JP2009044587A - 放射線画像検出器 - Google Patents
放射線画像検出器 Download PDFInfo
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- JP2009044587A JP2009044587A JP2007208935A JP2007208935A JP2009044587A JP 2009044587 A JP2009044587 A JP 2009044587A JP 2007208935 A JP2007208935 A JP 2007208935A JP 2007208935 A JP2007208935 A JP 2007208935A JP 2009044587 A JP2009044587 A JP 2009044587A
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- 230000005855 radiation Effects 0.000 claims abstract description 153
- 238000001514 detection method Methods 0.000 claims description 69
- 238000005070 sampling Methods 0.000 description 51
- 239000004065 semiconductor Substances 0.000 description 11
- 239000003990 capacitor Substances 0.000 description 10
- 230000002596 correlated effect Effects 0.000 description 8
- 230000000875 corresponding effect Effects 0.000 description 8
- 238000009825 accumulation Methods 0.000 description 7
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 239000011159 matrix material Substances 0.000 description 5
- 239000000758 substrate Substances 0.000 description 5
- 230000003287 optical effect Effects 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 3
- 238000002834 transmittance Methods 0.000 description 3
- 229910021417 amorphous silicon Inorganic materials 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 239000011669 selenium Substances 0.000 description 2
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000003071 parasitic effect Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 229910052711 selenium Inorganic materials 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/247—Detector read-out circuitry
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/30—Circuitry of solid-state image sensors [SSIS]; Control thereof for transforming X-rays into image signals
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
- H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
- H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
- H04N25/673—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction by using reference sources
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/30—Transforming light or analogous information into electric information
- H04N5/32—Transforming X-rays
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- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Measurement Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Abstract
【解決手段】切替出力部102の切替素子106a〜106eのうちの最後に切り替えられる切替素子106eに、所定のラインの放射線検出素子の信号が出力された後、上記所定のラインの次のラインの放射線検出素子の信号に影響を及ぼさない程度の大きさの信号を出力するダミー回路部(GND)を接続する。
【選択図】図2
Description
11 電荷収集電極
12 蓄積容量
13,201 TFTスイッチ
14 画素
15,203 走査配線
16,204 データ配線
100 放射線画像検出器
101 放射線画像検出器本体
102,206 読出回路(切替出力部)
103,205 ゲートドライバ
104,202 放射線検出素子
105,207 チャージアンプ
106a〜106e,208a〜208d スイッチ素子
107,208 マルチプレクサ
108a,209 第1サンプリング回路
108b,210 第2サンプリング回路
109,211 差動アンプ
110 放射線遮蔽部材
111 第2ゲートドライバ
112 アッテネータ(ダミー回路部)
Claims (6)
- 放射線を検出する放射線検出素子が少なくとも1次元状に配列された配列された放射線画像検出器本体と、
多数の切替素子を有し、該切替素子によって前記放射線検出素子の列を順次切り替えて前記放射線検出素子により検出された信号を1ラインずつ順次出力する切替出力部と、
該切替出力部の切替素子のうちの最後に切り替えられる切替素子に接続され、所定のラインの放射線検出素子の信号が出力された後、前記所定のラインの次のラインの放射線検出素子の信号に影響を及ぼさない程度の大きさの信号を出力するダミー回路部とを備えたことを特徴とする放射線画像検出器。 - 前記ダミー回路部が、GNDであることを特徴とする請求項1記載の放射線画像検出器。
- 前記ダミー回路部が、所定の低い電圧を出力するものであることを特徴とする請求項1記載の放射線画像検出器。
- 前記ダミー回路部が、電荷発生効率の低い素子であることを特徴とする請求項1記載の放射線画像検出器。
- 前記ダミー回路部が、前記放射線検出素子と該放射線検出素子により検出された電荷信号を電圧信号に変換するチャージアンプとを有し、
前記チャージアンプのゲインを下げることを特徴とする請求項1記載の放射線画像検出器。 - 前記ダミー回路部が、前記放射線検出素子と該放射線検出素子により検出された電荷信号を電圧信号に変換するチャージアンプと該チャージアンプから出力された電圧信号の大きさを低減する減衰部とを有することを特徴とする請求項1記載の放射線画像検出器。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007208935A JP4949964B2 (ja) | 2007-08-10 | 2007-08-10 | 放射線画像検出器 |
US12/188,560 US7566878B2 (en) | 2007-08-10 | 2008-08-08 | Radiation image detector |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007208935A JP4949964B2 (ja) | 2007-08-10 | 2007-08-10 | 放射線画像検出器 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2009044587A true JP2009044587A (ja) | 2009-02-26 |
JP4949964B2 JP4949964B2 (ja) | 2012-06-13 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2007208935A Expired - Fee Related JP4949964B2 (ja) | 2007-08-10 | 2007-08-10 | 放射線画像検出器 |
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US (1) | US7566878B2 (ja) |
JP (1) | JP4949964B2 (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010268171A (ja) * | 2009-05-14 | 2010-11-25 | Konica Minolta Medical & Graphic Inc | 放射線画像撮影装置および放射線画像撮影システム |
JP2015158501A (ja) * | 2009-03-26 | 2015-09-03 | コーニンクレッカ フィリップス エヌ ヴェ | データ取得 |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9523730B2 (en) | 2009-04-08 | 2016-12-20 | Analog Devices, Inc. | Architecture and method to determine leakage impedance and leakage voltage node |
US8427167B2 (en) | 2009-04-08 | 2013-04-23 | Analog Devices, Inc. | Architecture and method to determine leakage impedance and leakage voltage node |
JP5730030B2 (ja) * | 2011-01-17 | 2015-06-03 | 浜松ホトニクス株式会社 | 固体撮像装置 |
US9185314B2 (en) * | 2011-11-08 | 2015-11-10 | Texas Instruments Incorporated | Mitigating the effects of signal overload in analog front-end circuits used in image sensing systems |
WO2013126427A1 (en) * | 2012-02-22 | 2013-08-29 | Analog Devices, Inc. | Architecture and method to determine leakage impedance and leakage voltage node |
US9291723B2 (en) * | 2013-06-27 | 2016-03-22 | Savannah River Nuclear Solutions, Llc | Instrument for assaying radiation |
JP6670313B2 (ja) | 2014-12-30 | 2020-03-18 | ゼネラル・エレクトリック・カンパニイ | X線検出器アセンブリ |
CN114068591B (zh) * | 2020-07-29 | 2024-08-06 | 京东方科技集团股份有限公司 | 平板探测器及成像系统 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001056382A (ja) * | 1999-06-07 | 2001-02-27 | Toshiba Corp | 放射線検出器及び放射線診断装置 |
JP2006352621A (ja) * | 2005-06-17 | 2006-12-28 | Konica Minolta Photo Imaging Inc | 撮像装置 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3319905B2 (ja) * | 1995-03-24 | 2002-09-03 | 株式会社モリタ製作所 | デジタルx線撮影装置 |
US5744807A (en) | 1996-06-20 | 1998-04-28 | Xerox Corporation | Sensor array data line readout with reduced crosstalk |
EP0898421A3 (en) | 1997-08-19 | 2001-12-05 | Fuji Photo Film Co., Ltd. | Electrostatic recording member, electrostatic latent image recording apparatus, and electrostatic latent image read-out apparatus |
US7119341B2 (en) * | 2003-12-08 | 2006-10-10 | General Electric Company | Split scan line and combined data line x-ray detectors |
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2007
- 2007-08-10 JP JP2007208935A patent/JP4949964B2/ja not_active Expired - Fee Related
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2008
- 2008-08-08 US US12/188,560 patent/US7566878B2/en not_active Expired - Fee Related
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001056382A (ja) * | 1999-06-07 | 2001-02-27 | Toshiba Corp | 放射線検出器及び放射線診断装置 |
JP2006352621A (ja) * | 2005-06-17 | 2006-12-28 | Konica Minolta Photo Imaging Inc | 撮像装置 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2015158501A (ja) * | 2009-03-26 | 2015-09-03 | コーニンクレッカ フィリップス エヌ ヴェ | データ取得 |
JP2010268171A (ja) * | 2009-05-14 | 2010-11-25 | Konica Minolta Medical & Graphic Inc | 放射線画像撮影装置および放射線画像撮影システム |
Also Published As
Publication number | Publication date |
---|---|
JP4949964B2 (ja) | 2012-06-13 |
US20090039277A1 (en) | 2009-02-12 |
US7566878B2 (en) | 2009-07-28 |
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