JP2008535316A5 - - Google Patents

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Publication number
JP2008535316A5
JP2008535316A5 JP2008503020A JP2008503020A JP2008535316A5 JP 2008535316 A5 JP2008535316 A5 JP 2008535316A5 JP 2008503020 A JP2008503020 A JP 2008503020A JP 2008503020 A JP2008503020 A JP 2008503020A JP 2008535316 A5 JP2008535316 A5 JP 2008535316A5
Authority
JP
Japan
Prior art keywords
time constant
network
predetermined reference
voltage
waveform
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2008503020A
Other languages
English (en)
Japanese (ja)
Other versions
JP2008535316A (ja
Filing date
Publication date
Priority claimed from US11/089,963 external-priority patent/US7190213B2/en
Application filed filed Critical
Publication of JP2008535316A publication Critical patent/JP2008535316A/ja
Publication of JP2008535316A5 publication Critical patent/JP2008535316A5/ja
Pending legal-status Critical Current

Links

JP2008503020A 2005-03-25 2006-03-10 デジタル時定数トラッキング技術及び装置 Pending JP2008535316A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/089,963 US7190213B2 (en) 2005-03-25 2005-03-25 Digital time constant tracking technique and apparatus
PCT/US2006/008741 WO2006104671A1 (en) 2005-03-25 2006-03-10 A digital time constant tracking technique and apparatus

Publications (2)

Publication Number Publication Date
JP2008535316A JP2008535316A (ja) 2008-08-28
JP2008535316A5 true JP2008535316A5 (enExample) 2009-04-23

Family

ID=37034601

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008503020A Pending JP2008535316A (ja) 2005-03-25 2006-03-10 デジタル時定数トラッキング技術及び装置

Country Status (5)

Country Link
US (1) US7190213B2 (enExample)
JP (1) JP2008535316A (enExample)
CN (1) CN101124721A (enExample)
TW (1) TW200641568A (enExample)
WO (1) WO2006104671A1 (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102006005778A1 (de) * 2006-02-03 2007-08-16 Atmel Germany Gmbh Verfahren und Schaltung zum Ableichen eines RC-Gliedes
DE602007005766D1 (de) * 2007-02-23 2010-05-20 St Microelectronics Srl Hochpräzisionskalibrierungsschaltkreis zur Kalibrierung einer verstellbaren Kapazität eines integrierten Schaltkreises mit von der Kapazität abhängiger Zeitkonstante
CN102426416B (zh) * 2011-09-05 2014-04-09 广东电网公司电力科学研究院 控制对象频域幅值特性辩识方法和装置
PL2915255T3 (pl) * 2012-10-31 2017-06-30 Diehl Ako Stiftung & Co. Kg Układ wyczuwający klawisz piezoelektryczny i sposób testowania układu wyczuwającego klawisz piezoelektryczny
US9065324B2 (en) * 2013-10-23 2015-06-23 Taiwan Semiconductor Manufacturing Company, Ltd. Electronic device with PVT delay compensation and related method
EP2930647B1 (en) * 2014-04-11 2018-08-08 Nxp B.V. Contactless communication device with receiver input voltage stabilization
CN109794405A (zh) * 2019-02-18 2019-05-24 河南中医药大学 高强度聚焦超声信号校准电路
US11393533B1 (en) 2021-02-12 2022-07-19 Micron Technology, Inc. Estimating resistance-capacitance time constant of electrical circuit

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0834403B2 (ja) * 1989-04-24 1996-03-29 日本電気株式会社 アクティブフィルタ
US5392456A (en) * 1989-10-06 1995-02-21 Hitachi, Ltd. Method of controlling filter time constant and filter circuit having the time constant control function based on the method
US5416438A (en) 1992-03-18 1995-05-16 Nec Corporation Active filter circuit suited to integration on IC chip
US5663675A (en) 1995-06-07 1997-09-02 American Microsystems, Inc. Multiple stage tracking filter using a self-calibrating RC oscillator circuit
US5914633A (en) 1997-08-08 1999-06-22 Lucent Technologies Inc. Method and apparatus for tuning a continuous time filter
FR2775141B1 (fr) * 1998-02-19 2002-10-11 Sgs Thomson Microelectronics Dispositif d'etalonnage de constantes de temps
JP2000004143A (ja) * 1998-06-17 2000-01-07 Nec Corp アナログデータ処理装置
US6259311B1 (en) 1998-12-23 2001-07-10 Agere Systems Guardian Corp. Method and apparatus for tuning filters
US6417727B1 (en) 1999-11-30 2002-07-09 Koninklijke Philips Electronics N.V. Circuit for automatically tuning filter circuits over process, voltage, and temperature
EP1158303A1 (en) * 2000-05-25 2001-11-28 Semiconductor Ideas to The Market (ItoM) BV A circuit for measuring absolute spread in capacitors implemented in planary technology
SE519372C2 (sv) * 2001-03-09 2003-02-18 Nat Semiconductor Corp Metod och krets för filtertrimning
DE10156027B4 (de) 2001-11-15 2012-02-09 Globalfoundries Inc. Abgleichbare Filterschaltung
US6677814B2 (en) 2002-01-17 2004-01-13 Microtune (San Diego), Inc. Method and apparatus for filter tuning
US6803813B1 (en) * 2003-04-22 2004-10-12 National Semiconductor Corporation Time constant-based calibration circuit for active filters

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