JP2002056801A5 - - Google Patents

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Publication number
JP2002056801A5
JP2002056801A5 JP2000247937A JP2000247937A JP2002056801A5 JP 2002056801 A5 JP2002056801 A5 JP 2002056801A5 JP 2000247937 A JP2000247937 A JP 2000247937A JP 2000247937 A JP2000247937 A JP 2000247937A JP 2002056801 A5 JP2002056801 A5 JP 2002056801A5
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JP
Japan
Prior art keywords
chamber
mass spectrometer
needle electrode
sample gas
opening
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2000247937A
Other languages
English (en)
Japanese (ja)
Other versions
JP4126150B2 (ja
JP2002056801A (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from JP2000247937A external-priority patent/JP4126150B2/ja
Priority to JP2000247937A priority Critical patent/JP4126150B2/ja
Priority to EP00120100A priority patent/EP1093151B1/en
Priority to EP10009000A priority patent/EP2296167B1/en
Priority to DE60044892T priority patent/DE60044892D1/de
Priority to US09/663,796 priority patent/US6686592B1/en
Priority to IL13854000A priority patent/IL138540A0/xx
Publication of JP2002056801A publication Critical patent/JP2002056801A/ja
Priority to US10/651,997 priority patent/US6838664B2/en
Publication of JP2002056801A5 publication Critical patent/JP2002056801A5/ja
Publication of JP4126150B2 publication Critical patent/JP4126150B2/ja
Application granted granted Critical
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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JP2000247937A 1999-09-20 2000-08-10 質量分析装置 Expired - Lifetime JP4126150B2 (ja)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP2000247937A JP4126150B2 (ja) 2000-08-10 2000-08-10 質量分析装置
EP00120100A EP1093151B1 (en) 1999-09-20 2000-09-15 Ion source, mass spectrometer, mass spectrometry, and monitoring system
EP10009000A EP2296167B1 (en) 1999-09-20 2000-09-15 Ion source, mass spectrometer, detector and monitoring system
DE60044892T DE60044892D1 (de) 1999-09-20 2000-09-15 Ionenquelle, Massenspektrometer, Massenspektrometrie und Überwachungssystem
US09/663,796 US6686592B1 (en) 1999-09-20 2000-09-18 Mass spectrometer, mass spectrometry, and monitoring system
IL13854000A IL138540A0 (en) 1999-09-20 2000-09-18 Mass spectrometer, mass spectrometry, and monitoring system
US10/651,997 US6838664B2 (en) 1999-09-20 2003-09-02 Mass spectrometer, mass spectrometry, and monitoring system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000247937A JP4126150B2 (ja) 2000-08-10 2000-08-10 質量分析装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2008017012A Division JP4678032B2 (ja) 2008-01-29 2008-01-29 イオン源およびそれを用いた質量分析計

Publications (3)

Publication Number Publication Date
JP2002056801A JP2002056801A (ja) 2002-02-22
JP2002056801A5 true JP2002056801A5 (enExample) 2005-06-30
JP4126150B2 JP4126150B2 (ja) 2008-07-30

Family

ID=18737934

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000247937A Expired - Lifetime JP4126150B2 (ja) 1999-09-20 2000-08-10 質量分析装置

Country Status (1)

Country Link
JP (1) JP4126150B2 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4678032B2 (ja) * 2008-01-29 2011-04-27 株式会社日立製作所 イオン源およびそれを用いた質量分析計
CN103069538B (zh) * 2010-08-19 2016-05-11 莱克公司 具有软电离辉光放电和调节器的质谱仪
JP4853588B2 (ja) * 2010-11-19 2012-01-11 株式会社日立製作所 イオン源
CN108760721A (zh) * 2018-09-18 2018-11-06 四川大学 基于中空电极尖端放电的原子发射光谱分析检测装置
JP7453642B2 (ja) * 2020-02-25 2024-03-21 株式会社バイオクロマト イオン化装置、質量分析システム及びイオン化方法
CN113793796B (zh) * 2020-05-29 2022-11-11 同方威视技术股份有限公司 电晕放电型电离源组件和离子迁移谱仪
JP7525072B2 (ja) * 2021-09-16 2024-07-30 株式会社島津製作所 質量分析装置の電圧設定方法及び質量分析装置

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