JP2007534126A5 - - Google Patents
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- JP2007534126A5 JP2007534126A5 JP2007508963A JP2007508963A JP2007534126A5 JP 2007534126 A5 JP2007534126 A5 JP 2007534126A5 JP 2007508963 A JP2007508963 A JP 2007508963A JP 2007508963 A JP2007508963 A JP 2007508963A JP 2007534126 A5 JP2007534126 A5 JP 2007534126A5
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- JP
- Japan
- Prior art keywords
- ions
- ion
- ion mobility
- voltage
- transient
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 150000002500 ions Chemical class 0.000 claims description 804
- 230000005684 electric field Effects 0.000 claims description 125
- 230000001052 transient effect Effects 0.000 claims description 113
- 238000000766 differential mobility spectroscopy Methods 0.000 claims description 75
- 230000007423 decrease Effects 0.000 claims description 18
- 238000000926 separation method Methods 0.000 claims description 18
- 238000005040 ion trap Methods 0.000 claims description 17
- 230000001133 acceleration Effects 0.000 claims description 15
- 238000001871 ion mobility spectroscopy Methods 0.000 claims description 15
- 238000000034 method Methods 0.000 claims description 12
- 238000013467 fragmentation Methods 0.000 claims description 11
- 238000006062 fragmentation reaction Methods 0.000 claims description 11
- 230000000737 periodic effect Effects 0.000 claims description 11
- 230000004888 barrier function Effects 0.000 claims description 8
- 238000003795 desorption Methods 0.000 claims description 7
- 238000000065 atmospheric pressure chemical ionisation Methods 0.000 claims description 6
- 238000005251 capillar electrophoresis Methods 0.000 claims description 6
- 238000001698 laser desorption ionisation Methods 0.000 claims description 6
- 238000004949 mass spectrometry Methods 0.000 claims description 6
- 238000004587 chromatography analysis Methods 0.000 claims description 4
- 238000000688 desorption electrospray ionisation Methods 0.000 claims description 4
- 238000000132 electrospray ionisation Methods 0.000 claims description 4
- 238000010265 fast atom bombardment Methods 0.000 claims description 4
- 238000009616 inductively coupled plasma Methods 0.000 claims description 4
- 230000002285 radioactive effect Effects 0.000 claims description 4
- 238000004992 fast atom bombardment mass spectroscopy Methods 0.000 claims description 3
- 238000004817 gas chromatography Methods 0.000 claims description 3
- 238000004811 liquid chromatography Methods 0.000 claims description 3
- 238000000816 matrix-assisted laser desorption--ionisation Methods 0.000 claims description 3
- PXHVJJICTQNCMI-RNFDNDRNSA-N nickel-63 Chemical compound [63Ni] PXHVJJICTQNCMI-RNFDNDRNSA-N 0.000 claims description 3
- 229910052710 silicon Inorganic materials 0.000 claims description 3
- 239000010703 silicon Substances 0.000 claims description 3
- 238000004808 supercritical fluid chromatography Methods 0.000 claims description 3
- 208000035699 Distal ileal obstruction syndrome Diseases 0.000 claims description 2
- 238000004252 FT/ICR mass spectrometry Methods 0.000 claims description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 2
- 238000000451 chemical ionisation Methods 0.000 claims description 2
- 239000011159 matrix material Substances 0.000 claims description 2
- 238000004150 penning trap Methods 0.000 claims description 2
- 230000003252 repetitive effect Effects 0.000 claims description 2
- 102100022704 Amyloid-beta precursor protein Human genes 0.000 claims 1
- 101000823051 Homo sapiens Amyloid-beta precursor protein Proteins 0.000 claims 1
- DZHSAHHDTRWUTF-SIQRNXPUSA-N amyloid-beta polypeptide 42 Chemical compound C([C@@H](C(=O)N[C@@H](C)C(=O)N[C@@H](CCC(O)=O)C(=O)N[C@@H](CC(O)=O)C(=O)N[C@H](C(=O)NCC(=O)N[C@@H](CO)C(=O)N[C@@H](CC(N)=O)C(=O)N[C@@H](CCCCN)C(=O)NCC(=O)N[C@@H](C)C(=O)N[C@H](C(=O)N[C@@H]([C@@H](C)CC)C(=O)NCC(=O)N[C@@H](CC(C)C)C(=O)N[C@@H](CCSC)C(=O)N[C@@H](C(C)C)C(=O)NCC(=O)NCC(=O)N[C@@H](C(C)C)C(=O)N[C@@H](C(C)C)C(=O)N[C@@H]([C@@H](C)CC)C(=O)N[C@@H](C)C(O)=O)[C@@H](C)CC)C(C)C)NC(=O)[C@H](CC=1C=CC=CC=1)NC(=O)[C@@H](NC(=O)[C@H](CC(C)C)NC(=O)[C@H](CCCCN)NC(=O)[C@H](CCC(N)=O)NC(=O)[C@H](CC=1N=CNC=1)NC(=O)[C@H](CC=1N=CNC=1)NC(=O)[C@@H](NC(=O)[C@H](CCC(O)=O)NC(=O)[C@H](CC=1C=CC(O)=CC=1)NC(=O)CNC(=O)[C@H](CO)NC(=O)[C@H](CC(O)=O)NC(=O)[C@H](CC=1N=CNC=1)NC(=O)[C@H](CCCNC(N)=N)NC(=O)[C@H](CC=1C=CC=CC=1)NC(=O)[C@H](CCC(O)=O)NC(=O)[C@H](C)NC(=O)[C@@H](N)CC(O)=O)C(C)C)C(C)C)C1=CC=CC=C1 DZHSAHHDTRWUTF-SIQRNXPUSA-N 0.000 claims 1
- 239000007788 liquid Substances 0.000 claims 1
- 238000001004 secondary ion mass spectrometry Methods 0.000 claims 1
- 230000001360 synchronised effect Effects 0.000 claims 1
- 230000037230 mobility Effects 0.000 description 308
- 239000007789 gas Substances 0.000 description 46
- 239000002184 metal Substances 0.000 description 15
- 229910052751 metal Inorganic materials 0.000 description 15
- 239000000203 mixture Substances 0.000 description 9
- 238000011144 upstream manufacturing Methods 0.000 description 6
- 230000003247 decreasing effect Effects 0.000 description 5
- VEXZGXHMUGYJMC-UHFFFAOYSA-M Chloride anion Chemical compound [Cl-] VEXZGXHMUGYJMC-UHFFFAOYSA-M 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 238000001228 spectrum Methods 0.000 description 4
- 239000002360 explosive Substances 0.000 description 3
- 230000002441 reversible effect Effects 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 239000012491 analyte Substances 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 2
- 230000004323 axial length Effects 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
- 238000006731 degradation reaction Methods 0.000 description 2
- 230000001419 dependent effect Effects 0.000 description 2
- 239000012634 fragment Substances 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- -1 tetrapropylammonium ions Chemical class 0.000 description 2
- MYMOFIZGZYHOMD-UHFFFAOYSA-N Dioxygen Chemical compound O=O MYMOFIZGZYHOMD-UHFFFAOYSA-N 0.000 description 1
- 206010013654 Drug abuse Diseases 0.000 description 1
- 239000008186 active pharmaceutical agent Substances 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000003153 chemical reaction reagent Substances 0.000 description 1
- 238000013375 chromatographic separation Methods 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 239000012141 concentrate Substances 0.000 description 1
- 230000006378 damage Effects 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- 229910001882 dioxygen Inorganic materials 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 238000013537 high throughput screening Methods 0.000 description 1
- 238000011065 in-situ storage Methods 0.000 description 1
- 239000003317 industrial substance Substances 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000010884 ion-beam technique Methods 0.000 description 1
- 239000006193 liquid solution Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000005405 multipole Effects 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- IJGRMHOSHXDMSA-UHFFFAOYSA-N nitrogen Substances N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 1
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen(.) Chemical compound [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 description 1
- 239000000575 pesticide Substances 0.000 description 1
- 238000005036 potential barrier Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 208000011117 substance-related disease Diseases 0.000 description 1
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB0408751.6 | 2004-04-20 | ||
| GBGB0408751.6A GB0408751D0 (en) | 2004-04-20 | 2004-04-20 | Mass spectrometer |
| US58447604P | 2004-07-02 | 2004-07-02 | |
| US60/584,476 | 2004-07-02 | ||
| PCT/GB2005/001488 WO2005104182A2 (en) | 2004-04-20 | 2005-04-20 | Mass spectrometer |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2007534126A JP2007534126A (ja) | 2007-11-22 |
| JP2007534126A5 true JP2007534126A5 (https=) | 2012-02-23 |
| JP4950028B2 JP4950028B2 (ja) | 2012-06-13 |
Family
ID=32344045
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007508963A Expired - Fee Related JP4950028B2 (ja) | 2004-04-20 | 2005-04-20 | 質量分析計 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US9880129B2 (https=) |
| EP (1) | EP1738398B8 (https=) |
| JP (1) | JP4950028B2 (https=) |
| CA (1) | CA2562802C (https=) |
| GB (3) | GB0408751D0 (https=) |
| WO (1) | WO2005104182A2 (https=) |
Families Citing this family (85)
| Publication number | Priority date | Publication date | Assignee | Title |
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| JP4513488B2 (ja) * | 2004-10-06 | 2010-07-28 | 株式会社日立製作所 | イオンモビリティー分析装置及びイオンモビリティー分析方法 |
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| US8785848B2 (en) * | 2007-07-11 | 2014-07-22 | Excellims Corporation | Parallel ion mass and ion mobility analysis |
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| US8026477B2 (en) | 2006-03-03 | 2011-09-27 | Ionsense, Inc. | Sampling system for use with surface ionization spectroscopy |
| CN101063672A (zh) * | 2006-04-29 | 2007-10-31 | 复旦大学 | 离子阱阵列 |
| RU2327245C2 (ru) * | 2006-05-03 | 2008-06-20 | Евгений Васильевич Мамонтов | Способ масс-селективного анализа ионов по времени пролета и устройство для его осуществления |
| GB0624679D0 (en) * | 2006-12-11 | 2007-01-17 | Shimadzu Corp | A time-of-flight mass spectrometer and a method of analysing ions in a time-of-flight mass spectrometer |
| DE102008005281B4 (de) * | 2008-01-19 | 2014-09-18 | Airsense Analytics Gmbh | Verfahren und Vorrichtung zur Detektion und Identifizierung von Gasen |
| RU2387043C2 (ru) * | 2008-04-10 | 2010-04-20 | Евгений Васильевич Мамонтов | Способ формирования двумерного линейного поля и устройство для его осуществления |
| CN101738429B (zh) | 2008-11-26 | 2013-04-03 | 岛津分析技术研发（上海）有限公司 | 离子分离、富集与检测装置 |
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| GB2390478B (en) * | 2002-05-17 | 2004-06-02 | Micromass Ltd | Mass spectrometer |
| JP3971958B2 (ja) * | 2002-05-28 | 2007-09-05 | 株式会社日立ハイテクノロジーズ | 質量分析装置 |
| US6791078B2 (en) * | 2002-06-27 | 2004-09-14 | Micromass Uk Limited | Mass spectrometer |
-
2004
- 2004-04-20 GB GBGB0408751.6A patent/GB0408751D0/en not_active Ceased
-
2005
- 2005-04-20 EP EP05734046.5A patent/EP1738398B8/en not_active Expired - Lifetime
- 2005-04-20 GB GB0619276A patent/GB2428875B/en not_active Expired - Fee Related
- 2005-04-20 CA CA2562802A patent/CA2562802C/en not_active Expired - Fee Related
- 2005-04-20 WO PCT/GB2005/001488 patent/WO2005104182A2/en not_active Ceased
- 2005-04-20 JP JP2007508963A patent/JP4950028B2/ja not_active Expired - Fee Related
- 2005-04-20 GB GB0508007A patent/GB2413433B/en not_active Expired - Fee Related
- 2005-04-20 US US11/568,167 patent/US9880129B2/en active Active
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