JP2008210897A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2008210897A5 JP2008210897A5 JP2007044651A JP2007044651A JP2008210897A5 JP 2008210897 A5 JP2008210897 A5 JP 2008210897A5 JP 2007044651 A JP2007044651 A JP 2007044651A JP 2007044651 A JP2007044651 A JP 2007044651A JP 2008210897 A5 JP2008210897 A5 JP 2008210897A5
- Authority
- JP
- Japan
- Prior art keywords
- beams
- exposure apparatus
- individually
- electron
- aligner
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 claims 2
- 230000000903 blocking effect Effects 0.000 claims 1
- 238000010894 electron beam technology Methods 0.000 claims 1
- 238000003384 imaging method Methods 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 claims 1
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007044651A JP5117069B2 (ja) | 2007-02-23 | 2007-02-23 | 露光装置、及びデバイス製造方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007044651A JP5117069B2 (ja) | 2007-02-23 | 2007-02-23 | 露光装置、及びデバイス製造方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2008210897A JP2008210897A (ja) | 2008-09-11 |
| JP2008210897A5 true JP2008210897A5 (https=) | 2010-04-08 |
| JP5117069B2 JP5117069B2 (ja) | 2013-01-09 |
Family
ID=39786969
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007044651A Expired - Fee Related JP5117069B2 (ja) | 2007-02-23 | 2007-02-23 | 露光装置、及びデバイス製造方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP5117069B2 (https=) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6215586B2 (ja) | 2012-11-02 | 2017-10-18 | 株式会社ニューフレアテクノロジー | マルチ荷電粒子ビーム描画方法及びマルチ荷電粒子ビーム描画装置 |
| JP6057700B2 (ja) * | 2012-12-26 | 2017-01-11 | 株式会社ニューフレアテクノロジー | マルチ荷電粒子ビーム描画装置 |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005149806A (ja) * | 2003-11-12 | 2005-06-09 | Sony Corp | 電子ビーム照射装置および電子ビーム照射方法 |
| JP3889743B2 (ja) * | 2003-12-05 | 2007-03-07 | 株式会社東芝 | 荷電ビーム描画方法及び描画装置 |
| JP4181533B2 (ja) * | 2004-09-09 | 2008-11-19 | 株式会社日立ハイテクノロジーズ | 電子ビーム描画装置 |
| JP2007019246A (ja) * | 2005-07-07 | 2007-01-25 | Canon Inc | 電子ビーム装置およびデバイス製造方法 |
-
2007
- 2007-02-23 JP JP2007044651A patent/JP5117069B2/ja not_active Expired - Fee Related
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TWI849632B (zh) | 用於檢測樣本的方法及帶電粒子束裝置 | |
| KR101900050B1 (ko) | 멀티 하전 입자빔 장치 | |
| TWI582816B (zh) | 帶電粒子的多個小射束設備以及用於影響及/或控制其中的帶電粒子小射束的軌跡之方法 | |
| JP5663717B2 (ja) | 荷電粒子システム | |
| TWI377593B (en) | A charged particle multi-beamlet system for exposing a target using a plurality of beamlets | |
| JP4484868B2 (ja) | 複数の小ビームを発生させるための装置 | |
| KR20200083924A (ko) | 다수의 입자 빔을 생성하기 위한 장치, 및 다중빔 입자 빔 시스템 | |
| CN112840431A (zh) | 带电粒子束设备、场曲校正器、及操作带电粒子束设备的方法 | |
| TWI743262B (zh) | 用於電子束系統中之像差校正之系統 | |
| US8835868B2 (en) | Multi charged particle beam writing apparatus | |
| WO2014188882A1 (ja) | 荷電粒子線応用装置 | |
| JP7336926B2 (ja) | 性能が向上されたマルチ電子ビーム撮像装置 | |
| KR20120098627A (ko) | 다중 빔을 갖는 대전 입자 광학 시스템 | |
| KR20200113166A (ko) | 시료로부터 에너지 분석기 및 전자 분광계 장치로의 전자 전달 장치 및 방법 | |
| JP3962778B2 (ja) | 電子ビーム検出器、並びにそれを用いた電子ビーム描画方法及び電子ビーム描画装置 | |
| TW202307899A (zh) | 帶電粒子評估系統及方法 | |
| US6878937B1 (en) | Prism array for electron beam inspection and defect review | |
| TW202328812A (zh) | 帶電粒子裝置及方法 | |
| JP2026040580A (ja) | 走査型電子顕微鏡および走査型電子顕微鏡の2次電子検出方法 | |
| US10283316B2 (en) | Aperture for inspecting multi beam, beam inspection apparatus for multi beam, and multi charged particle beam writing apparatus | |
| CN114762076A (zh) | 多源照射装置 | |
| JP2003332207A (ja) | 電子ビーム露光装置及び電子ビーム処理装置 | |
| JP2011023126A (ja) | 荷電粒子線照射装置、描画装置、分析顕微鏡、荷電粒子線出射装置および荷電粒子線用のレンズ装置 | |
| JP2008210897A5 (https=) | ||
| EP1679734B1 (en) | Multiple lens assembly and charged particle beam device comprising the same |