JP2008014645A - 電圧測定装置 - Google Patents
電圧測定装置 Download PDFInfo
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- JP2008014645A JP2008014645A JP2006183107A JP2006183107A JP2008014645A JP 2008014645 A JP2008014645 A JP 2008014645A JP 2006183107 A JP2006183107 A JP 2006183107A JP 2006183107 A JP2006183107 A JP 2006183107A JP 2008014645 A JP2008014645 A JP 2008014645A
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Abstract
【解決手段】測定対象体4の交流電圧V1を測定可能に構成された電圧測定装置1であって、一次巻線Tr3aに入力した電圧信号S6を昇圧して参照電位Vrとして二次巻線Tr3bに出力する昇圧トランスTr3を有する電圧生成部3bと、測定対象体4の交流電圧V1と参照電位Vrとの間の電位差(V1−Vr)に応じて振幅が変化する検出信号S3を出力するプローブユニット2と、検出信号S3の振幅が減少するように電圧生成部3bに対して参照電位Vrの電圧を変化させる制御部3aとを備えている。
【選択図】図1
Description
2 プローブユニット(センサ部)
3 本体ユニット
3a 制御部
3b 電圧生成部
4 測定対象体
11 ケース
12 検出電極
14 駆動回路
15 電流検出器
19 可変容量回路
E11〜E14 第1電気的要素
E22,E23 第2電気的要素
E33,E34 第3電気的要素
Tr3 トランス
S3 検出信号
V1 測定対象体の電圧
Vr 参照電位
Claims (4)
- 測定対象体の交流電圧を測定可能に構成された電圧測定装置であって、
一次巻線に入力した信号を昇圧して参照電位として二次巻線に出力する昇圧トランスを有する電圧生成部と、
前記測定対象体の交流電圧と前記参照電位との間の電位差に応じて振幅が変化する検出信号を出力するセンサ部と、
前記検出信号の振幅が減少するように前記電圧生成部に対して前記参照電位の電圧を変化させる制御部とを備えている電圧測定装置。 - 前記センサ部は、前記測定対象体に対向可能な検出電極と、当該検出電極に接続されてその静電容量を変化可能に構成された可変容量回路と、静電容量変化時において前記可変容量回路で発生する電流または前記可変容量回路の両端間電圧を前記検出信号として検出する検出回路とを備えている請求項1記載の電圧測定装置。
- 前記可変容量回路は、直流信号の通過を阻止しつつ印加電圧の絶対値の大きさに応じて容量が変化する電気的要素を含んで構成されている請求項2記載の電圧測定装置。
- 前記可変容量回路は、ブリッジ状に接続された4つの前記電気的要素を備えている請求項3記載の電圧測定装置。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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JP2006183107A JP4726722B2 (ja) | 2006-07-03 | 2006-07-03 | 電圧測定装置 |
Applications Claiming Priority (1)
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JP2006183107A JP4726722B2 (ja) | 2006-07-03 | 2006-07-03 | 電圧測定装置 |
Publications (2)
Publication Number | Publication Date |
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JP2008014645A true JP2008014645A (ja) | 2008-01-24 |
JP4726722B2 JP4726722B2 (ja) | 2011-07-20 |
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JP2006183107A Expired - Fee Related JP4726722B2 (ja) | 2006-07-03 | 2006-07-03 | 電圧測定装置 |
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Cited By (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10120021B1 (en) | 2017-06-16 | 2018-11-06 | Fluke Corporation | Thermal non-contact voltage and non-contact current devices |
US10119998B2 (en) | 2016-11-07 | 2018-11-06 | Fluke Corporation | Variable capacitance non-contact AC voltage measurement system |
US10139435B2 (en) | 2016-11-11 | 2018-11-27 | Fluke Corporation | Non-contact voltage measurement system using reference signal |
US10254375B2 (en) | 2016-11-11 | 2019-04-09 | Fluke Corporation | Proving unit for voltage measurement systems |
US10281503B2 (en) | 2016-11-11 | 2019-05-07 | Fluke Corporation | Non-contact voltage measurement system using multiple capacitors |
US10352967B2 (en) | 2016-11-11 | 2019-07-16 | Fluke Corporation | Non-contact electrical parameter measurement systems |
US10359494B2 (en) | 2016-11-11 | 2019-07-23 | Fluke Corporation | Proving unit for non-contact voltage measurement systems |
US10502807B2 (en) | 2017-09-05 | 2019-12-10 | Fluke Corporation | Calibration system for voltage measurement devices |
US10509063B2 (en) | 2017-11-28 | 2019-12-17 | Fluke Corporation | Electrical signal measurement device using reference signal |
US10539643B2 (en) | 2017-09-01 | 2020-01-21 | Fluke Corporation | Proving unit for use with electrical test tools |
US10551416B2 (en) | 2018-05-09 | 2020-02-04 | Fluke Corporation | Multi-sensor configuration for non-contact voltage measurement devices |
US10557875B2 (en) | 2018-05-09 | 2020-02-11 | Fluke Corporation | Multi-sensor scanner configuration for non-contact voltage measurement devices |
US10591515B2 (en) | 2016-11-11 | 2020-03-17 | Fluke Corporation | Non-contact current measurement system |
US10605832B2 (en) | 2016-11-11 | 2020-03-31 | Fluke Corporation | Sensor subsystems for non-contact voltage measurement devices |
US10677876B2 (en) | 2018-05-09 | 2020-06-09 | Fluke Corporation | Position dependent non-contact voltage and current measurement |
US10746767B2 (en) | 2018-05-09 | 2020-08-18 | Fluke Corporation | Adjustable length Rogowski coil measurement device with non-contact voltage measurement |
US10775409B2 (en) | 2018-05-09 | 2020-09-15 | Fluke Corporation | Clamp probe for non-contact electrical parameter measurement |
US10802072B2 (en) | 2018-05-11 | 2020-10-13 | Fluke Corporation | Non-contact DC voltage measurement device with oscillating sensor |
US10908188B2 (en) | 2018-05-11 | 2021-02-02 | Fluke Corporation | Flexible jaw probe for non-contact electrical parameter measurement |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6114576A (ja) * | 1984-06-29 | 1986-01-22 | Nobuaki Abu | 交流電圧検出器 |
JPH1050156A (ja) * | 1996-08-05 | 1998-02-20 | Sumitomo Wiring Syst Ltd | 撚線の撚り状態検出装置及び検出方法 |
JP2000065878A (ja) * | 1998-08-25 | 2000-03-03 | Kawaguchi Denki Seisakusho:Kk | 表面電位計 |
JP2002162429A (ja) * | 2000-11-24 | 2002-06-07 | Tdk Corp | 表面電位検出方法、表面電位検出装置及び表面電位センサ |
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2006
- 2006-07-03 JP JP2006183107A patent/JP4726722B2/ja not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6114576A (ja) * | 1984-06-29 | 1986-01-22 | Nobuaki Abu | 交流電圧検出器 |
JPH1050156A (ja) * | 1996-08-05 | 1998-02-20 | Sumitomo Wiring Syst Ltd | 撚線の撚り状態検出装置及び検出方法 |
JP2000065878A (ja) * | 1998-08-25 | 2000-03-03 | Kawaguchi Denki Seisakusho:Kk | 表面電位計 |
JP2002162429A (ja) * | 2000-11-24 | 2002-06-07 | Tdk Corp | 表面電位検出方法、表面電位検出装置及び表面電位センサ |
Cited By (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10119998B2 (en) | 2016-11-07 | 2018-11-06 | Fluke Corporation | Variable capacitance non-contact AC voltage measurement system |
US10359494B2 (en) | 2016-11-11 | 2019-07-23 | Fluke Corporation | Proving unit for non-contact voltage measurement systems |
US10139435B2 (en) | 2016-11-11 | 2018-11-27 | Fluke Corporation | Non-contact voltage measurement system using reference signal |
US10254375B2 (en) | 2016-11-11 | 2019-04-09 | Fluke Corporation | Proving unit for voltage measurement systems |
US10281503B2 (en) | 2016-11-11 | 2019-05-07 | Fluke Corporation | Non-contact voltage measurement system using multiple capacitors |
US10352967B2 (en) | 2016-11-11 | 2019-07-16 | Fluke Corporation | Non-contact electrical parameter measurement systems |
US10605832B2 (en) | 2016-11-11 | 2020-03-31 | Fluke Corporation | Sensor subsystems for non-contact voltage measurement devices |
US11237192B2 (en) | 2016-11-11 | 2022-02-01 | Fluke Corporation | Non-contact current measurement system |
US10591515B2 (en) | 2016-11-11 | 2020-03-17 | Fluke Corporation | Non-contact current measurement system |
US10120021B1 (en) | 2017-06-16 | 2018-11-06 | Fluke Corporation | Thermal non-contact voltage and non-contact current devices |
US10539643B2 (en) | 2017-09-01 | 2020-01-21 | Fluke Corporation | Proving unit for use with electrical test tools |
US10502807B2 (en) | 2017-09-05 | 2019-12-10 | Fluke Corporation | Calibration system for voltage measurement devices |
US10509063B2 (en) | 2017-11-28 | 2019-12-17 | Fluke Corporation | Electrical signal measurement device using reference signal |
US10551416B2 (en) | 2018-05-09 | 2020-02-04 | Fluke Corporation | Multi-sensor configuration for non-contact voltage measurement devices |
US10677876B2 (en) | 2018-05-09 | 2020-06-09 | Fluke Corporation | Position dependent non-contact voltage and current measurement |
US10746767B2 (en) | 2018-05-09 | 2020-08-18 | Fluke Corporation | Adjustable length Rogowski coil measurement device with non-contact voltage measurement |
US10775409B2 (en) | 2018-05-09 | 2020-09-15 | Fluke Corporation | Clamp probe for non-contact electrical parameter measurement |
US10557875B2 (en) | 2018-05-09 | 2020-02-11 | Fluke Corporation | Multi-sensor scanner configuration for non-contact voltage measurement devices |
US10802072B2 (en) | 2018-05-11 | 2020-10-13 | Fluke Corporation | Non-contact DC voltage measurement device with oscillating sensor |
US10908188B2 (en) | 2018-05-11 | 2021-02-02 | Fluke Corporation | Flexible jaw probe for non-contact electrical parameter measurement |
US11209480B2 (en) | 2018-05-11 | 2021-12-28 | Fluke Corporation | Non-contact DC voltage measurement device with oscillating sensor |
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