schematic diagram which shows the 1st manufacturing process of the electronic component assembly of this invention, (a) is a side view, (b) is a top view. 本発明の電子部品集合体の第一の製造プロセスの別例を示す模式図で、(a)は側面図、(b)は平面図である。It is a schematic diagram which shows another example of the 1st manufacturing process of the electronic component assembly of this invention, (a) is a side view, (b) is a top view. 本発明の電子部品集合体の第ニの製造プロセスを示す模式図である。It is a schematic diagram which shows the 2nd manufacturing process of the electronic component aggregate | assembly of this invention. 本発明の電子部品集合体の第ニの製造プロセスを示す模式図である。It is a schematic diagram which shows the 2nd manufacturing process of the electronic component aggregate | assembly of this invention.

符号の説明Explanation of symbols

1、1’ 電子部品集合体
2 チップ型電子部品
3 樹脂モールド
4 配線基板
4a 接合パッド
5 保持部材
5a 接着部材
DESCRIPTION OF SYMBOLS 1, 1 'electronic component assembly 2 Chip-type electronic component 3 Resin mold 4 Wiring board 4a Bonding pad 5 Holding member 5a Adhesive member

Claims (5)

複数のチップ型電子部品を樹脂モールドによって一体化した電子部品集合体の製造方法において、
複数のチップ型電子部品を保持部材上に詰めて並べて保持させるステップと、
前記複数のチップ型電子部品を保持させた前記保持部材を平面方向に延伸させて、前記複数のチップ型電子部品の各々の間に隙間を形成するステップと、
前記保持部材を延伸させた状態で硬化性の絶縁性樹脂を流し込み、前記複数のチップ型電子部品を被覆すると共に、前記隙間に前記絶縁性樹脂を充填するステップと、
前記絶縁性樹脂を硬化させた後、前記保持部材を除去するステップと、
を有することを特徴とする電子部品集合体の製造方法。
In the manufacturing method of an electronic component assembly in which a plurality of chip-type electronic components are integrated by a resin mold,
A step of packing a plurality of chip-type electronic components on a holding member and holding them side by side;
Extending the holding member holding the plurality of chip-type electronic components in a planar direction to form a gap between each of the plurality of chip-type electronic components;
Pouring a curable insulating resin in a state in which the holding member is stretched, covering the plurality of chip-type electronic components, and filling the gap with the insulating resin;
Removing the holding member after curing the insulating resin;
A method for producing an electronic component assembly, comprising:
前記保持部材を平面方向に延伸させる手段は、前記保持部材を加熱して熱膨張させることであることを特徴とする請求項1に記載の電子部品集合体の製造方法。   2. The method of manufacturing an electronic component assembly according to claim 1, wherein the means for extending the holding member in a planar direction is to heat and heat-expand the holding member. 前記保持部材を平面方向に延伸させる手段は、前記保持部材に張力を加えて引き伸ばすことであることを特徴とする請求項1に記載の電子部品集合体の製造方法。   2. The method of manufacturing an electronic component assembly according to claim 1, wherein the means for extending the holding member in a planar direction is to apply tension to the holding member and extend the holding member. 複数のチップ型電子部品を樹脂モールドによって一体化した電子部品集合体において、
複数のチップ型電子部品を保持部材上に詰めて並べて保持させるステップと、
前記複数のチップ型電子部品を保持させた前記保持部材を平面方向に延伸させて、前記複数のチップ型電子部品の各々の間に隙間を形成するステップと、
前記保持部材を延伸させた状態で硬化性の絶縁性樹脂を流し込み、前記複数のチップ型電子部品を被覆すると共に、前記隙間に前記絶縁性樹脂を充填するステップと、
前記絶縁性樹脂を硬化させた後、前記保持部材を除去するステップと、
を経て形成されていることを特徴とする電子部品集合体。
In an electronic component assembly in which a plurality of chip-type electronic components are integrated by a resin mold,
A step of packing a plurality of chip-type electronic components on a holding member and holding them side by side;
Extending the holding member holding the plurality of chip-type electronic components in a planar direction to form a gap between each of the plurality of chip-type electronic components;
Pouring a curable insulating resin in a state in which the holding member is stretched, covering the plurality of chip-type electronic components, and filling the gap with the insulating resin;
Removing the holding member after curing the insulating resin;
An electronic component assembly characterized by being formed through a process.
前記複数のチップ型電子部品は、異なる形状のものを含むことを特徴とする請求項4に記載の電子部品集合体。

The electronic component assembly according to claim 4, wherein the plurality of chip-type electronic components include different shapes.

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018067687A (en) * 2016-10-21 2018-04-26 株式会社村田製作所 Composite type electronic component and method of manufacturing the same
US11923142B2 (en) 2020-12-22 2024-03-05 Murata Manufacturing Co., Ltd. Multilayer ceramic capacitor and method of manufacturing multilayer ceramic capacitor

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018067687A (en) * 2016-10-21 2018-04-26 株式会社村田製作所 Composite type electronic component and method of manufacturing the same
US10763036B2 (en) 2016-10-21 2020-09-01 Murata Manufacturing Co., Ltd. Composite electronic component and manufacturing method for same
US11923142B2 (en) 2020-12-22 2024-03-05 Murata Manufacturing Co., Ltd. Multilayer ceramic capacitor and method of manufacturing multilayer ceramic capacitor
JP7444048B2 (en) 2020-12-22 2024-03-06 株式会社村田製作所 Multilayer ceramic capacitor and method for manufacturing multilayer ceramic capacitor

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