JP2008159593A5 - - Google Patents
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- Publication number
- JP2008159593A5 JP2008159593A5 JP2008017012A JP2008017012A JP2008159593A5 JP 2008159593 A5 JP2008159593 A5 JP 2008159593A5 JP 2008017012 A JP2008017012 A JP 2008017012A JP 2008017012 A JP2008017012 A JP 2008017012A JP 2008159593 A5 JP2008159593 A5 JP 2008159593A5
- Authority
- JP
- Japan
- Prior art keywords
- needle electrode
- tip
- opening
- ion source
- sample gas
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 150000002500 ions Chemical class 0.000 claims 8
- 239000007789 gas Substances 0.000 claims 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims 1
- 229910052757 nitrogen Inorganic materials 0.000 claims 1
- 239000001301 oxygen Substances 0.000 claims 1
- 229910052760 oxygen Inorganic materials 0.000 claims 1
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008017012A JP4678032B2 (ja) | 2008-01-29 | 2008-01-29 | イオン源およびそれを用いた質量分析計 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008017012A JP4678032B2 (ja) | 2008-01-29 | 2008-01-29 | イオン源およびそれを用いた質量分析計 |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000247937A Division JP4126150B2 (ja) | 1999-09-20 | 2000-08-10 | 質量分析装置 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010258478A Division JP4853588B2 (ja) | 2010-11-19 | 2010-11-19 | イオン源 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2008159593A JP2008159593A (ja) | 2008-07-10 |
| JP2008159593A5 true JP2008159593A5 (enExample) | 2008-08-21 |
| JP4678032B2 JP4678032B2 (ja) | 2011-04-27 |
Family
ID=39660231
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2008017012A Expired - Lifetime JP4678032B2 (ja) | 2008-01-29 | 2008-01-29 | イオン源およびそれを用いた質量分析計 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP4678032B2 (enExample) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4853588B2 (ja) * | 2010-11-19 | 2012-01-11 | 株式会社日立製作所 | イオン源 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3550222B2 (ja) * | 1995-07-07 | 2004-08-04 | 株式会社日本エイピーアイ | 質量分析装置 |
| JP4126150B2 (ja) * | 2000-08-10 | 2008-07-30 | 株式会社日立製作所 | 質量分析装置 |
-
2008
- 2008-01-29 JP JP2008017012A patent/JP4678032B2/ja not_active Expired - Lifetime
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