JP2008521189A - 質量分析計 - Google Patents

質量分析計 Download PDF

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Publication number
JP2008521189A
JP2008521189A JP2007542101A JP2007542101A JP2008521189A JP 2008521189 A JP2008521189 A JP 2008521189A JP 2007542101 A JP2007542101 A JP 2007542101A JP 2007542101 A JP2007542101 A JP 2007542101A JP 2008521189 A JP2008521189 A JP 2008521189A
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JP
Japan
Prior art keywords
mass
ion
ion guide
filter device
ions
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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JP2007542101A
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English (en)
Japanese (ja)
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JP2008521189A5 (enExample
Inventor
ベイトマン、ロバート、ハロルド
ジャイルズ、ケビン
プリングル、スティーブン、デレク
ワイルドグース、ジェイソン、リー
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マイクロマス ユーケー リミテッド
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Application filed by マイクロマス ユーケー リミテッド filed Critical マイクロマス ユーケー リミテッド
Publication of JP2008521189A publication Critical patent/JP2008521189A/ja
Publication of JP2008521189A5 publication Critical patent/JP2008521189A5/ja
Pending legal-status Critical Current

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/421—Mass filters, i.e. deviating unwanted ions without trapping
    • H01J49/4215—Quadrupole mass filters
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426—Methods for controlling ions
    • H01J49/427—Ejection and selection methods
    • H01J49/428—Applying a notched broadband signal

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2007542101A 2004-11-18 2005-11-18 質量分析計 Pending JP2008521189A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GBGB0425426.4A GB0425426D0 (en) 2004-11-18 2004-11-18 Mass spectrometer
US63195604P 2004-11-30 2004-11-30
PCT/GB2005/004457 WO2006054101A2 (en) 2004-11-18 2005-11-18 Mass spectrometer

Publications (2)

Publication Number Publication Date
JP2008521189A true JP2008521189A (ja) 2008-06-19
JP2008521189A5 JP2008521189A5 (enExample) 2008-12-11

Family

ID=33548493

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007542101A Pending JP2008521189A (ja) 2004-11-18 2005-11-18 質量分析計

Country Status (6)

Country Link
US (1) US8952320B2 (enExample)
EP (1) EP1812950A2 (enExample)
JP (1) JP2008521189A (enExample)
CA (1) CA2586519A1 (enExample)
GB (2) GB0425426D0 (enExample)
WO (1) WO2006054101A2 (enExample)

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JP4756096B2 (ja) * 2007-01-25 2011-08-24 マイクロマス ユーケー リミテッド 質量分析計

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US7964843B2 (en) 2008-07-18 2011-06-21 The George Washington University Three-dimensional molecular imaging by infrared laser ablation electrospray ionization mass spectrometry
US8067730B2 (en) 2007-07-20 2011-11-29 The George Washington University Laser ablation electrospray ionization (LAESI) for atmospheric pressure, In vivo, and imaging mass spectrometry
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US8829426B2 (en) 2011-07-14 2014-09-09 The George Washington University Plume collimation for laser ablation electrospray ionization mass spectrometry
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EP2807669A2 (en) 2012-01-24 2014-12-03 Thermo Finnigan LLC Multinotch isolation for ms3 mass analysis
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WO2013176901A1 (en) 2012-05-23 2013-11-28 President And Fellows Of Harvard College Mass spectrometry for multiplexed quantitation using multiple frequency notches
CN103515183B (zh) * 2012-06-20 2017-06-23 株式会社岛津制作所 离子导引装置和离子导引方法
JP6491097B2 (ja) 2012-10-22 2019-03-27 プレジデント アンド フェローズ オブ ハーバード カレッジ 質量分析法を使用する正確で干渉のない多重定量プロテオミクス
EP2956957B1 (en) * 2013-02-18 2020-01-22 Micromass UK Limited Device allowing improved reaction monitoring of gas phase reactions in mass spectrometers using an auto ejection ion trap
US20150380231A1 (en) * 2013-02-18 2015-12-31 Micromass Uk Limited Improved Efficiency and Precise Control of Gas Phase Reactions in Mass Spectrometers Using an Auto Ejection Ion Trap
WO2014159478A1 (en) * 2013-03-14 2014-10-02 President And Fellows Of Harvard College Adjusting precursor ion populations in mass spectrometry using dynamic isolation waveforms
GB201315145D0 (en) 2013-08-23 2013-10-09 Smiths Detection Watford Ltd Ion Modification
US9997340B2 (en) * 2013-09-13 2018-06-12 Dh Technologies Development Pte. Ltd. RF-only detection scheme and simultaneous detection of multiple ions
WO2015056066A1 (en) * 2013-10-16 2015-04-23 Dh Technologies Development Pte. Ltd. Systems and methods for identifying precursor ions from product ions using arbitrary transmission windowing
WO2015068001A1 (en) 2013-11-07 2015-05-14 Dh Technologies Development Pte. Ltd. Multiplexing of ions for improved sensitivity
WO2015071648A2 (en) 2013-11-12 2015-05-21 Micromass Uk Limited Ion trap mass spectrometers
GB201319942D0 (en) * 2013-11-12 2013-12-25 Micromass Ltd Ion Trap Mass Spectrometers
WO2015118321A1 (en) 2014-02-04 2015-08-13 Micromass Uk Limited Optimized multiple reaction monitoring or single ion recording method
WO2015162415A1 (en) * 2014-04-23 2015-10-29 Micromass Uk Limited Identification and removal of chemical noise for improved ms and ms/ms analysis
CN106663590B (zh) * 2014-06-10 2019-03-26 英国质谱公司 离子引导器
US9875885B2 (en) * 2015-05-11 2018-01-23 Thermo Finnigan Llc Systems and methods for ion isolation
EP3357080B1 (en) 2015-10-01 2024-05-01 DH Technologies Development PTE. Ltd. Mass-selective axial ejection linear ion trap
US9741552B2 (en) * 2015-12-22 2017-08-22 Bruker Daltonics, Inc. Triple quadrupole mass spectrometry coupled to trapped ion mobility separation
US11085927B2 (en) 2016-06-03 2021-08-10 President And Fellows Of Harvard College Techniques for high throughput targeted proteomic analysis and related systems and methods
CN109643635B (zh) * 2016-07-25 2021-08-17 Dh科技发展私人贸易有限公司 用于在扫描swath数据中识别前体及产物离子对的系统及方法
EP3577677B1 (en) 2017-02-01 2024-09-04 DH Technologies Development PTE. Ltd. Fourier transform mass spectrometer
GB2563565B (en) * 2017-04-13 2022-05-11 Micromass Ltd Mass spectrometry with increased duty cycle
GB2572846B (en) 2018-02-16 2020-09-16 Micromass Ltd Quadrupole devices
WO2020183160A1 (en) 2019-03-11 2020-09-17 Micromass Uk Limited Quadrupole devices
JP2022534468A (ja) 2019-05-31 2022-08-01 ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド 走査型ｓｗａｔｈデータのリアルタイムエンコーディングおよび前駆体推測のための確率的フレームワークのための方法
CN111309060A (zh) * 2020-03-27 2020-06-19 北京环拓科技有限公司 一种大气负氧离子观测仪的控制方法
EP3916755A1 (en) * 2020-05-26 2021-12-01 Thermo Finnigan LLC Methods and apparatus for high speed mass spectrometry
GB202011470D0 (en) 2020-07-24 2020-09-09 Micromass Ltd ION mobility separation
GB202306186D0 (en) * 2023-04-27 2023-06-14 Micromass Ltd Mass spectrometer having parallel precursor ion isolation

Citations (8)

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US5187365A (en) * 1991-02-28 1993-02-16 Teledyne Mec Mass spectrometry method using time-varying filtered noise
JPH09180672A (ja) * 1995-12-18 1997-07-11 Hewlett Packard Co <Hp> ノッチ・フィルタ及び目標イオンの除去方法
JPH11154486A (ja) * 1997-08-22 1999-06-08 Micromass Ltd タンデム式質量分光分析の方法とタンデム式質量分光分析計
US6093929A (en) * 1997-05-16 2000-07-25 Mds Inc. High pressure MS/MS system
JP2001526448A (ja) * 1997-12-04 2001-12-18 ユニヴァーシティー オブ マニトバ 四重極イオンガイド中でイオンを選択的に衝突誘発解離する方法および装置
WO2003091721A1 (en) * 2002-04-24 2003-11-06 Mds Inc. , Doing Business As Mds Sciex Apparatus and method for mobility separation of ions utilizing an ion guide with an axial field and counterflow of gas
JP2003338261A (ja) * 2002-05-20 2003-11-28 Shimadzu Corp イオントラップ型質量分析装置
JP2005524211A (ja) * 2002-04-29 2005-08-11 エムディーエス　インコーポレイテッド　ドゥーイング　ビジネス　アズ　エムディーエス　サイエックス 衝突エネルギーを変化させることによる質量分析における広いイオンフラグメント化範囲を得る方法

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US5187365A (en) * 1991-02-28 1993-02-16 Teledyne Mec Mass spectrometry method using time-varying filtered noise
JPH09180672A (ja) * 1995-12-18 1997-07-11 Hewlett Packard Co <Hp> ノッチ・フィルタ及び目標イオンの除去方法
US6093929A (en) * 1997-05-16 2000-07-25 Mds Inc. High pressure MS/MS system
JPH11154486A (ja) * 1997-08-22 1999-06-08 Micromass Ltd タンデム式質量分光分析の方法とタンデム式質量分光分析計
JP2001526448A (ja) * 1997-12-04 2001-12-18 ユニヴァーシティー オブ マニトバ 四重極イオンガイド中でイオンを選択的に衝突誘発解離する方法および装置
WO2003091721A1 (en) * 2002-04-24 2003-11-06 Mds Inc. , Doing Business As Mds Sciex Apparatus and method for mobility separation of ions utilizing an ion guide with an axial field and counterflow of gas
JP2005524211A (ja) * 2002-04-29 2005-08-11 エムディーエス　インコーポレイテッド　ドゥーイング　ビジネス　アズ　エムディーエス　サイエックス 衝突エネルギーを変化させることによる質量分析における広いイオンフラグメント化範囲を得る方法
JP2003338261A (ja) * 2002-05-20 2003-11-28 Shimadzu Corp イオントラップ型質量分析装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4756096B2 (ja) * 2007-01-25 2011-08-24 マイクロマス ユーケー リミテッド 質量分析計
US8076637B2 (en) 2007-01-25 2011-12-13 Micromass Uk Limited Mass spectrometer

Also Published As

Publication number Publication date
GB2421842B (en) 2007-08-01
GB0523569D0 (en) 2005-12-28
WO2006054101A2 (en) 2006-05-26
US20090194688A1 (en) 2009-08-06
US8952320B2 (en) 2015-02-10
GB2421842A (en) 2006-07-05
GB0425426D0 (en) 2004-12-22
WO2006054101A3 (en) 2007-01-18
EP1812950A2 (en) 2007-08-01
CA2586519A1 (en) 2006-05-26

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