JP2009004593A5 - - Google Patents
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- JP2009004593A5 JP2009004593A5 JP2007164605A JP2007164605A JP2009004593A5 JP 2009004593 A5 JP2009004593 A5 JP 2009004593A5 JP 2007164605 A JP2007164605 A JP 2007164605A JP 2007164605 A JP2007164605 A JP 2007164605A JP 2009004593 A5 JP2009004593 A5 JP 2009004593A5
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- Prior art keywords
- conductive
- semiconductor chip
- semiconductor
- conductive via
- wiring electrode
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- 239000004065 semiconductor Substances 0.000 claims 66
- 239000011347 resin Substances 0.000 claims 22
- 229920005989 resin Polymers 0.000 claims 22
- 238000004519 manufacturing process Methods 0.000 claims 10
- 239000007788 liquid Substances 0.000 claims 4
- 230000003287 optical Effects 0.000 claims 4
- 239000002184 metal Substances 0.000 claims 2
- 238000000034 method Methods 0.000 claims 2
- 238000007747 plating Methods 0.000 claims 2
- 239000000758 substrate Substances 0.000 claims 2
- 230000000875 corresponding Effects 0.000 claims 1
- 239000004973 liquid crystal related substance Substances 0.000 claims 1
- 230000002093 peripheral Effects 0.000 claims 1
- 239000011148 porous material Substances 0.000 claims 1
Claims (14)
前記第2半導体チップと積層方向に接続するとともに所定の前記第1配線電極と接続する導電性樹脂を充填した第1導電ビアを有する第1半導体チップと、
前記第1半導体チップと積層方向に接続するとともに所定の前記第2配線電極と接続する導電性樹脂を充填した第2導電ビアを有する第2半導体チップとを、少なくとも備え、
相対する前記第1導電ビアと前記第2導電ビアとが、複数の突起部を有する個別部材からなる導電性接続体を介して電気的に接続されていることを特徴とする半導体積層構造体。 A semiconductor laminated structure in which a first semiconductor chip having at least a first wiring electrode and a second semiconductor chip having a second wiring electrode are laminated,
A first semiconductor chip having a first conductive via which is connected to the second semiconductor chip in a stacking direction and filled with a conductive resin connected to the predetermined first wiring electrode;
A second semiconductor chip having a second conductive via connected to the first semiconductor chip in the stacking direction and filled with a conductive resin connected to the predetermined second wiring electrode;
The semiconductor laminated structure, wherein the first conductive via and the second conductive via facing each other are electrically connected via a conductive connecting member made of an individual member having a plurality of protrusions .
前記第1半導体チップに前記第2半導体チップと積層方向に接続するとともに所定の前記第1配線電極と接続する第1貫通孔を形成する工程と、
前記第2半導体チップに前記第1半導体チップと積層方向に接続するとともに所定の前記第2配線電極と接続する第2貫通孔を形成する工程と、
前記第1貫通孔および前記第2貫通孔に導電性樹脂ペーストを充填し前記第1半導体チップに第1導電ビアおよび前記第2半導体チップに第2導電ビアを形成する導電ビア形成工程と、
複数の突起部を有する個別部材からなる導電性接続体を形成する導電性接続体形成工程と、
少なくとも前記第1半導体チップまたは前記第2半導体チップの一方の面上に前記導電性接続体を前記第1導電ビアまたは前記第2導電ビアに配置する導電性接続体配置工程と、所定の前記第1半導体チップの前記第1導電ビアと前記第2半導体チップの前記第2導電ビアとを位置合わせし、付着させた前記導電性接続体を介して前記第1導電ビアと前記第2導電ビアを電気的に接続させる半導体チップ積層工程と、
を含むことを特徴とする半導体積層構造体の製造方法。 A method for manufacturing a semiconductor stacked structure in which a first semiconductor chip having at least a first wiring electrode and a second semiconductor chip having a second wiring electrode are stacked,
Forming a first through-hole in the first semiconductor chip connected to the second semiconductor chip in the stacking direction and connected to the predetermined first wiring electrode;
Forming a second through hole connected to the second semiconductor chip in a stacking direction with the first semiconductor chip and connected to the predetermined second wiring electrode;
A conductive via forming step of filling the first through hole and the second through hole with a conductive resin paste to form a first conductive via in the first semiconductor chip and a second conductive via in the second semiconductor chip;
A conductive connector forming step of forming a conductive connector composed of individual members having a plurality of protrusions ;
A conductive connector arrangement step of arranging the conductive connector in the first conductive via or the second conductive via on at least one surface of the first semiconductor chip or the second semiconductor chip; and the predetermined first The first conductive via of the first semiconductor chip is aligned with the second conductive via of the second semiconductor chip, and the first conductive via and the second conductive via are connected via the conductive connection body attached thereto. A semiconductor chip stacking process for electrical connection;
The manufacturing method of the semiconductor laminated structure characterized by the above-mentioned.
前記第1半導体チップの前記第1導電ビアと接続し、前記第2半導体チップの前記第2導電ビアと対向する位置に、少なくとも1つの凸部を有する前記導電性接続体を光造形法により形成する導電性接続体形成工程と、
所定の前記導電性接続体の前記凸部と前記第2半導体チップの前記第2導電ビアとを位置合わせし、前記導電性接続体を介して前記第1導電ビアと前記第2導電ビアを電気的に接続させる半導体チップ積層工程と、
を含むことを特徴とする請求項9に記載の半導体積層構造体の製造方法。 The steps after the conductive via forming step are:
The conductive connection body having at least one protrusion is formed by stereolithography at a position connected to the first conductive via of the first semiconductor chip and facing the second conductive via of the second semiconductor chip. A conductive connecting body forming step,
The convex portion of the predetermined conductive connection body and the second conductive via of the second semiconductor chip are aligned, and the first conductive via and the second conductive via are electrically connected via the conductive connection body. Semiconductor chip stacking process to be connected to each other,
The method of manufacturing a semiconductor stacked structure according to claim 9, characterized in that it comprises a.
前記第1半導体チップに前記第2半導体チップと積層方向に接続するとともに所定の前記第1配線電極と接続する第1貫通孔を形成する工程と、
前記第2半導体チップに前記第1半導体チップと積層方向に接続するとともに所定の前記第2配線電極と接続する第2貫通孔を形成する工程と、
前記第1半導体チップを光硬化性導電性樹脂液中に浸漬し、前記第1貫通孔内の前記光硬化性導電性樹脂を光硬化させて第1導電ビアを形成するとともに、前記第1導電ビアと接続される複数の突起部を有する個別部材からなる導電性接続体を形成する工程と、
さらに前記第2半導体チップを前記光硬化性導電性樹脂液中に浸漬し、前記導電性接続体に対応する前記第2貫通孔と位置合わせして、前記第2貫通孔内の前記光硬化性導電性樹脂を光硬化させて第2導電ビアを形成し、導電性接続体を介して前記第1導電ビアと前記第2導電ビアを電気的に接続させる半導体チップ積層工程と、
を含むことを特徴とする半導体積層構造体の製造方法。 A method for manufacturing a semiconductor stacked structure in which a first semiconductor chip having at least a first wiring electrode and a second semiconductor chip having a second wiring electrode are stacked,
Forming a first through-hole in the first semiconductor chip connected to the second semiconductor chip in the stacking direction and connected to the predetermined first wiring electrode;
Forming a second through hole connected to the second semiconductor chip in a stacking direction with the first semiconductor chip and connected to the predetermined second wiring electrode;
The first semiconductor chip is immersed in a photocurable conductive resin liquid, the photocurable conductive resin in the first through hole is photocured to form a first conductive via, and the first conductive forming a conductive connecting member comprising a discrete member having a plurality of projections which are connected to the via,
Further, the second semiconductor chip is immersed in the photocurable conductive resin liquid, aligned with the second through hole corresponding to the conductive connector, and the photocurable property in the second through hole. A semiconductor chip stacking step in which a conductive resin is photocured to form a second conductive via, and the first conductive via and the second conductive via are electrically connected via a conductive connector;
The manufacturing method of the semiconductor laminated structure characterized by the above-mentioned.
前記第1半導体チップに前記第2半導体チップと積層方向に接続するとともに所定の前記第1配線電極と接続する第1貫通孔に導電性樹脂ペーストを充填して前記第1半導体チップに第1導電ビアを形成し、前記第1導電ビアと接続する複数の突起部を有する個別部材からなる導電性接続体を光造形法により形成する第1半導体チップ形成工程と、
前記第2半導体チップに前記第1半導体チップと積層方向に接続するとともに所定の前記第2配線電極と接続する第2貫通孔に導電性樹脂ペーストを充填して前記第2半導体チップに第2導電ビアを形成する第2半導体チップ形成工程と、
前記第1半導体チップの前記導電性接続体の前記凸部と前記第2半導体チップの前記第2導電ビアとを位置合わせし、前記導電性接続体を介して前記第1導電ビアと前記第2導電ビアを電気的に接続させる半導体チップ積層工程と、
を含むことを特徴とする半導体積層構造体の製造方法。 A method for manufacturing a semiconductor stacked structure in which a first semiconductor chip having at least a first wiring electrode and a second semiconductor chip having a second wiring electrode are stacked,
The first semiconductor chip is filled with a conductive resin paste in a first through-hole connected to the first semiconductor chip in the stacking direction with the second semiconductor chip and connected to the predetermined first wiring electrode. A first semiconductor chip forming step of forming a via and forming a conductive connection body made of an individual member having a plurality of protrusions connected to the first conductive via by an optical modeling method;
The second semiconductor chip is filled with a conductive resin paste in a second through-hole connected to the second semiconductor chip in the stacking direction with the first semiconductor chip and connected to the predetermined second wiring electrode. A second semiconductor chip forming step of forming vias;
The convex portion of the conductive connection body of the first semiconductor chip is aligned with the second conductive via of the second semiconductor chip, and the first conductive via and the second are interposed via the conductive connection body. A semiconductor chip stacking step for electrically connecting conductive vias;
The manufacturing method of the semiconductor laminated structure characterized by the above-mentioned.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007164605A JP5018270B2 (en) | 2007-06-22 | 2007-06-22 | Semiconductor laminate and semiconductor device using the same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007164605A JP5018270B2 (en) | 2007-06-22 | 2007-06-22 | Semiconductor laminate and semiconductor device using the same |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2009004593A JP2009004593A (en) | 2009-01-08 |
JP2009004593A5 true JP2009004593A5 (en) | 2010-04-22 |
JP5018270B2 JP5018270B2 (en) | 2012-09-05 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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JP2007164605A Expired - Fee Related JP5018270B2 (en) | 2007-06-22 | 2007-06-22 | Semiconductor laminate and semiconductor device using the same |
Country Status (1)
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JP (1) | JP5018270B2 (en) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPWO2010101163A1 (en) * | 2009-03-04 | 2012-09-10 | 日本電気株式会社 | Functional element built-in substrate and electronic device using the same |
JP5187284B2 (en) * | 2009-06-26 | 2013-04-24 | ソニー株式会社 | Manufacturing method of semiconductor device |
WO2011036819A1 (en) * | 2009-09-28 | 2011-03-31 | 株式会社 東芝 | Method for manufacturing semiconductor device |
JP5517800B2 (en) | 2010-07-09 | 2014-06-11 | キヤノン株式会社 | Member for solid-state imaging device and method for manufacturing solid-state imaging device |
WO2016114320A1 (en) * | 2015-01-13 | 2016-07-21 | デクセリアルズ株式会社 | Multilayer substrate |
CN110783728A (en) * | 2018-11-09 | 2020-02-11 | 广州方邦电子股份有限公司 | Flexible connector and manufacturing method |
KR20200094529A (en) * | 2019-01-30 | 2020-08-07 | 에스케이하이닉스 주식회사 | Semiconductor memory device and method of manufacturing the same |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4154919B2 (en) * | 2002-02-28 | 2008-09-24 | 日立化成工業株式会社 | Circuit connection material and circuit terminal connection structure using the same |
JP3950406B2 (en) * | 2002-11-21 | 2007-08-01 | 東レエンジニアリング株式会社 | SEMICONDUCTOR SUBSTRATE SEGMENT AND METHOD FOR MANUFACTURING SAME, LAMINATED SEMICONDUCTOR SUBSTRATE FORMED BY LAYING THE SEGMENT |
JP5247968B2 (en) * | 2003-12-02 | 2013-07-24 | 日立化成株式会社 | Circuit connection material and circuit member connection structure using the same |
JP4467318B2 (en) * | 2004-01-28 | 2010-05-26 | Necエレクトロニクス株式会社 | Semiconductor device, chip alignment method for multi-chip semiconductor device, and method for manufacturing chip for multi-chip semiconductor device |
JP4074862B2 (en) * | 2004-03-24 | 2008-04-16 | ローム株式会社 | Semiconductor device manufacturing method, semiconductor device, and semiconductor chip |
JP2006165073A (en) * | 2004-12-03 | 2006-06-22 | Hitachi Ulsi Systems Co Ltd | Semiconductor device and its manufacturing method |
KR20110048079A (en) * | 2005-11-18 | 2011-05-09 | 히다치 가세고교 가부시끼가이샤 | Adhesive composition |
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2007
- 2007-06-22 JP JP2007164605A patent/JP5018270B2/en not_active Expired - Fee Related
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