JP2008519433A - アポクロマート等倍投影光学系 - Google Patents
アポクロマート等倍投影光学系 Download PDFInfo
- Publication number
- JP2008519433A JP2008519433A JP2007539114A JP2007539114A JP2008519433A JP 2008519433 A JP2008519433 A JP 2008519433A JP 2007539114 A JP2007539114 A JP 2007539114A JP 2007539114 A JP2007539114 A JP 2007539114A JP 2008519433 A JP2008519433 A JP 2008519433A
- Authority
- JP
- Japan
- Prior art keywords
- optical system
- projection optical
- mirror
- projection
- glass
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003287 optical effect Effects 0.000 title claims abstract description 183
- 239000011521 glass Substances 0.000 claims description 34
- 230000005499 meniscus Effects 0.000 claims description 24
- 238000005286 illumination Methods 0.000 claims description 8
- 238000001459 lithography Methods 0.000 claims description 6
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims 10
- 239000005350 fused silica glass Substances 0.000 claims 5
- 230000003595 spectral effect Effects 0.000 abstract description 19
- 238000000206 photolithography Methods 0.000 abstract description 14
- 238000013461 design Methods 0.000 description 48
- 230000004075 alteration Effects 0.000 description 39
- 238000012937 correction Methods 0.000 description 30
- 230000001419 dependent effect Effects 0.000 description 11
- 238000000034 method Methods 0.000 description 8
- 201000009310 astigmatism Diseases 0.000 description 7
- 239000000463 material Substances 0.000 description 6
- 206010010071 Coma Diseases 0.000 description 5
- 230000008569 process Effects 0.000 description 5
- 238000001228 spectrum Methods 0.000 description 5
- 230000005855 radiation Effects 0.000 description 4
- 238000009826 distribution Methods 0.000 description 3
- 230000006872 improvement Effects 0.000 description 3
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 3
- 229910052753 mercury Inorganic materials 0.000 description 3
- 229920002120 photoresistant polymer Polymers 0.000 description 3
- 230000000295 complement effect Effects 0.000 description 2
- 239000002131 composite material Substances 0.000 description 2
- 238000011960 computer-aided design Methods 0.000 description 2
- 238000004042 decolorization Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- 238000001429 visible spectrum Methods 0.000 description 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000002086 nanomaterial Substances 0.000 description 1
- 239000005304 optical glass Substances 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 238000005549 size reduction Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70225—Optical aspects of catadioptric systems, i.e. comprising reflective and refractive elements
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/08—Mirrors
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/008—Systems specially adapted to form image relays or chained systems
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/08—Catadioptric systems
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
- G03B27/00—Photographic printing apparatus
- G03B27/32—Projection printing apparatus, e.g. enlarger, copying camera
- G03B27/52—Details
- G03B27/54—Lamp housings; Illuminating means
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Lenses (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/980,110 US7148953B2 (en) | 2004-11-01 | 2004-11-01 | Apochromatic unit-magnification projection optical system |
| PCT/US2005/038777 WO2006050029A2 (en) | 2004-11-01 | 2005-10-27 | Apochromatic unit-magnification projection optical system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2008519433A true JP2008519433A (ja) | 2008-06-05 |
| JP2008519433A5 JP2008519433A5 (enExample) | 2010-05-20 |
Family
ID=36261404
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007539114A Pending JP2008519433A (ja) | 2004-11-01 | 2005-10-27 | アポクロマート等倍投影光学系 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US7148953B2 (enExample) |
| JP (1) | JP2008519433A (enExample) |
| KR (1) | KR101130594B1 (enExample) |
| TW (1) | TWI420149B (enExample) |
| WO (1) | WO2006050029A2 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014123719A (ja) * | 2012-12-21 | 2014-07-03 | Ultratech Inc | 熱変形を低減するwynn−dyson結像システム |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8208198B2 (en) | 2004-01-14 | 2012-06-26 | Carl Zeiss Smt Gmbh | Catadioptric projection objective |
| US20080151364A1 (en) | 2004-01-14 | 2008-06-26 | Carl Zeiss Smt Ag | Catadioptric projection objective |
| KR101213831B1 (ko) | 2004-05-17 | 2012-12-24 | 칼 짜이스 에스엠티 게엠베하 | 중간이미지를 갖는 카타디옵트릭 투사 대물렌즈 |
| EP1912098B1 (en) * | 2006-10-12 | 2012-04-25 | Carl Zeiss SMT GmbH | Unit magnification projection objective |
| DE102008015775A1 (de) | 2007-04-16 | 2008-12-18 | Carl Zeiss Smt Ag | Chromatisch korrigiertes Lithographieobjektiv |
| US7710564B1 (en) * | 2007-09-03 | 2010-05-04 | Kla-Tencor Corporation | Polarized broadband wafer inspection |
| US8493670B2 (en) | 2010-09-10 | 2013-07-23 | Coherent, Inc. | Large-field unit-magnification catadioptric projection system |
| US8659823B2 (en) | 2011-04-22 | 2014-02-25 | Coherent, Inc. | Unit-magnification catadioptric and catoptric projection optical systems |
| US8830590B2 (en) * | 2012-05-30 | 2014-09-09 | Ultratech, Inc. | Unit magnification large-format catadioptric lens for microlithography |
| US8845163B2 (en) * | 2012-08-17 | 2014-09-30 | Ultratech, Inc. | LED-based photolithographic illuminator with high collection efficiency |
| US9488811B2 (en) | 2013-08-20 | 2016-11-08 | Ultratech, Inc. | Wynne-Dyson optical system with variable magnification |
| US9436103B2 (en) | 2014-05-19 | 2016-09-06 | Ultratech, Inc. | Wynne-Dyson projection lens with reduced susceptibility to UV damage |
| JP2016218299A (ja) * | 2015-05-22 | 2016-12-22 | 財団法人國家實驗研究院 | 単一非球面共通光学素子露光機レンズセット |
| CN107064016B (zh) * | 2017-04-14 | 2019-11-12 | 中国科学院长春光学精密机械与物理研究所 | 一种光栅色散成像光谱仪 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5413329A (en) * | 1977-06-30 | 1979-01-31 | Ibm | Unittmagnification achromatic optical system |
| JPH11202208A (ja) * | 1997-10-27 | 1999-07-30 | Wescam Inc | 反射屈折光学系ズームレンズ組立体 |
| WO2004061487A2 (en) * | 2003-01-02 | 2004-07-22 | Ultratech Stepper, Inc. | Variable numerical aperture large-field unit-magnification projection system |
| WO2004062262A2 (en) * | 2002-12-27 | 2004-07-22 | Ultratech Stepper, Inc. | Large-field unit-magnification projection system |
Family Cites Families (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4103989A (en) | 1977-02-07 | 1978-08-01 | Seymour Rosin | Unit-power concentric optical systems |
| US4171870A (en) | 1977-05-06 | 1979-10-23 | Bell Telephone Laboratories, Incorporated | Compact image projection apparatus |
| US4391494A (en) | 1981-05-15 | 1983-07-05 | General Signal Corporation | Apparatus for projecting a series of images onto dies of a semiconductor wafer |
| US4425037A (en) | 1981-05-15 | 1984-01-10 | General Signal Corporation | Apparatus for projecting a series of images onto dies of a semiconductor wafer |
| US4469414A (en) | 1982-06-01 | 1984-09-04 | The Perkin-Elmer Corporation | Restrictive off-axis field optical system |
| US4768869A (en) | 1984-11-29 | 1988-09-06 | Lockheed Missiles & Space Company, Inc. | Catadioptric imaging system |
| US4934801A (en) | 1984-11-29 | 1990-06-19 | Lockheed Missiles & Space Company, Inc. | Optical imaging system |
| US4681407A (en) | 1985-12-02 | 1987-07-21 | Lockheed Missiles & Space Company, Inc. | Two-glass photographic objective color-corrected at four wavelengths |
| US4704011A (en) | 1985-12-13 | 1987-11-03 | Lockheed Missiles & Space Company, Inc. | Three-glass photographic objective color-corrected at four wavelengths |
| US4929071A (en) | 1985-12-20 | 1990-05-29 | Lockheed Missiles & Space Company, Inc. | Long-focus color-corrected petzval-type optical objective |
| US5000548A (en) | 1988-04-25 | 1991-03-19 | Lockheed Missiles & Space Company, Inc. | Microscope objective |
| US5040882A (en) | 1988-11-07 | 1991-08-20 | General Signal Corporation | Unit magnification optical system with improved reflective reticle |
| US4964705A (en) | 1988-11-07 | 1990-10-23 | General Signal Corporation | Unit magnification optical system |
| US5031977A (en) | 1989-12-27 | 1991-07-16 | General Signal Corporation | Deep ultraviolet (UV) lens for use in a photolighography system |
| US5161062A (en) | 1991-07-11 | 1992-11-03 | General Signal Corporation | Optical projection system including a refractive lens assembly having a gap between constituent lenses |
| US5559629A (en) | 1994-08-19 | 1996-09-24 | Tamarack Scientific Co., Inc. | Unit magnification projection system and method |
| JPH08211294A (ja) | 1995-02-02 | 1996-08-20 | Nikon Corp | 投影露光装置 |
| US6963403B2 (en) * | 2002-01-15 | 2005-11-08 | Council Of Scientific And Industrial Research | Method for determining the reflectance profile of materials |
| US6809888B1 (en) * | 2003-04-16 | 2004-10-26 | Ultratech, Inc. | Apparatus and methods for thermal reduction of optical distortion |
| US6863403B2 (en) * | 2003-05-27 | 2005-03-08 | Ultratech, Inc. | Deep ultraviolet unit-magnification projection optical system and projection exposure apparatus |
-
2004
- 2004-11-01 US US10/980,110 patent/US7148953B2/en not_active Expired - Fee Related
-
2005
- 2005-10-19 TW TW094136504A patent/TWI420149B/zh not_active IP Right Cessation
- 2005-10-27 KR KR1020077009974A patent/KR101130594B1/ko not_active Expired - Fee Related
- 2005-10-27 JP JP2007539114A patent/JP2008519433A/ja active Pending
- 2005-10-27 WO PCT/US2005/038777 patent/WO2006050029A2/en not_active Ceased
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5413329A (en) * | 1977-06-30 | 1979-01-31 | Ibm | Unittmagnification achromatic optical system |
| JPH11202208A (ja) * | 1997-10-27 | 1999-07-30 | Wescam Inc | 反射屈折光学系ズームレンズ組立体 |
| WO2004062262A2 (en) * | 2002-12-27 | 2004-07-22 | Ultratech Stepper, Inc. | Large-field unit-magnification projection system |
| WO2004061487A2 (en) * | 2003-01-02 | 2004-07-22 | Ultratech Stepper, Inc. | Variable numerical aperture large-field unit-magnification projection system |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014123719A (ja) * | 2012-12-21 | 2014-07-03 | Ultratech Inc | 熱変形を低減するwynn−dyson結像システム |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2006050029A3 (en) | 2006-08-10 |
| US20060092395A1 (en) | 2006-05-04 |
| US7148953B2 (en) | 2006-12-12 |
| KR101130594B1 (ko) | 2012-04-02 |
| WO2006050029A2 (en) | 2006-05-11 |
| TWI420149B (zh) | 2013-12-21 |
| TW200615577A (en) | 2006-05-16 |
| KR20070069186A (ko) | 2007-07-02 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20081015 |
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| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20100405 |
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| A977 | Report on retrieval |
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| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20110928 |
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| A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20111222 |
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| A602 | Written permission of extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A602 Effective date: 20120105 |
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| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20120328 |