JP2008072139A5 - - Google Patents
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- JP2008072139A5 JP2008072139A5 JP2007300911A JP2007300911A JP2008072139A5 JP 2008072139 A5 JP2008072139 A5 JP 2008072139A5 JP 2007300911 A JP2007300911 A JP 2007300911A JP 2007300911 A JP2007300911 A JP 2007300911A JP 2008072139 A5 JP2008072139 A5 JP 2008072139A5
- Authority
- JP
- Japan
- Prior art keywords
- annular
- fluid supply
- cover means
- gas
- partial vacuum
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000012530 fluid Substances 0.000 claims 10
- 239000000758 substrate Substances 0.000 claims 8
- 230000001808 coupling Effects 0.000 claims 7
- 238000010168 coupling process Methods 0.000 claims 7
- 238000005859 coupling reaction Methods 0.000 claims 7
- 238000005286 illumination Methods 0.000 claims 3
- 239000011148 porous material Substances 0.000 claims 3
- 238000004519 manufacturing process Methods 0.000 claims 2
- 230000003287 optical Effects 0.000 claims 1
- 238000000059 patterning Methods 0.000 claims 1
Claims (12)
- 放射線のビームを調節する照明システムと、
前記放射線のビームの断面にパターンを与えるパターニングデバイスを保持する支持構造体と、
基板を保持する基板テーブルと、
パターン化したビームを前記基板の目標部分上に投影する投影システムと、
前記投影システムの少なくとも一部、前記照明システムの少なくとも一部、またはその両方を含む容積に流体を提供する流体供給システムと、
前記流体供給システムと前記投影システムとの間の開口を覆うカバー手段と、
前記カバー手段を前記流体供給システムに結合する結合デバイスと、
を備えるリソグラフィ装置。 - 前記結合デバイスは、ガスベアリングを含む、請求項1記載の装置。
- 前記結合デバイスは、少なくとも部分真空を含む、請求項1又は2記載の装置。
- 複数のガス出口及び複数の少なくとも部分真空の入口を含む、請求項3に記載の装置。
- 前記ガス出口およびガス入口は、それぞれ、環状をなすガス供給領域、および、環状をなす少なくとも部分真空の領域に設けられており、前記環状をなすガス供給領域、および、前記環状をなす少なくとも部分真空の領域は、前記投影システムの光軸のまわりに同心状に配されている、請求項4に記載の装置。
- 前記環状をなすガス供給領域、および、前記環状をなす少なくとも部分真空の領域は、それぞれ多孔質材料を含む、請求項5に記載の装置。
- 前記環状をなすガス供給領域の多孔質材料は、前記環状をなす少なくとも部分真空の領域の多孔質材料よりも高い多孔性を有する、請求項6記載の装置。
- 前記カバー手段を拾いあげるために前記ガス出口からのガスを止める請求項4乃至7のいずれか一項に記載の装置。
- 前記カバー手段は、前記基板テーブル内に配置され、前記カバー手段の表面は、前記基板テーブルの表面と同一平面上にある請求項1乃至8のいずれか一項に記載の装置。
- 前記結合デバイスは、さらに、前記流体供給システムを前記基板テーブル及び/又は基板に結合可能である、請求項1乃至9のいずれか一項に記載の装置。
- 投影システムを用いて、パターン化したビームを基板の目標部分上に投影すること、
前記投影システムの少なくとも一部、照明システムの少なくとも一部、またはその両方を含む容積に、流体供給システムを用いて、流体を提供すること、および
前記流体供給システムと前記投影システムとの間の開口を覆うカバー手段と、前記流体供給システムとを結合すること、を含むデバイス製造方法。 - 前記流体供給システムと前記カバー手段とを真空を用いて結合する請求項11に記載の製造方法。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/873650 | 2004-06-23 | ||
US10/873,650 US7057702B2 (en) | 2004-06-23 | 2004-06-23 | Lithographic apparatus and device manufacturing method |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005181472A Division JP2006013502A (ja) | 2004-06-23 | 2005-06-22 | リソグラフィ装置およびデバイス製造方法 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2008072139A JP2008072139A (ja) | 2008-03-27 |
JP2008072139A5 true JP2008072139A5 (ja) | 2010-11-25 |
JP5064979B2 JP5064979B2 (ja) | 2012-10-31 |
Family
ID=34938361
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005181472A Pending JP2006013502A (ja) | 2004-06-23 | 2005-06-22 | リソグラフィ装置およびデバイス製造方法 |
JP2007300911A Expired - Fee Related JP5064979B2 (ja) | 2004-06-23 | 2007-11-20 | リソグラフィ装置およびデバイス製造方法 |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005181472A Pending JP2006013502A (ja) | 2004-06-23 | 2005-06-22 | リソグラフィ装置およびデバイス製造方法 |
Country Status (7)
Country | Link |
---|---|
US (1) | US7057702B2 (ja) |
EP (1) | EP1610183A3 (ja) |
JP (2) | JP2006013502A (ja) |
KR (1) | KR100695553B1 (ja) |
CN (2) | CN101916050B (ja) |
SG (2) | SG138618A1 (ja) |
TW (1) | TWI277837B (ja) |
Families Citing this family (43)
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SG121818A1 (en) | 2002-11-12 | 2006-05-26 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method |
KR101177330B1 (ko) | 2003-04-10 | 2012-08-30 | 가부시키가이샤 니콘 | 액침 리소그래피 장치 |
SG141425A1 (en) | 2003-04-10 | 2008-04-28 | Nikon Corp | Environmental system including vacuum scavange for an immersion lithography apparatus |
JP4315198B2 (ja) | 2003-04-11 | 2009-08-19 | 株式会社ニコン | 液浸液体を光学アセンブリ下に維持するリソグラフィ装置及び液浸液体維持方法並びにそれらを用いるデバイス製造方法 |
TWI442694B (zh) * | 2003-05-30 | 2014-06-21 | Asml Netherlands Bv | 微影裝置及元件製造方法 |
KR101146962B1 (ko) | 2003-06-19 | 2012-05-22 | 가부시키가이샤 니콘 | 노광 장치 및 디바이스 제조방법 |
US8064044B2 (en) * | 2004-01-05 | 2011-11-22 | Nikon Corporation | Exposure apparatus, exposure method, and device producing method |
US7589822B2 (en) | 2004-02-02 | 2009-09-15 | Nikon Corporation | Stage drive method and stage unit, exposure apparatus, and device manufacturing method |
TWI402893B (zh) * | 2004-03-25 | 2013-07-21 | 尼康股份有限公司 | 曝光方法 |
US7486381B2 (en) * | 2004-05-21 | 2009-02-03 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7522261B2 (en) * | 2004-09-24 | 2009-04-21 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7119876B2 (en) * | 2004-10-18 | 2006-10-10 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7583357B2 (en) * | 2004-11-12 | 2009-09-01 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US20070132976A1 (en) * | 2005-03-31 | 2007-06-14 | Nikon Corporation | Exposure apparatus, exposure method, and method for producing device |
US7411654B2 (en) | 2005-04-05 | 2008-08-12 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7834974B2 (en) | 2005-06-28 | 2010-11-16 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7170583B2 (en) * | 2005-06-29 | 2007-01-30 | Asml Netherlands B.V. | Lithographic apparatus immersion damage control |
US7432513B2 (en) * | 2005-10-21 | 2008-10-07 | Asml Netherlands B.V. | Gas shower, lithographic apparatus and use of a gas shower |
US8125610B2 (en) | 2005-12-02 | 2012-02-28 | ASML Metherlands B.V. | Method for preventing or reducing contamination of an immersion type projection apparatus and an immersion type lithographic apparatus |
US7728952B2 (en) * | 2007-01-25 | 2010-06-01 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method and system for closing plate take-over in immersion lithography |
US8654305B2 (en) * | 2007-02-15 | 2014-02-18 | Asml Holding N.V. | Systems and methods for insitu lens cleaning in immersion lithography |
US8817226B2 (en) * | 2007-02-15 | 2014-08-26 | Asml Holding N.V. | Systems and methods for insitu lens cleaning using ozone in immersion lithography |
NL1035908A1 (nl) * | 2007-09-25 | 2009-03-26 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method. |
JP2009094145A (ja) * | 2007-10-04 | 2009-04-30 | Canon Inc | 露光装置、露光方法およびデバイス製造方法 |
NL2005586A (en) * | 2009-12-02 | 2011-06-06 | Asml Netherlands Bv | Lithographic apparatus and sealing device for a lithographic apparatus. |
EP2381310B1 (en) | 2010-04-22 | 2015-05-06 | ASML Netherlands BV | Fluid handling structure and lithographic apparatus |
WO2012027406A2 (en) * | 2010-08-24 | 2012-03-01 | Nikon Corporation | Vacuum chamber assembly for supporting a workpiece |
NL2008199A (en) | 2011-02-28 | 2012-08-29 | Asml Netherlands Bv | A fluid handling structure, a lithographic apparatus and a device manufacturing method. |
NL2008695A (en) * | 2011-05-25 | 2012-11-27 | Asml Netherlands Bv | Lithographic apparatus comprising substrate table. |
NL2009591A (en) * | 2011-11-22 | 2013-05-23 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method. |
WO2014005780A1 (en) | 2012-07-06 | 2014-01-09 | Asml Netherlands B.V. | A lithographic apparatus |
US9568828B2 (en) * | 2012-10-12 | 2017-02-14 | Nikon Corporation | Exposure apparatus, exposing method, device manufacturing method, program, and recording medium |
US10095129B2 (en) | 2014-07-04 | 2018-10-09 | Asml Netherlands B.V. | Lithographic apparatus and a method of manufacturing a device using a lithographic apparatus |
US11397385B2 (en) | 2016-06-17 | 2022-07-26 | Taiwan Semiconductor Manufacturing Company, Ltd | Apparatus and a method of forming a particle shield |
CN107783283B (zh) * | 2016-08-30 | 2020-01-24 | 上海微电子装备(集团)股份有限公司 | 镜片防污染装置及方法 |
CN109283797B (zh) | 2017-07-21 | 2021-04-30 | 上海微电子装备(集团)股份有限公司 | 物镜保护装置、物镜系统以及光刻设备 |
EP3620858B1 (en) * | 2018-09-10 | 2023-11-01 | Canon Kabushiki Kaisha | Exposure apparatus and method of manufacturing article |
WO2021032356A1 (en) * | 2019-08-20 | 2021-02-25 | Asml Netherlands B.V. | Substrate holder, lithographic apparatus and method |
JP7378481B2 (ja) * | 2019-12-26 | 2023-11-13 | ナンジン リアン セミコンダクター リミテッド | 半導体産業におけるウェハ幾何学形状測定のためのツールアーキテクチャ |
EP3919978A1 (en) * | 2020-06-05 | 2021-12-08 | Taiwan Semiconductor Manufacturing Co., Ltd. | Apparatus and a method of forming a particle shield |
US11740564B2 (en) * | 2020-06-18 | 2023-08-29 | Taiwan Semiconductor Manufacturing Company, Ltd. | Lithography apparatus and method using the same |
CN113262956B (zh) * | 2021-07-21 | 2021-10-15 | 四川洪芯微科技有限公司 | 一种半导体晶圆表面处理装置 |
DE102023204744A1 (de) | 2023-05-22 | 2024-05-16 | Carl Zeiss Smt Gmbh | Optisches system und projektionsbelichtungsanlage |
Family Cites Families (13)
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JPS57153433A (en) * | 1981-03-18 | 1982-09-22 | Hitachi Ltd | Manufacturing device for semiconductor |
US5900354A (en) * | 1997-07-03 | 1999-05-04 | Batchelder; John Samuel | Method for optical inspection and lithography |
EP1041605A4 (en) * | 1997-08-29 | 2005-09-21 | Nikon Corp | TEMPERATURE ADJUSTMENT FOR A DISPLAY DEVICE |
AU4653999A (en) * | 1999-07-16 | 2001-02-05 | Nikon Corporation | Exposure method and system |
EP1279070B1 (en) * | 2000-05-03 | 2007-10-03 | ASML Holding N.V. | Apparatus for providing a purged optical path in a projection photolithography system and a corresponding method |
JP2001358056A (ja) * | 2000-06-15 | 2001-12-26 | Canon Inc | 露光装置 |
TWI222668B (en) * | 2001-12-21 | 2004-10-21 | Nikon Corp | Gas purging method and exposure system, and device production method |
US6788477B2 (en) * | 2002-10-22 | 2004-09-07 | Taiwan Semiconductor Manufacturing Co., Ltd. | Apparatus for method for immersion lithography |
EP1429188B1 (en) * | 2002-11-12 | 2013-06-19 | ASML Netherlands B.V. | Lithographic projection apparatus |
EP2495613B1 (en) | 2002-11-12 | 2013-07-31 | ASML Netherlands B.V. | Lithographic apparatus |
DE60335595D1 (de) * | 2002-11-12 | 2011-02-17 | Asml Netherlands Bv | Lithographischer Apparat mit Immersion und Verfahren zur Herstellung einer Vorrichtung |
JP4362867B2 (ja) * | 2002-12-10 | 2009-11-11 | 株式会社ニコン | 露光装置及びデバイス製造方法 |
EP1503244A1 (en) * | 2003-07-28 | 2005-02-02 | ASML Netherlands B.V. | Lithographic projection apparatus and device manufacturing method |
-
2004
- 2004-06-23 US US10/873,650 patent/US7057702B2/en active Active
-
2005
- 2005-06-20 SG SG200718993-9A patent/SG138618A1/en unknown
- 2005-06-20 SG SG200503932A patent/SG118391A1/en unknown
- 2005-06-22 JP JP2005181472A patent/JP2006013502A/ja active Pending
- 2005-06-22 TW TW094120867A patent/TWI277837B/zh not_active IP Right Cessation
- 2005-06-23 EP EP05076479A patent/EP1610183A3/en not_active Withdrawn
- 2005-06-23 KR KR1020050054233A patent/KR100695553B1/ko not_active IP Right Cessation
- 2005-06-23 CN CN2010102497928A patent/CN101916050B/zh not_active Expired - Fee Related
- 2005-06-23 CN CN200510079476.XA patent/CN1713075B/zh not_active Expired - Fee Related
-
2007
- 2007-11-20 JP JP2007300911A patent/JP5064979B2/ja not_active Expired - Fee Related
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