JP2008040450A - 有機発光表示装置及び有機発光表示装置の検査回路駆動方法 - Google Patents
有機発光表示装置及び有機発光表示装置の検査回路駆動方法 Download PDFInfo
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Abstract
【解決手段】データ信号を印加するデータ駆動部、走査信号を印加する走査駆動部、駆動トランジスタ、駆動トランジスタに前記データ信号を印加するスイッチングトランジスタ、前記駆動トランジスタと電気的に連結される有機電界発光素子及び前記有機電界発光素子と同一基板上に形成されたベアガラス検査回路を含む。ベアガラス検査回路は、3相インバータ回路及び第1トランジスタを含む。これにより、セル間の干渉現象を防止でき、ベアガラス検査時発生する電圧降下を防止でき、走査駆動部の消費電力を測定できる。
【選択図】図1
Description
本発明の実施形態による第2信号入力部410は第1電源(VVDD)または第2電源(VVSS)の電圧を有する第1クロック信号(SCLK1)及び第2クロック信号(SCLK2)を生成する。
200 一つのセルのデータ駆動部
300 一つのセルの表示部
310 前記表示部の画素回路
400 一つのセルのベアガラス検査回路
410、420 前記ベアガラス検査回路の第1及び第2信号入力部
430 前記ベアガラス検査回路の信号受信部
500 ベアガラス全体のための検査信号発生部
1000 ベアガラス上の一つのセル
DS1、DS2 第1及び第2検査信号
FLM フレームパルス
OS 出力信号
SCLK1、SCLK2 第1及び第2クロック信号
SCTL、SCTLB 第1及び第2制御信号線
SFTCLK、SFTCLKB 第1及び第2シフトクロック信号
Sn 走査信号
VVDD、VVSS 第1及び第2電源
Claims (19)
- データ信号を印加するデータ駆動部;
走査信号を印加する走査駆動部;
第1電極及び制御電極に印加される電圧に対応する電流が発生する駆動トランジスタ;
前記駆動トランジスタに前記データ信号を印加するスイッチングトランジスタ;
前記駆動トランジスタと電気的に連結される有機電界発光素子;及び
前記有機電界発光素子と同一基板上に形成されたベアガラス検査回路を含み、
前記ベアガラス検査回路は、
3相インバータ回路及び第1トランジスタを含み、前記3相インバータは入力端子及び出力端子を含み、前記入力端子に入力される信号に関係なく出力端子の出力信号が決定される時、前記第1トランジスタは前記出力端子に第1電源電圧を伝達することを特徴とする、有機発光表示装置。 - 前記3相インバータ回路は、
前記同一基板上に前記走査駆動部と前記データ駆動部が形成された領域以外の領域で、形成されたことを特徴とする、請求項1に記載の有機発光表示装置。 - 前記3相インバータ回路は、
前記同一基板上に前記走査駆動部と前記データ駆動部が形成された領域以外の領域で、形成されたことを特徴とする、請求項2に記載の有機発光表示装置。 - 前記3相インバータ回路は、相補型半導体を含むことを特徴とする、請求項3に記載の有機発光表示装置。
- 前記3相インバータ回路は、
制御電極に入力される第1信号に応答して第1電源電圧を前記相補型半導体の第1電極に伝達する第1トランジスタ、及び
制御電極に入力される第2信号に応答して第2電源電圧を前記相補型半導体の第2電極に伝達する第2トランジスタをさらに含むことを特徴とする、請求項4に記載の有機発光表示装置。 - 前記相補型半導体は、
前記第1信号に応答して前記第1電源電圧を前記出力端子に伝達する第3トランジスタ、及び
前記第2信号に応答して前記第2電源電圧を前記出力端子に伝達する第4トランジスタを含むことを特徴とする、請求項5に記載の有機発光表示装置。 - 前記第1及び第3トランジスタは、Pチャンネルタイプのトランジスタであり、前記第2及び第4トランジスタはNチャンネルタイプのトランジスタであることを特徴とする、請求項6に記載の有機発光表示装置。
- 前記3相インバータ回路は、
第1インバータサブ回路部と第2インバータサブ回路部が直列に連結される第1ノードを含み、前記第1ノードは前記3相インバータ回路の出力端子であることを特徴とする、請求項3に記載の有機発光表示装置 - 前記第1インバータサブ回路部は、p型金属酸化膜半導体で構成されて、第2インバータ回路部はn型金属酸化膜半導体で構成されることを特徴とする、請求項8に記載の有機発光表示装置。
- 前記ベアガラス検査回路は、
2相インバータ回路をさらに含み、
前記2相インターバー回路の入力端子は、前記3相インバータ回路の出力端子に電気的に連結されることを特徴とする、請求項3乃至請求項9のうち何れか一項に記載の有機発光表示装置。 - 有機発光素子、スイッチングトランジスタ、走査駆動部及びベアガラス検査回路を含み、前記有機発光素子、スイッチングトランジスタ、走査駆動部及びベアガラス検査回路は同一基板上に形成される有機発光表示装置のベアガラス検査回路駆動方法であって、
ベアガラス検査信号発生部から第1制御信号、第2制御信号及び検査信号が前記ベアガラス検査回路に伝達される段階;及び
前記第1制御信号及び第2制御信号に応答して前記検査信号に対応する少なくとも一つの信号を前記走査駆動部に伝達する段階を含むことを特徴とする、有機発光表示装置の検査回路駆動方法。 - 前記走査駆動部が前記少なくとも一つの信号を用いて、ベアガラス検査用走査信号を生成して、前記スイッチングトランジスタの制御電極に前記ベアガラス検査用走査信号を印加する段階をさらに含むことを特徴とする、請求項11に有機発光表示装置の検査回路駆動方法。
- 前記第1制御信号及び第2制御信号に応答して、前記ベアガラス検査用走査信号を受信して、受信された走査信号を反転させて出力させる段階をさらに含むことを特徴とする、請求項12に有機発光表示装置の検査回路駆動方法。
- 前記第1制御信号及び第2制御信号がそれぞれハイレベル及びローレベルである時、前記ベアガラス検査用走査信号を受信して、受信された走査信号を反転させて、出力させることを特徴とする、請求項13に有機発光表示装置の検査回路駆動方法。
- 前記第1制御信号及び第2制御信号がそれぞれハイレベル及びローレベルである時、前記ベアガラス検査用走査信号が前記スイッチングトランジスタに印加されることを特徴とする、請求項12に有機発光表示装置の検査回路駆動方法。
- 前記第1制御信号及び第2制御信号がそれぞれローレベル及びハイレベルである時、前記ベアガラス検査用走査信号が遮断されることを特徴とする、請求項12に有機発光表示装置の検査回路駆動方法。
- ベアガラス検査用電源電圧を印加するベアガラス検査用電源電圧線、有機発光素子、駆動トランジスタ、走査駆動部及び検査回路を含み、前記ベアガラス検査用電源電圧線、有機発光素子、駆動トランジスタ、走査駆動部及び検査回路は同一基板上に形成されている有機発光表示装置の検査回路駆動方法であって、
ベアガラス検査信号発生部から検査信号、制御信号及び逆相制御信号が前記検査回路に伝達される段階;
前記制御信号及び逆相制御信号に応答して、前記検査信号に対応する少なくとも一つの信号を生成して、前記走査駆動部に伝達する段階;
前記少なくとも一つの信号を用いて、走査信号を生成する段階;及び
前記走査信号に対応して、前記ベアガラス検査用電源電圧を前記駆動トランジスタの第1電極に印加する段階を含むことを特徴とする、有機発光表示装置の検査回路駆動方法。 - 前記制御信号及び逆相制御信号がそれぞれハイレベル及びローレベルである時、前記ベアガラス検査用電源電圧を前記駆動トランジスタの第1電極に印加することを特徴とする、請求項17に有機発光表示装置の検査回路駆動方法。
- 前記制御信号及び逆相制御信号がそれぞれハイレベル及びローレベルである時、前記ベアガラス検査用電源電圧を前記駆動トランジスタの第1電極と遮断することを特徴とする、請求項17に有機発光表示装置の検査回路駆動方法。
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US (1) | US8054257B2 (ja) |
EP (1) | EP1887728B1 (ja) |
JP (1) | JP2008040450A (ja) |
KR (1) | KR100749423B1 (ja) |
CN (1) | CN101123069B (ja) |
Families Citing this family (12)
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KR100884463B1 (ko) * | 2007-07-31 | 2009-02-20 | 삼성모바일디스플레이주식회사 | 발광 표시 장치 및 그의 제조 방법 |
KR100958643B1 (ko) * | 2008-10-17 | 2010-05-20 | 삼성모바일디스플레이주식회사 | 터치 스크린 디스플레이 장치 및 이의 구동 방법 |
JP5433309B2 (ja) | 2009-06-03 | 2014-03-05 | 株式会社ジャパンディスプレイ | 表示装置 |
TWI433310B (zh) * | 2009-07-02 | 2014-04-01 | Au Optronics Corp | 有機發光二極體顯示裝置 |
KR20240024377A (ko) | 2011-05-13 | 2024-02-23 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 |
KR101881853B1 (ko) | 2012-02-29 | 2018-07-26 | 삼성디스플레이 주식회사 | 에미션 구동 유닛, 에미션 구동부 및 이를 포함하는 유기 발광 표시 장치 |
CN104616611A (zh) * | 2015-02-15 | 2015-05-13 | 合肥鑫晟光电科技有限公司 | 点灯检测设备及点灯检测方法 |
KR102312291B1 (ko) * | 2015-02-24 | 2021-10-15 | 삼성디스플레이 주식회사 | 표시장치 및 그의 검사방법 |
JP2018132744A (ja) * | 2017-02-17 | 2018-08-23 | パナソニック液晶ディスプレイ株式会社 | 表示装置 |
CN109427301B (zh) | 2018-05-09 | 2021-01-22 | 京东方科技集团股份有限公司 | 像素电路和电致发光显示面板、其驱动方法及显示装置 |
US11341878B2 (en) * | 2019-03-21 | 2022-05-24 | Samsung Display Co., Ltd. | Display panel and method of testing display panel |
CN110349536B (zh) * | 2019-04-08 | 2021-02-23 | 深圳市华星光电半导体显示技术有限公司 | Goa电路及显示面板 |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
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US6437596B1 (en) | 1999-01-28 | 2002-08-20 | International Business Machines Corporation | Integrated circuits for testing a display array |
JP5051942B2 (ja) | 2000-02-01 | 2012-10-17 | 株式会社半導体エネルギー研究所 | 半導体装置 |
JP4659180B2 (ja) | 2000-07-12 | 2011-03-30 | シャープ株式会社 | 表示装置 |
KR100906964B1 (ko) * | 2002-09-25 | 2009-07-08 | 삼성전자주식회사 | 유기 전계발광 구동 소자와 이를 갖는 유기 전계발광 표시패널 |
JP4211368B2 (ja) | 2002-11-25 | 2009-01-21 | 沖電気工業株式会社 | 表示駆動回路の試験方法 |
WO2004061811A1 (ja) * | 2002-12-26 | 2004-07-22 | Semiconductor Energy Laboratory Co., Ltd. | 半導体装置、半導体装置の駆動方法及び半導体装置の検査方法 |
KR100964620B1 (ko) | 2003-07-14 | 2010-06-22 | 삼성전자주식회사 | 하부기판용 모기판, 표시패널용 기판 및 표시패널의제조방법 |
KR100566814B1 (ko) * | 2003-07-24 | 2006-04-03 | 엘지.필립스 엘시디 주식회사 | 쉬프트 레지스터 |
KR100930494B1 (ko) * | 2003-08-11 | 2009-12-09 | 삼성전자주식회사 | 검사장치 |
KR100951357B1 (ko) | 2003-08-19 | 2010-04-08 | 삼성전자주식회사 | 액정 표시 장치 |
JP2005189834A (ja) * | 2003-12-03 | 2005-07-14 | Renesas Technology Corp | 半導体装置およびその試験方法 |
TWI254799B (en) | 2003-12-03 | 2006-05-11 | Renesas Tech Corp | Semiconductor device and the method of testing the same |
KR20050108886A (ko) * | 2004-05-14 | 2005-11-17 | 삼성전자주식회사 | 표시 패널용 어레이 기판의 모기판 |
KR100662989B1 (ko) * | 2004-08-20 | 2006-12-28 | 삼성에스디아이 주식회사 | 검사회로부를 구비하는 표시장치 |
JP4247631B2 (ja) | 2004-09-06 | 2009-04-02 | ソニー株式会社 | 画像表示装置 |
CN100405068C (zh) | 2006-01-13 | 2008-07-23 | 友达光电股份有限公司 | 有机发光显示面板的测试装置与方法 |
KR100759688B1 (ko) * | 2006-04-07 | 2007-09-17 | 삼성에스디아이 주식회사 | 원장단위 검사가 가능한 유기전계발광 표시장치 및모기판과 그 검사방법 |
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2006
- 2006-08-09 KR KR1020060075175A patent/KR100749423B1/ko active IP Right Grant
- 2006-11-17 JP JP2006311632A patent/JP2008040450A/ja active Pending
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2007
- 2007-04-11 US US11/783,711 patent/US8054257B2/en active Active
- 2007-05-08 CN CN2007101024094A patent/CN101123069B/zh active Active
- 2007-07-11 EP EP07252772.4A patent/EP1887728B1/en active Active
Also Published As
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EP1887728B1 (en) | 2017-05-17 |
KR100749423B1 (ko) | 2007-08-14 |
US8054257B2 (en) | 2011-11-08 |
US20080036711A1 (en) | 2008-02-14 |
CN101123069A (zh) | 2008-02-13 |
EP1887728A2 (en) | 2008-02-13 |
CN101123069B (zh) | 2011-06-08 |
EP1887728A3 (en) | 2011-01-12 |
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