JP2008539399A5 - - Google Patents

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Publication number
JP2008539399A5
JP2008539399A5 JP2008508125A JP2008508125A JP2008539399A5 JP 2008539399 A5 JP2008539399 A5 JP 2008539399A5 JP 2008508125 A JP2008508125 A JP 2008508125A JP 2008508125 A JP2008508125 A JP 2008508125A JP 2008539399 A5 JP2008539399 A5 JP 2008539399A5
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JP
Japan
Prior art keywords
substrate
liquid
receiving
atomized
during
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2008508125A
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English (en)
Japanese (ja)
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JP5002584B2 (ja
JP2008539399A (ja
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Priority claimed from PCT/EP2006/003726 external-priority patent/WO2006114249A1/de
Publication of JP2008539399A publication Critical patent/JP2008539399A/ja
Publication of JP2008539399A5 publication Critical patent/JP2008539399A5/ja
Application granted granted Critical
Publication of JP5002584B2 publication Critical patent/JP5002584B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2008508125A 2005-04-26 2006-04-22 親和性検定方法による分析試料検出用の基質をコーティングするための新規な装置および方法 Expired - Fee Related JP5002584B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
CH0735/05 2005-04-26
CH7352005 2005-04-26
PCT/EP2006/003726 WO2006114249A1 (de) 2005-04-26 2006-04-22 Neue apparatur und verfahren zur beschichtung von trägersubstraten für einen analytnachweis mittels affinitäts-nachweisverfahren

Publications (3)

Publication Number Publication Date
JP2008539399A JP2008539399A (ja) 2008-11-13
JP2008539399A5 true JP2008539399A5 (OSRAM) 2011-05-26
JP5002584B2 JP5002584B2 (ja) 2012-08-15

Family

ID=36808724

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008508125A Expired - Fee Related JP5002584B2 (ja) 2005-04-26 2006-04-22 親和性検定方法による分析試料検出用の基質をコーティングするための新規な装置および方法

Country Status (9)

Country Link
US (1) US9050615B2 (OSRAM)
EP (1) EP1877773B1 (OSRAM)
JP (1) JP5002584B2 (OSRAM)
CN (1) CN101208599B (OSRAM)
AU (1) AU2006239534B2 (OSRAM)
CA (1) CA2605750A1 (OSRAM)
DK (1) DK1877773T3 (OSRAM)
ES (1) ES2525324T3 (OSRAM)
WO (1) WO2006114249A1 (OSRAM)

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GB2485564A (en) * 2010-11-18 2012-05-23 Rolls Royce Plc Luminescent surface coating for inspection
MX2013014553A (es) 2011-06-30 2014-02-19 Koninkl Philips Nv Examenes multiples de una muestra.
US10545141B2 (en) 2014-01-10 2020-01-28 Konica Minolta, Inc. Immunoassay method and immunoassay system
DE102014112625A1 (de) * 2014-09-02 2016-03-03 Schmid Energy Systems Gmbh Großflächen-Ultraschallverdampfer
US10703843B2 (en) 2014-12-08 2020-07-07 University Of Virginia Patent Foundation Compositions and methods for bonding glues, adhesives, and coatings to surfaces
CH712376A1 (de) 2016-04-19 2017-10-31 Camag Derivatisierungsgerät und -verfahren.
CN106198952A (zh) * 2016-07-01 2016-12-07 清华大学 一种抑制核酸分子对传感界面非特异性吸附的封闭方法
CN107807133A (zh) * 2017-11-08 2018-03-16 苏州安路特汽车部件有限公司 一种雾化渗透探伤装置
EP3963091A4 (en) * 2019-04-29 2023-07-19 Nautilus Biotechnology, Inc. METHODS AND SYSTEMS FOR ON-CHIP INTEGRATED SINGLE MOLECULE DETECTION
CN117203369A (zh) * 2021-05-19 2023-12-08 Swimc有限公司 金属封装液体或气溶胶喷射涂料组合物、涂覆的基材、封装和方法
CN115147617B (zh) * 2022-09-06 2022-11-22 聊城集众环保科技有限公司 基于计算机视觉的污水处理智能监控方法
CN115837944A (zh) * 2023-02-16 2023-03-24 太原理工大学 一种电厂烟气注入采空区防灾封存的气体监测装置

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JPH01115450A (ja) * 1987-10-28 1989-05-08 Seiko Epson Corp 潤滑層の形成方法
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