JP2008544265A5 - - Google Patents

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Publication number
JP2008544265A5
JP2008544265A5 JP2008517462A JP2008517462A JP2008544265A5 JP 2008544265 A5 JP2008544265 A5 JP 2008544265A5 JP 2008517462 A JP2008517462 A JP 2008517462A JP 2008517462 A JP2008517462 A JP 2008517462A JP 2008544265 A5 JP2008544265 A5 JP 2008544265A5
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JP
Japan
Prior art keywords
analysis system
test element
lens
synthetic resin
optical module
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2008517462A
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English (en)
Japanese (ja)
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JP2008544265A (ja
JP4804535B2 (ja
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Publication date
Priority claimed from EP05013452A external-priority patent/EP1736774B1/de
Application filed filed Critical
Publication of JP2008544265A publication Critical patent/JP2008544265A/ja
Publication of JP2008544265A5 publication Critical patent/JP2008544265A5/ja
Application granted granted Critical
Publication of JP4804535B2 publication Critical patent/JP4804535B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2008517462A 2005-06-22 2006-06-13 分析試験エレメント上の試料の分析のための分析システム Expired - Fee Related JP4804535B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP05013452A EP1736774B1 (de) 2005-06-22 2005-06-22 Analysesystem zur Analyse einer Probe auf einem analytischen Testelement
EP05013452.7 2005-06-22
PCT/EP2006/063145 WO2006136512A2 (de) 2005-06-22 2006-06-13 Analysesystem zur analyse einer probe auf einem analytischen testelement

Publications (3)

Publication Number Publication Date
JP2008544265A JP2008544265A (ja) 2008-12-04
JP2008544265A5 true JP2008544265A5 (enExample) 2011-08-04
JP4804535B2 JP4804535B2 (ja) 2011-11-02

Family

ID=35539656

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008517462A Expired - Fee Related JP4804535B2 (ja) 2005-06-22 2006-06-13 分析試験エレメント上の試料の分析のための分析システム

Country Status (9)

Country Link
US (1) US7808645B2 (enExample)
EP (1) EP1736774B1 (enExample)
JP (1) JP4804535B2 (enExample)
CN (1) CN101203755B (enExample)
AT (1) ATE385571T1 (enExample)
CA (1) CA2611921C (enExample)
DE (1) DE502005002762D1 (enExample)
ES (1) ES2299920T3 (enExample)
WO (1) WO2006136512A2 (enExample)

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