JP2007523810A5 - - Google Patents

Download PDF

Info

Publication number
JP2007523810A5
JP2007523810A5 JP2006547467A JP2006547467A JP2007523810A5 JP 2007523810 A5 JP2007523810 A5 JP 2007523810A5 JP 2006547467 A JP2006547467 A JP 2006547467A JP 2006547467 A JP2006547467 A JP 2006547467A JP 2007523810 A5 JP2007523810 A5 JP 2007523810A5
Authority
JP
Japan
Prior art keywords
processing
product
web
digital information
sites
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2006547467A
Other languages
English (en)
Other versions
JP2007523810A (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/US2004/043623 external-priority patent/WO2005065305A2/en
Publication of JP2007523810A publication Critical patent/JP2007523810A/ja
Publication of JP2007523810A5 publication Critical patent/JP2007523810A5/ja
Pending legal-status Critical Current

Links

Claims (4)

  1. ウェブの一連の部分を撮像してデジタル情報を提供
    前記デジタル情報を少なくとも一つの初期アルゴリズムにより処理して、異常を含む前記ウェブ上の領域を識別
    前記ウェブを製品に加工すべく複数の加工拠点の一つを選択
    前記デジタル情報の少なくとも一部を一つ以上の後続アルゴリズムにより解析して、前記製品向けの前記ウェブにおいてどの異常が実際の欠陥を表わすかを決定
    前記決定された実際の欠陥に基づいて、前記選択された加工拠点において前記ウェブを前記製品に加工すること
    を含む方法。
  2. 複数の加工拠点の一つを選択することが、
    前記複数の加工拠点の各々について少なくとも1個の拠点選択パラメータの値を決定することであって、前記拠点選択パラメータが、前記複数の加工拠点の各々における前記製品の在庫水準、前記複数の加工拠点の各々における前記製品の受注残、前記複数の加工拠点の各々における前記製品の市場需要、または前記複数の加工拠点の各々における前記製品の加工時間の一つ以上を含むことと、
    前記各々の加工拠点について決定された値に基づいて、前記複数の加工拠点から加工拠点を選択することと、
    を含む、請求項1に記載の方法。
  3. ウェブの一連の部分を撮像してデジタル情報を提供する撮像装置と、
    前記デジタル情報を初期アルゴリズムにより処理して、異常を含む前記ウェブ上の領域を識別する解析用コンピュータと、
    前記ウェブを製品に加工すべく複数の加工拠点の一つを選択して、前記デジタル情報の少なくとも一部を少なくとも一つの後続アルゴリズムにより解析し、前記製品向けの前記ウェブにおいてどの異常が実際の欠陥を表わすかを決定する加工制御システムと、
    を含むシステム。
  4. 前記加工制御システムが、前記複数の加工拠点の各々について少なくとも1個の拠点選択パラメータの値を決定し、前記加工拠点の各々について決定された値に基づいて前記ウェブを加工すべく前記加工拠点の一つを選択
    前記拠点選択パラメータが、前記複数の加工拠点の各々における前記製品の在庫水準、前記複数の加工拠点の各々における前記製品の受注残、前記複数の加工拠点の各々における前記製品の市場需要、または前記複数の加工拠点の各々における前記製品の加工時間の一つ以上を含む、請求項に記載のシステム。
JP2006547467A 2003-12-31 2004-12-29 ウェブに基づく物品の在庫管理 Pending JP2007523810A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US53359603P 2003-12-31 2003-12-31
PCT/US2004/043623 WO2005065305A2 (en) 2003-12-31 2004-12-29 Inventory control for web-based articles

Publications (2)

Publication Number Publication Date
JP2007523810A JP2007523810A (ja) 2007-08-23
JP2007523810A5 true JP2007523810A5 (ja) 2007-12-27

Family

ID=34748924

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006547467A Pending JP2007523810A (ja) 2003-12-31 2004-12-29 ウェブに基づく物品の在庫管理

Country Status (6)

Country Link
US (1) US7120515B2 (ja)
EP (1) EP1702299A4 (ja)
JP (1) JP2007523810A (ja)
KR (1) KR101203325B1 (ja)
BR (1) BRPI0418285A (ja)
WO (1) WO2005065305A2 (ja)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7623699B2 (en) * 2004-04-19 2009-11-24 3M Innovative Properties Company Apparatus and method for the automated marking of defects on webs of material
US20060090319A1 (en) * 2004-11-01 2006-05-04 Howe Major K Defect locating system for moving web
US7545971B2 (en) * 2005-08-22 2009-06-09 Honeywell International Inc. Method and apparatus for measuring the crepe of a moving sheet
US20090060316A1 (en) * 2006-02-22 2009-03-05 Hannu Ruuska Method for Monitoring a Rapidly-Moving Paper Web and Corresponding System
DE602007002780D1 (de) * 2007-02-01 2009-11-26 Abb Oy Verfahren zur Erstellung eines optimierten Schnittplans für ein streifenförmiges Material
US20090028417A1 (en) * 2007-07-26 2009-01-29 3M Innovative Properties Company Fiducial marking for multi-unit process spatial synchronization
US7542821B2 (en) * 2007-07-26 2009-06-02 3M Innovative Properties Company Multi-unit process spatial synchronization of image inspection systems
US8175739B2 (en) * 2007-07-26 2012-05-08 3M Innovative Properties Company Multi-unit process spatial synchronization
US7937233B2 (en) 2008-04-17 2011-05-03 3M Innovative Properties Company Preferential defect marking on a web
US7797133B2 (en) 2008-09-10 2010-09-14 3M Innovative Properties Company Multi-roller registered repeat defect detection of a web process line
US8270701B2 (en) 2010-01-08 2012-09-18 3M Innovative Properties Company Optical web-based defect detection using intrasensor uniformity correction
CN102339296A (zh) * 2010-07-26 2012-02-01 阿里巴巴集团控股有限公司 一种查询结果的排序方法和装置
US9845574B2 (en) 2014-04-15 2017-12-19 Gpcp Ip Holdings Llc Method of marking a paper web for controlling a manufacturing line used to convert the paper web into paper products by reading marks on the paper web
JP2018036890A (ja) * 2016-08-31 2018-03-08 富士通株式会社 情報処理装置、情報処理システムおよび情報処理方法
DE102017108496B4 (de) 2017-04-21 2023-06-29 Windmöller & Hölscher Kg Verfahren und Vorrichtungen sowie System zum Auf- und Abwickeln eines Wickels
US11120213B2 (en) * 2018-01-25 2021-09-14 Vmware, Inc. Intelligent verification of presentation of a user interface

Family Cites Families (49)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3759620A (en) 1972-05-30 1973-09-18 Philco Ford Corp Flaw detection and marking apparatus
US4173441A (en) 1977-03-28 1979-11-06 E. I. Du Pont De Nemours And Company Web inspection system and method therefor
DE3325125C1 (de) 1983-07-12 1985-02-14 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Anordnung zur Markierung von Fehlstellen an schnell laufenden Materialbahnen
JP2602201B2 (ja) 1985-04-12 1997-04-23 株式会社日立製作所 被検査パターンの欠陥検査方法
JPS6293637A (ja) 1985-10-21 1987-04-30 Hitachi Ltd 自動検反システム
US4752897A (en) 1987-05-01 1988-06-21 Eastman Kodak Co. System for monitoring and analysis of a continuous process
IL99823A0 (en) 1990-11-16 1992-08-18 Orbot Instr Ltd Optical inspection method and apparatus
US5440648A (en) 1991-11-19 1995-08-08 Dalsa, Inc. High speed defect detection apparatus having defect detection circuits mounted in the camera housing
JP3200237B2 (ja) * 1992-06-09 2001-08-20 イーストマン コダック カンパニー 欠陥ドナー検出方法
WO1994001528A1 (en) 1992-07-13 1994-01-20 Minnesota Mining And Manufacturing Company A technique to count objects in a scanned image
US5365596A (en) 1992-12-17 1994-11-15 Philip Morris Incorporated Methods and apparatus for automatic image inspection of continuously moving objects
US5305392A (en) 1993-01-11 1994-04-19 Philip Morris Incorporated High speed, high resolution web inspection system
US5544256A (en) 1993-10-22 1996-08-06 International Business Machines Corporation Automated defect classification system
US5434629A (en) 1993-12-20 1995-07-18 Focus Automation Systems Inc. Real-time line scan processor
US5563809A (en) 1994-04-06 1996-10-08 Abb Industrial Systems, Inc. Measurement/control of sheet material using at least one sensor array
JPH08189904A (ja) * 1995-01-06 1996-07-23 Kawasaki Steel Corp 表面欠陥検出装置
US6031931A (en) 1996-03-15 2000-02-29 Sony Corporation Automated visual inspection apparatus
WO1998008080A1 (de) 1996-08-20 1998-02-26 Zellweger Luwa Ag Verfahren und vorrichtung zur erkennung von fehlern in textilen flächengebilden
US5774177A (en) 1996-09-11 1998-06-30 Milliken Research Corporation Textile fabric inspection system
US6092059A (en) 1996-12-27 2000-07-18 Cognex Corporation Automatic classifier for real time inspection and classification
FR2761475B1 (fr) 1997-03-28 1999-06-11 Lorraine Laminage Procede d'inspection de surface d'une bande en defilement par segmentation d'image en zones suspectes
KR100303608B1 (ko) 1997-05-22 2001-11-22 박호군 혈구세포자동인식방법및장치
TW331650B (en) 1997-05-26 1998-05-11 Taiwan Semiconductor Mfg Co Ltd Integrated defect yield management system for semiconductor manufacturing
US6014209A (en) 1997-06-23 2000-01-11 Beltronics, Inc. Method of optically inspecting multi-layered electronic parts and the like with fluorescent scattering top layer discrimination and apparatus therefor
US6246472B1 (en) 1997-07-04 2001-06-12 Hitachi, Ltd. Pattern inspecting system and pattern inspecting method
ES2153150T3 (es) 1997-08-22 2001-02-16 Fraunhofer Ges Forschung Metodo y aparato para la inspeccion automatica de superficies en movimiento.
US6259109B1 (en) 1997-08-27 2001-07-10 Datacube, Inc. Web inspection system for analysis of moving webs
JPH11248641A (ja) 1998-03-03 1999-09-17 Sumitomo Metal Ind Ltd 表面欠陥検査装置及び表面欠陥検査方法
US6272437B1 (en) 1998-04-17 2001-08-07 Cae Inc. Method and apparatus for improved inspection and classification of attributes of a workpiece
JP2000009447A (ja) 1998-06-25 2000-01-14 Nippon Inter Connection Systems Kk テープキャリアの欠陥検出装置および欠陥検出方法
JP3293587B2 (ja) * 1998-07-03 2002-06-17 日本鋼管株式会社 欠陥マーキング方法、欠陥マーキングしたコイルの作業方法及び欠陥マーキングしたコイルの製造方法
US6252237B1 (en) 1998-07-15 2001-06-26 3M Innovation Properties Company Low cost thickness measurement method and apparatus for thin coatings
KR100367222B1 (ko) 1998-07-28 2003-01-09 마츠시다 덴코 가부시키가이샤 가요성 소재의 연속 기판시트 상에 형성된 개별배선패턴을 검사하는 검사시스템
US6266436B1 (en) 1999-04-09 2001-07-24 Kimberly-Clark Worldwide, Inc. Process control using multiple detections
US6404910B1 (en) 1998-12-31 2002-06-11 Kimberly-Clark Worldwide, Inc. Making absorbent articles using vision imaging system
FI106086B (fi) 1999-01-22 2000-11-15 Hildeco Oy Ltd Järjestelmä prosessin tarkkailemiseksi
US6496596B1 (en) 1999-03-23 2002-12-17 Advanced Micro Devices, Inc. Method for detecting and categorizing defects
US6407373B1 (en) 1999-06-15 2002-06-18 Applied Materials, Inc. Apparatus and method for reviewing defects on an object
US6470228B1 (en) * 1999-06-23 2002-10-22 Vought Aircraft Industries, Inc. Material management system and method
DE19930173A1 (de) 1999-06-30 2001-01-04 Parsytec Comp Gmbh Verfahren und Vorrichtung zur prozeßoptimierenden Einstellung von Parametern eines Produktionsprozesses
US6484306B1 (en) 1999-12-17 2002-11-19 The Regents Of The University Of California Multi-level scanning method for defect inspection
JP2001261191A (ja) 2000-03-21 2001-09-26 Dainippon Printing Co Ltd 情報記憶可能な不良位置指示テープを用いた不良情報付加装置と不良情報書換え装置および不良位置指示テープ
EP1148332B1 (en) * 2000-04-18 2005-11-30 The University of Hong Kong Method of inspecting images to detect defects
CN1289901C (zh) 2000-09-10 2006-12-13 奥博泰克有限公司 Pcb检测中错误报警的减少
US6750466B2 (en) 2001-02-09 2004-06-15 Wintriss Engineering Corporation Web inspection system
US6950547B2 (en) * 2001-02-12 2005-09-27 3M Innovative Properties Company Web inspection method and device
US6845278B2 (en) * 2002-08-07 2005-01-18 Kimberly-Clark Worldwide, Inc. Product attribute data mining in connection with a web converting manufacturing process
US7082347B2 (en) * 2002-08-07 2006-07-25 Kimberly-Clark Worldwide, Inc. Autosetpoint registration control system and method associated with a web converting manufacturing process
US7027934B2 (en) * 2003-09-24 2006-04-11 3M Innovative Properties Company Apparatus and method for automated web inspection

Similar Documents

Publication Publication Date Title
JP2007523810A5 (ja)
JP2007517232A5 (ja)
WO2005065367A3 (en) Maximation of yield for web-based articles
JP2005182196A5 (ja)
KR101565748B1 (ko) 이미지에서 반복 패턴을 검출하는 방법 및 장치
CN101465000B (zh) 图像处理设备和方法
JP2003256836A5 (ja)
JP2010109592A5 (ja)
EP1615134A3 (en) System and method for distributing processing among a plurality of processors based on information regarding the temperature of each processor
DE602004004436D1 (de) Vorrichtung, Verfahren und Verarbeitungsprogramm zum Empfangen und Wiedergeben von Daten
SE0302525D0 (sv) Method and system for interaction analysis
JP2011113195A (ja) 不良要因の分析表示方法および不良要因の分析表示装置
JP2010507155A5 (ja)
CA2460089A1 (en) Method, apparatus and program for determining growth of trees
CN106326632A (zh) 物体分析方法与物体分析系统
CN101009755A (zh) 带水印图像的生成器及方法和分析器、介质和可机读介质
TW202200993A (zh) 檢查裝置、檢查方法及檢查程式
JP2010081537A5 (ja)
CN108062821B (zh) 边缘检测方法及验钞设备
JP6305252B2 (ja) 目視検査技能向上支援システム及びこれを用いた目視検査技能向上支援方法並びに目視検査技能向上支援システム用プログラム
US20080283449A1 (en) Method of Analyzing and Sorting Eggs
JP2001043378A5 (ja)
JP2005160020A5 (ja)
EP2192378A3 (en) System, apparatus, method, and computer program product for determining spatial characteristics of an object using a camera and a search pattern
JP2016110626A5 (ja)