JP4678032B2 - イオン源およびそれを用いた質量分析計 - Google Patents
イオン源およびそれを用いた質量分析計 Download PDFInfo
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- JP4678032B2 JP4678032B2 JP2008017012A JP2008017012A JP4678032B2 JP 4678032 B2 JP4678032 B2 JP 4678032B2 JP 2008017012 A JP2008017012 A JP 2008017012A JP 2008017012 A JP2008017012 A JP 2008017012A JP 4678032 B2 JP4678032 B2 JP 4678032B2
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- needle electrode
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Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008017012A JP4678032B2 (ja) | 2008-01-29 | 2008-01-29 | イオン源およびそれを用いた質量分析計 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008017012A JP4678032B2 (ja) | 2008-01-29 | 2008-01-29 | イオン源およびそれを用いた質量分析計 |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000247937A Division JP4126150B2 (ja) | 1999-09-20 | 2000-08-10 | 質量分析装置 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010258478A Division JP4853588B2 (ja) | 2010-11-19 | 2010-11-19 | イオン源 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2008159593A JP2008159593A (ja) | 2008-07-10 |
| JP2008159593A5 JP2008159593A5 (enExample) | 2008-08-21 |
| JP4678032B2 true JP4678032B2 (ja) | 2011-04-27 |
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ID=39660231
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2008017012A Expired - Lifetime JP4678032B2 (ja) | 2008-01-29 | 2008-01-29 | イオン源およびそれを用いた質量分析計 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP4678032B2 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011044438A (ja) * | 2010-11-19 | 2011-03-03 | Hitachi Ltd | イオン源 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3550222B2 (ja) * | 1995-07-07 | 2004-08-04 | 株式会社日本エイピーアイ | 質量分析装置 |
| JP4126150B2 (ja) * | 2000-08-10 | 2008-07-30 | 株式会社日立製作所 | 質量分析装置 |
-
2008
- 2008-01-29 JP JP2008017012A patent/JP4678032B2/ja not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011044438A (ja) * | 2010-11-19 | 2011-03-03 | Hitachi Ltd | イオン源 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2008159593A (ja) | 2008-07-10 |
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