WO2017042918A1 - イオン移動度分析装置 - Google Patents
イオン移動度分析装置 Download PDFInfo
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- WO2017042918A1 WO2017042918A1 PCT/JP2015/075643 JP2015075643W WO2017042918A1 WO 2017042918 A1 WO2017042918 A1 WO 2017042918A1 JP 2015075643 W JP2015075643 W JP 2015075643W WO 2017042918 A1 WO2017042918 A1 WO 2017042918A1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
- G01N27/68—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using electric discharge to ionise a gas
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
- G01N27/622—Ion mobility spectrometry
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/40—Time-of-flight spectrometers
Definitions
- the present invention relates to an ion mobility analyzer that detects and separates ions according to their mobility or sends them to a subsequent mass analyzer or the like.
- FIG. 5 is a schematic configuration diagram of a conventional general ion mobility analyzer (see Patent Document 1).
- This ion mobility analyzer includes an ion source 1 that ionizes component molecules in a sample, a drift region 5 for measuring ion mobility provided in a cylindrical housing (not shown), and a drift region 5. And a detector 6 for detecting ions that have moved inside.
- a shutter gate 3 is provided at the entrance of the drift region 5 in order to send the ions generated in the ion source 1 to the drift region 5 in a pulse manner limited to a very short time width.
- the inside of the housing is an atmospheric pressure atmosphere or a low-vacuum atmosphere of about 100 [Pa], and the DC voltage applied to each of a number of annular electrodes 2 a included in the drift electrode group 2 disposed in the drift region 5.
- a uniform electric field is formed that exhibits a downward potential gradient (accelerates ions) in the ion movement direction (Z direction in FIG. 5). Further, a neutral diffusion gas flow is formed in a direction opposite to the acceleration direction by the electric field.
- the final electrode 2a before the detector 6 is a grid-like (mesh) electrode. Yes.
- the ions generated in the ion source 1 are once blocked by the shutter gate 3, and when the shutter gate 3 is opened only for a short time, the ions are introduced into the drift region 5 in a packet form.
- the introduced ions travel with an accelerating electric field while colliding with the diffusion gas coming in the drift region 5.
- Ions are temporally separated by ion mobility depending on their size, three-dimensional structure, charge, etc., and ions having different ion mobility reach the detector 6 with a time difference.
- the electric field in the drift region 5 is uniform, it is possible to estimate the collision cross section between the ion and the diffusion gas from the drift time required for ions to pass through the drift region 5.
- a high-resolution ion mobility analyzer with a large resolution R is required.
- the drift time Td may be increased or the ion pulse width ⁇ T may be decreased.
- the shutter opening time may be shortened. However, if the shutter opening time is shortened, the amount of ions passing therethrough is reduced, so that the sensitivity is lowered. Therefore, there is a limit to shortening the shutter opening time when trying to obtain a certain degree of sensitivity.
- the ions that pass through the drift region are diffused (molecules spread spatially by random motion) and dispersed (molecules spread spatially when moving in the fluid). Therefore, there is a limit in reducing the ion pulse width ⁇ T even if the shutter opening time is shortened. For this reason, it is effective to increase the length of the drift region 5, that is, the drift length L, to increase the resolution in the ion mobility analyzer.
- the ion mobility analyzer in order to avoid that ions having a high drift velocity are overlapped and measured by ions having a low drift velocity, all the ions introduced into the drift region 5 are completely passed through the drift region 5.
- the shutter gate 3 needs to be closed. For this reason, when the drift time Td is increased by increasing the drift length L as described above, the waiting time from when the shutter gate 3 is opened until the next shutter gate 3 is opened, that is, the shutter gate operation cycle is increased. It will be long. As a result, the rate (sampling rate) at which the ion mobility spectrum can be measured per second is lowered.
- Non-Patent Document 1 describes that isomer separation of silicon clusters is performed using a high-resolution ion mobility analyzer with a drift tube length of 63 cm.
- the drift time is as long as about 100 msec.
- the sampling rate is 10 Hz.
- an ion mobility analyzer is used as a detector for a liquid chromatograph (LC) to analyze components in a sample that is continuously eluted from an LC column
- the data point time in the chromatogram is reduced when the sampling rate is reduced.
- the interval becomes wide and the peak cannot be properly captured. In extreme cases, there is a possibility that detection of specific ions may be missed.
- the resolution R and the sampling rate S are in a trade-off relationship, and it is difficult to achieve a high resolution and a high sampling rate with a single device.
- the present invention has been made to solve these problems, and its main purpose is to perform ion migration that can be performed by switching between high-resolution measurement and high-sampling-rate measurement according to the purpose of analysis. It is to provide a degree analyzer.
- the present invention provides an ion mobility analysis that separates ions according to ion mobility by introducing packeted ions into a drift region where an acceleration electric field is formed and drifting.
- a first shutter gate disposed at the entrance of the drift region; b) a second shutter gate disposed downstream of the first shutter gate in the drift direction in the drift region; c) a voltage generator for applying a predetermined voltage to each of the first and second shutter gates; d)
- a voltage is applied to the shutter gates so that ions pass through the first shutter gate in a pulsed manner and ions are passed through the second shutter gate;
- the voltage generator is controlled to apply a voltage to the shutter gate so that the ions pass through the first shutter gate and the ions are pulsed through the second shutter gate.
- a control unit It is characterized by having.
- the ions separated according to the ion mobility by drifting in the drift region may be detected by the detector, or separated according to the mobility.
- the ions may be further introduced into a mass separator that separates the ions according to the mass-to-charge ratio.
- the control unit when detecting ions passing through the drift region with a detector, the length of the drift region between the first shutter gate and the detector is greater than the length of the drift region between the second shutter gate and the detector. Also long. Therefore, in the ion mobility analyzer according to the present invention, in the first measurement mode (high resolution measurement mode), the control unit does not block ions at all by the second shutter gate on the downstream side, and the upstream side. The voltage applied to each shutter gate is set so that ions are temporarily blocked only by the first shutter gate and the ions are allowed to pass for a short time. In this case, since the drift length is longer than that in the second measurement mode, the drift time is also increased, and the resolution is increased accordingly.
- the control unit temporarily blocks ions only at the second shutter gate on the downstream side without blocking ions at the first shutter gate on the upstream side. Then, the voltage applied to each shutter gate is set so that ions pass for a short time. In this case, since the drift length is relatively short compared to the first measurement mode, the drift time is short and the resolution is relatively low, but the operation period of the second shutter gate is shortened to increase the sampling rate. Can do.
- the ion mobility analyzer further includes an instruction unit for instructing to select at least the first measurement mode and the second measurement mode, and the control unit provides a selection instruction in the instruction unit. Accordingly, control corresponding to the first or second measurement mode may be performed.
- control unit pulsates ions with the first shutter gate in the third measurement mode in addition to the first and second measurement modes.
- the control unit pulsates ions with the first shutter gate in the third measurement mode in addition to the first and second measurement modes.
- the voltage generator be controlled.
- ions that have passed through the first shutter gate for a short time to form a packet correspond to the ion mobility in the drift region from the first shutter gate to the second shutter gate.
- the resolution is the same as in the first measurement mode, but ions within a specific ion mobility range are detected by, for example, a detector instead of the total ion mobility range, and the ion mobility is detected.
- a spectrum can be created.
- the drift time is shortened and the sampling rate can be increased as compared with the case of measuring all ions.
- the sampling rate can be improved as compared with the first measurement mode while the resolution is almost the same as that of the first measurement mode.
- another shutter gate may be provided in addition to the first and second shutter gates and further separated in the ion drift direction. That is, three or more shutter gates may be provided and the voltage applied to them may be switched appropriately.
- a measurement mode capable of separating ions derived from a sample with high resolution although the sampling rate is lowered according to the purpose of analysis, Although the resolution is inferior, it is possible to selectively execute a measurement mode in which the sampling rate is increased to increase the frequency of repeated measurement, that is, the measurement time interval can be shortened.
- the measurement time interval can be shortened.
- an ion mobility spectrum having an appropriate width before and after a particularly notable ion mobility can be obtained with high resolution, and the sampling rate can be increased at that time. it can.
- the schematic block diagram of the ion mobility analyzer which is one Example of this invention.
- FIG. 1 is a schematic cross-sectional view of the ion mobility analyzer of this embodiment. Components that are the same as or correspond to those in the conventional ion mobility analyzer already described with reference to FIG.
- a second shutter gate 4 is provided in addition to the first shutter gate 3 disposed at the entrance of the drift region 5, the drift region 5 that is downstream of the shutter gate 3 in the ion drift direction.
- a predetermined DC voltage is applied to each of the plurality of electrodes 2 a of the drift electrode group 2 from the drift voltage generator 7.
- a pulse voltage is applied to the first and second shutter gates 3 and 4 from the shutter voltage generator 8 at a predetermined timing.
- the control unit 9 includes a measurement mode switching unit 91 as a functional block, and controls the drift voltage generation unit 7 and the shutter voltage generation unit 8 respectively.
- An input unit 10 is connected to the control unit 9, and a user (analyzer) can specify a measurement mode from the input unit 10.
- the distance from the first shutter gate 3 to the detection electrode 6a at the inlet end of the detector 6 is L1
- the distance from the second shutter gate 4 to the detection electrode 6a is L2 ( ⁇ L1).
- three measurement modes of a high resolution measurement mode, a high sampling rate measurement mode, and a zoom measurement mode can be selectively designated from the input unit 10. The operation in the measurement mode will be described with reference to FIGS.
- FIG. 2A and 2B are diagrams for explaining the operation in the high-resolution measurement mode.
- FIG. 2A is a schematic configuration diagram
- FIG. 2B is a schematic diagram of an ion mobility spectrum.
- the measurement mode switching unit 91 in the control unit 9 keeps the second shutter gate 4 in an open state, and the voltage generation unit 7, so that ions are pulsed by the first shutter gate 3, 8 is controlled. That is, the second shutter gate 4 does not function as a shutter gate, and only has an action of forming a uniform acceleration electric field, like the other electrodes 2a. In this case, the ions packetized by the first shutter gate 3 drift through the entire drift region 5 having the drift length L 1 and reach the detector 6.
- the drift length is long, the drift time is long and high-resolution measurement is possible.
- the time width of the opening time of the first shutter gate 3 affects the resolution. In order to obtain high resolution, it is desirable to shorten the opening time of the first shutter gate 3 as much as possible within a range in which the signal intensity is allowed.
- ion mobility analysis can be performed with high resolution using the entire drift region 5.
- FIG. 3A and 3B are diagrams for explaining the operation in the high sampling rate measurement mode.
- FIG. 3A is a schematic configuration diagram
- FIG. 3B is a schematic diagram of an ion mobility spectrum.
- the measurement mode switching unit 91 in the control unit 9 causes the first shutter gate 3 to be always open and the second shutter gate 4 to pulse ions so that the voltage generator 7 , 8 are controlled.
- the ions packetized by the second shutter gate 4 drift to a region having a drift length L 2 that is a part of the drift region 5 and reach the detector 6.
- the drift time is shorter because the drift length is shorter than in the high-resolution measurement mode.
- the drift time T2 T1 ⁇ (L2 / L1). That is, the time required to measure the ion mobility spectrum once is shortened by L2 / L1 ( ⁇ 1) times compared to the case of the high resolution measurement mode. Therefore, although the resolution is reduced to about ⁇ (L2 / L1) as compared with the high resolution measurement mode, the operation cycle of the second shutter gate 4 can be shortened, and the sampling rate S2 is the sampling rate S1 in the high resolution measurement mode. It increases to L1 / L2 (> 1) times.
- FIG. 4A and 4B are diagrams for explaining the operation in the zoom measurement mode.
- FIG. 4A is a schematic configuration diagram
- FIG. 4B is a schematic diagram of an ion mobility spectrum.
- the zoom measurement mode is designated from the input unit 10
- the second shutter gate is also determined based on the period of opening and closing operations of the first and second shutter gates 3 and 4 and the timing at which the first shutter gate 3 is opened. Control conditions such as a delay time until the timing of releasing 4 is appropriately set.
- the control conditions corresponding to the range are specified. May be automatically calculated.
- the measurement mode switching unit 91 in the control unit 9 causes the voltage generating unit 7 to interlock the opening time of the first shutter gate 3 and the opening time of the second shutter gate 4 as follows. , 8 are controlled. As a result, among the various ions generated by the ion source 1, only the ion group that is a zoom target having a specific drift velocity (ion mobility) is drifted over the drift length L1 and separated. On the other hand, ion groups that are not to be zoomed are blocked by the second shutter gate 4.
- the ion having the slowest drift velocity passes through the first shutter gate 3.
- the ion mobility of the focused ion is Kp (> Kmin)
- the ion passes through the first shutter gate 3 and then the second time is reached when T3 ⁇ (Kmin / Kp) has elapsed.
- the shutter gate 4 is reached.
- the second is set so that ions corresponding to the range can pass through the second shutter gate 4.
- Tp L1 / (Kp ⁇ E)
- the time width for opening the second shutter gate 3 is 2 ⁇ ⁇ (L1 ⁇ L2) / L1.
- the opening time width of the first shutter gate 3 affects the resolution.
- the resolution increases as the opening time width of the first shutter gate 3 is reduced within the allowable sensitivity range. This is the same as in the high sensitivity measurement mode.
- the target ion group is limited.
- the zoomed ion group can be analyzed for ion mobility with the same high resolution as the high sensitivity measurement mode, and the sampling rate is also high. Can be high.
- the sampling rate in the high sampling rate measurement mode can be further increased.
- the sampling rate in the zoom measurement mode is relatively small, there is an advantage that the range of ion mobility that can be zoomed is wider and more easily set.
- the sampling rate in the high sampling measurement mode is relatively low and the sampling rate in the zoom measurement mode is higher. be able to.
- separated in the drift region 5 was detected with the detector 6, for example, the ion isolate
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Abstract
Description
R=Td/ΔT …(1)
a)前記ドリフト領域の入口に配設された第1のシャッタゲートと、
b)前記ドリフト領域中で前記第1のシャッタゲートよりもドリフト方向の下流側に配設された第2のシャッタゲートと、
c)前記第1及び第2のシャッタゲートそれぞれに所定の電圧を印加する電圧生成部と、
d)第1の測定モードにおいては、前記第1のシャッタゲートでイオンをパルス的に通過させ、前記第2のシャッタゲートでイオンを素通りさせるようにそれらシャッタゲートに電圧を印加し、第2の測定モードにおいては、前記第1のシャッタゲートでイオンを素通りさせ、前記第2のシャッタゲートでイオンをパルス的に通過させるようにそれらシャッタゲートに電圧を印加するように前記電圧生成部を制御する制御部と、
を備えることを特徴としている。
図1は本実施例のイオン移動度分析装置の概略断面図である。図5によりすでに説明した従来のイオン移動度分析装置と同じ又は相当する構成要素には同じ符号を付してある。
図2は高分解能測定モードにおける動作説明図であり、(a)は概略構成図、(b)はイオン移動度スペクトルの模式図である。
高分解能測定モードが指定されると、制御部9において測定モード切替部91は、第2シャッタゲート4を常時開放状態とし、第1シャッタゲート3でイオンをパルス化するように電圧発生部7、8を制御する。即ち、第2シャッタゲート4はシャッタゲートとしては機能せず、他の電極2aと同様に、一様の加速電場を形成する作用のみを有する。この場合、第1シャッタゲート3でパケット化されたイオンは、ドリフト長L1の長さのドリフト領域5全体をドリフトして検出器6に到達する。ドリフト長が長いのでドリフト時間が長くなり、高分解能測定が可能となる。この測定モードでは、第1シャッタゲート3の開放時間の時間幅が分解能に影響する。高分解能を得るためには、信号強度が許容される範囲で、可能な限り第1シャッタゲート3の開放時間を短くすることが望ましい。
図3は高サンプリングレート測定モードにおける動作説明図であり、(a)は概略構成図、(b)はイオン移動度スペクトルの模式図である。
高サンプリングレート測定モードが指定されると、制御部9において測定モード切替部91は、第1シャッタゲート3を常時開放状態とし、第2シャッタゲート4でイオンをパルス化するように電圧発生部7、8を制御する。この場合、第2シャッタゲート4でパケット化されたイオンは、ドリフト領域5の一部であるドリフト長L2の長さの領域をドリフトして検出器6に到達する。高分解能測定モードに比べてドリフト長が短いためにドリフト時間は短くなる。
図4はズーム測定モードにおける動作説明図であり、(a)は概略構成図、(b)はイオン移動度スペクトルの模式図である。
ズーム測定モードを入力部10から指定する場合には、併せて、第1、第2シャッタゲート3、4の開放、閉鎖動作の周期や、第1シャッタゲート3を開放したタイミングから第2シャッタゲート4を開放するタイミングまでの遅延時間などの制御条件を適当に設定する。ただし、こうした数値を指定する代わりに、例えば高分解能測定モードや高サンプリングレート測定モードで得られたイオン移動度スペクトルの表示上で、ユーザが着目する範囲を指定すると、その範囲に対応した制御条件が自動的に算出されるようにしてもよい。
上記実施例のイオン移動度分析装置の一例として、第2シャッタゲート4をドリフト領域5の中央に設置した場合(L2=L1/2)を考える。この場合、高サンプリングレート測定モードでは高分解能測定モードに比べて、分解能は約1/√(2)に低下するが、サンプリングレートは2倍になる。さらにズーム測定モードにすると、高分解能測定モードと同じ高い分解能を維持しつつ、サンプリングレートを2倍にすることができる。
2…ドリフト電極群
2a…電極
3…第1シャッタゲート
4…第2シャッタゲート
5…ドリフト領域
6…検出器
6a…検出電極
7…ドリフト電圧発生部
8…シャッタ電圧発生部
9…制御部
91…測定モード切替部
10…入力部
Claims (3)
- パケット状のイオンを加速電場が形成されたドリフト領域中に導入しドリフトさせることで、イオンをイオン移動度に応じて分離するイオン移動度分析装置において、
a)前記ドリフト領域の入口に配設された第1のシャッタゲートと、
b)前記ドリフト領域中で前記第1のシャッタゲートよりもドリフト方向の下流側に配設された第2のシャッタゲートと、
c)前記第1及び第2のシャッタゲートそれぞれに所定の電圧を印加する電圧生成部と、
d)第1の測定モードにおいては、前記第1のシャッタゲートでイオンをパルス的に通過させ、前記第2のシャッタゲートでイオンを素通りさせるようにそれらシャッタゲートに電圧を印加し、第2の測定モードにおいては、前記第1のシャッタゲートでイオンを素通りさせ、前記第2のシャッタゲートでイオンをパルス的に通過させるようにそれらシャッタゲートに電圧を印加するように前記電圧生成部を制御する制御部と、
を備えることを特徴とするイオン移動度分析装置。 - 請求項1に記載のイオン移動度分析装置であって、
少なくとも第1の測定モードと第2の測定モードとを選択指示するための指示部をさらに備え、前記制御部は該指示部での選択指示に応じて第1又は第2の測定モードに対応した制御を実施することを特徴とするイオン移動度分析装置。 - 請求項1又は2に記載のイオン移動度分析装置であって、
前記制御部は、第1、第2の測定モードに加えて、第3の測定モードにおいて、前記第1のシャッタゲートでイオンをパルス的に通過させ、前記第2のシャッタゲートで前記第1のシャッタゲートが開放された時点から所定時間遅延した時点で所定期間、イオンをパルス的に通過させるようにそれらシャッタゲートに電圧を印加するべく前記電圧生成部を制御することを特徴とするイオン移動度分析装置。
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US15/758,609 US10317366B2 (en) | 2015-09-09 | 2015-09-09 | Ion mobility spectrometer |
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WO2019008655A1 (ja) * | 2017-07-04 | 2019-01-10 | 株式会社島津製作所 | イオン移動度分析装置 |
WO2021157337A1 (ja) * | 2020-02-06 | 2021-08-12 | シャープ株式会社 | 分析装置 |
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US10585066B2 (en) * | 2017-06-12 | 2020-03-10 | Washington State University | High accuracy ion mobility spectrometry |
GB2618318A (en) * | 2022-04-28 | 2023-11-08 | Smiths Detection Watford Ltd | Method and apparatus for improving false alarm rate in trace detection |
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- 2015-09-09 US US15/758,609 patent/US10317366B2/en not_active Expired - Fee Related
- 2015-09-09 CN CN201580083037.8A patent/CN108027344B/zh not_active Expired - Fee Related
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WO2019008655A1 (ja) * | 2017-07-04 | 2019-01-10 | 株式会社島津製作所 | イオン移動度分析装置 |
JPWO2019008655A1 (ja) * | 2017-07-04 | 2019-11-14 | 株式会社島津製作所 | イオン移動度分析装置 |
WO2021157337A1 (ja) * | 2020-02-06 | 2021-08-12 | シャープ株式会社 | 分析装置 |
JPWO2021157337A1 (ja) * | 2020-02-06 | 2021-08-12 | ||
JP7245367B2 (ja) | 2020-02-06 | 2023-03-23 | シャープ株式会社 | 分析装置 |
Also Published As
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JPWO2017042918A1 (ja) | 2018-05-17 |
JP6460248B2 (ja) | 2019-01-30 |
CN108027344A (zh) | 2018-05-11 |
US10317366B2 (en) | 2019-06-11 |
CN108027344B (zh) | 2021-07-30 |
US20180328886A1 (en) | 2018-11-15 |
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